| Title: |
Sensors Accelerate Into Sports - MEMS
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| Author: | Paul G. Schreier, Contributing Editor - Evaluation Engineering |
| Date: | 9/2/2008 |
| Type: | Magazine Article |
| Source: |
Evaluation Engineering
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| Subjects: | sensors, MEMS |
| Abstract: |
Low-cost MEMS-based accelerometers have been part of automotive airbag systems for many years, and now multi-axis versions are being built into 3-D game controllers as well as pedometers and mobile phones. But, these transducers are not limited to c...
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| Title: |
A Good Time for MEMS-Based Oscillators
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| Author: | Tom Lecklider, Senior Technical Editor |
| Date: | 9/1/2008 |
| Type: | Magazine Article |
| Source: |
Evaluation Engineering
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| Subjects: | MEMS, sensors |
| Abstract: |
Quartz isn't dead yet, not by a long shot. But for less demanding applications, oscillators based on MEMS resonators are a tiny and low-cost alternative. Some MEMS-based oscillators can be integrated with CMOS circuitry while others must be separate...
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| Title: |
Olympics ushers in new MEMS era
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| Author: | EE Times Asia |
| Date: | 8/12/2008 |
| Type: | Announcement |
| Source: |
EE Times
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| Subjects: | sensors |
| Abstract: |
When a cascade of mesmerizing tableaux unfolded on the floor of the "Bird's Nest" at the Beijing Summer Olympics opening ceremony, TV viewers couldn't help but notice the intense flickering of what seemed like 92,000 red, green, blue, yellow and whi...
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| Title: |
'Chip-on-MEMS' enables wafer-level calibration
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| Author: | EE Times Asia |
| Date: | 12/17/2007 |
| Type: | Product Release |
| Source: |
EE Times Asia
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| Subjects: | wafer test, microelectromagnetic sensors |
| Abstract: |
MEMS chips are currently joined to separate CMOS ASICs after separate wafers are diced. A new technique called "chip-on-MEMS" bonds ASIC dice atop an entire MEMS wafer before dicing, according to developer VTI Technologies Oy.
"Chip-on-MEMS is a...
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| Title: |
Handheld spectrum analyzer operates up to 7.5GHz
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| Author: | EE Times Asia |
| Date: | 11/27/2007 |
| Type: | Product Release |
| Source: |
Boonton Electronics
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| Subjects: | spectrum analyzers |
| Abstract: |
Related Content
• Willtek serves up RF calibration services (2004-08-17)
• Software extends Willtek handheld spectrum analyzer (2004-05-26)
Top Ranked Articles
• Mobile gizmos to get single-chip RFID reader
• RF...
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| Title: |
RF MEMS Switch Market Set To Soar
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| Author: | Electronic Design |
| Date: | 11/26/2007 |
| Type: | Report |
| Source: |
Wicht Technologie Consulting (WTC)
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| Subjects: | MEMS sensors |
| Abstract: |
Only $5 million worth of RF MEMS switches were sold last year, but an updated technical and market analysis by Wicht Technologie Consulting (WTC) predicts that the market will surge to $210 million by 2011.
Nearly half of that total — $100 milli...
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| Title: |
Tiny Switches With Big Features - MEMS
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| Author: | Tom Lecklider, Senior Technical Editor |
| Date: | 9/1/2007 |
| Type: | Magazine Article |
| Source: |
Evaluation Engineering
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| Subjects: | switching |
| Abstract: |
MEMS switches and relays are desirable because of their size, longevity, and RF performance. Today, at least four companies either have products available in volume or soon will. MEMS switches introduced a few years ago proved to be unreliable, whic...
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| Title: |
FormFactor's Khandros touts R&D results - MEMS-based probing contact
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| Author: | Rick Nelson, Chief Editor, Test & Measurement World |
| Date: | 7/17/2007 |
| Type: | Product Release |
| Source: |
FormFactor, Inc.
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| Subjects: | semiconductor ATE, wafer probing |
| Abstract: |
R&D pays off. That's the message that FormFactor CEO Igor Khandros brought to Semicon West, where he discussed FormFactor's development of a MEMS-based probing contact technology capable of full area wafer probing of high-pin-density, ultra-fine-pit...
[more] |
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| Title: |
Analog Devices debuts tri-axis inertial measurement unit
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| Author: | Test & Mesurement World |
| Date: | 6/14/2007 |
| Type: | Product Release |
| Source: |
Analog Devices
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| Subjects: | sensors |
| Abstract: |
Analog Devices chose Sensors Expo to extend its iSensor intelligent sensor product family with a motion sensor that allows industrial designers to easily and cost-effectively equip their products with full-range, multi-axis inertial sensing. Leverag...
