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Cost Effective Tests Using ATE, DFT and BIST

What you will learn:
The two main reasons to test are 1) to eliminate failures escaping to your customers and 2) to reduce the life cycle cost of a product by eliminating penalty costs associated with delivering potentially faulty units. Many people have traded one of these requirements for the other, but with the advent of more sophisticated automatic test equipment (ATE), more attention paid to design for testability (DFT) and utilizing built-in self test (BIST), it is possible to do both. This tutorial provides a thorough understanding of each of these tools and strategies for more comprehensive and cost-effective testing. The course will combine the technical aspects of testing today’s complex circuits with the economics demanded by lower costs, faster times to market and a higher rate of obsolescence for both electronic products and test equipment.
The course will treat the topics of modern test engineering from both a technical and economic perspective. Students will learn to create trade offs based on cost effective measures, whether they are implemented in design (as DFT and BIST), in part selection (as in JTAG/IEEE 1149.x boundary scanned), in manufacturing tests (as in X-ray vs. AOI vs. In-Circuit vs. Functional Test), in support (as in System Tester vs. BIST and prognosis vs. diagnosis) and in management goals (as in Early Time to Market with DFT).

Who should attend:
This course is designed to benefit anyone concerned with both the technical and economic aspects of test. It is primarily oriented towards test engineers, but design engineers and managers will also benefit from DFT, BIST and test economics.

It has been said that "Test is a technical solution to an economic problem." This course is uniquely designed to make technical people more aware of the economic aspects of testing, while at the same time discuss the technical considerations and difficulties with management types. Treated in a consise, one-day format, this course is a must for test professionals AND their managers. While it contains techincal information, it is presented in a manner that semi-technical or even non-technical managers can follow. The course concludes with the New Test Paradigm that finally explains the way test and design must be treated together. With the tools provided in the course, the attendees will be able to justify such changes both in terms of test coverage improvements and lower overall test costs.

  • Defects Oriented Testing
  • Test Strategies
  • Automatic Testing and ATE
  • DFT, including JTAG/IEEE-1149.x
  • BIST
  • Test Economics
  • New Test Paradigms

Instructor: Louis Y. Ungar
Louis Y. Ungar is president of A.T.E. Solutions, Inc., a leading independent test and testability consulting and educational firm. He has taught ATE and Testability courses at the University of California at Los Angeles (UCLA) and throughout industry. Mr. Ungar is a consultant to The American Society of Test Engineers, has served as Testability Chair for the Surface Mount Technology Association and has served on committees for various IEEE standards, including those of IEEE Std. 1149.x. Mr. Ungar holds a B.S.E.E. and Computer Science degree from the UCLA and has completed his course work towards a M.A. in Management.

It is amazing how much I learned in this one-day class at Apex in 2005. I will go back and reassess how we do things.

--A.J. a test engineer for a Fortune 100 company
Frustrated manufacturing
Our designs come from Japan. We manufacture and support the products in the United States. As a result of your course I now see that once we can bring testability input to the design, it will save us a great deal of money - and a lot of frustration.
Attendee from a major Electronics manufacturer at APEX 2007

Course Notes 250 pages 
Course Notes 300 pages $199.50
Onsite Define 1 day 
Private Define 1 dayLos Angeles
Public Define11-10-081 dayLos Angeles, California$895.00