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Reinhardt System und Messelectronic ATS-KMFT 670 Automatic Test Equipment In-Circuit Testers Combinational
 Description   
  Combined InCircuit- and Functional test system. The benchtop unit has a transparent WINDOWS200®-based menu-driven software with automatic program generation, CAD data import, statistics and autolearn for high test accuracy and high test speed.
ABI Electronics Ltd. System 8 Automatic Test Equipment In-Circuit Testers Mixed Signal
 Description   
  Mixed-Signal In-Circuit Tester
Specifications   LL:Lower Limit  NV:Nominal Value  UL:Upper Limit
Analog Stimulus/Measurement Channels     UL: 24 channels 
Digital Driver/Sensor Channels     UL: 64 channels 
Input Stimulus Bit Resolution     UL: 10 bits 
Programmable Current Source LL: 10.0 microamps    UL: 150.0 milliamps 
Programmable Power Supply     UL: 5.0 volts DC 
Programmable Voltage Source LL: -12.0 volts DC    UL: 12.0 volts DC 
V-I Characteristics      
Waveform Comparison      
Aeroflex Laboratories IFR 4500 Flying Probe Test System Automatic Test Equipment In-Circuit Testers Flying Probe
 Description   
  Latest linear motor technology integrated software approach for CAD translation through to production ready flying probe test programs. Up to 1020 fixed pins allow test times to be optimized for production beat rate requirements.
Agilent 3175 Automatic Test Equipment In-Circuit Testers Mixed Signal
 Description   
   
Specifications   LL:Lower Limit  NV:Nominal Value  UL:Upper Limit
Analog Stimulus/Measurement Channels     UL: 2592 channels 
Automatic Test Program Generation      
Boundary-Scan      
Capacitance      
Capacitor Polarity Check      
Digital Driver/Sensor Channels     UL: 2592 channels 
       Comments: Per-pin with analog capabilities.
Inductance      
Internal Clock LL: 625.0 Khertz    UL: 80.0 Mhertz 
Resistance      
Test Rate     UL: 2.0E+7 patterns/sec 
       Comments: For digital testing. Faster for analog.
Transistor Gain Measurement      
Agilent 3173 Automatic Test Equipment In-Circuit Testers Mixed Signal
 Description   
   
