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Test Publications

  

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1 Publications Found
Title: Agilent Medalist Bead Probe Technology allows board trace probing
Author:Agilent Technologies, Inc.
Date:11/29/2006
Type:Product Release
Source: Agilent Technologies, Inc.
Subjects:in-circuit test, fixturing
Abstract: Agilent is the first to answer the call for more test point accessibility on today’s densely populated Printed Circuit Boards (PCBs). Agilent Medalist Bead Probe Technology specifies how test targets, or bead probes, can be placed directly onto copp... [more]

1 Publications Found

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