A.T.E. Solutions Info
About Us
Contact Us
Site Map
Short Cuts
Online Store
Books on Test
Build a Test Library
Testability Director Software
Test Flow Simulator Software
Schedule of Courses
On-Site Courses
ConsulTraining
Test Requirements Analysis
TRD and TPS Development
Testability Consulting
BIST Consulting
ATE Market Consulting
Consultant Reports
BITES single-chip Built-In Tester
BestTest Directory
Test Calendar
Test Definitions
Articles on Test
Test Vendor Directory
Test Products and Services Directory
Advertising

Test Publications

  

-Publications sorted with most recent date first. Before you can add a new entry, you will need to log in. The log in box should appear by the 3rd search.-
Publication Type:
Text Search:
   
1 Publications Found
Title: How Best to Measure Spread Spectrum Clocking (SSC) on Data
Author:Russ McHugh and Mark Johnson, Agilent Technologies
Date:1/1/2007
Type:Magazine Article
Source: Agilent Technologies, Inc.
Subjects:electromagnetic compatibility, EMC
Abstract: Spread spectrum clocking (SSC) is commonly used to reduce EMI. The amount of energy isn't necessarily reduced, but by spreading it over a wider bandwidth its effect at any one frequency is made significantly less. This article delves into the proble... [more]

1 Publications Found

Please report broken links or errors to webmaster@BestTest.com