Cost Effective Test Strategies Using ATE, DFT and BIST

The two main reasons to test are 1) to eliminate failures escaping to your customers and 2) to reduce the life cycle cost of a product by eliminating penalty costs associated with delivering faulty units. Many people have traded one of these requirements for the other. With the advent of more sophisticated automatic test equipment (ATE), more attention paid to design for testability (DFT) and the use of built-in self test (BIST), it is possible to do both. This tutorial provides a thorough understanding of each of these tools and strategies for more comprehensive and cost-effective testing. The course will combine the technical aspects of testing today’s complex circuits with the economics demanded by lower costs, faster times to market and a higher rate of obsolescence for both electronic products and test equipment.