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Test Publications

  

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1 Publications Found
Title: Guest commentary: IJTAG, SJTAG claims premature
Author:CJ Clark, Intellitech -- Test & Measurement World
Date:1/9/2007
Type:Magazine Article
Source: Intellitech Corporation
Subjects:boundary scan, JTAG, design for testabilty, DFT, IEEE 1149.1
Abstract: I listened to T&MW Chief Editor Rick Nelsonís ITC audio interview with Glenn Woppman of Asset InterTech, in which Woppman discussed IEEE P1687 (IJTAG) and a potential standard on system-level JTAG. I believe the pronouns and ownership words such as ... [more]

1 Publications Found

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