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Online Catalog of Educational Courses and Resources

 

Page 1 of 3 of Users' Guide
Welcome to the Online Catalog of Courses and Educational Resources. There are many ways we have for you to find what you want from this catalog:
  1. Using the "Search for Topic or Format-Text" box you can filter the selections by
      a. Keywords, such as "in-circuit," "environment," etc.
      b. Course formats, such as "public," "private," etc.
  2. Read the "What You Will Learn" section next to each course.
  3. For each course of interest, you can click the hyperlinked "Details" to see the detailed course outline.
  4. Check the "Select" button next to titles that are of interest to you.
  5. Press the "More on Selected Titles" button to see what formats and dates are available for these selected courses.
Search for Topic or Format-Text:
183 Records Found
Select A Title What You Will Learn Details
  A Designer's Guide to Built-in Self-Test Part of the DFT/BIST Library Collection. A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers. More ...
  A Unified Approach for Timing Verification and Delay Fault Testing A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing. More ...
  Accelerated Reliability Engineering: HALT and HASS Accelerated reliability engineering is becoming a popular industry alternative to on-going product quality testing. Highly Accelerated Life Tests (HALT) and Highly Accelerated Stress Screens (HASS) are intensive methods, which use stresses higher than the field environments to expose and then improve design and process weaknesses. HALT and HASS offer faster, cheaper and more accurate results than traditional reliability testing techniques. This book provides comprehensive coverage of the methods and philosophy behind this successful approach. Production managers will appreciate the time-saving and cost-effective testing techniques described. Design engineers involved in quality assurance and students of reliability engineering will benefit from this unique resource detailing the technical aspects of accelerated reliability engineering. Features Include: · Coverage of the physics of failure and useful testing equipment enabling those new to the area to grasp the concepts behind HALT and HASS · Overview of the HALT technique demonstrating how to find design and process defects quickly using accelerated stress methodology during the design phase of the project · Examination of detection screens and modulated excitation used to detect flaws exposed in HALT · Description of how to set up a HASS profile and how to minimize costs whilst retaining efficiency · Applications of HALT and HASS and analysis of common mistakes highlighting the pitfalls to avoid when implementing the methods More ...
  Accelerated Stress Testing Handbook: Guide for Achieving Quality Products Electrical Engineering Accelerated Stress Testing Handbook Guide for Achieving Quality Products As we move closer to a genuinely global economy, the pressure to develop highly reliable products on ever-tighter schedules will increase. Part of a designer's "toolbox" for achieving product reliability in a compressed time frame should be a set of best practices for utilizing accelerated stress testing (AST). The Accelerated Stress Testing Handbook delineates a core set of AST practices as part of an overall methodology for enhancing hardware product reliability. The techniques presented will teach readers to identify design deficiencies and problems with component quality or manufacturing processes early in the product's life, and then to take corrective action as quickly as possible. A wide array of case studies gleaned from leading practitioners of AST supplement the theory and methodology, which will provide the reader with a more concrete idea of how AST truly enhances quality in a reduced time frame. Important topics covered include: * Theoretical basis for AST * General AST best practices * AST design and manufacturing processes * AST equipment and techniques * AST process safety qualification In this handbook, AST cases studies demonstrate thermal, vibration, electrical, and liquid stress application; failure mode analysis; and corrective action techniques. Individuals who would be interested in this book include: reliability engineers and researchers, mechanical and electrical engineers, those involved with all facets of electronics and telecommunications product design and manufacturing, and people responsible for implementing quality and process improvement programs. More ...
  Advanced Topics in LabWindows/CVI Take virtual instrumentation to the next level with high-level programming. * High-level programming with LabWindows/CVI * Live data display via Internet or intranet sources * Programmatic creation and control of GUIs * Data acquisition and VXI device communication * Graph control, table control, function panels, instrument drivers, and Open GL Unleash the true power of LabWindows/CVI when you employ the rich features of this programming environment. In this follow-up to his LabWindows CVI Programming for Beginners, Shahid F. Khalid presents the sophisticated techniques that allow experienced users to make the most of this virtual instrumentation powerhouse. The flexibility of LabWindows/CVI software means that you can build virtual instrumentation using Microsoft Visual Basic and Visual C++ as well as ANSI C. Advanced Topics in LabWindows/CVI focuses on the use of C in an open software architecture. It is a project-oriented guide that will teach you to build applications using the more complex features of this programming environment. Applications include: * Live data acquisition via Internet or intranet sources using Data Socket technology * GUI controls created and manipulated in real time * Advanced features of graph and table controls * 3-D data plotting with Open GL * Communications with VXI devices using VISA * Creating and using function panels and instrument drivers The material is organized to present information with maximum clarity, keeping the reader in mind. For convenience, each chapter concludes with an explanation of the purpose and prototype of the library functions under discussion. Advanced Topics in LabWindows/CVI will give students and working professionals the tools to build and automate sophisticated virtual instrumentation for a world of applications.About the CD: The accompanying CD-ROM includes a demo version of LabWindows/CVI 6.0 that is included as a component of Measurement Studio and all the projects in the book in complete, ready-to-run form. Just load and run the projects as you work along with the text. More ...
  An Introduction to Mixed-Signal IC Test and Measurement Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. This book was written in response ot the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is designed to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts. More ...
  Analog & Mixed-Signal Hardware Description Languages Hardware description languages (HDL) such as VHDL and Verilog have found their way into almost every aspect of the design of digital hardware systems. Since their inception they gradually proved to be an essential part of modern design methodologies and design automation tools, ever exceeding their original goals of being description and simulation languages.Their use for automatic synthesis, formal proof, and testing are good examples. So far, HDLs have been mainly dealing with digital systems. However, integrated systems designed today require more and more analog parts such as A/D and D/A converters, phase locked loops, current mirrors, etc. The verification of the complete system therefore asks for the use of a single language. Using VHDL or Verilog to handle analog descriptions is possible, as it is shown in this book, but the real power is coming from true mixed-signal HDLs that integrate discrete and continuous semantics into a unified framework. Analog HDLs (AHDL) are considered here a subset of mixed-signal HDLs as they intend to provide the same level of features as HDLs do but with a scope limited to analog systems, possibly with limited support of discrete semantics. Analog and Mixed-Signal Hardware Description Languages covers several aspects related to analog and mixed-signal hardware description languages including: The use of a digital HDL for the description and the simulation of analog systems The emergence of extensions of existing standard HDLs that provide true analog and mixed-signal HDLs. The use of analog and mixed-signal HDLs for the development of behavioral models of analog (electronic) building blocks (operational amplifier, PLL) and for the design of microsystems that do not only involve electronic parts. The use of a front-end tool that eases the description task with the help of a graphical paradigm, yet generating AHDL descriptions automatically. Analog and Mixed-Signal Hardware Description Languages is the first book to show how to use these new hardware description languages in the design of electronic components and systems. It is necessary reading for researchers and designers working in electronic design. More ...
  Analog and Mixed-Signal Boundary-Scan A Guide to the IEEE 1149.4 Test Standard The Mixed-Signal Boundary-Scan Test Bus is the natural complement to the widely used Boundary-Scan IEEE Std. 1149.1, commonly known as JTAG. This new Mixed-Signal standard is called IEEE Standard 1149.4 and is mainly dedicated to the manufacturing test of analog and mixed-signal boards. But like the IEEE 1149.1 it can be used for many other purposes: the test buses and their digital control form a very general `analog data highway'. Increasingly, mixed-signal boards are gaining complexity, making their testing process extremely challenging. At the same time, IC complexity and technology are getting so sophisticated that testing ICs at the board level becomes very expensive. Embedding a part of the board tester on chip is the aim of the IEEE 1149.4. Analog and Mixed-Signal Boundary-Scan is a comprehensive treatment of the design, application and structure of the IEEE 1149.4. It updates the information on digital Boundary-Scan and addresses chip designers in a dedicated chapter containing guidance to easily build analog circuits including IEEE 1149.4. A basic metrology and a test strategy with the instrumentation needed for it are also described. Analog and Mixed-Signal Boundary-Scan is essential reading for researchers and professionals who need to understand IEEE Standard 1149.4 and its practical implementation in industry. More ...
  Analog and Mixed-Signal Test This comprehensive guide to analog and mixed-signal IC testing is a tutorial and reference for electrical engineers designing or testing integrated circuits and devices with analog or both analog and digital components. Increasingly, ICs contain both analog and digital circuitry, making the testing process extremely challenging. This comprehensive guide reviews all the potential testing options for analog and mixed-signal ICs, enabling designers, engineers, CAD developers and researchers to choose the most cost-effective, accurate solution. It reviews all the potential testing options with an eye to choosing the most cost-effective and accurate solution; explains which digital testing techniques and algorithms are applicable to analog and mixed-signal circuitry and which must be modified; details fault modeling, especially inductive fault analysis; describes how to implement the 1149.4 Standard Mixed-signal Test Bus and its test functions, capabilities, potential benefits, and costs; and examines testing and design issues associated with CMOS switched-current circuits. It outlines the state-of-the-art in analog testing, and covers both major alternatives in-depth: specification-based test and fault model-based test. More ...
  Analog Signal Generation for Built-in-Self-Test of Mixed-Signal Integrated Circuits Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. It begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods. More ...
Analog Test and Fault Isolation The problems that you will encounter when you try to test analog circuits with an ATE. The course will show how accuracies and resolutions can affect your test results. You will also learn to deal with analog simulation and fault simulation issues. The IEEE-1149.4 Mixed Signal Testability as well as the IEEE-1149.6 mechanisms will also be explored. Details
  Analog Test Signal Generation Using Periodic Sigma Delta-Encoded Data Streams Analog Test Signal Generation Using Periodic ÓÄ-Encoded Data Streams presents a new method to generate high quality analog signals with low hardware complexity. The theory of periodic ÓÄ-encoded bitstreams is presented along with a set of empirical tables to help select the appropriate parameters of a bitstream. An optimization procedure is also outlined to help select a bit sequence with the desired attributes. A large variety of signals can be generated using this approach. Silicon implementation issues are discussed with a specific emphasis on area overhead and ease of design. One FPGA circuit and three different silicon implementations are presented along with experimental results. It is shown that simple designs are capable of generating very high precision signals-on-chip. The technique is further extended to multi-bit signal generation where it is shown how to increase the performance of arbitrary waveform, generators commonly found in past and present-day mixed-signal testers. No hardware modifications are required, only the numbers in memory are changed. Three different calibration techniques to reduce the effects of the AWG's non-linearities are also introduced, together with supporting experimental evidence. The main focus of this text is to describe an area-efficient technique for analog signal generation using ÓÄ-encoded data stream. The main characteristics of the technique are: · High quality signals (SFDR of 110 dB observed); · Large variety of signals generated; · Bitstreams easily obtained with a fast optimization program; · Good frequency resolution, compatible with coherent sampling; · Simple and fast hardware implementation; · Mostly digital, except an easily testable 1-bit DAC and possibly a reconstruction filter; · Memory already available on-chip can be reused, reducing area overhead; · Designs can be incorporated into existing CAD tools; · High frequency generation. More ...
  Analog VHDL Analog VHDL brings together in one place important contributions and up-to-date research results in this fast moving area. Analog VHDL serves as an excellent reference, providing insight into some of the most challenging research issues in the field. More ...
  Assessing Fault Model and Test Quality Assessing Fault Model and Test Quality reports original research on the nature of logical fault models and their interactions with ATPG algorithms. The monograph condenses an extensive survey of literature pertaining to testing, test quality, defect level modeling, ordered binary decision diagrams, and other related topics into a cohesive treatment of the general question of measuring the `goodness' of a test. Novel discoveries concerning graphical function representation are recounted. Methods of IC defect level prediction and correlation are reviewed, and a new technique is introduced which inherently addresses more statistically significant sets of test data than was previously possible. The tools introduced in Assessing Fault Model and Test Quality form the basis for the study of many interesting open questions in the areas of test generation, design for testability, design verification, and other disciplines as is shown with the example data that it reports. More ...
ATE Selection and Management Presented from a non-biased perspective, this course will teach you the decision process for test strategy selection. It provides a generic approach and alert you to things you should consider for ATE investment. Details
ATE Selection, Design and Programming This course covers every aspect of a test engineer's responsibility. Participants will learn how to select an automatic test equipment (ATE) from the number of choices and generically different types available. You will learn how to build an ATE from instrumentation and other building blocks. You will learn the bussing requirements of the IEEE 488, VXIbus, and PC-based instruments. You will also learn the software issues. The course will teach you how to approach a functional test programming activity for digital circuits. (In the longer, three-day course, analog test programming is also covered.) Finally, you will learn test management issues, such as test program development estimation, acquisition and quality assurance. Details
ATLAS This course will teach you how to write test procedures and code for many of the ATEs used in the military and airline industries using the Abbreviated Test Language for All Systems (ATLAS) a standard that is maintained by the IEEE. Details
  Automated Software Testing: Introduction, Management, and Performance With the urgent demand for rapid turnaround on new software releases--without compromising quality--the testing element of software development must keep pace, requiring a major shift from slow, labor-intensive testing methods to a faster and more thorough automated testing approach. Automated Software Testing is a comprehensive, step-by-step guide to the most effective tools, techniques, and methods for automated testing. Using numerous case studies of successful industry implementations, this book presents everything you need to know to successfully incorporate automated testing into the development process. In particular, this book focuses on the Automated Test Life Cycle Methodology (ATLM), a structured process for designing and executing testing that parallels the Rapid Application Development methodology commonly used today. Automated Software Testing is designed to lead you through each step of this structured program, from the initial decision to implement automated software testing through test planning, execution, and reporting. Included are test automation and test management guidance for: * Acquiring management support * Test tool evaluation and selection * The automated testing introduction process * Test effort and test team sizing * Test team composition, recruiting, and management * Test planning and preparation * Test procedure development guidelines * Automation reuse analysis and reuse library * Best practices for test automation More ...
Ball Grid Array Inspection and Defect Guide This CD ROM is fully interactive and covers the different types of BGA component, design and process requirement with X-ray inspection of solder joints and a inspection standard for guidance. A Word document of the text is available on the CD ROM for use in a company standard and may be edited to suit the company documentation system. Examples of satisfactory standards are provided with a complete guide to possible process defects. The defect section may be viewed with small examples to make searching easy and then each sample may be viewed at both half and full screen. A description of each of the defects is included with the examples. A full animation of the surface mount assembly process is included on the disk which includes the BGA, double sided assembly and through hole/Intrusive reflow assembly. This section features a commentary by Bob Willis or can be viewed with just a text guide. The CD ROM also includes over 130 picture files which may be used freely in training material and standards in a manufacturing company provided that the resulting material is not resold. Details
  Basic ESD and I/O Design A text devoted to electrostatic discharge (ESD) and input/output (I/O) design. The authors cover ESD protection methods such as silicon-controlled rectifiers and thick-field-oxide clamps, small- chip ESD issues, hot-electron interactions, circuit considerations such as compensation schemes and simultaneous switching output noise, and ESD and I/O interactions. The emphasis is on design principles that can be applied widely as the field continues to evolve. Intended for engineers and others designing circuits, systems, or devices for future technologies. Also of use as a reference for researchers and graduate students involved in core VLSI design or computer architecture. More ...
