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Test Publications


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1 Publications Found
Title: ‘Design-with-test’ for low-power devices
Author:Tom Jackson, EE Times Asia
Type:Magazine Article
Source: Cadence Design Systems
Subjects:Design for testability (DFT), low power
Abstract: Battery-powered devices are coming out in large volumes from 65nm manufacturing. This advanced process technology enables devices to leverage significant benefits beyond those of their predecessors. Devices fabricated using 65nm allow design... [more]

1 Publications Found

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