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Intellitech Corp. Eclipse Automatic Test Equipment Boundary-Scan Test  
 Description   
  Intellitech’s Eclipse™ Family of Products is a Complete Solution for Design Debug, In-system Device Configuration and Automated Test Program Development for Complex PCBs and Systems. Lab tests can be passed to production test and boundary-scan BIST.
Intellitech Corp. Scan-Ring-Linker & multi-PCB linker Automatic Test Equipment Boundary-Scan Test  
 Description   
  The Scan-Ring-Linker (SRL) and Parallel Test & Configuration (PTC) ICs are infrastucture components needed for designing PCBs and Systems with complex scan-chains. The PTC uses Intellitech's patent-pending parallel test over 1149.1.
Intellitech Corp. SystemBIST Automatic Test Equipment Boundary-Scan Test  
 Description   
  SystemBIST is a component for embedded boundary-scan test and FPGA configuration. All interconnect, scanpath, memory and IC tests can be embedded with SystemBIST. Programs any IEEE 1532 FPGA or CPLD. Easy to user tool sets enable validation

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