  Beta Testing for Better Software Implement, operate, and use beta testing immediately with this hands-on guide to the best practices. Beta testing is a complex process that, when properly run, provides a wealth of diverse information. But when poorly executed, it delivers little or no data while wasting time and money. Written by a leading expert in the field, this book will help you reach the full potential that beta testing has to offer. Michael Fine compiles the best practices to date so you can effectively bring beta testing into your company’s process to improve product quality. Using real-world case studies, this book begins by clearly explaining what a beta is and why you need one. Fine then explores the beta test procedure and walks through the best processes to use when implementing a test. He concludes by detailing the steps you should take after completing a test in order to take full advantage of the results. With this book, you’ll gain a better understanding of what beta testing is, why every company needs a beta test program, and how to get the most from a test. Fine will help you: · Understand all the steps involved in beta testing using real-world case studies · Implement a beta test using best- known practices · Produce better products based on the results of well-run beta tests · Apply beta testing across many platforms and many technologies · Improve on existing processes and identify critical issues More ...
  Boundary-Scan Interconnect Diagnosis Boundary-Scan Interconnect Diagnosis explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those sequences. Its importance has to do with designing complex electronic systems using pre-designed intellectual property (IP) cores, which is becoming increasingly popular nowadays. Since tests for pre-designed cores can be supplied with the cores themselves, the only additional tests that need to be developed to test and diagnose the entire system are those for wire interconnects between the cores. Besides the trivial solutions that are often used to solve this problem, there are many more methods that enable significant optimizations of test vector length and/or diagnostic resolution. The book surveys all existing methods of this kind and proposes new ones. In the new approach circuit and interconnect faults are carefully modeled, and graph techniques are applied to solve the problem. The original feature of the new method is the fact that it can be adjusted to provide shorter test sequences and/or greater diagnostic resolution. The effectiveness of existing and proposed methods is then evaluated using real electronic assemblies and published statistical data for an actual manufacturing process from HP. More ...
  Building a Successful Board-Test Strategy Second Edition Written in a clear and thoughtful style, Building a Successful Board-Test Strategy, Second Edition offers an integrated approach to the complicated process of developing the test strategies most suited to a company's profile and philosophy. This book also provides comprehensive coverage of the specifics of electronic test equipment as well as those broader issues of management and marketing that shape a manufacturer's "image of quality." In this new edition, the author adds still more "war stories," relevant examples from his own experience, which will guide his readers in their decision making. He has also updated all technical aspects of the first edition, covering new device and attachment technologies, new inspection techniques including optical, infrared and x-ray, as well as vectorless methods for detecting surface-mount open-circuit board failures. The chapter on economics has been extensively revised, and the bibliography includes the latest material on this topic. More ...
Building your own ATE You will learn how to put together an Automatic Test Equipment (ATE) from instrumentation built to the IEEE-488 (GPIB or HPIB) and VXIbus and PXI standards. Details
  Built In Test for VLSI: Pseudorandom Techniques This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing. More ...
  Built-In Test: Bridge From Design Through Support This book was written for use by various disciplines. It clearly describes the use if BIT, BITE, Self-Test and BIST, from the perspective of Designers, Test Engineers, Support and Management. It distinguishes between component, board and system application of BIT and illustrates implementation for each. The reader is introduced to scan techniques, Linear Feedback Shift Registers, signature analyzers, Pseudo-Random Signal Generators and other BIT design tools. Analog BIT is also covered. Finally, techniques are given to evaluate BIT design in terms of fault detection, fault isolation, false alarm rates, as well as its effect on maintainability, MTTR, Operational Readiness and Availability. More ...
  Cabling Handbook, The , 2nd Edition The #1 A-Z network and telecom cabling reference—100% updated! New coverage! Fiber, home networking, cable modems, and much more WAN connections, xDSL wiring-even wireless networks Step-by-step planning, implementation, and management Systematic troubleshooting guide Quick-reference, task-oriented format! The professional's guide to computer and telecom cabling! Completely updated! Fiber, home networking, cable modems, wireless, and more Choosing the right vendors and products Great preparation for Network+ cable-related exam objectives! The Cabling Handbook, Second Edition is a thorough, up-to-the-minute professional's guide to every aspect of LAN and telecommunications cabling, from planning through installation and management. From Category 5 twisted pair and fiber to the latest wireless LAN solutions, it's all here: standards, product comparisons, topology and architecture design, electrical and safety considerations, and more—including invaluable information for anyone preparing for CompTIA Network+ certification. This brand new second edition has been updated with extensive new coverage of fiber technologies, home networking, cable modems, and much more. Rely on this book for expert guidance on: Estimating the cost of cable plant upgrades Choosing the right installer and supervising installation Selecting the optimal cabling system and products Deploying wireless LANs with maximum reliability, coverage, throughput, and security Managing cable systems to minimize long-term costs and maximize long-term reliability Troubleshooting cable system problems rapidly and effectively Expert John Vacca goes beyond LANs, reviewing key cable-related issues associated with campus networks, WANs, and the Internet. You'll find extensive coverage of cable management software and documenting cable systems. The book contains detailed listings of top cable installers, fiber optic cable manufacturers, cable labeling vendors, SCSI, and wireless LAN providers. Whether you buy, sell, or manage cabling systems, you need to maximize quality and minimize disruption—now and for decades to come. One book shows you how: The Cabling Handbook, Second Edition. More ...
  Circuit Troubleshooting Handbook This valuable problem-solving guide puts in your hands the power you need today to resolve faults in and coax peak performance from new, experimental, or just plain temperamental circuits. Written by one of the bestselling practical electronics authors of all time (his books have sold more than 2 million copies in 9 languages worldwide) The Electronic Troubleshooting Handbook, Volume I, gives you full descriptions of the operation of important circuits, and it shows you how each circuits characteristics may figure in its failure or poor performance. Without abstract theory or complicated math, this book gives you the clear explanations and hands-on troubleshooting procedures that will quickly point you toward the villain in malfunctions in circuits from op-amp to data conversion to OTA. No other book offers such complete and to-the-point guidance in troubleshooting today’s circuits. Its an electronic circuit problem-solving kit between covers. Correct failures and solve performance problems in today’s circuits with this hands-on guide. Nothing is as important to advanced technology as complex electronic circuits. This valuable problem-solving guide puts in your hands the power to resolve faults in and coax peak performance from those important new, experimental, or just plain temperamental circuits. The Circuit Troubleshooting Handbook gives you full descriptions of the operation of important circuits. And it shows you how each circuits characteristics may figure in its failure or poor performance. Without abstract theory or complicated math, this book gives you the clear explanations and hands-on troubleshooting procedures that will quickly point you toward the villain in any circuit malfunction--whether its the capacitor, transistor, resistor, IC, or any other component. In circuit types with many variations, you get the needed assortment of appropriate troubleshooting tactics. No other book offers such complete and to-the-point guidance in troubleshooting today’s circuits. No other book offers designers and experimenters so much hands-on help in locating the cause of failure or lag in newly designed circuits. This book is an electronic circuit problem-solving kit between covers. More ...
  CMOS Cookbook, 2E A clear and complete look at CMOS. This easy-to-follow text is targeted for beginning to intermediate level users. Requiring a minimum of math, it covers the latest CMOS series of devices and subfamilies and presents tabular comparisons to earlier versions. More ...
  Communications Network: Test and Measurement Handbook Assure peak efficiency and performance in any type of communications network! The explosive growth of digital communications networks, linking all parts of the globe has dramatically increased the need for tools and processes that ensure the ability of these vaious elements to operate together, set national and international standards, achieve local objectives for quality of service, and provide information that allows effective and proactive network management. Test and measurement instruments, systems and software provide these tools. This handbook explains how they work and how to use them in a set of clear and understandable chapters written by experts in their fields. Youll find everything you need to enhance performance in public and private networks, the Internet and cellular networks. Chapters describe how to select tools, develop and perform appropriate tests, and get information as well as data that ensures effective network and understanding on: Network operation parameters and success metrics; Hardware and software technolgies in communications; The Open Systems Interface (OSI) model; Analyses of network protocols, transmission errors, and physical connections; Development of effective tests for operation and performance of all types of networks; Selection of the most appropriate test and measurement tools; Development of information not just data. Let the Communications Network Test and Measurement Handbook guide you straight to optimum network performance. More ...
  Contaminants and Moisture Can Disrupt Your Electronics Course description This course provides details about the root causes of many poorly understood electronic failures. The chemistry encountered in many end-use environments will be covered at length. We will discuss sources of contamination and the adverse effects of contamination on high-rel electronic systems. This understanding will enable participants to create more complete and accurate testing protocols for evaluating the true long-term reliability of new electronic designs, materials and processes. This understanding will also help organizations to troubleshoot production and field problems with existing electronic designs, materials and processes. Illustrated lectures and classroom discussion reveal the dangerous yet little recognized synergistic (that is, combined) field conditions of contamination + moisture, especially when field thermal and vibration stresses are added. These conditions will cause the premature failure of many forms of allegedly strong and highly reliable (but actually weak and unreliable - vulnerable) electronic equipment. Current production testing and screening protocols (as well as reliability studies) largely ignore these dangerous combined environments. Ever-smaller feature sizes and separations, plus smaller signal levels and higher frequencies all act to increase vulnerability to contaminants and moisture. Without proper testing, too much blind trust is being placed in supposedly safe conformal coatings and other protective measures. Subtle changes in test protocols, which can cause major differences in the results, will be discussed, along with some of the limitations of present measuring and monitoring equipment. A major topic: the optimum point in the production cycle at which to screen. Objectives High reliability electronic systems utilizing new designs and expanded systems integration are required to meet performance based specifications. Contracts should include some form of laboratory validation method prior to (1) awarding the contract, (2) making milestone payments, and (3) assessing penalty clauses if fielded equipment fails to perform fully. Upon completion of this course, participants will realize the potential cost savings of highly accelerated life testing (HALT) that combines contamination with traditional testing protocols. The course will enable participants to generate more realistic test data needed for (1) predicting long term reliability and for (2) predicting warranty/infant mortality. June 16-18, 2003 in Santa Barbara More ...
Cost Effective Tests Using ATE, DFT and BIST The two main reasons to test are 1) to eliminate failures escaping to your customers and 2) to reduce the life cycle cost of a product by eliminating penalty costs associated with delivering potentially faulty units. Many people have traded one of these requirements for the other, but with the advent of more sophisticated automatic test equipment (ATE), more attention paid to design for testability (DFT) and utilizing built-in self test (BIST), it is possible to do both. This tutorial provides a thorough understanding of each of these tools and strategies for more comprehensive and cost-effective testing. The course will combine the technical aspects of testing today’s complex circuits with the economics demanded by lower costs, faster times to market and a higher rate of obsolescence for both electronic products and test equipment. Details
  CTL for Test Information of Digital ICs CTL is a language that is used to represent test information. It is being developed as a standard within the IEEE framework. The proposed standard IEEE 1450.6 namely the Core Test Language (CTL) has its beginnings in the IEEE 1500 standardization activity as the language to represent test information about a core. The language has been designed to be generally applicable for a number of activities in digital IC testing. This book is focused on describing CTL. CTL for Test Information of Digital ICs is an example-oriented book on CTL that is written with the goal of getting the reader to think like the creators of CTL. Most of the explanations are limited to very simple examples so that the netlist (design) can be drawn out for better visualization of the concepts. There are two types of example CTL syntax in this book: Examples that explain the use of CTL and examples that describe syntax and semantics of the language as it is being introduced. This book should be read by anyone who is interested in testing integrated circuits. The contents of this book are especially relevant to the segment of the industry that is developing cores and/or using cores in system-on-chip methodologies. More ...
  Defect Oriented Testing for CMOS Analog and Digital Circuits Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that cannot be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. More ...
  Delay Fault Testing for VLSI Circuits With the ever-increasing speed of integrated circuits, violations of the performance specifications are becoming a major factor affecting the product quality level. The need for testing timing defects is further expected to grow with the current design trend of moving towards deep submicron devices. After a long period of prevailing belief that high stuck-at fault coverage is sufficient to guarantee high quality of shipped products, the industry is now forced to rethink other types of testing. Delay testing has been a topic of extensive research both in industry and in academia for more than a decade. As a result, several delay fault models and numerous testing methodologies have been proposed. Delay Fault Testing for VLSI Circuits presents a selection of existing delay testing research results. It combines introductory material with state-of-the-art techniques that address some of the current problems in delay testing. Delay Fault Testing for VLSI Circuits covers some basic topics such as fault modeling and test application schemes for detecting delay defects. It also presents summaries and conclusions of several recent case studies and experiments related to delay testing. A selection of delay testing issues and test techniques such as delay fault simulation, test generation, design for testability and synthesis for testability are also covered. Delay Fault Testing for VLSI Circuits is intended for use by CAD and test engineers, researchers, tool developers and graduate students. It requires a basic background in digital testing. The book can used as supplementary material for a graduate-level course on VLSI testing. More ...
  Design and Test for Multiple Gbps Communication Devices and Systems Design and Test for Multiple Gbps Communication Devices and Systems focuses on the latest multiple Gbps communication technologies and applications "from design to test" and covers the essential elements of device and system development (architecture, simulation and modeling, design techniques, and testing). Currently, the data rate for communication systems continues to increase. In the network area, 10- and 40-Gbps devices and systems are now available for Gigabit Ethernet and SONET. In the computer area, I/O buses at 2.5 and 3 Gbps are common for PCI Express and Serial ATA, respectively, with higher-speed I/O buses at up to 4.8 Gbps on the horizon. Such data-rate increases suggest a growing demand for higher-speed applications and create greater challenges that affect system architectures, design methods, simulation and modeling methods, and test and measurement methods. With Design and Test for Multiple Gbps Communication Devices and Systems in hand, you will learn and master the basics of today's design and test methodologies and techniques. With this enhanced knowledge, you will be able to more fully understand the current challenges facing today's practitioners, as well as which existing solutions are best to combat those challenges. More ...
  Design for AT-Speed Test, Diagnosis and Measurement Design for AT-Speed Test, Diagnosis and Measurement offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted. More ...