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| Title: |
Worldwide MEMS Systems Market Expected To Reach $95 Billion By 2010
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| Author: | Semiconductor Online |
| Date: | 5/8/2007 |
| Type: | Report |
| Source: |
Research and Markets
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| Subjects: | Micro-electromechanical systems |
| Abstract: |
Micro-electromechanical systems (MEMS) include products such as automobile airbag systems, display systems and inkjet cartridges. The worldwide MEMS systems market reached $48 billion in 2005, and is expected to rise to $72 billion by 2008 and $95 b...
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| Title: |
MEMS RF Switch Operates To 26 GHz
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| Author: | Louis E. Frenzel, Electronic Design |
| Date: | 4/30/2007 |
| Type: | Product Release |
| Source: |
TeraVicta Technologies Inc.
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| Subjects: | high speed switching |
| Abstract: |
For years, companies have been trying to make a fast, reliable microelectromechanical-systems (MEMS) switch that can switch quickly as well as work at the upper microwave frequencies. Many efforts over the past decade have resulted in products that ...
[more] |
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| Title: |
XYZ-axis accelerometers roll for mobile CE apps
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| Author: | EE Times Asia |
| Date: | 1/11/2007 |
| Type: | Product Release |
| Source: |
Freescale Semiconductor
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| Subjects: | accelerometers, sensors |
| Abstract: |
Freescale Semiconductor has unveiled three highly sensitive XYZ-axis accelerometers for smart mobile devices. The MMA7360L, MMA7340L and MMA7330L triple-axis accelerometers provide motion-sensing solutions for CE devices that require fast response t...
[more] |
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| Title: |
Best in Test Awards—Winners announced!
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| Author: | Test & Measurement World |
| Date: | 12/1/2006 |
| Type: | Report |
| Source: |
Test & Measurement World
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| Subjects: | test products |
| Abstract: |
The top 12 candidates for the Best in Test have been named:
DIGITAL MULTIMETERS
8846A digital multimeter, Fluke
AUDIO TEST
APx585 audio tester, Audio Precision
WAVEFORM GENERATORS
AWG7000 series arbitrary waveform generators, Tektronix
...
[more] |
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| Title: |
YESTech announces new XXX 3-D X-Ray inspection software
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| Author: | EMSNow |
| Date: | 11/29/2006 |
| Type: | Product Release |
| Source: |
YesTech, Inc.
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| Subjects: | x-ray inspection |
| Abstract: |
YESTech has added 3D Tomography capability to its high-resolution YTX-3000 X-Ray inspection systems. This new capability is used to generate a three-dimensional image of an object from a large series of two-dimensional X-ray images taken around a si...
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| Title: |
MEMS-based oscillator threatens quartz; resonator could move on-chip
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| Author: | Maury Wright, Editor in Chief |
| Date: | 4/10/2006 |
| Type: | Magazine Article |
| Source: |
SiTime
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| Subjects: | oscillator, clocking circuit |
| Abstract: |
Few electronic components have stood the test of time better than the quartz-crystal oscillator or resonator. But researchers continue to search for a quartz replacement because the components don’t scale downward sizewise—at least relative to ICs—a...
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| Title: |
Tokyo Electron delivers MEMS tester
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| Author: | Peter Clarke, EE Times |
| Date: | 4/4/2006 |
| Type: | Announcement |
| Source: |
Tokyo Electron Ltd.
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| Subjects: | microelectromechanical ATE |
| Abstract: |
Production equipment company Tokyo Electron Ltd. (TEL) has developed a wafer-level tester for microelectromechanical systems (MEMS). The first example has been delivered to a Japanese MEMS device maker. |
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| Title: |
Feinfocus Fox X-ray inspection series with new HDX-ray(TM) Imaging Chain
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| Author: | EMSNow |
| Date: | 7/6/2005 |
| Type: | Product Release |
| Source: |
Feinfocus
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| Subjects: | x-ray inspection |
| Abstract: |
Feinfocus, a business unit of COMET, announces the new HDX-ray(TM) 16-bit Imaging Chain for the complete series of award-winning Feinfocus Fox X-ray inspection systems. The system captures high-resolution images with film-like quality, even in real-...
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| Title: |
Design-for-manufacturability a must
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| Author: | Mark da Silva, Director of MEMS Technology |
| Date: | 3/16/2005 |
| Type: | Magazine Article |
| Source: |
EE Times Asia
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| Subjects: | nanotechnology manufacturing and test |
| Abstract: |
Microelectromechanical system (MEMS) devices require a clear design-for-manufacturability (DFM) strategy that establishes concurrent-design principles through a common CAD framework. Detailed process and material-property characterization early in t...
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