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Test Events

  

-Listings are in date order, except those with paid image adds appear first.-
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19 Events Found
Jun 16, 2008
Cost Effective Test Strategies Using ATE, DFT and BIST
  This tutorial will cover the two main reasons to test are 1) to eliminate failures escaping to your customers and 2) to reduce the life cycle cost of a product by eliminating penalty costs associated with delivering faulty units.
Chicago, Illinois
USA
Contact: A.T.E. Solutions, Inc.
Email: Edcuation@BestTest.com
Phone: 310-641-8400
Jul 15 - 18, 2008
Random Vibration, Shock Testing, HALT, ESS, HASS Measurements, Analysis and Calibration
  Review of basic vibrations, vibration measurements, analysis and calibration; sinusoidal and random vibration testing; ESS; HASS and HALT; vibration and shock test fixture design; shock measurement, shock response spectrum (SRS) and shock testing.
Hillsboro, Oregon
USA
Contact: A.T.E. Solutions, Inc.
Email: Education@BestTest.com
Phone: 310-641-8400
Jul 28 - 30, 2008
Design for Testability and for Built-In Self Test Course
  The first part, Design for Testability provides the guidelines necessary to improve circuit design testability. It includes (JTAG) IEEE-1149.1 boundary scan as well as 1149.4 and 1149.6. The second part of the course will cover Built-In Self Test.
Boston, Massachusetts
USA
Contact: A.T.E. Solutions, Inc.
Email: Education@BestTest.com
Phone: 310-641-8400
May 8 - 13, 2008
  The Embedded Masterclass 2008
  Embedded Masterclass has gained a reputation for being 'useful and informative', a chance to meet with vendors and engineers in a non-sales environments and a chance to listen to technical presentations from key industry leaders.
The Thames Innovation Centre
London
United Kingdom
Contact: Richard Blackburn
Email: richard@energi-tech.co.uk
Phone: +44(0)1603 278228
May 11 - 16, 2008
  PCB East 2008
  From the moment you arrive at PCB East 2008, you'll be surrounded by a brain trust of industry experts who not only will understand your toughest design issues, they'll also show you how to solve them.
Holiday Inn Select & Convention Center
Tinley Park, Illinois
USA
Contact: Frances Stewart
Email: fstewart@upmediagroup.com
Phone: 678-589-8818
May 12 - 15, 2008
  International Instrumentation and Measurment Technology Conference (I2MTC)
  The Conference focuses on all aspects of instrumentation and measurement science and technology – research, development and applications.
Fairmont Empress Hotel & Conference Center
Victoria, Vancouver Island, British Columbia
Canada
Contact: Robert C. (Bob) Rassa, General Chair
Email: Bob.Rassa@ieee.org
May 12 - 15, 2008
  Random Vibration, Shock Testing, HALT, ESS, HASS Measurements, Analysis and Calibration
  Review of basic vibrations, vibration measurements, analysis and calibration; sinusoidal and random vibration testing; ESS; HASS and HALT; vibration and shock test fixture design; shock measurement, shock response spectrum (SRS) and shock testing.
Toronto, Ontario
Canada
Contact: A.T.E. Solutions, Inc.
Email: Education@BestTest.com
Phone: 310-641-8400
May 12 - 15, 2008
  International Instrumentation & Measurement Technology Conference
  The Conference focuses on all aspects of instrumentation and measurement science and technology – research, development and applications.
Fairmont Empress Hotel
Victoria, Vancouver Island, BC
Canada
Contact: Robert C. Rassa, Conference Chair
Email: Bob.Rassa@ieee.org
May 14 - 16, 2008
  International Conference on Soldering & Reliability
  This conference will bring together the community of soldering and reliability experts.
Toronto Hilton Airport
Toronto, Ontario
Canada
Contact: Melissa Serres, SMTA
Email: melissa@smta.org
Phone: 952-920-7682