Design for Excellence This course will teach you how to design a product that is manufacturable, testable, reliable, useable, electromagnetically compatible, maintainable and supportable. In short, an electronic product that not only functions but is made to be of excellent value to you and to your customer. Details
Design for Testability and for Built-in Self Test In this course you will learn all aspects of Design for Testability, from what it is, why you might need it, why someone would object to it, and what it can and cannot accomplish. You will learn how today's technology has become elusive to certain failure modes and how important it is to expose them through more testable designs. First you will learn some simple techniques to enhance observability and controllability. You will learn how you can access hundreds of internal points with as few as four additional edge connector pins. You will learn specific guidelines for both digital and analog circuit testability. You will learn structured testability techniques, such as internal and boundary-scan. You will come away with a deep understanding of the IEEE 1149.1 (JTAG) standard's operation, use and even its limitations. You will also learn some new techniques in testability, including IDDQ testing and I/O Mapping. In the second part of the course, you will learn what built-in [self] test (BIST) is and how it can be specified. You will learn structures such as linear feedback shift registers (LFSRs), signature analyzers, and pseudo-random signal generators. With these building blocks you will be able to evaluate a number of BIST architectures. You will learn BIT Software techniques and consider the effect false alarms have on BIT. You will finally be able to specify BIT for your products and look at the possibilities of BIT taking over some of the ATE functions. Details
  Design-For-Test For Digital IC's and Embedded Core Systems The first practical DFT guide from an industry insider. Skip the high-brow theories and mathematical formulas—get down to the business of digital design and testing as it's done in the real world. Learn practical testing strategies that address today's business needs for quality, reliability, and cost control, working within the tight deadlines of typical high-pressure production environments. Design-for-Test for Digital IC's and Embedded Core Systems helps you optimize the engineering trade-offs between such resources as silicon area, operating frequency, and power consumption, while balancing the corporate concerns of cost-of-test, time-to-market, and time-to-volume. You'll also boost your efficiency with the special focus on automatic test pattern generation (ATPG). The book includes a roadmap that allows you to fine-tune your learning if you want to skip directly to a specific subject. Key topics include: Core-based design, focusing on embedded cores and embedded memories System-on-a-chip and ultra-large scale integrated design issues AC scan, at-speed scan, and embedded DFT Built-in self-test, including memory BIST, logic BIST, and scan BIST Virtual test sockets and testing in isolation Design for reuse, including reuse vectors and cores Test issues being addressed by VSIA and the IEEE P1500 Standard Design-for-Test for Digital IC's and Embedded Core Systems is filled with full-page graphics taken directly from the author's teaching materials. Every section is illustrated with flow-charts, engineering diagrams, and conceptual summaries to make learning and reference fast and easy. This book is a must for the engineers and managers involved in design and testing. The enclosed CD-ROM contains full-color versions of all the book's illustrations in Acrobat PDF format. These images may be viewed interactively on screen or printed out to create overheads for teaching. Acrobat Reader software for Windows and UNIX computers is included. More ...
  Detecting the World: Capturing Physical Measurements With C++ * Build cost-effective data recording and analysis systems on the PC * Measure speed, temperature, force, pressure, voltage, amperage, and resistance Do you need to build a system that can capture and analyze real-world data including speed, temperature, force, pressure, voltage, amperage, or electrical resistance? If so, you will find this an essential guide to building, programming, and using accurate and cost-effective PC-based data acquisition systems. You'll find designs for: * electronic measurement probing with physical transducers and signal conditioning * converting analog to digital records * software techniques appropriate for collecting, compressing, storing, reducing, analyzing, and presenting measurements While there is no typical data acquisition system, McCombs has identified the basic concepts that occur in all systems. You'll learn about selecting power supplies, sensors, and transducers, and you can even develop a fully functional PC-based voltmeter, ammeter, and ohmmeter! C++ code examples on the companion disk show how to use the data acquisition programs with Windows 95 or DOS, and can be ported to Presentation Manager under OS/2 and to X11 under Linux- or Intel-based UNIX. More ...
  Dictionary of Modern Electronics Technology New technology overpowers the old everyday. One minute you're working with the quickest and most sophisticated electronic equipment, and the next minute you're working with a museum piece. The words that support your equipment change just as fast. If you're looking for a dictionary that thoroughly defines the ever-changing and advancing world of electronic terminology, look no further than the Modern Dictionary of Electronics Technology. With up-to-date definitions and explanations, this dictionary sheds insightful light on words and terms used at the forefront of today's integrated circuit industry and surrounding electronic sectors. Whether you're a device engineer, a specialist working in the semiconductor industry, or simply an electronics enthusiast, this dictionary is a necessary guide for your electronic endeavors. More ...
  Digital Circuit Testing: A Guide to DFT and Other Technologies Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods. More ...
  Digital Logic Test and Simulation, 2nd Edition The increase in the size and complexity of circuits on a chip with little or no increase in the number of Input/Output pins has made the need for testing ever more important. The test must detect failures in individual units, as well as failures caused by defective manufacturing processes. Random defects that go undetected may result in expensive recalls and also endanger the public, since digital logic devices have become pervasive in products that affect public safety, including applications such as transportation and human implants among others. This thoroughly revised edition of the author’s popular textbook first published in 1985 has been updated to include coverage of: BDDs (binary decision diagrams) and Cycle based simulation; Tester architectures/STIL (Standard Test Interface Language); Hardware Design Language (HDL) rather than pseudocode; and Behavioral ATPG (automatic test pattern generation). More ...
  Digital Multimeter-Data Hold-Backlight If youre looking for a nice little DMM to keep in your tool box, this ones for you! Small and inexpensive, yet packed with great functions and features. Has all the normal ranges of a pocket DMM plus a plug-in transistor tester socket for quick transistor testing. Plus a built-in continuity test provides an audible buzzer for eyes-off testing. The oversized 3½ digit display has a selectable backlight feature which illuminates the display in the dark. Besides all this, there is a professional data hold feature to hold and store a reading. Also features a high impact rubber holster just like the big boys! Includes a great set of test probes and even has the 9V battery installed. All this for under $20! More ...
  Digital Systems Testing and Testable Design This widely-used textbook provides comprehensive, state-of-the-art coverage of digital systems testing and testable design. Considered a definitive text in this area, the book includes in-depth discussions of the following topics: Test generation Fault modeling for classic and new technologies Simulation Fault simulation Design for testability Built-in self-test (BIST) Diagnosis All topics are covered extensively, from fundamental concepts to advanced techniques. Successfully used world-wide at leading universities, the book is appropriate for graduate-level and senior-level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field. More ...
  DSP-Based Testing of Analog and Mixed-Signal Circuits Answers the commonly asked questions about how digital signal processing-based machines work and what role DSP plays in the process. It shows you how DSP performs in real-test situations and uses mathematical concepts rather than derivations. The text addresses difficult test problems and their solutions resulting from the union of automatic test equipment (ATE) and DSP. The author establishes a philosophy of DSP-based testing describing how to think, how to approach a problem, how to create a solution, and how to determine if it really works properly. More ...
  Eben Hewitt's ColdFusion Training Course: A Digital Seminar on CD-ROM Start creating ColdFusion enterprise applications right now -- visually! · A fully-integrated eBook/QuickTime video package: more than 5 hours of expert personal training from Eben Hewitt, one of the world's most experienced ColdFusion developers! · Includes easy-to-adapt source code for key enterprise applications -- XML, WML, SQL/database integration, Web mail, and much more. · Bonus! Eben Hewitt's best-selling Core ColdFusion 5 in fully searchable electronic format. Web developers and designers live in a visual world -- and now there's a visual way to master ColdFusion 5's most powerful capabilities: Eben Hewitt's ColdFusion Training Course! Your personal instructor is Eben Hewitt, creator of ColdFusion sites visited by more than two million people each month. Watch as he builds enterprise-class Web applications right before your eyes -- and listen, as he explains every step. You'll learn a broad range of essential ColdFusion techniques, encompassing the ColdFusion language and application server, administration, content serialization with XML, SQL, wireless deployment, and more. The course offers practical insight into advanced ColdFusion 5 features, including user-defined functions, query-of-queries, data-driven Macromedia Generator graphs, custom tags, and more. Your CD-ROM contains all the source files you'll need to follow along. You also get a 250-page printed workbook -- plus a comprehensive eBook, Core ColdFusion 5, accessible with one click from anywhere in the course. As you practice, test yourself with exercises -- and extend your knowledge with the CD-ROM's extensive resource center, full of additional ColdFusion readings and Web links. Eben Hewitt is a Macromedia Certified ColdFusion Developer, a certified Microsoft SQL Server Administrator, and Director of Production for Creative Services at Cybertrails.com. A frequent ColdFusion Developer's Journal columnist, he is a member of the ColdFusion Edge faculty, and author of Core ColdFusion 5. Every month, nearly two million people visit the ColdFusion sites he has created. More ...
  Economic and Financial Analysis for Engineering and Project Management Easy to understand financial explanations so you can get your work done quickly and efficiently Offers an array of fully worked problems Allows working of problems in popular spreadsheets Links quantitative data to management decisions and standard reporting forms Economic and Financial Analysis for Engineering and Project Management is for engineers and others who must analyze the financial and economic ramifications of producing and sustaining capital projects. Unlike other books in the field, it offers straightforward and lucid explanations of all main formulas needed to carry out financial analyses. The math is kept simple and is fully explained, making the book accessible to non-technical personnel. Numerous sample problems are provided, and can be worked on standard spreadsheet programs, as well as using interest rate tables. The book shows how to link quantitative data to management decisions and to standard reporting forms and has been designed for practicing engineers and students alike. Economic and Financial Analysis for Engineering and Project Management is a "must have" for graduate students in engineering management departments; graduate and undergraduates taking courses in project management, engineering economics, and engineering finance. Practicing engineers will find this book THE handy reference for any project involving financial analyses. More ...
  Economics of Electronic Design, Manufacture and Test The general understanding of design is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect. As a result, the product will be faulty, will require testing and fixing. Where does economics enter this scenario? Consider the cost of testing and fixing the product. If a manufactured product is grossly faulty, or too many of the products are faulty, the cost of testing and fixing will be high. Suppose we do not like that. We then ask what is the cause of the faulty product. There must be something wrong in the manufacturing process. We trace this cause and fix it. Suppose we fix all possible causes and have no defective products. We would have eliminated the need for testing. Unfortunately, things are not so perfect. There is a cost involved with finding and eliminating the causes of faults. We thus have two costs: the cost of testing and fixing (we will call it cost-1), and the cost of finding and eliminating causes of faults (call it cost-2). Both costs, in some way, are included in the overall cost of the product. If we try to eliminate cost-1, cost-2 goes up, and vice versa. An economic system of production will minimize the overall cost of the product. Economics of Electronic Design, Manufacture and Test is a collection of research contributions derived from the Second Workshop on Economics of Design, Manufacture and Test, written for inclusion in this book. More ...
  Electrical Safety Engineering This third edition incorporates revisions that cover the Electricity at Work Regulations 1989, EC Directives on safety matters and many recent developments in safety legislation and guidance publications. W Fordham Cooper drew on his long experience as HM Electrical Inspector of Factories and a consultant to the Insurance Technical Bureau to write this wide-ranging work. D A Dolbey Jones, who has revised this classic for its third edition, adds his own insights gained as an HM Senior Electrical Inspector with the Health and Safety Executive, responsible for steering the project on the Electricity at Work Regulations and the official Memorandum of Guidance on the Regulations; and as a Senior Engineering Inspector with the Department of Energy (now the DTI) . Published guidance and other useful reference material is signposted throughout the book. Two new appendices deal with essential up-to-date publications. Revised by D.A. Dolbey Jones Senior Engineering Inspector Electrical Safety Engineering deals with the theory and practice of the safe design, installation and operation of industrial electrical equipment. It is well established as the leading comprehensive source of reference on electrical safety. More ...
  Electrician's Pocket Manual This toolbox-sized time-and-trouble saver makes short shrift of all those questions that pop up during your day's work, whether they relate to tools of the trade...standard electrical procedures...working with fiber optics and installing the newest communications equipment...basic math and measurement, including conversion...reading blueprints. It's also loaded with 100 tables and charts, 100 formulas and 300 diagrams. An appendix looks at codes, standards and regulations. More ...
  Electrician's Troubleshooting & Testing Pocket Guide Whether you're an electrician or a consulting or plant engineer, if you use portable meters to test, maintain, and troubleshoot electrical equipment and systems, this quick look-up, pocket-sized resource delivers key information where you need it most--on the job. Completely updated, the Electrician's Troubleshooting and Testing Pocket Guide covers it all, from lighting systems and motors, to wiring methods and transformers. More ...
Electromagnetic Compatability Test and Design You will learn the principles of electromagnetic compatibility (EMC) as it applies to military and non-military compliance. The course introduces EMC compliance requirements and methods by which they can be tested. It covers techniques designers should use to improve compatibility Details
  Electronic Test Instruments: Theory and Application Offers an in-depth examination of basic measurement theory and how it relates to practical measurements. For those who are interested in learning about electronic measurements. DLC: Electronic instruments. More ...
  Electronic Failure Analysis Handbook Still digging for the latest developments and techniques in electronic failure analysis? The leading-edge methods for slashing product failure rates are all right here in this complete, comprehensive source. You'll find top-to-bottom coverage of this rapidly developing field, encompassing breakthrough techniques and technologies for both components and systems reliability testing, performance evaluation, and liability avoidance. Absolutely essential to anyone concerned with electronic product development and testing, the Handbook gives you ready-to-use, insider information on state-of-the-art EFA techniques; the how's and why's of electronic failures; failure prediction; warranty cost control; liability-costs and other issues. More ...
  Electronic Instrument Handbook Design, select and operate the latest electronic instruments. Now in an up-to-the-minute third edition, the bestselling Electronic Instrument Handbook, by top technical author Clyde F. Coombs, Jr. and over 30 leading experts, helps you design, select and operate conventional, virtual, and network-based electronic instruments. From calibration, traceability standards, data acquisition, transducers, analog-to-digital conversion, signal sources, processors and microprocessors, power supplies and more, you move on to current and voltage measurement, signal- and waveform-generation, frequency and time measurement and circuit element measurement instruments, microwave passive devices and digital domain instruments. You learn what every instrument type does.. how it works...and how to get the most out of it. You'll also zero in on: *Instrument systems *Software and connectivity for instrumentation -- including network connections...instrument drivers...graphical user interfaces...virtual instruments and software defined instruments *Distributed and networked instrumentation, including smart sensors and the Internet *Much, much more! More ...
  Electronic Test Instruments: Analog and Digital Measurements , 2nd Edition Electronic Test Instruments: Analog and Digital Measurements, Second Edition offers a thorough, unified, up-to-date survey of electronics instrumentation, digital and analog. Start with basic measurement theory, then master all mainstream forms of electronic test equipment through real-world application examples. This new edition is now fully updated for the latest technologies, with extensive new coverage of digital oscilloscopes, power supplies, and more. More ...
  Electronic Testing and Fault Diagnosis, 3rd Edition Electronic Testing and Fault Diagnosis is a highly practical guide to the theory and methods of testing electronic circuits and systems. The third edition has been fully revised to provide up-to-date coverage of standard test procedures and reliability and maintainability analysis for most analog and digital electronic circuits and components. An introduction to automatic test equipment (ATE) is included, as well as data on passive and active components. More ...
  Electronic Troubleshooting Finding a useful guide to the principles of electronic troubleshooting was a problem in itself for professional technicians and hobbyists. Not anymore. This updated tool gives them all the fundamentals they need to do successful servicing and repair work, blending traditional theory with the very latest insight into modern electronics technology. Time-saving tables, charts, and illustrations pinpoint equipment problems in a snap. Numerous reference guides, rules of thumb, and tricks of the trade all combine to assist them in troubleshooting the full spectrum of devices and products more easily than ever before. More ...
