Analog Test and Fault Isolation

What you will learn:

The problems that you will encounter when you try to test analog circuits with an ATE. The course will show how accuracies and resolutions can affect your test results. You will also learn to deal with analog simulation and fault simulation issues. The IEEE-1149.4 Mixed Signal Testability as well as the IEEE-1149.6 mechanisms will also be explored.

Abstract:

The course introduces how analog is tested and proceeds to characterize analog failures. It looks at the role of D/A and A/D converters and their influence on measurements. The course also discusses fault isolation and how ATE can meet this challenge.

Who should attend:

Anyone who tests analog and mixed signal circuits. Basic understanding of electrical circuits is required to follow the material.

Detail:

COURSE OUTLINE:

Introduction to the Analog World

Measurement Problems
Stimulus Problems
Speed Problems
Automation Problems

Analog Testing

Measurements Criteria
Failure Analysis
Digital Signal Processing
Fixturing Considerations

Analog Fault Isolation

Concept of the Active Element Group (AEG)
In-Circuit Test Methods

Analog Simulation

Using ISPICE
Mathematical Modeling
Tolerances and Accuracies
Analog Automatic Test Generation

Analog Boundary-Scan

Introduction to boundary-scan
The (JTAG) IEEE-1149.1
Mixed-Signal Boundary-Scan and the IEEE-1149.4
AC EXTEST and differential transmission using IEEE-1149.6

Availability:
Format	Date	Length	Location	Price
CourseNotes				RFQ
Onsite				RFQ
Private			Los Angeles	RFQ