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UltraTest International MultiTrace Automatic Test Equipment IC Testers Mixed Signal
 Description   
  Automatic curve tracer tests up to 625 pins. The MultiTrace is much more than just an automated curve tracer. It is an advanced electrical characterization system that can also do Latch-Up testing, IDDQ testing, and DC Parametric measurements.
ABI Electronics ChipMaster Compact Automatic Test Equipment IC Testers Digital
 Description   
  Hand-held Tester.
ABI Electronics Ltd. SYSTEM 8 Analogue Test Station Automatic Test Equipment IC Testers Analog
 Description   
  Able to functionally test all common analogue ICs in-circuit. It is also capable of identifying and testing all other analogue devices by means of the well-known V-I test technique.
Advantest America T6683 SOC Test System Automatic Test Equipment IC Testers SOC
 Description   
  For testing SOC and MPU devices. Can perform device characterization.
Specifications   LL:Lower Limit  NV:Nominal Value  UL:Upper Limit
Algorithmic Pattern Generation      
Arbitrary Waveform Generator      
Automatic Test Program Generation      
Boundary-Scan      
Digital Driver/Sensor Channels      
Handler Interface      
Internal Clock     UL: 1.6 Ghertz 
Maximum Simultaneously Tested Devices     UL: 8 devices 
Test Pattern Depth LL: 3.2E+7 patterns    UL: 6.4E+7 patterns 
Test Rate     UL: 500.0 Mhertz 
Advantest America T7721 Advanced Mixed Signal Test System Automatic Test Equipment IC Testers Mixed Signal
 Description   
  Capable of testing advanced consumer linear devices or mixed-signal devices with high throughput, even in the field of automotive analog devices.
Advantest America T7611 RF Tester Automatic Test Equipment IC Testers Mixed Signal
 Description   
  A mixed-signal test system that combines two technologies, digital device testing and analog measurement, to enable efficient testing of mixed signal devices while maintaining signal synchronization.
Advantest America T7722 Digital Logic and/or Linear/Mixed Signal Tes Automatic Test Equipment IC Testers SOC
 Description   
  Provides a down-sized, low-cost test solution for evaluation and production test of digital logic and/or linear/mixed-signal devices with higher voltage and current requirements of today’s Automotive and Power IC production testing.
Advantest America T5371 Memory Test System Automatic Test Equipment IC Testers Memory
 Description   
  The T5731's timing capabilities include true Double Data Rate (DDR) execution for both drive data and strobe functions. One-pass capability have been added with independent comparator resources and expect-data.
Advantest America T7611 RFIC Test System Automatic Test Equipment IC Testers Mixed Signal
 Description   
  High speed measurement of a wide dynamic range of harmonic waves and Adjacent Channel leakage Power (ACP) and high-speed function testing.
Advantest America T6300 Automatic Test Equipment IC Testers Digital
 Description   
  The T6300 family is designed to provide maximum test coverage for LCD driver ICs. It includes the T6371, the T6361 and T6331 test systems.
Aehr Test Systems Max-4 High-Power Burn-In and Test Automatic Test Equipment IC Testers Digital
 Description   
  For buurning-in and testing high power devices under test (DUTs) such as microprocessors, DSPs, and logic devices, which require high current and low voltage.
Agilent Technologies - Automated Test Group 84000 RFIC Series Test Systems Automatic Test Equipment IC Testers Mixed Signal
 Description   
  Designed to test RF integrated circuits (RFICs) used in wireless products like cellular and cordless phones, the 84000 RFIC Series can test a variety of parts.
Analog Devices AD53508 Dual Channel PMU Automatic Test Equipment IC Testers Mixed Signal
 Description   
  Contains programmable modes allowing it to force voltage (current) and measure current (voltage) at a DUT pin. Higher currents can be measured directly while very low current measurements use integration to obtain low noise and high accuracy.
Analog Devices AD53032 DRIVER/COMPARATOR/LOAD Automatic Test Equipment IC Testers Digital
 Description   
  The AD53032 is a single chip that performs the pin electronics functions of driver, comparator and active load in ATE VLSI and memory testers. In addition, a Schottky diode bridge for the active load and a VCOM buffer are included internally.
ANDO AL6095 Memory Test System Automatic Test Equipment IC Testers Memory
 Description   
   
Specifications   LL:Lower Limit  NV:Nominal Value  UL:Upper Limit
Algorithmic Pattern Generation     UL: 128 devices 
       Comments: x 8-bit devices.
Per-Pin Architecture      
Test Rate     UL: 500.0 Mhertz 
Ando AL7260 VLSI Test System Automatic Test Equipment IC Testers Digital
 Description   
   
B+K Precision 570 Automatic Test Equipment IC Testers Mixed Signal
 Description   
  Handheld tester.
B+K Precision 575 Automatic Test Equipment IC Testers Digital
 Description   
  Handheld tester.
Chroma ATE 3600 VLSI Test System Automatic Test Equipment IC Testers Mixed Signal
 Description   
  The Chroma 3600 is designed to meet the challenges of digital and analog test. It offers powerful, integrated and flexible resources, such as 100MHz, 16V and 400mA, in a single test today and is easy to be upgraded for your future needs.
Credence Systems Corporation SZ Falcon Automatic Test Equipment IC Testers Mixed Signal
 Description   
  SZ Falcon delivers high throughput with a 200 MHz digital sequencer per channel architecture, and reduces test costs through its high-speed computer/tester interface, and parallel, multi-site, and concurrent test capabilities.

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