  Embedded Processor-Based Self-Test Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. More ...
  EMC and the Printed Circuit Board: Design, Theory, & Layout Made Simple This accessible, new reference work shows how and why RF energy is created within a printed circuit board and the manner in which propagation occurs. With lucid explanations, this book enables engineers to grasp both the fundamentals of EMC theory and signal integrity and the mitigation process needed to prevent an EMC event. Author Montrose also shows the relationship between time and frequency domains to help you meet mandatory compliance requirements placed on printed circuit boards. Using real-world examples the book features: Clear discussions, without complex mathematical analysis, of flux minimization concepts Extensive analysis of capacitor usage for various applications Detailed examination of components characteristics with various grounding methodologies, including implementation techniques An in-depth study of transmission line theory A careful look at signal integrity, crosstalk, and termination" Sponsored by: IEEE Electromagnetic Compatibility Society. More ...
  EMC for Product Designers, 3rd edition Widely regarded as the standard text on EMC, Tim Williams' book provides all the information necessary to meet the requirements of the EMC Directive. Most importantly, it shows how to incorporate EMC design principles into products, avoiding cost and performance penalties, meeting the needs of specific standards, and resulting in a better overall product. More ...
  EMI Troubleshooting Techniques Stop EMI, EMD and RFI cold! Now you can get the newest, most effective weapons to fight costly and potentially devastating electromagnetic interference (EMI), electromagnetic discharge (EMD), and radio frequency interference (RFI) in the field or on the bench. EMI Troubleshooting Techniques, by Michel Marduian, arms you with an arsenal of fail-safe, time- and labor-saving diagnostic routines to help you pinpoint and lock out even the most persistent interference problems. Its 4-step approach lets you 1) identify specific (and even hidden) trouble symptoms, 2) find the matching solutions, 3) implement them and 4) understand their strengths and limitations. From power line filters and conduction type fixes to transient suppressors and radiation control, this time-and money-saving guide streamlines robust designs, speeds on-site troubleshooting for industrial-strength applications, and simplifies EMC lab testing for optimal result. Plus, you get a variety of recommended filters, isolation transformers, shields, varistors, grounding and impedance devices, tapes, foils, and more. The EMI/RFI problems stop here. When you have got an electrical noise or interference problem this reference is all you need to diagnose and solve it in a hurry. EMI Troubleshooting Techniques presents an orderly, methodical approach to locating the cause of and correcting EMI/RFI breakdowns. It gives you hands-on, optimal solutions whether your task is design, lab testing, or on-site troubleshooting, no matter what type of electronic equipment you are handling. Written by veteran EMC designer/troubleshooter Michel Mardiguian, this efficiency-boosting guide is just what you are looking for in a practical solutions kit--and more. It offers: a solution matrix that helps you pinpoint the right fix quickly; a walk-through chart that simplifies the troubleshooting process; EMI-reduction components categorized by indications, applications, and limitations; practical alternatives to lab testing methods; consideration of real-life issues such as costs, time constraints, and accessibility; solutions for most electronic environments. Whether the EMI in a cars automatic-locking mechanism, a medical diagnostic tool, or a computer motherboard, and whether you are developing, prototyping, testing, diagnosing, or applying fixes, there is only one EMI reduction kit virtually guaranteed to help you avoid dead ends and wasted time: EMI Troubleshooting Techniques. More ...
Environmental and Reliabilty Testing This course covers the environmental and reliability tests performed during design and in manufacturing. You will learn about reliability prediction techniques and factors. You will learn what you can expect from reliability growth testing environmental stress screening (ESS). You will know how environmental stress screening (ESS) is used to flush out flaws introduced during processing, fabrication and assembly. When highly accelerated for longer duration, this is called Reliability Test. You will learn how Reliability Test can flush out design flaws resulting from incompatible interfaces, from erroneous functional performance in different environments and from weak components. By the completion of this course you will be able to formulate environmental and reliability test strategies for your own products. Details
  ESD : RF Technology and Circuits ESD: RF Technology and Circuits: Presents methods for co-synthesizisng ESD networks for RF applications to achieve improved performance and ESD protection of semiconductor chips; discusses RF ESD design methods of capacitance load transformation, matching network co-synthesis, capacitance shunts, inductive shunts, impedance isolation, load cancellation methods, distributed loads, emitter degeneration, buffering and ballasting; examines ESD protection and design of active and passive elements in RF complementary metal-oxide-semiconductor (CMOS), RF laterally-diffused metal oxide semiconductor (LDMOS), RF BiCMOS Silicon Germanium (SiGe), RF BiCMOS Silicon Germanium Carbon (SiGeC), and Gallim Arsenide technology; gives information on RF ESD testing methodologies, RF degradation effects, and failure mechanisms for devices, circuits and systems; highlights RF ESD mixed-signal design integration of digital, analog and RF circuitry; sets out examples of RF ESD design computer aided design methodologies; covers state-of-the-art RF ESD input circuits, as well as voltage-triggered to RC-triggered ESD power clamps networks in RF technologies, as well as off-chip protection concepts. More ...
  ESD Design and Analysis Handbook Electrostatic Discharge (ESD) is a pervasive issue in the semiconductor industry affecting both manufacturers and users of semiconductors. The problem worsens with each new generation of parts and components. As technology scales to higher levels of integration, circuits become more sensitive to ESD and the design of protection becomes more difficult. ESD Design and Analysis Handbook presents an overview of ESD as it effects electronic circuits and provides a concise introduction for students, engineers, circuit designers and failure analysts. This handbook is written in simple terms and is filled with practical advice and examples to illustrate the concepts presented. While this treatment is not exhaustive, it presents many of the most important areas of the ESD problem and suggests methods for improving them. The key topics covered include the physics of the event, failure analysis, protection, characterization, and simulation techniques. The book is intended as both an introductory text on ESD and a useful reference tool to draw on as the reader gains experience. The authors have tried to balance the level of detail in the ESD Design and Analysis Handbook against the wealth of literature published on ESD every year. To that end, each chapter has a topical list of references to facilitate further in-depth study. More ...
  ESD in Silicon Integrated Circuits Introduces the basic mechanisms involved in electrostatic discharge (ESD) events, the physical processes that take place in a semiconductor, and circuit design for ESD protection. Written for engineers who design ICs and transistors, the book addresses such topics as the physics of devices under high current and high voltage conditions, layout techniques for input/output pins, and failure mode analysis. The second edition adds a chapter on circuit simulation. More ...
  ESD Physics and Devices ESD Physics and Devices provides a concise treatment of the ESD phenomenon and the physics of devices operating under ESD conditions. Voldman presents an accessible introduction to the field for engineers and researchers requiring a solid grounding in this important area. The book contains advanced CMOS, Silicon On Insulator, Silicon Germanium, and Silicon Germanium Carbon. In addition it also addresses ESD in advanced CMOS with discussions on shallow trench isolation (STI), Copper and Low K materials. Provides a clear understanding of ESD device physics and the fundamentals of ESD phenomena. Analyses the behaviour of semiconductor devices under ESD conditions. Addresses the growing awareness of the problems resulting from ESD phenomena in advanced integrated circuits. Covers ESD testing, failure criteria and scaling theory for CMOS, SOI (silicon on insulator), BiCMOS and BiCMOS SiGe (Silicon Germanium) technologies for the first time. Discusses the design and development implications of ESD in semiconductor technologies. More ...
  ESD Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control This is a revision of the highly successful electronic manufacturing guide, ESD Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control. This revision is comprehensive and explains how to develop, implement and manage an ESD control program, and includes up-to-date data, many new chapters, new case studies, and much more. New to this edition: + Extensive changes and additions to auditing techniques, cost benefits data, and materials evaluation. + Six new chapters on common myths, issues related to smaller companies, process controls, ISO 9000, material characterization, and training. + New case studies on field-induced failures in the factory, long-distance central office system upsets, and automation-caused failures. + Expanded coverage of the needs of smaller companies including discussion of common problems and cost-effective solutions. A training breakthrough is presented. Previously invisible ESD events can now be easily displayed for students at all levels -- `Seeing is believing' + Inclusion of new testing instruments such as the event detector and resistance probe. + The 12 critical factors in an ESD program have been updated to reflect changes and refinements in program management. The author has also included the latest information on handling procedures and requirements from the Lucent ESD Control Handbook. ESD Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control, Second Edition, is a refreshingly unbiased guide for electronic manufacturing and quality control professionals. More ...
  Essential Analog Electronics Analog electronics is a topic in its own right, but also relates to most other aspects of electronics. Often ignored in favour of digital techniques, it is nevertheless a compulsory area of study for all electronics engineers and technicians as it underpins many technologies. To reflect the increased use of computer simulation by electronic design engineers, the many illustrations in this book include graphs and numerical data obtained from computer analyses. Owen Bishop has written many best-selling books including Understand Electrical and Electronic Maths, Understand Technical Maths, Understand Electronics and Understand Electronic Filters, all published by Newnes.The emphasis of this book s on understanding the essentials of analog electronics, rather than blindly applying equations and formulae. Students and professionals at all levels will be able to grasp the basic concepts without being side-tracked by burdensome calculations, which are now solved by computers in the real world and therefore need not hold back the engineer or designer. More ...
  Exploring the World of SCSI So many peripherals, so little time! With Exploring the World of SCSI, you will gain the knowledge needed to get the most out of your peripheral devices, including scanners, printers, external disc drives and more. Focusing on the needs of the hobbyist, PC enthusiast, as well as system administrator, This is a comprehensive book for anyone interested in learning the hands-on aspects of SCSI. It includes how to work with the Logical Unit Numbers (LUNs) within SCSI, how termination works, bus mastering, caching, and how the different levels of RAID provide varying levels of performance and reliability. This book offers the functionality that intermediate and advanced system users need for configuring SCSI on their systems, while also providing the experienced professional with the necessary diagrams, descriptions, information sources, and guidance on how to implement SCSI-based solutions. Exploring the World of SCSI contains both real-world applications and theoretical information for the technical professional who wants to get the most out of SCSI, including how to configure it on a workstation or server. This book can be used as both a desktop reference as well as a guide to configuring SCSI. Included are troubleshooting tips and tricks for getting SCSI devices configured on a network as well as information about the role of SCSI in network-based storage. Exploring the World of SCSI will provide both technicians and administrators with assistance in defining network topology issues. More ...
  Extech 480823 Electro Magnetic Field (EMF/ELF) Meter The Extech 480823 EMF/ELF meter allows you to measure electromagnetic field radiation levels from fans, electrical appliances, wiring, and power lines. With a large ½" LCD display and a sampling time of 2.5 times per second, you can be assured of easy and accurate measurements. Readings available in both milligauss or micro Tesla. Battery included. More ...
  Failure Analysis of Integrated Circuits: Tools and Techniques Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. More ...
Failure Mode and Effects Analysis (FMEA) You will learn how to prepare and utilize FMEA to improve reliability, safety, testability, and maintainability. This course will describe FMEA methodology and its multiple uses for a more reliable, testable and maintainable product. Details
  Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories From PDAs to supercomputers, cell phones to video games, every modern electronic system contains memory -- most often, RAM. As engineers seek to increase the power and capacity of these systems, they are introducing advanced new nanofabrication CMOS technologies. In these environments, today's processing techniques are no longer sufficient to produce high-yield wafers. To improve RAM reliability without compromising performance, cost, or space requirements, engineers are turning to advanced fault-tolerant techniques. This is the first book to survey the state-of-the-art in memory fault tolerance. KEY TOPICS:The authors survey the latest research and new field-proven techniques for reliable and fault-tolerant RAM circuit design and evaluation, placing these advances in the context of the field's progress over the past two decades. They examine both manufacturing fault-tolerance (e.g. self-repair at the time of manufacturing) and online and field-related fault-tolerance (e.g. error-correction). The book presents in-depth discussions of each key requirement for RAM design, and each key technique -- including rationale, advantages, disadvantages, design flow, implementation, and results. MARKET: For every professional concerned with VLSI/memory circuit design, testing, and reliability, including semiconductor and VLSI design and test engineers and other design team members working in industry; engineers working on SOC (system-on-a-chip) and embedded products; and electrical engineering researchers and advanced students throughout academia. More ...
  Fiber Optic Test and Measurement The complete, practical guide to testing fiber optic communication components and systems. Fiber optic networks are evolving rapidly—and so is the technology used to design, measure, and test them. Fiber Optic Test and Measurement is the first authoritative, complete guide to measuring both current optical networks and those on the horizon. It reflects the collective experience of Hewlett-Packard's world-class lightwave test and measurement organization, and presents extensive information that has had limited circulation to date. Learn how to characterize all three basic components of a fiber optic communication system: the optical transmitter, fiber medium, and optical receiver. Review each fundamental area of fiber optic measurement, including: Optical power measurements using several types of photodetectors Spectral measurements using diffraction gratings, Michelson interferometers and both heterodyne and homodyne spectrum analysis Polarization measurements—increasingly important in high data rate networks that utilize optical amplifiers Modulation measurements via frequency and time domain analyses The book's unprecedented coverage of advanced fiber technology will be invaluable to professionals implementing or maintaining new optical networks. Learn how to: Test digital fiber systems to SONET/SDH international standards Accurately characterize the behavior of Wavelength Division Multiplexing (WDM) fiber systems Test two-port optical devices for insertion loss, reflectivity of components, chromatic and polarization mode dispersion, and the behavior of Erbium-doped fiber amplifiers (EDFAs). This practical guide will help technicians, engineers, and scientists accurately measure and test fiber optic systems, without becoming experts in fiber optic theory. It will be equally useful for experienced fiber optic professionals and those new to the field. More ...
  Fluke Voltage Detector, Voltalert, 90VAC To 600VAC VoltAlert(TM) Voltage Detector Quickly locate the hot, neutral and ground terminals in any receptacle. Just touch the tip to a control wire, conductor or outlet. You know there's voltage when the tip glows red. Made of injection molded PVC and ABS that's high-impact and non-flammable. (USA) Detects line voltage from 90VAC - 600VAC More ...
  From Contamination to Defects, Faults and Yield Loss: Simulation and Applications Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Modern VLSI research and engineering (which includes design manufacturing and testing) encompasses a very broad range of disciplines such as chemistry, physics, material science, circuit design, mathematics and computer science. Due to this diversity, the VLSI arena has become fractured into a number of separate sub-domains with little or no interaction between them. This is the case with the relationships between testing and manufacturing. From Contamination to Defects, Faults and Yield Loss: Simulation and Applications focuses on the core of the interface between manufacturing and testing, i.e., the contamination-defect-fault relationship. The understanding of this relationship can lead to better solutions of many manufacturing and testing problems. Failure mechanism models are developed and presented which can be used to accurately estimate probability of different failures for a given IC. This information is critical in solving key yield-related applications such as failure analysis, fault modeling and design manufacturing. More ...
