| Title: |
PXI embedded controllers promise 'exceptional' performance
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| Author: | EE Times Asia |
| Date: | 4/25/2008 |
| Type: | Product Release |
| Source: |
National Instruments
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| Subjects: | PXI instruments, controllers |
| Abstract: |
National Instruments has announced two new low-cost embedded controllers—the PXI-8104 and PXI-8183—that promise exceptional performance for value-based test, measurement and control applications. With these new controllers, engineers and scientists ...
[more] |
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| Title: |
How-To Guide for Most Common Measurements
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| Author: | National Instruments |
| Date: | 4/25/2008 |
| Type: | Application Note |
| Source: |
National Instruments
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| Subjects: | measurements |
| Abstract: |
The National Instruments “How-To Guide for Most Common Measurements” is a centralized resource portal for obtaining information about making common sensor and signal measurements. Each of the following documents covers the operating principle for th...
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| Title: |
Self-Healing Stretchable Substrate
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| Author: | PCB007 |
| Date: | 4/25/2008 |
| Type: | Product Release |
| Source: |
Arkema
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| Subjects: | semiconductor technology |
| Abstract: |
IDTechEx conferences and reports on printed electronics have focused a great deal on smart substrates because they hugely leverage printed technology, making incredible new products possible. Smart substrates change shape under electrical bias, that...
[more] |
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| Title: |
Keithley's Test & Measurement Catalog CD
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| Author: | Keithley Instruments, Inc. |
| Date: | 4/25/2008 |
| Type: | FREE Giveaways |
| Source: |
Keithley Instruments, Inc.
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| Subjects: | test instruments |
| Abstract: |
Catalog CD has all of the information found on our 450+ page catalog, but in a convenient, tree-saving format! Like the print version, the CD includes useful selector guides, as well as information on the newest innovations in test and measurement, ...
[more] |
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| Title: |
LogicVision Reports First Quarter Financial Results
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| Author: | MSN Money |
| Date: | 4/22/2008 |
| Type: | Announcement |
| Source: |
LogicVision, Inc.
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| Subjects: | Built-In Self Test (BIST), memory BIST, Built-In Self Repair (BISR) |
| Abstract: |
LogicVision, Inc. LGVN, a leading provider of test and yield learning solutions, today announced its financial results for the first quarter of 2008, ended March 31, 2008.
First Quarter 2008 Results
Revenues in the first quarter of 2008 were...
[more] |
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| Title: |
Court junks FormFactor's patent complaint
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| Author: | EE Times Asia |
| Date: | 4/22/2008 |
| Type: | Announcement |
| Source: |
FormFactor Inc.
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| Subjects: | wafer probing |
| Abstract: |
Related Content
• Jury orders Microsoft to pay Alcatel-Lucent $367M (2008-04-09)
• U.S. Senate to take on patent reform bill issues (2008-04-08)
• Silicon Labs, ADI settle patent suit (2008-03-28)
• U.S. ITC to probe patent claim relatin...
[more] |
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| Title: |
World's smallest transistor created
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| Author: | The Times of India |
| Date: | 4/21/2008 |
| Type: | Announcement |
| Source: |
The Times of India
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| Subjects: | semiconductor business |
| Abstract: |
LONDON: Scientists have created the world's smallest transistor, measuring a little bigger than a molecule, a feat which they claim could spark the development of super-fast computer chips in the future.
Using the world's thinnest material calle...
[more] |
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| Title: |
MIMO Testing Made Easy
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| Author: | Louis E. Frenzel, Electronic Design |
| Date: | 4/18/2008 |
| Type: | Product Release |
| Source: |
Azimuth Systems
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| Subjects: | wireless, telecommunications |
| Abstract: |
If you’re developing Wi-Fi or WiMAX equipment with multiple-input/multiple-output (MIMO), you have a test problem. To ensure your new products meet the needs of your customers and comply with the standards organization’s test procedures, you need a ...
[more] |
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| Title: |
LCD display defects - Industry standard?
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| Author: | SMTNet |
| Date: | 4/17/2008 |
| Type: | Web posting |
| Source: |
SMTNet
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| Subjects: | defect analysis |
| Abstract: |
Q: Our company is placing an LCD display on boards for a customer and there are questions being raised on the quality level we are getting from our supplier on these LCDs. Does anyone know what an industry-wide quality level for LCD modules should b...
[more] |
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| Title: |
TRI integrates ASSET®’s ScanWorks® boundary-scan technology into its test systems
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| Author: | ASSET InterTech, Inc. |
| Date: | 4/17/2008 |
| Type: | Product Release |
| Source: |
ASSET InterTech, Inc.
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| Subjects: | boundary scan, JTAG, in-circuit test |
| Abstract: |
ASSET InterTech, Inc., (www.asset-intertech.com), the leading provider of boundary-scan (JTAG/IEEE 1149.1) systems for test, in-system programming (ISP) and embedded instrumentation applications such as design validation, test and debug, and Test Re...
