Provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations.
Keio Plaza Hotel Sapporo
Sapporo
Japan
Contact: General Co-Chairs: Yasuo Sato and Seiji Kajihara
The 2 day TestForum is a major event (workshop and exhibition) for Test professionals in the Nordic area of Europe. Every year it is attended by the industry's key persons as well as by international vendors of test & measurement equipment.
The purpose of this workshop is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing.
ACU (Advanced Center for Universities)
Sapporo
Japan
Individuals presenting at DesignCon will join an elite group offering leading-edge case studies, technology innovations, practical techniques, design tips, and application overviews.
Santa Clara Convention Center
Santa Clara, California
USA
Annual meeting of IEST with tutorials, seminars, and working group meetings related to the fields of contamination control; design, test, and evaluation; and product reliability.