  Genetic Algorithms for VLSI Design, Layout and Test Automation Genetic algorithms mimic the natural process of evolution, helping engineers optimize their designs by using the principle of "survival of the fittest." VLSI is especially suited to benefit from genetic algorithms - and this comprehensive book shows you how to get the best results, fast. You'll discover how genetic algorithms work and how you can use them in a wide variety of VLSI design, layout, and test automation tasks, including: Circuit partitioning Macro cell routing, including Steiner problems and global routing Standard cell and macro cell placement Circuit segmentation,FPGA mapping and pseudo-exhaustive testing Automatic test generation including compaction, eterministic/genetic test hybrids and integration of finite state machine sequences Peak power estimation You'll find essential insights into problem encoding and fitness functions; coverage of advanced parallel implementations; and much more. Specific experimental results are presented for every application - as are detailed problem descriptions and easy-to-adapt examples. Genetic algorithms are already being incorporated into leading electronic design automation systems. Leverage their full power now - with Genetic Algorithms For VLSI Design, Layout, and Test Automation. More ...
  GeoMeasurements by Pulsing TDR Cables and Probes GeoMeasurements by Pulsing TDR Cables and Probes examines Time Domain Reflectometry (TDR) research and provides information on its use as a robust, reliable, and economical production tool.Common uses for TDR technology include telecommunications and power industries, but the text examines applications such as measurement of moisture of unsaturated soils; detection of fluids for leak and pollution; measurement of water levels for hydrological purposes; measurement of water pressures beneath dams; and deformation and stability monitoring of mines, slopes, and structures.Chapters discuss:· basic physics of signal generation, transmission, and attenuation along the coaxial cable· probe designs and procedures for calibration as well as the variation in probe responses to changes in water content and soil mineralogy· variations in waveform characteristics associated with cable, deformation, cable calibration, and installation techniques for metallic cables in rock· several cases demonstrating the use of TDR cables in soil as well as weathered and soft rock· a rationale for the use of compliant cable in soil· the use of metallic cable (MTDR) and optical fiber (OTDR) to monitor response of structures· sensor/transducer components, connections from the sensors to the TDR pulser/sampler, and system control methods· available software for transmission and analysis of TDR signatures The diverse interest and terminology within the TDR community tends to obscure commonalities and the universal physical principles underlying the technology. The authors seek to crystallize the basic principles among the seemingly divergent specialties using TDR technology in geomaterials. By examining varied experiences, GeoMeasurements by Pulsing TDR Cables and Probes provides a synergistic text necessary to unify the field. More ...
  Grounding and Shielding Techniques A step-by-step guide to solving noise and interference problems in the digital age The rapid growth of digital technology over the past decade has brought the analog world into direct contact with high-speed operations and electromagnetic processes--and created a host of new problems for designers. This new twist requires different approaches to issues of noise and interference in digital processing, high-speed communication, mass data storage, and high-frequency applications. Grounding and Shielding Techniques, Fourth Edition is entirely rewritten to reflect these new challenges. This highly effective tool for the management of interference problems in electronic equipment treats the fundamentals of electrostatics as they relate to electromagnetic phenomena. Specifically, this volume deals with the new interference problems created when analog designs are buried in the middle of hardware that must meet radiation and susceptibility standards. It features: * Effective techniques for handling noise problems in a variety of circumstances * Step-by-step instructions for building noise-free instrument systems * Strategies for reducing or eliminating noise in interconnecting systems * Expanded discussion of multishielded transformers * An overview of current trends to limit the use of transformers * Real-world examples of factors influencing electronic noise * Simplified, practical explanations of the physics of fields * Dozens of illustrations and a clear, readable text. Grounding and Shielding Techniques, Fourth Edition is a state-of-the-art problem-solving guide for electronic design engineers and technicians. It is also an extremely useful text for short courses on electronic noise. More ...
  Handbook of Polygraph Testing The Handbook of Polygraph Testing examines the fundamental principles behind lie detector tests, and provides an up-to-date review of their validity. The editor presents current psychological theories, including an explanation of the cognitive processes central to polygraph testing. He describes the various methods of testing, the research in support of each method, and special issues in polygraph research. The Handbook helps readers interpret existing research studies, and learn how to improve the accuracy of polygraph testing and analysis. The dual focus on research and clinical applications makes this text appropriate for a broad range of readers, from polygraph examiners and law enforcement personnel to lawyers, scientists, and graduate students. The Handbook helps establish standards in the field by establishing a set of common terms, concepts, and processes for the people who administer and analyze the tests as well as for the researchers who test the underlying theories. More ...
  High Voltage Test Techniques Second Edition The second edition of High Voltage Test Techniques has been completely revised. The present revision takes into account the latest international developments in High Voltage and Measurement technology, making it an essential reference for engineers in the testing field. High Voltage Technology belongs to the traditional area of Electrical Engineering. However, this is not to say that the area has stood still. New insulating materials, computing methods and voltage levels repeatedly pose new problems or open up methods of solution; electromagnetic compatibility (EMC) or components and systems also demand increased attention. The authors hope that their experience will be of use to students of Electrical Engineering confronted with High Voltage problems in their studies, in research and development and also in the testing field. More ...
  High-Speed Digital System Design: A Handbook of Interconnect Theory and Design Practices A cutting-edge guide to the theory and practice of high-speed digital system design An understanding of high-speed interconnect phenomena is essential for digital designers who must deal with the challenges posed by the ever-increasing operating speeds of today's microprocessors. This book provides a much-needed, practical guide to the state of the art of modern digital system design, combining easily accessible explanations with immensely useful problem-solving strategies. Written by three leading Intel engineers, High-Speed Digital System Design clarifies difficult and often neglected topics involving the effects of high frequencies on digital buses and presents a variety of proven techniques and application examples. Extensive appendices, formulas, modeling techniques as well as hundreds of figures are also provided. Coverage includes: * A thorough introduction to the digital aspects of basic transmission line theory * Crosstalk and nonideal transmission line effects on signal quality and timings * The impact of packages, vias, and connectors on signal integrity * The effects of nonideal return current paths, high frequency power delivery, and simultaneous switching noise * Explanations of how driving circuit characteristics affect the quality of the digital signal * Digital timing analysis at the system level that incorporates high-speed signaling effects into timing budgets * Methodologies for designing high-speed buses and handling the very large number of variables that affect interconnect performance * Radiated emission problems and how to minimize system noise * The practical aspects of making measurements in high-speed digital systems More ...
How to Use BestTest.com to Market Your Courses You will learn how easily you can place your course on our web site and thereby advertise it to the thousands of engineering professionals that frequent BestTest.com in persuit of engineering knowledge. Details
  Iddq Testing for CMOS VLSI This is one of the most comprehensive books dealing with this new testing phenomenon that has demonstrated impressive increases in fault coverage with less effort than functional or scan based testing. The text is oriented towards application and is useful in understanding the objectives of IDDQ testing. More ...
  IDDQ Testing of VLSI Circuits Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice. More ...
  IEEE Standard Test Language for All Systems - (C/ATLAS) 1995 C/ATLAS or Common Abbreviated Test Language for All Systems is a standardized test language for test procedures and test programs. This volume is not only helpful to those who use ATLAS, but its syntax and structure are applicable to all test programs. More ...
  Inside SPICE Generate faster, more accurate SPICE simulations! Make your SPICE simulations faster, more accurate - and avoid nonconvergence using the breakthrough methods packed into the Second Edition of Inside SPICE. In this updated and revised bestseller, Ron Kielkowski gives you the hands-on help and guidance you need to create more effective software modles for simulating circuit behavior. This one-of-a-kind modeling toll and troubleshooter brings you up to speed on the latest commercially-SPICE-like simulators, including HSPICe, PSPICE, IS_SPICE and MICROCAP IV...delivers proven solutions to the full range of circuit simulation problems, including convergence and accuracy problems...shows you how to make difficult measurement such as loop gain of an op amp or distortion measurements of clocked ciruits like converters and sample-and-hold circuits...measure any class of circuits, such as oscillators, charge-storage circuits, or very large circuits...and more. Inside SPICE. Up-to-date methods for creating fast, accurate circuit simulations with SPICE. The complexities of SPICE - the international standard in circuit simulation software - require expert handling, Inside SPICE gives you everything necessary to create the most effective software models for simulation the behavior of real circuits. And this edition of Inside SPICE offers the most up-to-date techniques for generating faster, more accurate simulations. Inside SPICE, Second Edition is an indispensable reference tool - and a troubleshooter. It will help professionals and students analyze and work around problems typically encountered with SPICE and SPICE-like simulator programs: HSPICE, PSPICE, IS_SPICE, and MICROCAP IV. It has a new chapter on simulation trends, in addition to a new, Windows-compatible CD-ROM version of RSPICE with extensive sample models. Well-organized chapters spell out the fundamentals, including: understanding circuit simulations; nonconvergence; SPICE options; numeric integration. Packed with example circuit files. More ...
  Instrument Engineers Handbook, Third Edition, Three Volume Set You get: Three huge volumes: more than 4000 pages! Thousands of diagrams, charts, and tables Index with more than 10,000 entries Appendices that cover units, symbols, conversions, test procedures and calculations, suppliers' addresses and phone numbers, and much more Manufacturer product and contact information, domestic and overseas suppliers, and cost ranges This third edition of the Instrument Engineers' Handbook--most complete and respected work on process instrumentation and control--helps you: o Select and apply hundreds of process measurement and control instruments and analytical devices o Design the most cost-effective process control systems, optimizing production and maximizing safety The third edition covers all the latest advances in control hardware, transmitters, displays, DCS, PLC, and computer systems. It also provides in-depth coverage of control theory and shows how such unit processes as distillation and chemical reaction are optimized. Each section begins with a "Feature Summary," which provides quick access to specific information on cost, suppliers, ranges, and the accuracy of instrumentation. A fast reference for the data you need every day, Instrument Engineers' Handbook includes all the specifications, formulas, tables, and data you often need to look up on a moment's notice. More ...
Instrumentation and Instrument Buses An ATE consists of discrete instruments capable of applying stimuli and making accurate measurements under the control of a computer. You will learn how each of these elements does its job and what realistic expectations you can have. Details
  Integrated Circuit Defect-Sensitivity: Theory and Computational Models Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. Integrated Circuit Defect-Sensitivity: Theory and Computational Models reviews the importance of a defect-sensitivity analysis in comtemporary VLSI design procedures. The modeling of defects in microelectronics technologies is revised from a set theoretical approach as well as from a practical point of view. This way of handling the material introduces the reader step-by-step to critical area analysis through the construction of formal mathematical models. The rigorous formalism developed in this book is necessary to study the construction of deterministic algorithms for layout defect exploration. Without this basis, it would be impossible to scan layouts in the order of 106 objects, or more, in a reasonable time. The theoretical component of this book is complemented with a set of practical case studies for fault extraction, yield prediction, and IC defect-sensitivity evaluation. These case studies emphasize the fact that by using appropriate formulae combining statistical data with the computed defect-sensitivity, an estimate of the IC's defect tolerance can be obtained at the end of the respective production line. The case studies range from highlighting their geometrical nature as a function of the defect size to more specific situations highlighting layout regions where faults may occur. In addition to the visualization of critical areas, numerical data in the form of tables, graphs and histograms are provided for quantification purposes. More than that, ever smarter, defect-tolerant design strategies have to be devised to attain high yields. Obviously, the work presented in the book is not definitive, and more research will always be useful to advance the field of CAD for manufacturability. This is, of course, one of the interesting challenges imposed by the ever-changing nature of microelectronic technologies. CAD developers and yield practitioners from academia and industry will find that this book lays the foundations for further pioneering work More ...
Integrated Diagnostics and Artificial Intelligence How integrated diagnostics and artificial intelligence (AI) can be used to improve product support. You will learn the basic principals of artificial intelligence and how they apply to test and diagnosis. You will also learn diagnostic concepts, including dependency modeling and optimizations. Details
  Introduction to Advanced System-on-Chip Test Design and Optimization Test design is applied to make a system testable. In a modular core-based environment where blocks of reusable logic, the so called cores, are integrated to a system, test design for each core include: test method selection, test data (stimuli and responses) generation (ATPG), definition of test data storage and partitioning [off-chip as ATE (Automatic Test Equipment) and/or on-chip as BIST (Built-In Self-Test)], wrapper selection and design (IEEE std 1500), TAM (test access mechanism) design, and test scheduling minimizing a cost function whilst considering limitations and constraint. A system test design perspective that takes all the issues above into account is required in order to develop a globally optimized solution. SOC test design and its optimization is the topic of this book. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. More ...
  Introduction to EMC Explains the basic principles of EMC, how it may be controlled in practice through filtering, shielding appropriate printed circuit board design & other means. Discusses electrostatic discharge & surge protection. Examines the concern about the effects of electromagnetic wave fields on health. Paper. More ...
  Introduction to IDDQ Testing Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area. More ...
  Introduction to Instrumentation and Measurements Describes new quantum standards for the ohm, volt, and other modern measurement standards Includes a detailed treatment of linear and nonlinear analog signal processing Evaluates noise and coherent interference and explains how to predict the noise-limited resolution of a measurement system Presents numerous examples of optoelectronic instrument systems Introduces elements of digital signal conditioning used in modern measurement systems Offers examples of unique measurement systems designed by the author Discusses current industry trends Includes a separate problems and solutions manual with exercises for Chapters 1-8 This new textbook and reference makes it easy to make an informed choice among sensors and signal conditioning systems. The book's broad coverage includes: electrical and physical standards; analog signal conditioning; noise and coherent interference; DC and AC null methods; sensor mechanisms and applications; electrical measurements; digital interfaces; digital signal conditioning; measurement system design examples; and more. The few other texts available on this topic lack the breadth of coverage and fail to cover recent changes in standards. An excellent sourcebook for students and practicing engineers alike, Introduction to Instrumentation and Measurements includes all the general information on instrumentation and measurements, as well as the technical details you need to apply your knowledge in the real world. There is no other text like it. More ...
  IR101 Automatic Infrared IR Thermometer This beauty is one of the neatest thermometers we've ever seen! You can measure the temperature of anything merely by pointing a IR beam of light at it! That's right, no contact, no sensors, no wires, glass, nothing but a beam of IR light! Is your motor running hot? Is your refrigerator cold enough? How cold IS that bottle of soda? If you want to know, just aim and push the button. The temperature is immediately displayed on the backlit LCD display! Last measurement is automatically held and stored until power-off. Measurements can be momentary or continuous, with minimum and maximum temps held during measurement! You can't ask for much more than that in a handheld thermometer that is contact-free besides! How does it work, you ask? Well if you really want to know, when making a temperature measurement the surface radiation of the object to be measured is evaluated using the principle of radiation thermometry. This is a purely passive process, i.e. no radiation is transmitted, but instead, use is made of only the natural electromagnetic radiation energy (heat radiation) that every body above a temperature of absolute zero (-273 °C) has. The temperature can be determined very accurately from this radiation energy if the emission factor of the object being measured is known. We'll stop there, because we only have so much space for all this copy! Runs on 4 LR44 cells (included) for a long life. If you want to know what the temperature is, check it out with the IR101! More ...