[more] |
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| Title: |
Understand 3G LTE testing challenges
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| Author: | EE Times Asia |
| Date: | 4/16/2008 |
| Type: | Magazine Article |
| Source: |
EE Times Asia
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| Subjects: | wireless test, RF Test |
| Abstract: |
With over 2.5 billion users and growing, the GSM/3GSM radio access technology dominates today’s global cellular landscape. To keep pace with this growth and the demand for faster, more bandwidth-intensive services, it is essential that the technolog...
[more] |
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| Title: |
High-Tech Industry Added 91,400 Jobs in 2007 - Fewer than in 2006
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| Author: | Deb Perelman, eWeek.com |
| Date: | 4/16/2008 |
| Type: | Report |
| Source: |
AeA
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| Subjects: | Electronics Engineers |
| Abstract: |
The U.S. high-tech industry added jobs for a third year in a row, according to a report released April 2 by the AeA, a high-tech trade association. In 2007, 91,400 jobs were added, slightly less than the gains of 139,000 in 2006 but in line with the...
[more] |
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| Title: |
First reconfigurable avionics test system platform debuts
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| Author: | EE Times Asia |
| Date: | 4/16/2008 |
| Type: | Product Release |
| Source: |
Aeroflex
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| Subjects: | PXI, ATE design |
| Abstract: |
Aeroflex has introduced the Avionics Test Bench and Avionics Test Studio, said to be the first reconfigurable PXI-based test platform for avionics navigation and communications. Unlike standalone bench instruments, Aeroflex's new avionics test syste...
[more] |
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| Title: |
USB DMM has 6½ digits
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| Author: | Test & Measurement World |
| Date: | 4/16/2008 |
| Type: | Product Release |
| Source: |
Signametrics
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| Subjects: | digital multimeters (DMMs), measurements |
| Abstract: |
The SMU2055 from Signametrics lets you add a DMM to any Windows PC through a USB port. The SMU2055 measures DC and true-rms AC voltage and current, resistance (two wire and four wire), and it performs diode tests. It can measure at 250 readings/s an...
[more] |
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| Title: |
Gartner Downgrades 2008 Capex Spending Forecast
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| Author: | David Lammers, News Editor -- Semiconductor International |
| Date: | 4/16/2008 |
| Type: | Report |
| Source: |
Gartner, Inc.
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| Subjects: | ATE business |
| Abstract: |
Gartner Inc. (Stamford, Conn.) today announced a downgrade to its forecast for the semiconductor capital equipment market, predicting a 19.8% contraction for this year and a “stable but lackluster” outlook over the next several years.
NAND capital ...
[more] |
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| Title: |
Corelis ports development tool to latest AMCC processors
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| Author: | Test & Measurement World |
| Date: | 4/15/2008 |
| Type: | Announcement |
| Source: |
Corelis, Inc.
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| Subjects: | JTAG, IEEE-1149.1, Boundary-scan |
| Abstract: |
Corelis announced that its CodeSymphony software development and JTAG debug environment now works with PowerPC 460EX and 460GT embedded processors from Applied Micro Circuits Corp. (AMCC). CodeSymphony, which combines an Eclipse-based development pl...
[more] |
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| Title: |
JTAG Technologies - more focus on Russia
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| Author: | EMSNow |
| Date: | 4/14/2008 |
| Type: | Announcement |
| Source: |
JTAG Technologies
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| Subjects: | boundary scan. JTAG, IEEE-1149.1 |
| Abstract: |
JTAG Technologies B.V, a global leader in innovative Boundary-Scan (IEEE Standard 1149.1) products delivering a broad line of software and hardware tools for test preparation, test execution, test result analysis, and in-system programming applicati...
[more] |
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| Title: |
Latest Apple laptops give users graphics glitches galore
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| Author: | Chris Foresman - ars technica |
| Date: | 4/14/2008 |
| Type: | Web posting |
| Source: |
ars technica
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| Subjects: | failure modes |
| Abstract: |
The latest Penryn-based updates to Apple's popular MacBook and MacBook Pro models have been giving users headaches with unusual display problems, according to a number of Apple support threads unearthed by APC. The two most widely reported problems ...
[more] |
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| Title: |
Channel emulator line tailored for 4G wireless
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| Author: | EE Times Asia |
| Date: | 4/11/2008 |
| Type: | Product Release |
| Source: |
Azimuth Systems
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| Subjects: | wireless, telecommunications |
| Abstract: |
Azimuth Systems Inc. has announced an expanded channel emulator product line designed to address the needs of emerging 4G wireless broadband technologies including LTE, IEEE 802.16m, UMB and other technologies that will be deployed in the 700MHz spe...
[more] |
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