"45 Years of Support Innovation – Moving Forward at the Speed of Light", marks the 45th year of AUTOTESTCON and how our technical program is focused on the future of automatic test. Preview new products and meet military and aerospace leaders.
Orlando World Center Resort - Marriott
Orlando, Florida
USA
This is really two courses combined into one. The first part, Design for Testability provides the guidelines necessary to improve circuit design from a test perspective. It includes simple and easy-to-implement ad-hoc testability guidelines. Then the course looks at more sophisticated structured approaches to testability that can be placed into ICs and boards. Special emphasis will be given to boundary-scan, the (JTAG) IEEE-1149.1. Analog circuit testability builds on the IEEE-1149.1 and is now the Mixed-Signal testability standard, designated as IEEE-1149.4. We examine this standard as well as the IEEE-1149.6 standard for AC Signal and transmission. We will look at other related standards in development, such as the IEEE-1532, IJTAG and SJTAG. The second part of the course will cover Built-In Test. Starting with classification of Built-In Test approaches, the course introduces the building blocks of built-in self test (BIST) architectures. The course then examines some of these architectures, including Random Test Socket (RTS), the Built-In Logic Block Observer (BILBO), the Cyclic Analysis Testing Systems (CATS), the Built-In Test Exerciser and Sensor (BITES), and others. BIT software is also covered.
Learn to measure vibration, calibrate vibration and shock measurement systems, convert measured data into a test program, interpret vibration and shock test requirements, conduct vibration and shock tests, design vibration and shock test fixtures.
Learn to measure vibration, calibrate vibration and shock measurement systems, convert measured data into a test program, interpret vibration and shock test requirements, conduct vibration and shock tests, design vibration and shock test fixtures.
Exchange experiences between scientists and technologies of Eastern and Western Europe, as well as North America and other parts of the world, in the field of design, design automation and test of electronic circuits and systems.
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies.
ITC is the industry's premier conference dedicated to the electronic test of semiconductors, boards, and systems. Paper sessions, tutorials, panels, advanced industrial practice presentations, a lecture series, a poster session, workshops, exhibits.
