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Test Publications

  

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Title: Bizerba decides for JTAG/Boundary Scan Platform SCANFLEX® for Integration into Agilent In-Circuit Tester
Author:GOEPEL electronic
Date:9/8/2009
Type:Announcement
Source: GOEPEL electronic
Subjects:JTAG, Boundary Scan, Agilent, 3070, Scanflex
Abstract: GOEPEL electronic, leading vendor of JTAG/Boundary Scan solutions, has been selected by Bizerba to provide a SCANFLEX® Boundary Scan option for the Agilent3070 In-Circuit Tester (ICT). The integration solution is based on the PCI Boundary Scan cont... [more]
Title: GOEPEL electronics to run another Technology Day in UK
Author:GOEPEL electronic
Date:9/8/2009
Type:Announcement
Source: GOEPEL electronic
Subjects:JTAG, Boundary Scan, UK, Technology Day, AOI, Automated Inspection
Abstract: GOEPEL electronics Ltd, a leader in JTAG/Boundary Scan and AOI/AXI systems, will run another Technology Day in the UK on the 13th October 2009 in Southampton. The seminars will be covering latest developments and applications in JTAG/Boundary Scan a... [more]
Title: GOEPEL electronic's JTAG/Boundary Scan Platforms integrated into Polar Instruments Flying Prober GRS500
Author:GOEPEL electronic
Date:9/8/2009
Type:Announcement
Source: GOEPEL electronic
Subjects:JTAG, Boundary Scan, Polar Instruments, Flying Prober, Scanflex
Abstract: GOEPEL electronic, leading vendor of JTAG/Boundary Scan solutions compliant with IEEE Std.1149.x, and Polar Instruments recently developed a next generation JTAG/Boundary Scan option for the Flying Prober series with an OEM cooperation. The solution... [more]
Title: TDR Impedance Measurements: A Foundation for Signal Integrity
Author:Tektronix
Date:8/15/2009
Type:Application Note
Source: Tektronix
Subjects:signal integrity
Abstract: At today’s high operating frequencies, anything that affects your signal’s rise time, pulse width, timing, jitter or noise content can impact reliability at the system level. Mismatches and variations can cause reflections that decrease your signal ... [more]
Title: Testing Modern Radios
Author:Tektronix
Date:8/15/2009
Type:Application Note
Source: Tektronix
Subjects:RF test, telecommunications test
Abstract: Designers have long sought to improve the performance and resiliency of radio communications. With the radio frequency (RF) spectrum becoming more crowded and interference more prevalent in recent years, these efforts have become increasingly cri... [more]
Title: New technology partnership merges competences for extended JTAG/Boundary Scan
Author:EMSNow
Date:8/14/2009
Type:Product Release
Source: GOEPEL Electronics
Subjects:boundary scan, JTAG, connectivity test
Abstract: GOEPEL electronic, worldwide vendor of JTAG/Boundary Scan solutions compliant with IEEE1149.x, announces the incorporation of the company Flying Test Systems Ltd. (FTSL) into the global alliance program GATE (GOEPEL Associated Technical Experts). ... [more]
Title: Seica SpA launches brand new bare board flying probe system
Author:EMSNow
Date:8/12/2009
Type:Product Release
Source: Seica SpA
Subjects:flying probe testers
Abstract: Seica SpA, a manufacturer of Automatic Test Equipment (ATE) and laser-based selective soldering systems, has now announced the latest addition to its new generation of flying probe test systems. Seica's innovative test solutions are being used acros... [more]
Title: Geotest Announces Opening of Online Store
Author:Geotest
Date:8/11/2009
Type:Announcement
Source: Geotest
Subjects:test instruments business
Abstract: As part of a comprehensive enhancement of the company’s corporate website, Geotest-Marvin Test Systems, Inc. has added an online buying function to support the purchase of Geotest products on the Web. Customers are now able to view and purchase the ... [more]
Title: Audio test set handles Bluetooth products
Author:Test & Measurement World
Date:8/5/2009
Type:Product Release
Source: Anritsu Corporation
Subjects:audio test
Abstract: Anritsu has introduced the MT8855A integrated test set, which the company claims is the first dedicated Bluetooth audio test set. The instrument is aimed at products that use the Bluetooth A2DP (Advanced Audio Distribution Profile), headset profile,... [more]
Title: Agilent Technologies' Test Solutions Support March 2009 LTE Standard
Author:EMSNow
Date:8/4/2009
Type:Product Release
Source: Agilent Technologies, Inc.
Subjects:LTE standard test