ISO-9000 and Quality Assurance You will learn to identify the ISO-9000 standards relevant to your organization. You will also learn the planning and implementation process associated with installing an ISO-9000 quality system. Details
  LabVIEW for Electric Circuits, Machines, Drives, and Laboratories Master electric circuits, machines, devices, and power electronics hands on-without expensive equipment. In LabVIEW for Electric Circuits, Machines, Drives, and Laboratories Dr. Nesimi Ertugrul uses custom-written LabVIEW Virtual Instruments to illuminate the analysis and operation of a wide range of AC and DC circuits, electrical machines, and drives-including high-voltage/current/power applications covered in no other book. Includes detailed background, VI panels, lab practices, hardware information, and self-study questions - everything you need to achieve true mastery. More ...
  LabVIEW Graphical Programming : Practical Applications in Instrumentation and Control The #1 guide to LabVIEW, updated for release 4.0! This is the only in-depth, engineering-level guide to the popular graphical programming language for virtual instrumentation. Using LabVIEW, engineers and scientists can create software-based instruments that can do the job of real-world hardwareNsaving thousands of dollars! Providing complete coverage of LabVIEW from a practical, engineering perspective, and including a CD-ROM with an extensive library of ready-to-use virtual instruments, this book will get you up to speed in no time. More ...
  LabVIEW Programming, Data Acquisition and Analysis (with CD-ROM) *Master LabVIEW programming - hands-on! *Learn through real-world data acquisition and analysis applications *Dozens of key techniques presented through easy-to-adapt templates *Extensively classroom-tested with professional engineers *CD-ROM: Tools, templates, and complete LabVIEW evaluation version Master LabVIEW programming from the ground up - fast! LabVIEW Programming, Data Acquisition and Analysis is your easy, hands-on guide to LabVIEW programming and data analysis. Whether you're learning LabVIEW from the ground up, or updating knowledge you already have, Jeffrey Beyon covers every key technique you need to build reliable, high-performance applications. You'll start with the basics: the structure of LabVIEW source files; using sub VIs; loops and conditional statements; data display; data types; and the prerequisites for data acquisition, including sampling theorems and data acquisition VIs. Next, Beyon covers every key category of data acquisition and analysis application - analog and digital, input and output. Coverage includes: *Practical techniques for data save/read, data conversion, and much more *Tips and tricks for memory management, large file management, and more *Implementing each leading data analysis VI *Instrument control, counters, and more *Avoiding and troubleshooting common LabVIEW programming problems Most examples are presented in the form of software templates that are easy enough to understand quickly, and robust enough to serve as building blocks for real-world solutions. You'll find detailed, end-of-chapter review questions; an accompanying lab workbook is also available. Whether you're a field engineer, scientist, researcher, or student, there's no faster way to get results with LabVIEW! CD-ROM INCLUDES: *Complete library of LabVIEW tools and templates *Full LabVIEW evaluation version Companion lab workbook: Hands-On Exercise Manual for LabVIEW Programming, Data Acquisition and Analysis More ...
  LabVIEW: Advanced Programming Techniques The graphical nature of LabVIEW makes it ideal for test and measurement applications and its use brings significant improvements in productivity over conventional programming languages. However, comprehensive treatments of the more advanced topics have been scattered and difficult to find-until now.LabVIEW Advanced Programming Techniques offers in-depth coverage of the subjects that move you to the next level of programming-the level that allows full exploitation of LabVIEW's power and utility. These topics include:Active X: Gain the background needed to use Active X in your LabVIEW applications.Object-Oriented Technologies: Get a clear description of object analysis and see examples of how it can apply to LabVIEW applications. Application structure: Discover a three-tiered architecture that results in robust, flexible, and easy to maintain code.State machines: Get extensive coverage of several types of state machines-arguably the most useful programming tool available.Exception handling: Learn how to detect, process, and resolve exceptions in your code.Instrument drivers: See the value drivers bring to code readability and maintenance -Learn the techniques for constructing reusable drivers.Multi-threading: Learn how to look at a LabVIEW code diagram to determine how many threads your application can use, then optimize the performance of the application. More ...
  Magnetic Sensors and Magnetometers Whether you’re an expert or new to the field, this unique resource offers you a thorough overview of the principles and design of magnetic sensors and magnetometers, as well as guidance in applying specific devices in the real world. From exploring sensor and magnetometer properties for optimum system design… to the testing and calibration of precise magnetometers for full utilization, this book serves as your complete reference. You get practical approaches to selecting the right sensors for specific applications and advice on starting the development of a customized device. The book covers both multi-channel and gradiometric magnetometer systems, special problems such as cross-talk and crossfield sensitivity, and comparisons between different sensors and magnetometers with respect to various application areas. Miniaturization and the use of new materials in magnetic sensors are also discussed. A comprehensive list of references to journal articles, books, proceedings and webpages helps you find additional information quickly. Supported with 315 illustrations and 340 equations. Contents: Basics – Magnetic Quantities and Units. Magnetic States of Matter. Magnetic Materials for Sensor Applications. Sensor Specifications. Induction Sensors – Air Coils. Search Coils With a Ferromagnetic Core. Noise Matching to an Amplifier. Design Examples. Other Measuring Coils. Fluxgate Sensors – Orthogonal-Type Fluxgates. Core Shapes of Parallel-Type Fluxgates. Theory of Fluxgate Magnetometer. Principles of Fluxgate Magnetometers. Exitation. Tuning the Output Voltage. Current-Output (or Short-Circuited) Fluxgate. Noise and Offset Stability. Crossfield Effect. Designs of Fluxgate Magnetometers. Miniature Fluxgates. ac Fluxgate. Multiaxis Magnetometers. Fluxgate Gradiometers. Magnetoresistors – AMR Sensors. GMR Sensors. Hall-Effect Magnetic Sensors – Basics of the Hall Effect and Hall Devices. High Electron Mobility Thin-Film Hall Elements. Integrated Hall Sensors. Nonplatelike Hall Magnetic Sensors. Magneto-Optical Sensors – Faraday and Magneto-Optical Kerr Effects. Sensors of Magnetic Fields and Electric Currents. Geometric Measurements. Resonant Magnetometers – Magnetic Resonance. Proton Precession Magnetometers. Optically Pumped Magnetometers. Superconducting Quantum Interference Devices (SQUIDs) – Introduction. SQUID Sensors. SQUID Operation. Input Circuits. Refrigeration. Environmental Noise (Noise Reduction). Applications. Other Principles – Magnetoimpedance and Magnetoinductance. Magnetoelastic Field Sensors. Biological Sensors. Applications of Magnetic Sensors – Biomagnetic Measurements. Navigation. Military and Security. Automotive Applications. Nondestructive Testing. Magnetic Marking and Labeling. Geomagnetic Measurements: Mineral Prospecting, Object Location, and Variation Stations. Space Research. Testing and Calibration Instruments – Calibration Coils. Magnetic Shielding. Magnetic Sensors for Nonmagnetic Variables – Position Sensors. Proximity and Rotation Detectors. Force and Pressure. Torque Sensors. Magnetic Flowmeters. Current Sensors. Sensors Using Magnetic Liquids. Magnetic Sensors, Magnometers, and Calibration Equiptment Manufacturers. List of Symbols and Abbreviations More ...
  Maintainability: A Key to Effective Serviceability and Maintenance Management Gets professionals quickly on-line with all the crucial design concepts and skills they need to dramatically improve the maintainability of their products or systems Maintainability is a practical, step-by-step guide to implementing a comprehensive maintainability program within your organization's design and development function. From program scheduling, organizational interfacing, cost estimating, and supplier activities, to maintainability prediction, task analysis, formal design review, and maintainability tests and demonstrations, it describes all the planning and organizational aspects of maintainability for projects under development and Schools readers in state-of-the-art maintainability design techniques Demonstrates methods for quantitatively measuring maintainability at every stage of the development process Shows how to increase effectiveness while reducing life-cycle costs of already existing systems or products Features numerous case studies, sample applications, and practice exercises Functions equally well as a professional reference and a classroom text Independent cost analysis studies indicate that an inordinately large percentage of the overall life-cycle cost of most systems/products is currently taken up by maintenance and support. In fact, for many large-scale systems, maintenance and support have been shown to account for as much as 60% to 75% of overall life-cycle costs. At a time of fierce global competition, long-term cost effectiveness is a major competitive advantage that manufacturers simply cannot afford to underestimate. Clearly then, to remain competitive in today's international marketplace, companies must institute programs for reducing system maintenance and support costs— comprehensive programs that are an integral part of the design and development process from its earliest conceptual stages. This book shows you how to implement such a program within your organization's design and development function. From program scheduling, organizational interfacing, cost estimating, and supplier activities, to maintainability prediction, task analysis, formal design review, and maintainability tests and demonstrations, it describes all the planning and organizational aspects of maintainability for projects under development while schooling you in the use of the full range of proven design techniques—including methods for quantitatively measuring maintainability at every stage of the development process. The authors also clearly explain how the principles and practices outlined in Maintainability can be applied to the evaluation of systems/products now in use both to increase their effectiveness and reduce long-term costs. While theoretical aspects of maintainability are discussed, the authors' main purpose in writing this book is to help get professionals quickly on-line with the essential maintainability concepts and skills. Hence, in addition to clarity of presentation and a rational hierarchical format, Maintainability features many case studies and sample applications that help to clarify the points covered, and numerous practice exercises that help engineers to test their mastery of the concepts and techniques covered. Maintainability is an invaluable professional tool for engineers from all disciplines who are involved with the design, testing, prototyping, manufacturing, and maintenance of products and systems. It also serves as a superior course book for graduate-level programs in those disciplines. More ...
  Managing the Testing Process: Practical Tools and Techniques for Managing Hardware and Software Test An updated edition of the best tips and tools to plan, build, and execute a structured test operation. In this update of his bestselling book, Rex Black walks you through how to develop essential tools and apply them to your test project. He helps you master the basic tools, apply the techniques to manage your resources, and give each area just the right amount of attention so that you can successfully survive managing a test project! Offering a thorough review of the tools and resources you will need to manage both large and small projects for hardware and software, this book prepares you to adapt the concepts across a broad range of settings. Simple and effective, the tools comply with industry standards and bring you up to date with the best test management practices and tools of leading hardware and software vendors. Rex Black draws from his own numerous testing experiences–– including the bad ones, so you can learn from his mistakes–– to provide you with insightful tips in test project management. He explores such topics as: · Dates, budgets, and quality–expectations versus reality · Fitting the testing process into the overall development or maintenance process · How to choose and when to use test engineers and technicians, contractors and consultants, and external test labs and vendors · Setting up and using an effective and simple bug-tracking database · Following the status of each test case The companion Web site contains fifty tools, templates, and case studies that will help you put these ideas into action–– fast! More ...
  Measurement and Calibration Requirements for Quality Assurance to ISO 9000 Quality assurance is of paramount importance for today’s businesses. This uniquely integrated approach to quality management focuses on the measurement and calibration requirements that are key to the achievement of ISO 9000. The cross-disciplinary approach makes this well-structured text an invaluable asset both to engineers concerned with the development, implementation and maintenance of quality systems and to managers wishing to gain an insight into quality assurance issues. Features include: · Examination of the requirements of ISO 9000 benefiting readers who are constructing new quality systems or updating existing schemes · Description of the mechanisms for assessing the sources of measurement error and quantifying their effect allowing the engineer to pinpoint problems · Discussion of the general principles of measurement and calibration procedures enabling the reader to formulate a quality control strategy · The comprehensive review of measurement and calibration procedures for process parameters qualifying the reader to select appropriate instruments · Coverage of environmental management systems satisfying ISO 14000 enabling companies to demonstrate their commitment to responsible manufacturing More ...
  Neural Models and Algorithms for Digital Testing Neural Models and Algorithms for Digital Testing presents a novel solution to a difficult problem, namely, test generation for digital logic circuits. An optimization approach to this problem has only recently been attempted. The authors propose a new and unconventional modeling technique for digital circuits. The input and output signal states of a logic gate are related through an energy function such that the minimum energy states correspond to the gate's logic function. There are at least two advantages to this new approach. First, since the function of the circuit is expressed as a mathematical expression, new techniques can be used to solve a problem like test generation. Second, the non-causal form of the model allows effective use of parallel processing. The authors present the mathematical basis for models and discuss their fundamental properties. Based on the same circuit models, test generation algorithms that can exploit fine-grain parallel computing, relaxation techniques, quadratic 0-1 programming and graph-theoretic techniques are presented. In addition to its practical value, the proposed problem formulation leads to interesting theoretical contributions. As a further application of the model, the intractability of the test generation problem is considered. Using the neural network models, a new class of circuits in which this problem is solvable in polynomial time is presented. This contribution is especially important since it leads to design styles for easily-testable digital circuits and provides a possible step toward design for testability. More ...
  Noise Reduction Techniques in Electronic Systems This updated and expanded version of the very successful first edition offers new chapters on controlling the emission from electronic systems, especially digital systems, and on low-cost techniques for providing electromagnetic compatibility (EMC) for consumer products sold in a competitive market. There is also a new chapter on the susceptibility of electronic systems to electrostatic discharge. There is more material on FCC regulations, digital circuit noise and layout, and digital circuit radiation. Virtually all the material in the first edition has been retained. Contains a new appendix on FCC EMC test procedures. More ...
  On Line-Testing for VLSI Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. More ...
  On-Chip ESD Protection for Integrated Circuits: An IC Design Perspective This comprehensive and insightful book discusses ESD protection circuit design problems from an IC designer's perspective. On-Chip ESD Protection for Integrated Circuits: An IC Design Perspective provides both fundamental and advanced materials needed by a circuit designer for designing ESD protection circuits, including: · Testing models and standards adopted by U.S. Department of Defense, EIA/JEDEC, ESD Association, Automotive Electronics Council, International Electrotechnical Commission, etc. · ESD failure analysis, protection devices, and protection of sub-circuits · Whole-chip ESD protection and ESD-to-circuit interactions · Advanced low-parasitic compact ESD protection structures for RF and mixed-signal IC's · Mixed-mode ESD simulation-design methodologies for design prediction ESD-to-circuit interactions, and more! Many real world ESD protection circuit design examples are provided. The book can be used as a reference book for working IC designers and as a textbook for students in the IC design field. More ...
  OP Amps Design, 2E This book deliberately straddles that imaginary line between the technician and engineering worlds. Topics are addressed on three levels: operational overview, numerical analysis, and design procedures. More ...