Specifications   LL:Lower Limit  NV:Nominal Value  UL:Upper Limit
Analog Stimulus/Measurement Channels     UL: 5184 channels 
       Comments: Hybrid nodes
Automatic Test Program Generation      
Boundary-Scan      
Capacitance      
Digital Driver/Sensor Channels     UL: 5184 channels 
       Comments: Hybrid nodes
Inductance      
Internal Clock LL: 625.0 Khertz    UL: 80.0 Mhertz 
Resistance      
Test Rate     UL: 2.0E+7 patterns/sec 
Transistor Gain Measurement      
Agilent Technologies - Automated Test Group 3073 - Combinational Test System Automatic Test Equipment In-Circuit Testers Mixed Signal
 Description   
  The 3073 is the largest of the 3070 Series 3 family of combinational testers designed to provide in-circuit test capability coupled with additional capabilities to ensure high test coverage of today’s complex electronic assemblies.
Agilent Technologies - Automated Test Group 3072 - Process Test System Automatic Test Equipment In-Circuit Testers Unpowered
 Description   
  The 3072 is the largest of the 3070 Series 3 family of process testers designed to provide basic unpowered in-circuit test capability with the expandability potential for future test needs as well.
Agilent Technologies - Automated Test Group 3070 Series 3 Family Automatic Test Equipment In-Circuit Testers Combinational
 Description   
  The Agilent 3070 in-circuit test systems, are available in a wide range of offerings to meet your different needs. Nodal capacity ranges from 1,296 to 5,184 circuit nodes.
Agilent Technologies - Automated Test Group 3075 - High Performance Test System Automatic Test Equipment In-Circuit Testers Combinational
 Description   
  designed to provide in-circuit test capability coupled with support for high performance testing using features like timing sets and up to 20.5 Mega Patterns per Second (MPS) digital vector application rate.
Agilent Technologies - Automated Test Group 3170 PPU - Outsource Series Pay-Per-Use System Automatic Test Equipment In-Circuit Testers Combinational
 Description   
  The largest of the 3070 Outsource Series Pay-Per-Use (PPU) family of combinational test solutions offering the entire range of 3070 test capabilities coupled with Agilent´s unique Pay-Per-Use concept to have access to all of the 3070´s capabilities.
CheckSum LLC Analyst ems Automatic Test Equipment In-Circuit Testers Unpowered
 Description   
  It can perform effective power-down testing for most analog or digital assemblies being manufactured today. The optional power-up functional test capability is ideally suited for lower frequency analog assemblies with some digital content.
CheckSum LLC Analyst ils Automatic Test Equipment In-Circuit Testers Unpowered
 Description   
  Using sophisticated measurement techniques such as DC or complex-impedance measurements in conjunction with multi-point guarding, it can find the majority of faults such as shorts, opens and wrong or incorrectly installed components.
CheckSum, Inc. Model TR-8 Automatic Test Equipment In-Circuit Testers Mixed Signal
 Description   
  CheckSum, America's Leader in Manufacturing Defects Analyzer In-Circuit Test Systems (ICT/MDA). We provide low-cost in-circuit test systems used to detect and isolate faults on single or double-sided SMT and through-hole assemblies.
Comware Tech. Services GenRad 228X Products Automatic Test Equipment In-Circuit Testers Used or Refurbished to Sell
 Description   
  Refurbished ATEs with parts and accesories available
COMWARE Technical Services GenRad 227X Products Automatic Test Equipment In-Circuit Testers Used or Refurbished to Sell
 Description   
  Refurbished ATEs with parts and accesories available
Concord Technology T323 Automatic Test Equipment In-Circuit Testers Analog
 Description   
  MDA and discrete analog component In-Circuit tester.
Specifications   LL:Lower Limit  NV:Nominal Value  UL:Upper Limit
Analog Stimulus/Measurement Channels LL: 512 channels  NV: 0.0 amps  UL: 2048 channels 
Analog Stimulus/Measurement Channels LL: 1.0 microamps    UL: 20.0 milliamps 
Capacitance LL: 10.0 picofarads    UL: 0.02 farads 
Capacitor Polarity Check      
Inductance LL: 1.0 microhenries    UL: 40.0 henries 
Input Stimulus Bit Resolution     UL: 16 bits 
Programmable resistance threshold range for shorts LL: 0.0 ohms    UL: 100.0 ohms 
Programmable Voltage Source LL: 0.0 volts DC    UL: 10.0 volts DC 
Resistance LL: 9.9999998E-3 ohms    UL: 40.0 Mohms 
Sinewave Generator LL: 1.0 hertz    UL: 100.0 Khertz 
Six-Wire Resistance      
Test Rate LL: 50 tests/sec    UL: 1200 tests/sec 
       Comments: Capacitance measurements are the fastest, inductance the slowest.
Transistor Gain Measurement      
DiagnoSYS, Inc. VIP II In-Circuit Fault Detection and Analysis Automatic Test Equipment In-Circuit Testers  
 Description   
  Portable circuit analyzer used to troubleshoot to component level with power turned off.
Digitaltest MTS888 OMEGA Automatic Test Equipment In-Circuit Testers Combinational
 Description   
  Provides up to 7040 analog test pins or up to 3456 hybrid test pins. With the non-multiplexed (1:1) pin structure and a logic family definition for each pin, Omega eliminates the need to generate a test program prior to fixture design.
Digitaltest MTS180 EAGLE Automatic Test Equipment In-Circuit Testers Combinational
 Description   
  Economical test for high volume production. Optional functional teest modules provide higher fault coverage. Press-down unit dramatically lowers fixture costs. Up to 2000 analog or 1600 hybrid pins. Combining Econimics and Quality in Board Test
Digitaltest MTS300 Sigma Automatic Test Equipment In-Circuit Testers Combinational
 Description   
  The system is designed for high throughput; with up to 1,000 measurements/sec, it is one of the fastest machines on the market. Highest Fault Converage through flexible test strategies-Analog/Digital ICT/Functional-Memory Test, Flash, Boundary Scan

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