A.T.E. Solutions Info
About Us
Contact Us
Site Map
Short Cuts
Online Store
Books on Test
Build a Test Library
Testability Director Software
Test Flow Simulator Software
Schedule of Courses
On-Site Courses
ConsulTraining
Test Requirements Analysis
TRD and TPS Development
Testability Consulting
BIST Consulting
ATE Market Consulting
Consultant Reports
BITES single-chip Built-In Tester
BestTest Directory
Test Calendar
Test Definitions
Articles on Test
Test Vendor Directory
Test Products and Services Directory
Advertising

Test Publications

  

-Publications sorted with most recent date first. Before you can add a new entry, you will need to log in. The log in box should appear by the 3rd search.-
Publication Type:
Text Search:
   
|« First « Previous 4481 - 4500
of 4500 Publications Found
   
Title: Structured Logic Design with VHDL
Author:James R. Armstrong, Gail Gray, F. Gail Gray
Date:6/1/1993
Type:Book
Source: Addison-Wesley
Subjects:Digital Testing, Test Programming and Diagnosis
Abstract: Previous books on this subject have concentrated just on the VHDL hardware description language without really teaching the design, process. This new reference really shows how to design with VHDL in a synthesis context. Unlike the other books, it t... [more]
Title: Successful Implementation of Concurrent Engineering Products and Processes
Author:Sammy G. Shina (Editor)
Date:1/1/1993
Type:Book
Source: John Wiley & Sons
Subjects:Concurrent Engineering, Quality and Management
Abstract: Successful Implementation of Concurrent Engineering Products and Processes Edited by Sammy G. Shina Sammy G. Shina’s bestselling Concurrent Engineering and Design for Manufacture of Electronics Products demonstrated clearly how concurrent engineerin... [more]
Title: Power Station Instrumentation
Author:Max W. Jervis
Date:1/1/1993
Type:Book
Source: Butterworth Heineman
Subjects:Automatic Test Equipiment (ATE) and Instrumentation
Abstract: Few industries understand the importance of accurate and appropriate instrumentation as much as the power industry. Safety-critical control systems rely on the data provided so it is vital that instruments and sensors are installed and used correctl... [more]
Title: integrated Circuit Defect-Sensitivity: Theory and Computational Models
Author:José Pineda de Gyvez
Date:1/1/1992
Type:Book
Source: Kluwer Academic
Subjects:Digital Testing, Test Programming and Diagnosis
Abstract: Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. integrated Circuit De... [more]
Title: Digital Hardware Testing
Author:Rochit Rajsuman
Date:1/1/1992
Type:Book
Source: Artech House
Subjects:Analog Testing, Troubleshooting & Measurements
Abstract: Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging techno... [more]
Title: Electronic Test Instruments: Theory and Application
Author:Robert A. Witte
Date:1/1/1992
Type:Book
Source: Addison-Wesley
Subjects:Automatic Test Equipment (ATE) and Instrumentation
Abstract: Offers an in-depth examination of basic measurement theory and how it relates to practical measurements. For those who are interested in learning about electronic measurements. DLC: Electronic instruments.
Title: IDDQ Testing of VLSI Circuits
Author:Ravi K. Gulati and Charles F. Hawkins
Date:1/1/1992
Type:Book
Source: Kluwer Academic
Subjects:Testability & Built-in Test
Abstract: Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMO... [more]
Title: Built-In Test: Bridge From Design Through Support
Author:Louis Y. Ungar
Date:1/1/1991
Type:Book
Source: A.T.E. Solutions, Inc.
Subjects:Testability and Built-in Test
Abstract: This book was written for use by various disciplines. It clearly describes the use if BIT, BITE, Self-Test and BIST, from the perspective of Designers, Test Engineers, Support and Management. It distinguishes between component, board and system appl... [more]
Title: Digital Circuit Testing: A Guide to DFT and Other Technologies
Author:Wang, Francis C.
Date:1/1/1991
Type:Book
Source: Academic Press
Subjects:Testability & Built-in Test
Abstract: Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing met... [more]
Title: Troubleshooting Analog Circuits
Author:Pease, Robert A.
Date:1/1/1991
Type:Book
Source: Butterworth Heineman
Subjects:Analog Testing, Troubleshooting & Measurements
Abstract: Bob Pease is one of the legends of analog design, providing regular columns in many of the design magazines. This book is a compilation of his "battle-tested" methods. It provides an intuitive grasp of where problems are likely to show up and how to... [more]
