| Title: |
Seeking growth in embedded instrumentation
|
| Author: | Test & Measurement World |
| Date: | 7/31/2009 |
| Type: | Interviews and Forums |
| Source: |
ASSET InterTech, Inc.
|
| Subjects: | boundary scan, JTAG, microprocessor emulation, embedded instrument |
| Abstract: |
Tim Dehne, until recently a longtime executive with National Instruments, has joined the board of directors of Asset InterTech. Over a career stretching more than 21 years at NI, Dehne led global marketing and R&D at the company, which reported $824...
[more] |
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| Title: |
What leading vendors predict
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| Author: | Gail Flower, Contributing Editor -- Test & Measurement World |
| Date: | 7/22/2009 |
| Type: | Interviews and Forums |
| Source: |
Test & Measurement World
|
| Subjects: | ATE business |
| Abstract: |
Rick Nelson, editor in chief of Test & Measurement World, moderated a panel of top industry executives as they shared their visions for the semiconductor test industry during the Executive Test Summit held on Tuesday, July 14, during Semicon West 20...
[more] |
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| Title: |
SIA (Semiconductor Industry Association) defends overseas tax deferral
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| Author: | Tam Harbert, Contributing Editor -- Electronic Business |
| Date: | 3/17/2009 |
| Type: | Magazine Article |
| Source: |
Electronic Business
|
| Subjects: | electronics business |
| Abstract: |
At a media roundtable on Wednesday, the group discussed its top policy concerns and shared the findings of a recent SIA-sponsored report “Maintaining America’s Competitive Edge: Government Policies Affecting Semiconductor Industry R&D and Manufactur...
[more] |
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| Title: |
Amid economic gloom, semi execs chart encouraging future
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| Author: | Brian Fuller, Contributing Editor -- Electronic Business |
| Date: | 3/17/2009 |
| Type: | Magazine Article |
| Source: |
Electronic Business
|
| Subjects: | electronics business |
| Abstract: |
Capital drought may have changed the entire landscape, but the semiconductor industry isn't done for. It will need R&D, investments, and better cooperation, but there's plenty of opportunity ahead, industry leaders at the Semico Summit conference co...
[more] |
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| Title: |
Giga-tronics debuts Titan high-power microwave signal-generator system
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| Author: | Test & Measurement World |
| Date: | 3/4/2009 |
| Type: | Product Release |
| Source: |
Gigatronics, Inc.
|
| Subjects: | microwave signal generator |
| Abstract: |
Giga-tronics has introduced its GT-2620A Titan high-power microwave signal generator system, which, the company reports, provides higher power levels at microwave frequencies than are available from a stand-alone signal generator, while maintaining ...
[more] |
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| Title: |
Industry-First, Most Comprehensive DDR3 Test Suite
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| Author: | Agilent Technologies, Inc. |
| Date: | 3/3/2009 |
| Type: | Product Release |
| Source: |
Agilent Technologies, Inc.
|
| Subjects: | memory test |
| Abstract: |
Agilent Technologies Inc. (NYSE: A) today introduced the industry's first and most comprehensive DDR3 protocol debug and validation test suite for digital designers developing computer and embedded memory applications. The test platform offers the i...
[more] |
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| Title: |
Advanced Measurement Techniques for OFDM and MIMO Based Systems
|
| Author: | EE Times Asia |
| Date: | 3/2/2009 |
| Type: | White Paper |
| Source: |
Keithley Instruments, Inc.
|
| Subjects: | multiple input multiple output wireless test |
| Abstract: |
Advanced OFDM (Orthogonal Frequency Division Multiplex) technologies impose additional challenges and requirements for testing new wireless communication devices and systems. This paper compares and contrasts traditional single-carrier modulation sc...
[more] |
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| Title: |
LogicVision Reports Fourth Quarter and Fiscal 2008 Financial Results
|
| Author: | PR Newswire |
| Date: | 1/27/2009 |
| Type: | Announcement |
| Source: |
LogicVision, Inc.
|
| Subjects: | Built-In Self Test (BIST), memory BIST, Built-In Self Repair (BISR) |
| Abstract: |
LogicVision, Inc. LGVN, a leading provider of semiconductor built-in-self-test (BIST) and diagnostic solutions, today announced its financial results for the fourth quarter and fiscal year ended December 31, 2008.
Fourth Quarter 2008 Results
...
[more] |
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| Title: |
BER reference design rolls for 100G Ethernet testing
|
| Author: | EE Times Asia |
| Date: | 1/23/2009 |
| Type: | Product Release |
| Source: |
Inphi Corporation
|
| Subjects: | bit error rate tester, BERT |
| Abstract: |
Inphi Corp. launched a 28G Bit Error Ratio (BER) Receiver reference design for R&D or production testing of emerging high speed protocols from 13Gbit/s to 28Gbit/s, including 100Gbit Ethernet, 40G differential quadrate phase shift keying (DQPSK), 14...
[more] |
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| Title: |
Single test system for LTE debuts
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| Author: | EE Times Asia |
| Date: | 9/5/2008 |
| Type: | Product Release |
| Source: |
setcom wireless
|
| Subjects: | protocol analyzer, network analyzer |
| Abstract: |
setcom wireless positions its S-CORE conformance and research test environment for Long Term Evolution (LTE) protocol testing and monitoring. S-CORE is a protocol tester for LTE signalling designed from the ground up to be easy to use, provide clear...
