The Newsletter

An A.T.E. Solutions, Inc. Internet Publication
Volume 12 Number 9 September 16, 2008


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AutoTestCon
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Test & Measurement World

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A.H. Systems, Inc.
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Capital Equipment Corp.
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FTS Systems, Inc.
Geotest
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Intellitech Corporation
Invisar, Inc.
JTAG Technologies, Inc.
Madell Technology Corporation
Measurement Computing
Pickering Interfaces, Ltd.
ProbeStar, Inc.
QStar BE
Saelig Company Inc.
Tabor Electronics
Tecpel Co., Ltd.
Teradyne Assembly Test Division
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Geotest Inc.
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ICS Electronics
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Intellitech Corp.
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   Scan-Ring-Linker & multi-PCB linker
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JTAG Technologies, Inc.
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Meret Optical Communications
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Professional Testing DBA Pro Test
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Reinhardt System und Messelectronic
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Static Solutions
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Symtx, Inc.
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Tabor Electronics
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UniSoft
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VMETRO, Inc.
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WesTest Engineering
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YESTech Inc.
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Yokogawa Corp. of America
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ZTest
 

Don't Miss These Publicly Held Courses

Design for Built-In (Self) Test

by Louis Ungar at AutoTestCon in Salt Lake City on Sep 8, 2008

Random Vibration, Shock Testing, HALT, ESS, HASS Measurements, Analysis and Calibration

In Boxborough, Massachusetts on Oct 6-8, 2008

Cost Effective Tests Using ATE, DFT and BIST

by Louis Ungar in Los Angeles, CA on November 10, 2008
Design for Testability and for Built-In Self Test
by Louis Ungar in Los Angeles, CA on November 12-14, 2008

Other courses:

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This Issue's Feature Article

AutoTestCon 2008 - Feast or Femine? 

 By:  Louis Y. Ungar
Editor in Chief, The BestTest Newsletter
(Click here to skip article and go to TestNews)

AutoTestCon 2008 - Feast or Famine?
AutoTestCon 2008 takes place at the Salt Palace in Salt Lake City during the week of Sept. 8, 2008.  We are writing this before the conference or exhibit so we do not know what to expect.  We can only guess.

According to the preliminary figures the booth spaces are all sold out.  The conference paper sessions are all filled with great papers from around the military, commercial and even foreign authors.  So the conference should bring the message that despite what now appears to be a global recession, test is in tact - even if it is not thriving.  Certainly there is a need to support avionics and weapon systems that are aging, and not much has been spent developing new aircraft or weapon systems.  Military dollars previously spent on such new aircraft are now spent on munitions and other low tech stuff.

As bad as all this seems, AutoTestCon caters to test engineers who are better off than their colleagues in the commercial world.  While avionics boxes MUST be properly tested and supported, cell phones and computers can be tossed in the trash when they stop working - especially if that occurs a couple of years after they become state-of-the-art.  For manufacturers of commercial high tech, test is not a support function.  It is merely a way to check whether the manufacturing process created defects - Yes or No.  Even if it turns out that the test incorrectly makes this determination, exchanging a faulty unit for a new one, generally is an acceptable solution.  This leaves test engineers feeling unnecessary and often unwanted.  With the high unemployment and housing crisis, test engineers who work do not want to rock the boat.  They do what they need to.  Well, what else should they be doing?

Test engineers are professionals who (hopefully) chose this profession because they truly care whether the electronic products work properly when they are in the customer's hands.  This basic tenet of our profession must be shared by all of us.  So what can we say to those non-test people who tell us that it makes better business sense to sell it on time as is and fix it later?  (It doesn't make better business sense, but it does have to be delivered on time.) 

There is one way we can have early delivery and a comprehensive test.  Design testable circuits and your test will get done faster and it will be more thorough.  I doubt there are many readers who disagree with this, and may even yawn reading it because they find it obvious.  A no brainer.  Well, then how many companies practice Design for Testability (DFT)?  Sure, more-and-more designers use JTAG/IEEE-1149.1 boundary scan parts, but that is mainly because there are more such parts available - and often the only way some ICs are available.  Do designers actually decide to seek boundary scan equivalents of components they use?  Not often.  Do they ask test engineers to advice them?  Seldom.  Do managers have a meeting with designers and test engineers asking them to work together on DFT?  Not likely.  

Why aren't managers part of the solution?  There is no one more interested in getting a comprehensively tested product out the door on time than the manager, yet they do not actively support DFT.  Do they passively support it?  To some degree.  A test engineer asking for a budget to buy boundary scan tools or to add boundary scan features into an ATE will probably have some success.  This same engineer asking to work with and/or review the design early in the design phase and as it is progressing will likely be told in polite (or impolite) terms to mind his/her own business and keep his hands out of the design.  First the designer will complain, then the manager will and in such hard economic times who can blame the test engineer for backing off?

This year, AutoTestCon has devoted a number of papers to DFT and regardless of the attendance figures, I will consider it one of the most successful test events in many years.  The conference will have an entire session devoted to Testability and Diagnosability.  It features papers that came from members of the Testability Management Action Group (TMAG).  As founding President of TMAG, I am admittedly biased and consider those papers to be top notch.  TMAG will also have a Panel where test professionals can come to share their experiences with TMAG leaders.  While we will listen to problems, we will also have a set of success stories from Dennis Hecht about how well DFT has worked for Boeing.