  Optical Measurement Techniques and Applications Significant advances in optical metrology have fueled the development of new, innovative techniques for the technology in a wide range of applications. Now you can better understand these highly accurate and versatile new methods, and gain insight into applying the technology to solve specific measurement problems. Optical Measurement Techniques and Applications does much more than just cover the underlying principles behind the latest optical measurement techniques. With the help of hundreds of example diagrams and step-by-step equations, sixteen of the industry’s leading experts quickly bring you up to speed on how these methods are used in dozens of real-world applications -- from laser remote-sensing, to vibration measurement, to providing the data necessary to develop computer models, and more. The book also prepares you to meet future optical measurement challenges by identifying what areas of research are on the horizon. And each chapter concludes with an extensive list of references for more advanced research. This is an invaluable reference for optical researchers and practicing engineers who need sharp insight into the key optical measurement techniques and systems in use today. It’s also a powerful learning resource for upper-level undergraduate and postgraduate students. 1. Introduction: Interference of Waves. Diffraction. Polarization. Speckle. Sensitivity, Accuracy, and Precision. Scope of the Text. Concluding Remarks. 2. Optical Metrology of Engineering Surfaces -- Scope and Trends: Triangulation. Projected Fringe Techniques for Industrial Inspection and Microshape Analysis. Interferometry for Precision Measurements. Interferometry on Optically Rough Surfaces. Shearing Interferometry. White-Light Interferometry for Micro- and Macrostructure Analysis. Heterodyne Interferometry. Interferometry Outside the Coherence Length. Interferometry for Microtopography and Roughness Measurements. 3. Digital Processing of Fringe Patterns in Optical Metrology: Techniques for Digital Phase Reconstruction. Measurement of Three-Dimensional Displacement Fields. Conclusion. 4. Interferometric Optical Testing: Principles of Optical Testing. Implementation and Development of Interferometric Testing Methods. Conclusion. 5. Holographic Interferometry -- An Important Tool in Nondestructive Measurement and Testing: Wavefront Reconstruction Process. Basic Methods of Wavefront Comparison. Brief Introduction to Fringe Formation and Phase Difference Measurement. Measurement of Static Deformation. Study of Vibrations. Flow Visualization. Measurement of Surface Topography. Concept of Holographic Flaw Detection. Some Examples of Application. TV Holography and Electronic Holography. Conclusions. 6. Speckle Photography, Shearography, and ESPI: Some Statistical Properties. Speckle Photography. Speckle Interferometry. Speckle-Shear Interferometry (Shearography). Contour Generation. ESPI. Summary. 7. Photoelasticity and Moire: Photoelasticity. Moire. Conclusions. 8. Optical Fiber Sensors: Intensity-Based Sensors. Distributed Sensors. Interferometric Sensors. Summary. 9. Fiber Optic Smart Sensing: Fiber Optic Smart Sensing. Smart Sensing Subsystems. Sensor Selection. Application Examples. Outlook. 10. Holographic Metrology of Micro-objects in a Dynamic Volume: Historical Background. Basic Principles of In-Line Fraunhofer Holography. System Design Parameters. Some Practical Considerations. Hologram Fringe Contrast and Its Enhancement. Nonimage Plane Analysis. Velocimetry and High-Speed Holography. Off-Axis Holography. Automated Analysis. Some Other Developments. 11. Particle Image Velocimetry: Principles. Methods of Image Analysis in PIV. Advances. Conclusions Highlighting Areas of Future Development. 12. Surface Roughness Measurement: Microscopy. Mechanical Profilers. Optical Profilers. Total Integrated Scattering. Angle-Resolved Scattering. Other Techniques. Importance of Surface Cleanliness. Future Developments. 13. Lidar for Atmospheric Remote Sensing: The Lidar Method. Lidar Systems. Conclusion. 14. Some Other Methods in Optical Metrology: Optical Caustics. Digital Image Correlation. Ellipsometry. Digital Photogrammetry. More ...
  Optimizing Electronics Vibration HALT, HASS, ALT and ESS A three-day interactive workshop aimed at shortening the time required for electronics design, vibration testing and (when weaknesses are found) corrective action. This course applies to vibration of electronics at system, box or circuit card level. Methods can also be used in the design and testing of electronic components to meet vibration standards or desired capabilities. Discussion of simple methods and animations assist participants understand the complex responses of their electronics to laboratory and to field vibration. "Vibration test efficiency" is a new term, used here to illustrate recent improvements over the past slow "learning curve" for vibration knowledge. Since vibration life of most electronics is dependent on response at circuit card level, methods concentrate on the fatigue damage from PCB modal response. The purpose of this course is to simplify the complex field of vibration of electronics and make results understandable. 1% Efficiency? Tests can determine fragility limits of test samples. But few tests supply any further information (beyond pass/fail). Why? Because test measurements can't fully describe failures. Most tests miss most of the valuable information that is (with this course) readily available. Early Attempts In the 70's and 80's, relatively simple mathematical methods were developed to predict PCB vibration life capabilities. Why? Because few companies could afford that era's high-speed computer systems and the technical expertise needed to analyze vibration. Those early methods, still used by many, provide guidelines that sometimes work, but they never provide product understanding. And all too often, such guidelines outright fail, at great expense - the expense of design and production of an unreliable product. But since then, the cost of high-speed computer power has dropped at a rate of about 50% per year. The compounded cost savings of the mid 80's high-speed computer is over 99.99%. One of the best-kept secrets of certain large companies is their ability to produce reliable electronic products at low cost. How? They are able to fully understand vibration of their electronics through detailed analysis. Such companies rarely share their reliability secrets with competitors. But now, with this course, every company can afford high speed analysis support of its testing. Test Efficiency? Let's define test efficiency as dollar value of information gained divided by dollars of test cost. If you run a test program without analysis, your numerator is near zero. Adding modern technology analysis can immeasurably increase your "information gained" numerator. Every test performed without detailed posttest analysis throws information away and wastes money. Rather than throw it away, capture that information and use it to save many design and production problems. Detailed Analysis? The "design life" of any system is defined by its weakest part based on the part's local exposure. Since vibration damage of circuit cards is dominated by cyclic stresses (caused by modal vibration), analysis should concentrate on accurately quantifying the stresses experienced by every component. Design life is limited by accumulated fatigue damage. Taking advantage of the speed of today's PCs, companies without prior experience can use this course to understand and avoid vibration-induced failures. For DATES AND LOCATIONS see web page More ...
  OrCAD PSpice for Windows Volume 1: DC and AC Circuits For courses in DC/AC Principles, Devices and Circuits, Operational Amplifiers, and Digital, Analog, and Filter Design. This text series takes students from a simple DC circuit with its customary current and voltage measurements, through a damped resonant circuit requiring rise time characteristics, to a complex digital circuit that demands sophisticated timing and frequency measurements. It continues simulation studies with more advanced topics such as operational amplifiers, digital, and filter design. Comfortable, yet challenging, multi-level activities, examples, and exercises show students how to use the program to draw circuits directly on the screen, analyze the circuit in seconds using PSpice, and display the results using sophisticated techniques that go far beyond those possible with conventional instruments. More ...
  OrCAD PSpice Volume IIe for Windows Devices, Circuits, and Operational Amplifiers Assuming a working knowledge of basic PSpice techniques, this book explores simulation studies with more advanced topics such as operational amplifiers, digital, and filter design. It shows users how to use the program to draw circuits directly on the screen, analyze the circuit in seconds using PSpice, and display the results using sophisticated techniques that go far beyond those possible with conventional instruments. KEY TOPICS: Chapter topics include analog/digital conversions - resolution; random-access memory - data acquisition system; and printed circuit board layouts. For instruction in DC/AC and devices, operational amplifiers, digital, analog, and filter design. More ...
  PC Troubleshooting Pocket Book Third Edition The Newnes PC Troubleshooting Pocket Book provides a concise and compact reference that describes, in a clear and straightforward manner, the principles and practice of faultfinding and upgrading PCs and peripherals. The book is aimed at anyone who is involved with the installation, configuration, maintenance, upgrading, repair or support of PC systems. It also provides non-technical users with sufficient background information, charts and checklists to enable the diagnosis of faults and help to carry out simple modifications and repairs. The new edition of PC Troubleshooting will continue to include a number of short cuts that are instrumental in avoiding hours of potential frustration and costly effort. In order to reflect rapid changes in computer technology (both hardware and software) the third edition of the Newnes PC Troubleshooting Pocket Book has been completely revised and rewritten. New and expanded sections on: modern machines (Pentium II, III, IV, AMD); modern buses (FSB, AGP, Cyrix, Chip sets); different RAM chip types, performance and guide to RAM connectors; Win2000, ME, XP and NT4/5; latest SCSI standards, Ultra DMA, “live” re-portioning of the disc, FAT 16, FAT36, NTFS, performance and compatibility differences; ‘famous’ viruses and personal firewalls. More ...
  Power Station Instrumentation Few industries understand the importance of accurate and appropriate instrumentation as much as the power industry. Safety-critical control systems rely on the data provided so it is vital that instruments and sensors are installed and used correctly. This comprehensive volume examines, in detail, the types of instrumentation system that are available for all kinds of power station. Fossil fired, nuclear and hydroelectric plants are among those considered. Associated issues such as control rooms, computers, systems and management are also covered. The author has over forty years of experience in the electricity supply industry, and is well placed to describe the latest developments in this fast moving area. More ...
  Power Supply Tester Ultra has created the simplest yet most comprehensive way to test your power supply output - the Ultra Power Supply Tester More ...
  Power Supply Testing Handbook: Strategic Approaches in Test Cost Reduction Crandall's Power Supply Testing Handbook comes into the marketplace at an optimum time. Now, more than ever, there is an urgency for a comprehensive handbook on power supply testing that will fulfill the reference needs of the wide variety of professionals testing power supplies, including designers, manufacturers, purchasers, and field service organizations. More ...
  Power Supply Troubleshooting and Repair Power Supply Troubleshooting & Repair is designed to provide technicians with a better understanding of how switched-mode power supplies operate. It also provides practical, useful procedures to follow when you are troubleshooting switched-mode power supplies. Power Supply Troubleshooting & Repair shows you how to troubleshoot various types of switched-mode power supplies. This book covers switched-mode power supplies that you may encounter in modern consumer electronic products, and focuses on the most common supplies found throughout the industry. Using a block diagram and a full-circuit schematic, this book presents various circuits throughout its chapters to show you how switched-mode power supplies work. A brief troubleshooting procedure for servicing each supply is also included. After reading through this book, you will have a complete understanding of switched-mode power supplies and will be able to troubleshoot and repair them yourself within your own shop or home. More ...
  Power-Constrained Testing of VLSI Circuits Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density. Power-Constrained Testing of VLSI Circuits focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. The first part of this book surveys the existing techniques for power constrained testing of VLSI circuits. In the second part, several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths are presented. More ...
  Practical Electronic Fault-Finding andTroubleshooting It isn't enough to be able to design. It isn't even enough to be able to debug. To be a real fault finder, you must be able to get a feel for what is going on in the circuit you are examining. In this book Robin Pain explains the basic techniques needed to be fault finder. Simple circuit examples are used to illustrate principles and concepts fundamental to the process of fault finding. This is not a book of theory. It is a book of practical tips, hints, and rules of thumb, all of which will equip the reader to tackle any job, whether it is fixing a TV, improving the sound from a hi-fi, or locating the fault in a piece of process equipment. You may be an engineer or technician in search of information and guidance, a college student, a hobbyist building a project from a magazine, or simply a keen self-taught amateur who is interested in electronic fault finding but finds books on the subject too mathematical or specialized. But you have one thing lacking, no fault-finding strategy. Seasoned professional designers have that peculiar knowledge of their own work and specialized knowledge of its components to allow them to analyze and remove faults quickly on the spot (design errors take a little longer!). Fault finders can never have this depth of specialization; commercial pressures demand a minimum-knowledge-to-do-the-job approach. Practical Electronic Fault Finding and Troubleshooting describes the fundamental principles of analog and digital fault finding (although of course there is no such thing as a `digital fault' - all faults are by nature analog). This book is written entirely for a fault finder using only the basic fault-finding equipment: a digital multimeter and an oscilloscope. The treatment is non-mathematical (apart from Ohm's Law) and all jargon is strictly avoided. Robin Pain was originally trained to service color TV, and has worked as an industrial fault finder for manufacturers of mobile radio, audio equipment, microcomputers and medical equipment. He has lectured at home and abroad on microcomputer fault finding More ...
  Practical Radio Frequency Test and Measurement A Technician's Handbook The book will teach readers the basics of performing the tests and measurements used in radio-frequency systems installation, proof of performance, maintenance, and troubleshooting. Practical Radio Frequency Test and Measurement teaches readers the basics of performing the tests and measurements used in radio-frequency systems installation, proof of performance, maintenance, and troubleshooting. Anyone interested in gaining more practical proficiency with RF, whether engineer, technician, amateur radio buff, or hobbyist, needs a copy of this book. Joseph J. Carr, himself an accomplished practitioner in this field, examines the instruments used in the various types of measurement before moving on to specific measurement methods. Carr includes information on basic theories of RF measurement, as well as test equipment, test set-ups, test and measurement procedures, and interpretation of results. More ...
  Principles of Testing Electronic Systems A pragmatic approach to testing electronic systems. As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way–learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today’s very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: · An explanation of where a test belongs in the design flow · Detailed discussion of scan-path and ordering of scan-chains · BIST solutions for embedded logic and memory blocks · Test methodologies for FPGAs · A chapter on testing system on a chip · Numerous references More ...
  Printed Circuit Board Design Techniques for EMC Compliance : A Handbook for Designers "Electromagnetic compatibility (EMC) is an engineering discipline often identified as “black magic.” This belief exists because the fundamental mechanisms on how radio frequency (RF) energy is developed within a printed circuit board (PCB) is not well understood by practicing engineers. Rigorous mathematical analysis is not required to design a PCB. Using basic EMC theory and converting complex concepts into simple analogies helps engineers understand the mitigation process that deters EMC events from occurring. This user-friendly reference covers a broad spectrum of information never before published, and is as fluid and comprehensive as the first edition. The simplified approach to PCB design and layout is based on real-life experience, training, and knowledge. Printed Circuit Board Techniques for EMC Compliance, Second Edition will help prevent the emission or reception of unwanted RF energy generated by components and interconnects, thus achieving acceptable levels of EMC for electrical equipment. It prepares one for complying with stringent domestic and international regulatory requirements. Also, it teaches how to solve complex problems with a minimal amount of theory and math. Essential topics discussed include: Introduction to EMC Interconnects and I/O PCB basics Electrostatic discharge protection Bypassing and decoupling Backplanes–Ribbon Cables–Daughter Cards Clock Circuits–Trace Routing–Terminations Miscellaneous design techniques This rules-driven book—formatted for quick access and cross-reference—is ideal for electrical and EMC engineers, consultants, technicians, and PCB designers regardless of experience or educational background." Sponsored by: IEEE Electromagnetic Compatibility Society More ...
  Production Testing of RF and System-On-A-Chip Devices for Wireless Communications With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment. More ...
  PSIBER PINGER PLUS NETWORK IP TESTER The Pinger Plus+ is a unique handheld tester used for installing and maintaining computer Local Area Networks (LANs) running the TCP/IP protocol. It PINGS at 10 or 100 mbps to verify connectivity, check transmitted and received data integrity, indicate network traffic loading by measuring round trip time, provide the MAC address of an IP address and warns when default gateway cannot be located. The Pinger Plus+ can PING using variable packet sizes up to 99 times consecutively. In addition, PING can be used for a single or a range of IP addresses. The Pinger Plus+ also identifies reversed polarity for improperly connected wire pairs and provides a port identification feature with selectable blink rates to identify to which port on a hub or switch the wall outlet is connected. The Pinger Plus+ is the first handheld tester to provide gigabit over copper link detection. When connected to a hub, switch or NIC, the Pinger Plus+ displays the speed (10/100/1000Mbps) and duplex mode (half or full) capabilities of the equipment. The Pinger Plus+ is an ideal tool for quickly testing proper LAN operation after completing a move, add or change (MAC). Trouble calls are easily handled by verifying Link connection and running the comprehensive PING test. Resolve I can not connect to the Internet problems with the DHCP client mode. Remote office support can be provided by connecting the Pinger Plus+ to the LAN at the remote office trouble point and PINGing the tester over the Internet. More ...
