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A.T.E. Solutions, Inc. BITES Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST) Digital
 Description   
  Under a United States patent, BITES is a board-level Built-In Self Test (BIST) solution. It is a single chip, placed on a circuit board, or programmed into a programmable device such as an FPGA.
Agilent Technologies - Automated Test Group Agilent 93000 SOC Series BIST Assist 6.4 Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST) Mixed Signal
 Description   
  Provides customers using a DFT loopback testing approach with a cost effective alternative that reduces the risks posed by lack of fault coverage. It is a calibrated solution residing within the test head, which results in higher yields.
Alternative System Concepts VBIT® Boundary Scan Synthesis Tool Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST)  
 Description   
  Automatically synthesizes 1149.1 features and adds them to cores described in VHDL or Verilog. Also outputs functional testbench and BSDL and SVF file.
Credence Systems Corporation BIST Software Development Tools Test and Tester Software Built-In (Self) Test (BIST)  
 Description   
  These tools simulate BIST and circuit-under-test operation in a fraction of the time it takes to do complete SPICE simulations. They help with stimulus selection and fault coverage verification.
Credence Systems Corporation VCOBIST Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST) Mixed Signal
 Description   
  IP for making accurate jitter measurements within complex system-on-chip (SOC) designs. VCOBIST (voltage-controlled oscillator BIST) enables accurate, high-speed jitter measurements in silicon with complete test times as low as 20 milliseconds (ms).
Credence Systems Corporation ADCBIST Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST) Mixed Signal
 Description   
  ADCBIST enables engineers to quickly implement a built-in self-test (BIST) methodology for at-speed testing of analog-to-digital converters (ADCs) in complex, mixed-signal, system-on-chip (SoC) designs.
Intellitech Corporation SystemBIST Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST)  
 Description   
  SystemBIST is a code-less processor which enables design engineers to build high quality, self-testable and in-the-field reconfigurable products.
LogicVision, Inc. IC Memory BIST Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST) Memory
 Description   
  Automatically generates and inserts at-speed BIST for embedded memories, such as SRAM, ROM, and DRAM.
LogicVision, Inc. IC Memory BIST with BIRA Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST) Memory
 Description   
  Contains all of the features of the IC Memory BIST product as well as support for Built-In Repair Analysis (BIRA) of repairable memories.
LogicVision, Inc. Logic BIST Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST) Digital
 Description   
  Industry proven scan based test techniques to deliver robust, built-in, at-speed structural test of random logic within SOCs.
Mentor Graphics LBISTArchitect™ Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST)  
 Description   
  LBISTArchitect employs patented multi-test point insertion (MTPI) technology to ensure high fault coverage for BISTed designs and that defective devices are identified and isolated during the manufacturing test process.
Mentor Graphics MBISTArchitect Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST)  
 Description   
  Memory BIST synthesizer. Supported by all the major memory vendors, MBISTArchitect offers the widest variety of test patterns, diagnostic functions, and test control.
Ridgetop Group, Inc. InstaBIST Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST) Mixed Signal
 Description   
  InstaBIST™ involves the application of IP to an IC, PCB, or System level design. To incorporate wider analysis and monitoring of system health, as with a Prognostics/Health Monitoring (PHM) system, BIST is periodically interrogated by the system.
Synopsys, Inc. DW_rambist Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST) Intellectual Property (IP)
 Description   
  Embedded Memory BIST Controller Core
SynTest Technologies, Inc. TurboBIST-Memory Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST) Memory
 Description   
  Tools for adding highly efficient BIST structures to all types of embedded memories including SRAMs, ROMs, SDRAMs and CAMs.
SynTest Technologies, Inc. TurboBIST-Logic Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST) Digital
 Description   
  A powerful, yet easy-to-use, package to create Logic BIST circuits for embedded cores or IPs. It is suitable for IP-based SOC designs to reduce the cost of manufacture tests and improve the quality by using “at-speed” testing.
SynTest Technologies, Inc. TurboBIST-Logic Test and Tester Software Built-In (Self) Test (BIST)  
 Description   
  Design architecture specific PRPG, MISR & Controller are synthesized at Verilog or VHDL RT level.
Virage Logic Corporation STAR Memeory System Testability and Built-In Test Products/Servic Built-In (Self) Test (BIST) Memory
 Description   
  Consist of one or more STAR (repairable) memories and/or ASAP memories, one or more STAR (self-test and repair) processors, one fuse box for each STAR processor.

18 Records Found