A.T.E. Solutions Info
About Us
Contact Us
Site Map
Short Cuts
Online Store
Books on Test
Build a Test Library
Testability Director Software
Test Flow Simulator Software
Schedule of Courses
On-Site Courses
Test Requirements Analysis
TRD and TPS Development
Testability Consulting
BIST Consulting
ATE Market Consulting
Consultant Reports
BITES single-chip Built-In Tester
BestTest Directory
Test Calendar
Test Definitions
Articles on Test
Test Vendor Directory
Test Products and Services Directory

Test Publications


-Publications sorted with most recent date first. Before you can add a new entry, you will need to log in. The log in box should appear by the 3rd search.-
Publication Type:
Text Search:
1 Publications Found
Title: Guest commentary: IJTAG, SJTAG claims premature
Author:CJ Clark, Intellitech -- Test & Measurement World
Type:Magazine Article
Source: Intellitech Corporation
Subjects:boundary scan, JTAG, design for testabilty, DFT, IEEE 1149.1
Abstract: I listened to T&MW Chief Editor Rick Nelsonís ITC audio interview with Glenn Woppman of Asset InterTech, in which Woppman discussed IEEE P1687 (IJTAG) and a potential standard on system-level JTAG. I believe the pronouns and ownership words such as ... [more]

1 Publications Found

Please report broken links or errors to webmaster@BestTest.com