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WesTest Engineering Corp. WesTest 2000 Automatic Test Equipment Functional Board Testers Boards
 Description   
  Features Teradyne's high performance Digital Test Unit. Scalable and open architecture design, Designed for military and commercial applications. Includes TPS development tools.
Control Concepts SCR POWER CONTROLLER PRODUCTS Automatic Test Equipment Functional Board Testers Boards
 Description   
  SCR Power Controllers can be divided into two broad categories, Zero-cross and Phase-angle.
Digalog Systems, Inc. Series 2050 Test System Automatic Test Equipment Functional Board Testers PXI
 Description   
  As a fully integrated test system the Series 2050 includes an open architecture test system using the industry standard PXI bus.
Eagle Test Systems ETS-300 Automatic Test Equipment Functional Board Testers Boards
 Description   
  Its ability to provide up to 160 analog pin channels, and 32 digital channels makes it an affordable, versatile and capable choice.
ELES Equipment s. r.l. TEMIS 2000 Automatic Test Equipment Functional Board Testers Boards
 Description   
  TEMIS 2000 architecture has been developed for test automation addressed to design (prototype analysis and debug), to production (product final test) and to the analysis of operating conformity.
Interface Technology Digital Stimulus / Response Testers Automatic Test Equipment Functional Board Testers VXI
 Description   
  DSRs Simulate Actual Signal Environment. In the world of functional digital test, the Digital Stimulus/Response (DSR) subsystem is the most flexible and widely used tool available to the test engineer.
International Test Technologies µMaster Automatic Test Equipment Functional Board Testers Microprocessor
 Description   
  The complete solution for the hardware debug of virtually any processor-based board. It supports a wide range of UUT CPU's, including Intel®, AMD®, and Freescale™ Semiconductor (formerly Motorola™) processor families.
Intrinsic Quality   Automatic Test Equipment Functional Board Testers Boards
 Description   
   
JGB Consulting   Automatic Test Equipment Functional Board Testers Boards
 Description   
   
KES Systems   Automatic Test Equipment Functional Board Testers Boards
 Description   
   
LAEL-Laboratori Elettronici   Automatic Test Equipment Functional Board Testers Boards
 Description   
   
Lockheed Martin Vought Systems   Automatic Test Equipment Functional Board Testers Boards
 Description   
   
Micron Systems Integration   Automatic Test Equipment Functional Board Testers Boards
 Description   
   
Motay Electronics   Automatic Test Equipment Functional Board Testers Boards
 Description   
   
MSD3   Automatic Test Equipment Functional Board Testers Boards
 Description   
   
Multisources Electronique   Automatic Test Equipment Functional Board Testers Boards
 Description   
   
Northrop Grumman Corp. Combined Intermediate-Level Automatic Test Equipme Automatic Test Equipment Functional Board Testers  
 Description   
  Provides a comprehensive line replaceable unit (LRU) and shop replaceable unit (SRU) test capability for factory, depot and intermediate-level support. CIATE is based upon the Integrated Family of Test Equipment (IFTE).
Northrop Grumman Corp. Commercial Equivalent Equipment (CEE) Automatic Test Equipment Functional Board Testers  
 Description   
  A component of the Northrop Grumman IFTE family, the CEE duplicates the capabilities of the Base Shop Test Station (BSTS), and is used by weapons systems contractors as factory test equipment, by test program set (TPS) developers.
Northrop Grumman Corp. AN/GSM-397(V) Electronic Systems Test Set Automatic Test Equipment Functional Board Testers VXI
 Description   
  Combines the versatility and flexibility of commercial VXI instrument standards with the requirement for rugged, sophisticated and readily transportable avionics test equipment. ESTS is part of the Integrated Family of Test Equipment (IFTE),
Northrop Grumman Corp. Base Shop Test Facility (V)6 Automatic Test Equipment Functional Board Testers  
 Description   
  The system utilizes an instrument complement that is a subset of the IFTE VXI family. As configured, BSTF (V)6 will test both LRUs and SRUs and is compatible with existing IFTE TPSs.

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