May 19 - 23, 2008
  Asia-Pacific Symposium on Electromagnetic Compatibility
  The symposium will cover the entire scope of electromagnetic compatibility. Prospective authors are invited to submit original papers on their latest research results.
SUNTEC Convention & Exhibition Centre
Singapore
Singapore
Contact: Dr Er-Ping Li, Symposium Chair
Email: erpingli@ieee.org
May 25 - 29, 2008
  IEEE European Test Symposium (ETS'08)
  The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing.
Lago Maggiore
ITALY
Contact: Matteo Sonza Reorda – General Chair
Email: matteo.sonzareorda@polito.it
Phone: +39-011-564-7055
Jun 3 - 6, 2008
  NEPCON / MICROELECTRONICS Penang
  NEPCON Penang is an industry platform into the Malaysian electronics manufacturing sector, bringing together international suppliers of equipment, products and services and the multinational and local manufacturers in Malaysia.
Penang International Sports Arena
Penang
Malaysia
Contact: Ms TEO Hui Hiang
Email: huihiang.teo@reedexpo.com.sg
Phone: +65 6780 4602
Jun 18 - 20, 2008
  International Mixed-Signals, Sensors, and Systems Testing Workshop (IMS3TW'08)
  The rapid pervasion of micro/nanoelectronics into various application fields like biology, chemistry, mechanics, optics, etc. is fostering unprecedented types of heterogeneous integrated systems and associated interfaces between these domains.
Renaissance Hotel Harbourside
Vancouver
Canada
Contact: Bozena Kaminska
Email: kaminska@sfu.ca
Phone: +1 778.782.6855
Aug 5 - 7, 2008
  National Instruments NIWeek 2008
  Join more than 3,000 engineers, scientists, educators, and NI developers for three full days of technical sessions, hands-on workshops, case study presentations, and exhibitions on the latest technologies for design, control, and test applications.
Austin Convention Center
Austin, Texas
USA
Contact: Hilary Marchbanks, Public Relations
Email: hilary.marchbanks@ni.com
Phone: 512.683.5937
Sep 22 - 24, 2008
  Instrumentation and Methods for Electrical and Electronic
  Its objectives are the promotion of international interchange of scientific and technical information in the field of measurement and instrumentation.
Florence
Italy
Contact: Prof. Dr. António da Cruz Serra
Email: acserra@ist.utl.pt
Phone: +351 2 184 184 90
Sep 29 - 30, 2008
  IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems NDCS 2008
  The NDCS Workshop, at its first year, will provide an open forum for presentations in all aspects of design, manufacturing, test and reliability of innovative nano-circuits and systems.
Cambridge, Massachusetts
USA
Contact: Giorgio Baccarani
Email: gbaccarani@arces.unibo.it
Phone: +39 051 2095412
Oct 1 - 3, 2008
  International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'08)
  Field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. Combines new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field.
Cambridge, Massachusetts
USA
Contact: Cristiana Bolchini
Email: cristiana.bolchini@polimi.it
Phone: +39 02 2399 3619
Oct 21 - 23, 2008
  Mexitronica
  Mexitrónica features the most advanced tools, materials, equipment, electronic components, printed circuits, test instruments, connectors and cable. Everything needed to engineer, manufacture, and deliver high-quality electronic products.
Expo Guadalajara
Guadalajara, Jalisco
Mexico
Contact: Olga Villegas Fernández
Email: ovillegas@rocexhibitions.com
Phone: +52 (33) 3030 7215
Nov 25 - 26, 2008
  Nordic Test Forum's TestForum 2008
  The 2 day TestForum is a major event (workshop and exhibition) for Test professionals in the Nordic area of Europe. Every year it is attended by the industry's key persons as well as by international vendors of test & measurement equipment.
Nordic Hotel Forum
Tallinn
Estonia
Contact: Artur Jutman
Email: artur@pld.ttu.ee
Phone: +3726202263

19 Events Found