| Title: |
NEW DUAL FREQUENCY MULTI-GNSS CONSTELLATION SIMULATOR
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| Author: | Jennifer Beadling |
| Date: | 5/10/2012 |
| Type: | Product Release |
| Source: |
Spectracom
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| Subjects: | Spectracom’s 32-channel GSG-62 provides expandability to simulate current and future satellite navigation signals and frequencies |
| Abstract: |
Introducing Spectracom’s new L1+L2 dual frequency 32-channel multi-GNSS simulator, the GSG-62. The GSG-62 offers multiple frequency band operation, multiple GNSS constellation simulation, and expansion capability for more frequency bands and chann...
[more] |
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| Title: |
Spectracom Assures GPS Integrity with Leap Second Testing Tools
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| Author: | Tim Klimasewski |
| Date: | 1/26/2012 |
| Type: | Announcement |
| Source: |
Spectracom
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| Subjects: | GPS, Test, Leap Second |
| Abstract: |
GPS simulators offer fast and easy testing of the upcoming leap second event on June 30 to validate performance of GPS devices and systems.
Spectracom has published its Application Note: Leap Second Testing Made Easy in response to the recent ann...
[more] |
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| Title: |
THE FIRST PORTABLE SYNC TESTER/ANALYZER FOR NEXT GENERATION NETWORKS (NGN)
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| Author: | Staffan Johansson |
| Date: | 11/5/2010 |
| Type: | Product Release |
| Source: |
Spectracom
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| Subjects: | Press release |
| Abstract: |
Pendulum STA-61, a new field sync tester/analyzer that verifies synchronization quality in
traditional SDH/SONET core networks as well as IP-based backhaul and mobile networks.
Spectracom today announced its new Sync Tester/Analyzer developed f...
[more] |
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| Title: |
IEEE 1588-2008 perspectives and opportunities
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| Author: | André Marais, Symmetricom Inc -- EDN |
| Date: | 10/21/2010 |
| Type: | Magazine Article |
| Source: |
EDN
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| Subjects: | LXI, ethernet |
| Abstract: |
The PTP (Precision Time Protocol), which the IEEE defined under 1588-2008, represents a step change in the distribution of time and frequency across WANs (wide-area networks). The telecommunications industry is, in parallel, evolving to packet-trans...
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| Title: |
What IEEE 1588 means for your next T&M system design
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| Author: | Paul F. Franklin, Keithley Instruments Inc. |
| Date: | 10/19/2010 |
| Type: | Magazine Article |
| Source: |
EE Times
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| Subjects: | LXI, ehternet, IEEE-1588 |
| Abstract: |
Timing and synchronization are crucial in building test and measurement (T&M) systems, which makes the IEEE 1588 Precision Time Protocol’s ease of use and high performance especially attractive to system designers. This paper offers an overview of t...
[more] |
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| Title: |
Optimizing functional-test throughput in PXI-based automated test systems
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| Author: | Alan J. Lesko, Agilent Technologies |
| Date: | 10/19/2010 |
| Type: | Magazine Article |
| Source: |
EE Times
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| Subjects: | PXI, functional test |
| Abstract: |
The selected test methods must be efficient, focusing on validating functionality of the device under test (DUT) while gathering parametric data to help improve the manufacturing process. Also, instrument selection must consider both speed and measu...
[more] |
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| Title: |
Andy Grove: How America Can Create Jobs
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| Author: | Andy Grove |
| Date: | 7/1/2010 |
| Type: | Magazine Article |
| Source: |
Business Week
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| Subjects: | employment |
| Abstract: |
The former Intel chief says "job-centric" leadership and incentives are needed to expand U.S. domestic employment again. |
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| Title: |
Accuracy of Pick & Place System Ratings
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| Author: | Phil Zarrow and Jim Hall |
| Date: | 4/2/2010 |
| Type: | Video and Images |
| Source: |
Circuitmart
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| Subjects: | PCB manufacturing |
| Abstract: |
At Board Talk, the Assembly Brothers cut through the marketing hype, the platitudes and incompetent un-scientific baloney with a search for the truth. |
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| Title: |
PXI keeps pushing envelope
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| Author: | Richard A. Quinnell, Contributing Editor -- Test & Measurement World |
| Date: | 3/1/2010 |
| Type: | Magazine Article |
| Source: |
Test & Measurement World
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| Subjects: | PXI, functional test |
| Abstract: |
From its humble beginnings as a low-cost alternative to bench instrumentation, the PXI architecture has evolved to hold its own against high-end dedicated test systems. Now, advances in semiconductor integration and a weakened economy are helping PX...
