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WebCourse - ATE 201 - Test Strategy and ATE Mix

What you will learn:
Automatic Test Equipment (ATE) come in many generic forms. They serve different purposes and find different types of faults. In order to cover the types of faults you expect with your product, you need to strategize the types and the extent to which you will use some types of ATEs. This course will help you make these decisions, help you interpret fault data to improve your selections, and teach you how you can improve your allocation of ATE as your product matures and your fault universe changes.
This course introduces, classifies and explores the capabilities of various types of ATEs. In-circuit ATE finds different faults than functional ATE. Which do you need? Do you need both and if so, to what extent should you rely on one over the other and at what point in your product evolution. The goal of delivering fault free products to your customers can be met in many ways, but the selection of the proper test strategy will reduce your cost and test development time and effort considerably.

Who should attend:
All test engineers, manufacturing engineers and managers concerned with the effort of verifying and repairing products so that the quality of the products delivered is the best it can be.

This course examines the various classifications of faults and examines the ability of ATE types to find such faults. Since the ultimate goal is to find all faults before the product is delivered to your customer, a mix of ATEs will likely be needed. The capacity of each ATE used, however, need not be the same, so over a number of products you will find that one ATE of a certain is sufficient to service your entire product line, while other ATE types may require dedicated machines for each product. Utilizing outside testers or contract manufacturers can alter your ATE needs. As many contract manufacturers have a number of ATE types available, you may find ways to improve fault finding while lowering your test and repair costs.

Test Strategy and ATE Mix

  • Purpose of Test
    • Design Verification
    • Manufacturing Test
    • Qualification Test
    • Field Return Test
  • Inspection
    • Visual Inspection
    • Automatic Optical Inspection
    • X-Ray inspection
  • ATE Access
    • Edge Connector
    • Bed-of Nails
    • Flying Probe
  • ATE Types
    • Connectivity Tester
    • Manufacturing Defects Tester
    • In-Circuit ATE
    • Functional ATE
    • Emulation ATE
    • System ATE
  • Economic Evaluation
  • Designing for Testabiity (DFT) to target specific ATEs

Instructor: Louis Y. Ungar
Louis Y. Ungar is president of A.T.E. Solutions, Inc., a leading independent test and testability consulting and educational firm. He has taught ATE and Testability courses at the University of California at Los Angeles (UCLA) and throughout industry. Mr. Ungar is a consultant to The American Society of Test Engineers, has served as Testability Chair for the Surface Mount Technology Association and has served on committees for various IEEE standards, including those of IEEE Std. 1149.x. Mr. Ungar holds a B.S.E.E. and Computer Science degree from the UCLA and has completed his course work towards a M.A. in Management.

Format Date Length Location Price
Webinar 7-27-10 1.5 hour webinar WebCourse Start - 10 AM Pacific, 1 PM EST, 18:00 GMT $199.50
Onsite Define   1.5 hour webinar On Demand $599.50