WebCourse - ATE 101 - Overview of Test, ATE & Testability

What you will learn:

A participant who has little or no background in test can leave this course with a thorough understanding of the issues. While the course provides few solutions, it is imperative that anyone making decisions concerning test and testability should first attend this course.

Abstract:

This course attempts to introduce every aspect of testing. It progresses from definitions and introduction of various testing methods through economic justifications of the test investment. It discusses Test Requirements and shows how test programs are developed. Design for Testability, Built-In Test and other advanced topics are also discussed. It is a highly recommended prerequisite to all other courses.

Who should attend:

Anyone who considers test and wants to know what is involved.

Detail:

COURSE OUTLINE:

Introduction to Testing

When to Test
Definition of Terms
What is an Electronics Test Engineer?

Introduction to ATE

History of the ATE
Elements of an ATE
ATE Technology Development
Instrumentation Buses
Computers in ATE
Types of ATE Software

Testing Methods

IC Testers
Assembly Fault Testers
In-Circuit Testers
Functional Testers
Systems Testers
Environmental Test and Burn-In
Field Service Testers

Test Economics

Reasons for Testing
Cost of Testing
Costs of Not Testing
Manual vs. Automatic Testing
Military vs. Commercial ATE
Effect of Fault Distribution

Test Requirements

Test Specifications
Test Requirement Document (TRD)
Test Requirement Analysis (TRA)
Test Strategy Report (TSR)
Test Program Set (TPS)

Introduction to Test Programming

Stuck-at Faults
Modeling & Simulation
Automatic Test Pattern Generation (ATPG)
Analog Testing
Test Languages
ATLAS

Introduction to Design for Testability (DFT)

What is DFT and why do we need it?
Considerations for DFT
Scan & Boundary-Scan
Built-In Self Test
DFT Management
Testability in Concurrent Engineering

Trends in Automatic Testing

Analog Testing Issues
Computer Aided Design and Test
Integrated Diagnostics
Integrating Hardware and Software Test
Artificial Intelligence in Test
Prognostics and Health Management
Synthetic Instrumentation
Remote Testing
Common Test Platforms

Instructor: Louis Y. Ungar

Louis Y. Ungar is president of A.T.E. Solutions, Inc., a leading independent test and testability consulting and educational firm. He has taught ATE and Testability courses at the University of California at Los Angeles (UCLA) and throughout industry. Mr. Ungar is a consultant to The American Society of Test Engineers, has served as Testability Chair for the Surface Mount Technology Association and has served on committees for various IEEE standards, including those of IEEE Std. 1149.x. Mr. Ungar holds a B.S.E.E. and Computer Science degree from the UCLA and has completed his course work towards a M.A. in Management.

Availability:
Format	Date	Length	Location	Price
Webinar	7-26-10	1.5 hour webinar	WebCourse Start - 10 AM Pacific, 1 PM EST, 18:00 GMT	$199.50
Onsite		1.5 hour webinar	On Demand	$599.50