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A.T.E. Solutions, Inc. Consulting, Training and Books Testability and Built-In Test Products/Servic Boundary-Scan Test Consulting
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  Help with all aspects of Design for Testability (DFT), Built-In Self Test (BIST), Boundary-Scan, JTAG, IEEE-1149.1, IEEE-1149.4, and IEEE-1149.6 as well as MIL-HBK-2165 to improve chip, board and system level tests. Attend one of our courses or bring it to your site. Our consulting sessions are designed to create harmony between designers and test professionals, so that a cooperative rather than confrontational solution to testability is achieved.

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