[more] |
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| Title: |
Solving the Jitter Problem: Free Tutorial
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| Author: | Greg D Le Cheminant |
| Date: | 12/4/2009 |
| Type: | Application Note |
| Source: |
Agilent Technologies, Inc.
|
| Subjects: | jitter, clock measurement, signal integrity |
| Abstract: |
Jitter causes bit errors -- and that's not something you can afford in your
devices. So what can you do to handle the jitter problem once and for all?
Download this free tutorial for a better understanding of jitter and how
to solve it, with...
[more] |
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| Title: |
Seica marries flying-probe and boundary-scan test methods
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| Author: | Test & Measurement World |
| Date: | 11/19/2009 |
| Type: | Product Release |
| Source: |
Seica SpA
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| Subjects: | flying probe testers |
| Abstract: |
Seica, in partnership with Temento Systems, has developed the FlyScan module to enable the integration of boundary-scan testing with flying-probe test systems. According to the company, FlyScan exploits the specific benefits of flying-probe and boun...
[more] |
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| Title: |
Free-for-Life Tool Cracks PCB Debug Challenge
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| Author: | Ray Dellecker |
| Date: | 11/11/2009 |
| Type: | Product Release |
| Source: |
JTAG Technologies, Inc.
|
| Subjects: | Novel JTAG product available for immediate download |
| Abstract: |
With the breakthrough product family, JTAG Live(tm), debugging boards too crowded for traditional probing becomes a whole lot easier. JTAG Live is ideal for electronics engineers and technicians to use in checking PCBs for basic continuity and corr...
[more] |
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| Title: |
Designing an accessible board
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| Author: | Ron Wilson, Executive Editor -- EDN |
| Date: | 10/8/2009 |
| Type: | Magazine Article |
| Source: |
EDN Magazine
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| Subjects: | Design for Testability |
| Abstract: |
One of the responsibilities of board-level designers is to ensure that verification and failure-analysis engineers have adequate access to signals without resorting to drills, bed-of-nails testers, or focused ion beams. This requirement used to be s...
[more] |
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| Title: |
JTAG Technologies New Express Boundary-scan Controller
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| Author: | Ray Dellecker |
| Date: | 9/29/2009 |
| Type: | Product Release |
| Source: |
JTAG Technologies, Inc.
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| Subjects: | New Express Boundary-Scan Controller |
| Abstract: |
JTAG Technologies, a leading provider of IEEE Std. 1149.1 solutions for testing and programming high-density PCBs, announces a further extension of its line of high-performance boundary-scan IEEE Std. 1149.1 controllers. Known as the DataBlaster JT...
[more] |
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| Title: |
Product Release
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| Author: | Ray Dellecker |
| Date: | 9/15/2009 |
| Type: | Product Release |
| Source: |
JTAG Technologies, Inc.
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| Subjects: | JTAG Test Routines Bend the Coverage Curve |
| Abstract: |
Test engineers have a new weapon in the battle to verify the operation of complex, non-boundary-scan clusters. In addition to its ActiveTest tool, JTAG Technologies now offers JTAG Functional Test (JFT)simplifying test preparation and interpretatio...
[more] |
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| Title: |
GOEPEL electronics to run Webinars on JTAG/Boundary Scan in October
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| Author: | GÖPEL electronic |
| Date: | 9/8/2009 |
| Type: | Announcement |
| Source: |
GOEPEL electronic
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| Subjects: | JTAG, Boundary Scan, IEEE 1149.1, basics, webinar, scan test |
| Abstract: |
GOEPEL electronics, vendor of JTAG/Boundary Scan solutions compliant with IEEE Std.1149.x, will run free Webinars on the four Tuesdays in October 2009. The company, based in Austin, TX, will present information on topics such as the basics of JTAG/B...
[more] |
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| Title: |
GOEPEL electronics to run another Technology Day in UK
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| Author: | GOEPEL electronic |
| Date: | 9/8/2009 |
| Type: | Announcement |
| Source: |
GOEPEL electronic
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| Subjects: | JTAG, Boundary Scan, UK, Technology Day, AOI, Automated Inspection |
| Abstract: |
GOEPEL electronics Ltd, a leader in JTAG/Boundary Scan and AOI/AXI systems, will run another Technology Day in the UK on the 13th October 2009 in Southampton. The seminars will be covering latest developments and applications in JTAG/Boundary Scan a...
[more] |
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