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Test Publications


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1 Publications Found
Title: Taking a Signal to Bits - Jitter Analysis
Author:Tom Lecklider, Senior Technical Editor, Evaluation Engineering
Type:Magazine Article
Source: Evaluation Engineering
Subjects:jitter measurement
Abstract: Jitter is a simple concept: Digital signal active edges aren't exactly where they should be. However, sources of confusion accumulate quickly when considering the many types of instruments used to measure jitter, the different measurements they make... [more]

1 Publications Found

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