[more] |
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| Title: |
Aeroflex tips 3GHz RF generator
|
| Author: | EE Times Asia |
| Date: | 6/20/2008 |
| Type: | Product Release |
| Source: |
Aeroflex - Marcom Division
|
| Subjects: | RF test, telecommunications test, signal generator |
| Abstract: |
Aeroflex has rolled the 3020C PXI modular digital RF signal generator, a 3GHz variant to the growing PXI signal generator line. Aeroflex's modular RF test platform, the PXI 3000 Series, has the bandwidth and versatility to seamlessly cover the entir...
[more] |
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|
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| Title: |
LogicVision Reports First Quarter Financial Results
|
| Author: | MSN Money |
| Date: | 4/22/2008 |
| Type: | Announcement |
| Source: |
LogicVision, Inc.
|
| Subjects: | Built-In Self Test (BIST), memory BIST, Built-In Self Repair (BISR) |
| Abstract: |
LogicVision, Inc. LGVN, a leading provider of test and yield learning solutions, today announced its financial results for the first quarter of 2008, ended March 31, 2008.
First Quarter 2008 Results
Revenues in the first quarter of 2008 were...
[more] |
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| Title: |
New RF Switch PlatformCan Reduce Custom-Switch Development Time by Half
|
| Author: | Agilent Technologies, Inc. |
| Date: | 3/17/2008 |
| Type: | Product Release |
| Source: |
Agilent Technologies, Inc.
|
| Subjects: | RF test, telecommunications test, switching |
| Abstract: |
Agilent Technologies Inc. (NYSE: A) today introduced an RF switch platform designed to simplify the task of defining and building a custom switch matrix. The Agilent L4490A/91A RF switch platform allows R&D and manufacturing engineers to cut their R...
[more] |
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| Title: |
Semiconductor Industry Association 'Disappointed' in Bush, Congress
|
| Author: | Mike Buetow, Circuits Assembly |
| Date: | 12/27/2007 |
| Type: | Announcement |
| Source: |
Circuits Assembly
|
| Subjects: | semiconductor research and development (R&D) |
| Abstract: |
“A year that started with great promise of bipartisan action to enhance American competitiveness in the global economy appears about to end with no significant action on any of the key elements,” said Semiconductor Industry Association president Geo...
[more] |
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| Title: |
Verification tool speeds up RFIC designs
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| Author: | EE Times Asia |
| Date: | 12/18/2007 |
| Type: | Product Release |
| Source: |
Agilent Technologies Inc.
|
| Subjects: | design verification, RF test |
| Abstract: |
Agilent Technologies Inc. has developed the GoldenGate Plus for RFIC simulation, analysis and verification. Agilent's GoldenGate Plus product line speeds the design of large-scale RFICs for wireless communication products. It combines the high-capac...
[more] |
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| Title: |
Applied Materials to acquire PV cell test system provider
|
| Author: | EE Times Asia |
| Date: | 11/22/2007 |
| Type: | Announcement |
| Source: |
Applied Materials
|
| Subjects: | photovoltaic (PV) cells testin |
| Abstract: |
Applied Materials will acquire Italy-based supplier of automated metallization and test systems for manufacturing crystalline silicon (c-Si) photovoltaic (PV) cells Baccini S.p.A for $330 million in cash.
The integrated equipment set addresses c...
[more] |
|
| Title: |
RF-test system supports 4×4 MIMO, IEEE 802.11n 40-MHz WLAN MIMO
|
| Author: | Dan Strassberg, Contributing Technical Editor -- EDN |
| Date: | 10/11/2007 |
| Type: | Product Release |
| Source: |
Keithley Instruments
|
| Subjects: | telecommunications test, jitter |
| Abstract: |
Keithley Instruments has released what it terms an industry-leading 4×4 (four-transmitter-, four-receiver-per-sector) MIMO (multiple-input/multiple-output) RF-test system for R&D and production testing of next-generation RF-communications equipment ...
[more] |
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| Title: |
iNEMI publishes 2007 research priorities
|
| Author: | EMSNow |
| Date: | 10/5/2007 |
| Type: | Report |
| Source: |
iNEMI
|
| Subjects: | Design for Testability (DfT), Design for Reliability (DfR), Design for Manufacturability (DfM) |
| Abstract: |
The International Electronics Manufacturing Initiative (iNEMI), an industry-led consortium focused on identifying and closing technology gaps, has published its 2007 Research Priorities. This document identifies R&D priorities for the next 10 years ...
[more] |
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| Title: |
Intersil buys ATE market analog IC supplier
|
| Author: | EE Times Asia |
| Date: | 9/12/2007 |
| Type: | Announcement |
| Source: |
Intersil Corp
|
| Subjects: | ATE driver/sensor |
| Abstract: |
Intersil Corp. has entered into definitive agreement to acquire Planet ATE Inc., a privately held, fabless semiconductor supplier to the ATE market.
Planet ATE chips offer the high-integration and low-power solution for the per-channel analog co...
[more] |
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