Undoubtedly, management needs to wake up to the benefits and needs of DFT.  TMAG will help anyone trying to establish or promote DFT in their companies.  It is a group of test engineers who are preparing answers to objections.  It is a group that is collecting testimonials, resources, technical papers, information on tools, and literature.  TMAG recently helped the Surface Mount Technology Association with its Testability Guidelines.  TMAG can also help you.  They will be at AutoTestCon and you can always find them at www.TMAG4DFT.org.

Product/Service Focus
You can You can view and add to our existing list of Test Products/Services, Test Literature, Test Definitions, Test Vendors
 
What's New in Test
Announcements
  9/3/2008 Socle Adopts Atrenta's SpyGlass(R)-DFT Product
  9/2/2008 Teradyne to acquire Eagle Test Systems
  8/26/2008 ASSET assumes a leadership position of iNEMI's boundary scan (JTAG) adoption initiative
  8/20/2008 Revolutionary Streaming Technology attains real Fusion of JTAG Emulation and Boundary Scan for the first time ever
  8/19/2008 ASSET's ScanWorks® Supports On-Chip Evaluation of Avago Technologies' ASICs
  8/19/2008 Seica Inc. and Corelis Ally To Create A More Versatile Test Solution
Application Notes
  8/25/2008 Using a scope's segmented memory to capture signals more efficiently
Magazine Articles
  9/2/2008 ANSI Mezzanine Modules Provide Instrument Design/Replacement Flexibility
  9/2/2008 Sensors Accelerate Into Sports - MEMS
  9/2/2008 Testing the Reliability of Satellite Power Systems
  9/1/2008 10 Boundary Scan Tips Optimize Test Coverage
  9/1/2008 A Good Time for MEMS-Based Oscillators
  9/1/2008 Conducted Emissions Testing - A MIL-STD-461F Tutorial
  9/1/2008 Data Acquisition Addresses Multifaceted Applications
  9/1/2008 LXI Instruments - The Killer Bs Are Coming
  9/1/2008 The Need for LXI Conformance Testing
  9/1/2008 Using ATE for Efficient DigRF Interface Testing
  9/1/2008 Zeroing in on Component Reliability
  8/22/2008 Military and aerospace companies ensure electronic systems with test and measurement tools
  8/21/2008 On-chip test capabilities solve the analog-test problem for high-speed serial interfaces
  8/18/2008 Build distributed test system with LXI oscilloscope
  8/18/2008 Perform virtual field tests on DVB-T receivers
Product Releases
  9/5/2008 Single test system for LTE debuts
  9/2/2008 Geotest Releases ATEasy Version 7.0
  8/29/2008 New Boundary Scan Module from GOEPEL electronic extends structural Test Coverage to DIMM240 Interfaces
  8/27/2008 GOEPEL electronic's Boundary Scan Software Platform SYSTEM CASCON™ offers new Generation of Flash Programming Tools
  8/26/2008 Pickering Interfaces Introduces New PXI Solid State High Current Switches
  8/22/2008 Geotest Introduces GP1612H Function Generator
  8/21/2008 Agilent 89600 vector signal analysis software option
  8/20/2008 JTAG Technologies' ProVision raises the boundary-scan bar
Standards
  9/2/2008 TI driving development, ratification of IEEE 1149.7 embedded system standard
 
 
 
Next Issue's Product/Service Focus
In our next issue of Product/Service Focus we will cover Automatic Test Equipment. You can add or upgrade a listing before the next issue comes out.

If you would like to include an exclusive article on how to best select Automatic Test Equipment, please contact LouisUngar@ieee.org.
 

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Events/Announcements
This month:
9/10 - 9/11
   Testability Management Action Group (TMAG) Panel at AutoTestCon
10/6 - 10/8
   Random Vibration, Shock Testing, HALT, ESS, HASS Measurements, Analysis and Calibration
11/10
   Cost Effective Tests Using ATE, DFT and BIST
11/12 - 11/14
   Design for Testability and for Built-in Self Test
9/7 - 9/12
   EOS/ESD Symposium
9/8 - 9/11
   AutoTestCon 2008
9/14 - 9/19
   PCB West 2008
9/22 - 9/24
   Instrumentation and Methods for Electrical and Electronic
9/29 - 9/30
   IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems NDCS 2008
9/30 - 10/2
   INSPEX 08
10/1 - 10/3
   International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'08)
10/21 - 10/23
   Mexitronica
10/28 - 10/30
   International Test Conference 2008
10/30 - 10/31
   IEEE Defect and Data-Driven Testing (D3T 2008)
10/30 - 10/31
   Automated Test Equipment: Vision ATE 2020
10/30 - 10/31
   Design for Reliability and Variability (DRV 2008)
11/12 - 11/13
   Vibration Basics A-Z
11/17 - 11/20
   AeroTest America
11/19 - 11/21
   International High-Level Design, Validation and Test Workshop
11/24 - 11/27
   Asian Test Symposium (ATS'08)
11/25 - 11/26
   Nordic Test Forum's TestForum 2008
11/27 - 11/28
   IEEE Workshop on RTL and High Level Testing (WRTLT08)
1/12 - 1/16
   International Zurich Symposium on Electromagnetic Compatibility
2/2 - 2/5
   DesignCon 2009
4/20 - 4/24
   Design, Automation, and Test in Europe (DATE)
5/4 - 5/7
   ESTECH 2009
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