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Test Publications

  

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1 Publications Found
Title: SystemBIST receives honorable mention in “Best in Test” for 2007
Author:Test & Measurement World
Date:1/12/2007
Type:Announcement
Source: Intellitech Corporation
Subjects:Built-In Self Test (BIST), scan
Abstract: Intellitech earned its second TMW Best In Test Award with an honorable mention for SystemBIST in the board test category. SystemBIST is Intellitech’s FPGA configuration device that also enables embedded JTAG tests. SystemBIST enables PCBs to run a... [more]

1 Publications Found

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