Title: Neural Models and Algorithms for Digital Testing
Author:Srimat T. Chakradhar, Vishwani D. Agrawal, and Michael L. Bushnell
Date:1/1/1991
Type:Book
Source: Kluwer Academic
Subjects:Digital Testing, Test Programming and Diagnosis
Abstract: Neural Models and Algorithms for Digital Testing presents a novel solution to a difficult problem, namely, test generation for digital logic circuits. An optimization approach to this problem has only recently been attempted. The authors propose a n... [more]
Title: Assessing Fault Model and Test Quality
Author:Kenneth M. Butler and M. Ray Mercer
Date:1/1/1991
Type:Book
Source: Kluwer Academic
Subjects:Digital Testing, Test Programming and Diagnosis
Abstract: Assessing Fault Model and Test Quality reports original research on the nature of logical fault models and their interactions with ATPG algorithms. The monograph condenses an extensive survey of literature pertaining to testing, test quality, defect... [more]
Title: Microelectronic Reliability, Vol 1
Author:Edward B. Hakim
Date:1/1/1989
Type:Book
Source: Artech House
Subjects:Digital Testing, Test Programming and Diagnosis
Abstract: Let twelve specialists show you how to test, analyze, and achieve better Microelectronic Reliability of silicon and GaAs devices. Microelectronic Reliability, Volume I: Reliability, Test, and Diagnostics offers you detailed, original works on the to... [more]
Title: IEEE-488 General Purpose Instrumentation Bus Manual
Author:Anthony J. Caristi
Date:1/1/1989
Type:Book
Source: Academic Press
Subjects:Automatic Test Equipment (ATE) and Instrumentation
Abstract: Written by a working designer of IEEE-488 installations, this guide covers GPIB addressing and communications, complete GPIB protocols and hardware (including the new IEEE-488.2 standard which has solved many of the user problems plaguing the GPIB i... [more]
Title: Built In Test for VLSI: Pseudorandom Techniques
Author:Paul H. Bardell, W. H. McAnney, J. Savir
Date:1/1/1987
Type:Book
Source: John Wiley & Sons
Subjects:Testability & Built-in Test
Abstract: This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, writte... [more]
Title: How to Evaluate and Select a Data Acquisition & Control System for your Application
Author:Lou Lang
Date:1/1/1987
Type:Application Note
Source: Neff Instrument Corp.
Subjects:data acquisition, measurement systerms
Abstract: Objective evaluation and subsequent selection of a computer-based data acquisition system is complicated by both the lack of industry standards regarding performance specifications the myriad of options available from the different manufacturers. S... [more]
Title: MIL-STD-2165
Author:US Navy
Date:1/26/1985
Type:Standard
Source: Airtime
Subjects:Testability Program Planning, Testability Assessment, Testability Plan, Built In Test (BIT)
Abstract: 1. Testability addresses the extent to which a system or unit supports fault detection and fault isolation in a confident, timely and cost-effective manner. The incorporation of adequate testability, including built-in test (BIT), requires early and... [more]
Title: The Assessment of LOGMOD as a Testability Design Tool
Author:Bill Keiner
Date:12/31/1980
Type:Standard
Source: DETEX
Subjects:DFT standard
Abstract: The DETEX Maintenance Aid, based upon the Logic Model concept, has had good success when compared against traditional testing methods. This is perhaps an indication of the expected superiority of a standardized, methodical, automated approach over... [more]
Title: Congressional Letter for Testability
Author:Bill Keiner
Date:6/20/1980
Type:Standard
Source: DSI
Subjects:standard for testability
Abstract: The recommendation was considered by the Testability Task Group at the JLC Program Review on 11 June 1980 at which time Dr. DePaul presented his approach to the group. This was followed by a visit to Villa Park by Phil Writer (NOSC 921) on 18 June f... [more]
Title: Built-in Logic Block ObservationTechniques
Author:Bernd Konemann, Joachim Mucha and Gunther Zwiehoff
Date:1/1/1979
Type:Conference Article
Source: International Test Conference
Subjects:built-in self test, BILBO
Abstract: Parallel signature analysis with multiple- input signature registers allows to observe the data flow at internal testpoints on complex digital ICs. The test data are sampled and coded on- line at the rated internal speed of the ICs. The information ... [more]

|« First « Previous 4481 - 4500
of 4500 Publications Found
   

Please report broken links or errors to webmaster@BestTest.com