Abstract: Agilent Technologies Inc. (NYSE: A) announced its compliance with the March 2009 release of the 3GPP Long Term Evolution (LTE) standard. Agilent's compliance enables broader test capability for LTE TDD, LTE FDD and MIMO. Agilent's LTE test solut... [more]
Title: Oscilloscopes handle analog, digital, serial signals
Author:EE Times Asia
Date:8/4/2009
Type:Product Release
Source: Tektronix
Subjects:oscilloscope
Abstract: Tektronix Inc. has introduced a line of mixed-signal oscilloscopes that visualize and analyze analog, digital and serial signals with one instrument. The MSO3000 series offers up to four analog and 16 digital channels, 100MHz to 500MHz bandwidth, 5M... [more]
Title: LabView takes on software development
Author:Test & Measurement World
Date:8/4/2009
Type:Product Release
Source: National Instruments
Subjects:software test
Abstract: LabView 2009 adds a host of new toolkits that focus on software design and validation as well as giving you more control over multiple processor cores. Other features focus on wireless signal testing. Engineers are finding that regulatory agencie... [more]
Title: Q2 semiconductor sales up 17%, industry is 'returning to normal seasonal growth patterns,' SIA reports
Author:Suzanne Deffree, Managing Editor, News -- Electronic News
Date:8/3/2009
Type:Report
Source: Semiconductor Industry Association (SIA)
Subjects:semiconductor business
Abstract: Although sales numbers were a mixed bag of results, the SIA (Semiconductor Industry Association) this morning reported on Q2, June, and first half revenue with palatable optimism for a semiconductor industry recovery. Q2 recorded a sequential wor... [more]
Title: SerDes Test Strategies to Minimize EMI/EMC
Author:Tanja Hofner, Auto Electronics
Date:8/3/2009
Type:Magazine Article
Source: Maxim
Subjects:automobile electronics
Abstract: LCD video displays are becoming more common in automotive applications. Rugged design, small size, and low cost make them ideal for safety systems, navigation, and infotainment applications. As a digital device, the LCD display requires discrete dig... [more]
Title: Salary Survey - 2009
Author:Test & Measurement World
Date:8/2/2009
Type:Report
Source: Test & Measurement World
Subjects:test engineering
Abstract: Test & Measurement World conducted the survey by sending an e-mail to subscribers to Test & Measurement World magazine during June 2009. We asked them to tell us about their compensation, experience, education, job satisfaction, and workload. The re... [more]
Title: LogicVision Reports 2Q Financial Results
Author:Trading Markets.com
Date:8/2/2009
Type:Announcement
Source: LogicVision, Inc.
Subjects:Built-In Self Test (BIST), memory BIST, Built-In Self Repair (BISR)
Abstract: Second Quarter 2009 Results Revenues in the second quarter of 2009 were $3.0 million, compared with $3.1 million in the first quarter of 2009. Net loss in the second quarter of 2009 was $262,000, or $0.03 per share, compared with a net loss ... [more]
Title: Crosstalk Analysis in High-Speed Serial Links
Author:Pavel Zivny, Tektronix - Evaluation Engineering
Date:8/1/2009
Type:Magazine Article
Source: Tektronix
Subjects:communications test
Abstract: Timing jitter measurement has dominated high-speed serial link performance metrics for years, but horizontal-axis information gives only half the picture because it cannot account for amplitude distortion caused by crosstalk. By sampling the signal ... [more]
Title: Testing right from the start
Author:Martin Rowe, Senior Technical Editor -- Test & Measurement World
Date:8/1/2009
Type:Magazine Article
Source: Force 10 Networks
Subjects:test engineering
Abstract: Engineers at Force10 Networks develop test plans and automation scripts while products are still in development.
Title: Teaming up on design and test
Author:Rick Nelson, Chief Editor, Test & Measurement World
Date:8/1/2009
Type:Magazine Article
Source: Test & Measurement World
Subjects:Design for Testability
Abstract: No longer isolated disciplines, design and test work together, and test tools are taking on design tasks.
Title: Top 20 semiconductor companies saw 21% sales surge in Q2
Author:Suzanne Deffree, Managing Editor, News -- Electronic News
Date:7/31/2009
Type:Report
Source: IC Insights
Subjects:semiconductor business
Abstract: Analysts at IC Insights this week released an encouraging update, reporting that the top 20 semiconductor suppliers averaged a 21% sequential sales increase in Q2, a 37 point swing from the Q1 16% sequential fall averaged for the then top 20 supplie... [more]

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of 4500 Publications Found
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