  Radio Frequency and Microwave Electronics Illustrated Learn the fundamentals of RF and microwave electronics visually, using many thoroughly tested, practical examples RF and microwave technology are essential throughout industry and to a world of new applications-in wireless communications, in Direct Broadcast TV, in Global Positioning System (GPS), in healthcare, medical and many other sciences. Whether you're seeking to strengthen your skills or enter the field for the first time, Radio Frequency and Microwave Electronics Illustrated is the fastest way to master every key measurement, electronic, and design principle you need to be effective. Dr. Matthew Radmanesh uses easy mathematics and a highly graphical approach with scores of examples to bring about a total comprehension of the subject. Along the way, he clearly introduces everything from wave propagation to impedance matching in transmission line circuits, microwave linear amplifiers to hard-core nonlinear active circuit design in Microwave Integrated Circuits (MICs). Coverage includes: · A scientific framework for learning RF and microwaves easily and effectively · Fundamental RF and microwave concepts and their applications · The characterization of two-port networks at RF and microwaves using S-parameters · Use of the Smith Chart to simplify analysis of complex design problems · Key design considerations for microwave amplifiers: stability, gain, and noise · Workable considerations in the design of practical active circuits: amplifiers, oscillators , frequency converters, control circuits · RF and Microwave Integrated Circuits (MICs) · Novel use of "live math" in circuit analysis and design Dr. Radmanesh has drawn upon his many years of practical experience in the microwave industry and educational arena to introduce an exceptionally wide range of practical concepts and design methodology and techniques in the most comprehensible fashion. Applications include small-signal, narrow-band, low noise, broadband and multistage transistor amplifiers; large signal/high power amplifiers; microwave transistor oscillators, negative-resistance circuits, microwave mixers, rectifiers and detectors, switches, phase shifters and attenuators. The book is intended to provide a workable knowledge and intuitive understanding of RF and microwave electronic circuit design. Radio Frequency and Microwave Electronics Illustrated includes a comprehensive glossary, plus appendices covering key symbols, physical constants, mathematical identities/formulas, classical laws of electricity and magnetism, Computer-Aided-Design (CAD) examples and more. About the CD-ROM T The accompanying CD-ROM is an "E-Book" containing actual design examples and methodology from the text, in Microsoft Excel environment, where files can easily be manipulated with fresh data for a new design. More ...
Random Vibration, Shock Testing, HALT, ESS, HASS Measurements, Analysis and Calibration Upon completion of this short course, you will be able to measure vibration and shock, calibrate vibration and shock measurement systems, convert measured data into a test program, interpret vibration and shock test requirements, conduct vibration and shock tests, design suitable vibration and shock test fixtures. Details
  Research Perspectives and Case Studies in Systems Test and Diagnosis System level testing is becoming increasingly important. It is driven by the incessant march of complexity ... which is forcing us to renew our thinking on the processes and procedures that we apply to test and diagnosis of systems. In fact, the complexity defines the system itself which, for our purposes, is 'any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail'. System approaches embody the partitioning of problems into smaller inter-related subsystems that will be solved together. Thus, words like hierarchical, dependence, inference, model, and partitioning are frequent throughout this text. Each of the authors deals with the complexity issue in a similar fashion, but the real value in a collected work such as this is in the subtle differences that may lead to synthesized approaches that allow even more progress. The works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. The first such workshop was held in Freiburg, Germany, six years earlier. In the current workshop nearly 50 experts from around the world struggled over issues concerning the subject... In this volume, a select group of workshop participants was invited to provide a chapter that expanded their workshop presentations and incorporated their workshop interactions... While we have attempted to present the work as one volume and requested some revision to the work, the content of the individual chapters was not edited significantly. Consequently, you will see different approaches to solving the same problems and occasional disagreement between authors as to definitions or the importance of factors.... The works collected in this volume represent the state-of-the-art in system test and diagnosis, and the authors are at the leading edge of that science... More ...
  RF Measurements of Die and Packages The explosion in the wireless industry, coupled with the higher frequencies in today’s digital integrated circuits (IC) has made vital the need for accurate IC testing. This is the first book dedicated to the issues surrounding RFIC testing. An important resource for RFIC designers and high-frequency digital IC designers, IC test engineers, and IC manufacturing test engineers, this ground breaking resource helps you perform high-accuracy RF measurements of die and packages in the RF test lab, employ RF coplanar probes for accurate on-wafer characterization, and troubleshoot and utilize coplanar probes and test fixtures to extend their lifetime. Moreover, the book shows you how to build RF test systems for noise, high-power, and thermal testing, and de-embed the test system’s parasitic effects to get the die’s RF performance. This timely resource defines the essential elements in an RF system, explains where errors can be found in such a system, and shows how to mathematically remove them with calibration. It discusses the construction of both coplanar and high-volume testing membrane probes. The book details how to use coplanar probes to characterize individual die on the wafer, describes three popular RF test systems, and concludes with an explanation of how to characterize packages. Contents: Preface. Introduction. Calibration. Probes and Fixtures. Planarization. Repeatability. Performing Device Characterization. Characterizing Packaged Parts and Empty Packages. Summary: the Future. Appendix. More ...
  Sensors & Transducers: A Guide for Technicians, 3rd edition This book provides coverage of the theory, practice, applications and circuit use of electronic sensors and transducers. Describes a large range of devices, some for industrial, some for domestic use, some for use only in research laboratories. The sensors and transducers are grouped according to the physical effect that they detect or convert making the book an excellent reference source. There is a vast amount of information contained in the book, very well presented and explained, and with many diagrams and tables to help your understanding. It more than adequately meets its specified goal of 'proving useful to anyone who encounters sensors and transducers, whether from the point of view of specification, design, servicing or education'. More ...
  Simulation Methods for ESD Protection Development Simulation Methods for ESD Protection Development looks at the integration of new techniques into a comprehensive development flow, which is now available due advances made in the field during the recent years. These findings allow for an early, stable ESD concept at a very early stage of the technology development, which is essential now development cycles have been reduced. The book also offers ways of increasing the optimization and control of the technology concerning performance. Thus making the process more cost effective and increasingly efficient This title provides a guide through the latest research and technology presenting the ESD protection development methodology. This is based on a combination of process, device and circuit stimulation, and addresses the optimization of the industry critical issue, reduced development cycles.Written to address the needs of the ESD engineer, this text is required reading by all industry practitioners and researchers and students within this field. More ...
  SMTA Testability Guidelines 101C - Single User Copy Led by SMTA Testability Committee chair Louis Y. Ungar of A.T.E. Solutions, Inc., these SMTA Testability Guidelines were developed by various Task Forces. The work of the various Task Forces is featured as separate chapters. A general format applies to each task force, and it was intended to assist the reader in dealing with the testability considerations that need to go into the design, development, and test of a product. Each chapter begins with an introduction intended to put into perspective the enumerated guidelines that follow. Finally, a glossary is provided, and a reference section is included for further research. These guidelines can now be downloaded under either a Single-User license (only one copy – no sharing) or under a Site-License (everyone at your physical location –site) can use it both in hard or soft form. You may purchase a Single-User copy now, and update at a later time – but you will save $39.95 if you buy the Site-License copy now. Instead of this Single User Copy, select the Site License copy and save! You can compare the licenses here before you buy. More ...
  SMTA Testability Guidelines 101C - Site License for Everyone at your Facility If you already own the Single User Copy, you can upgrade to include everyone at your facility or you can save $39.95 by buying the more versatile Site License now. Led by SMTA Testability Committee chair Louis Y. Ungar of A.T.E. Solutions, Inc., these SMTA Testability Guidelines were developed by various Task Forces. The work of the various Task Forces is featured as separate chapters. A general format applies to each task force, and it was intended to assist the reader in dealing with the testability considerations that need to go into the design, development, and test of a product. Each chapter begins with an introduction intended to put into perspective the enumerated guidelines that follow. Finally, a glossary is provided, and a reference section is included for further research. Download this valuable document and have all your designs testable - today. You can compare the licenses here before you buy. More ...
  SOC (System-on-a-Chip) Testing for Plug and Play Test Automation System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing. More ...
  SOC Testing for Plug and Play Test Automation System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. More ...
Software Design for Testability (SDFT) The latest theory and practice of Software Design for Testability (SDFT) will be explained, primarily through comparisons and analogies to the well-established discipline of hardware DFT. Details
  Software System Testing and Quality Assurance While many sources tell you how to design, implement, and operate a system, few provide the practical guidance needed to ensure reliable operation of software in all stages of development. This comprehensive guide to system testing and quality assurance does. More ...
Software Test, Reliability and Quality Assurance You will get practical answers to the following questions: When should you start testing and when can you stop testing? How do you predict software bug rates? Which defects are acceptable and why? What software metrics should be collected to measure testing progress? How do you plan for testing, debugging, and fixing software? What can you look for in code to verify that software reliability has been designed into the software? This course prepares you to create better software and to evaluate software produced by others. Details
Standards in Test You will be introduced to most of the Military and Commercial Standards that affect the way test is performed and interpreted by both military and commercial concerns. Details
  Structured Logic Design with VHDL Previous books on this subject have concentrated just on the VHDL hardware description language without really teaching the design, process. This new reference really shows how to design with VHDL in a synthesis context. Unlike the other books, it teaches the VHDL language in detail and gives numerous examples of VHDL models used in different aspects of the design process; describes design at three different levels of abstraction: algorithmic, data flow, and gate level; illustrates the design of combinational and sequential logic at these three levels; and illustrates various forms of control unit design. For practicing engineers involved in digital design and those interested in the development of methods for computer aided design. More ...
  Successful Implementation of Concurrent Engineering Products and Processes Successful Implementation of Concurrent Engineering Products and Processes Edited by Sammy G. Shina Sammy G. Shina’s bestselling Concurrent Engineering and Design for Manufacture of Electronics Products demonstrated clearly how concurrent engineering can reduce time to market, improve design and product quality, increase employee activity, lower overall costs, and help boost customer satisfaction. Now, this natural follow-up book demonstrates through the use of case studies how the tools and methodologies of concurrent engineering have been successfully implemented at companies of varying size, scope, product type, and strategy. Professor Shina describes how these companies successfully implemented concurrent engineering through an interdisciplinary team environment and by their adaptation of concurrent engineering’s tools and methods to meet their particular needs. In many instances, the case study represents the company’s first experience with concurrent engineering. Successful Implementation of Concurrent Engineering Products and Processes serves as a working guide to putting concurrent engineering principles into action. Its unique coverage: identifies the elements of both successful and unsuccessful implementations teaches engineers how to plan and proceed for success demonstrates clear "before and after" comparisons features examples from projects at major firms such as Hewlett-Packard, Northern Telecom, Sun Microsystems, and others The case studies are augmented with detailed advice and techniques for measuring and analyzing product and process development data. Each case study is told by a principal member of the team and presents a brief chronology of the history and events that led to the successful implementation of the concurrent engineering effort and documents its results. Both product and process development projects are outlined, and the case studies represent how actual products and processes met their original goals and objectives. This advanced implementation guide is a must-have resource for every designer and firm that wishes to capitalize on the efficiency and profitability inherent in concurrent engineering. More ...
  System Validation and Verification Covers all aspects of validation and verification and their use as problem-solving tools Contains helpful figures and tables to support the text Includes both theory and practical methods Historically, the terms validation and verification have been very loosely defined in the system engineering world, with predictable confusion. Few hardware or software testing texts even touch upon validation and verification, despite the fact that, properly employed, these test tools offer system and test engineers powerful techniques for identifying and solving problems early in the design process. Together, validation and verification encompass testing, analysis, demonstration, and examination methods used to determine whether a proposed design will satisfy system requirements. System Validation and Verification offers, for the first time in a single reference, clear definitions of the terms and detailed information on using these fundamental tools for problem solving. It smoothes the transition between requirements and design by providing methods to evaluate a given approach's ability to satisfy demanding technical requirements. With System Validation and Verification, system and test engineers and project managers will gain confidence in their designs and lessen the likelihood of serious problems cropping up late in the program. In addition to explanations of the theories behind the concepts, the book includes practical methods for each step of the process, examples from the author's considerable firsthand experience, and illustrations and tables to support the ideas presented in the text. Although not primarily a textbook, System Validation and Verification is based in part on validation and verification courses taught by the author and is an excellent supplemental reference for engineering students. In addition to its usefulness to system engineers, the book will be valuable to a wider audience including manufacturing, design, software , and risk management project engineers - anyone involved in large systems design projects. More ...
  System-level Test and Validation of Hardware/Software Systems New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability. More ...
  System-on-a-Chip: Design and Test Starting with a basic overview of system-on-a-chip (SoC), including definitions of related terms, this new book helps you understand SoC design challenges, and the latest design and test methodologies. You see how ASIC technology evolved to an embedded cores-based concept that includes pre-designed, reusable Intellectual Property (IP) cores that act as microprocessors, data storage devices, DSP, bus control, and interfaces -- all "stitched" together by a User’s Defined Logic (UDL). Part One features a discussion of SoC-related design difficulties including hardware-software co-design, reuse design, and cores design. You get practical, real-world design guidance referencing actual product specifications, delivery requirements, and system integration requirements in use by commercial enterprises and under evaluation by the SoC community. Significant attention is paid to the rules and guidelines for making SoC design reusable, including RTL coding guidelines and design validation. Part One concludes with the information you need to develop test benches at both the cores and SoC level. Part Two contains a review of the challenges you face in testing SoC and test methodologies for overcoming these hurdles. Test methods for embedded logic cores, microprocessor cores, micro-controller cores and large memory blocks are included, as well as methods for testing embedded analog and mixed-signal circuits, and Iddq testing on SoC. You also get an overview of material handling, speed-binning, and production flow to apply your knowledge to actual production processes. System-on-a-Chip: Design and Test is an excellent, one-stop reference for SoC and ASIC design engineers, IP designers and providers, and test engineers seeking comprehensive information on SoC design, testing, and production. Contents: Part One - Design. Introduction. Design Methodology for SoC Logic Cores. RTL Guidelines for Design Reuse. Verification. Design Validation. Design Examples. Part Two - Test. Introduction to SoC Testing of Logic Cores. Testing of Embedded Memories. Testing of Analog and Mixed-Signal Circuits. IDDQ Testing. Production Testing. Summary and Conclusion. More ...
  Systematic Software Testing Gain an in-depth understanding of software testing management and process issues that are critical for delivering high-quality software on time and within budget. Written by leading experts in the field, this book offers those involved in building and maintaining complex, mission-critical software systems a flexible, risk-based process to improve their software testing capabilities. Whether your organization currently has a well-defined testing process or almost no process, Systematic Software Testing provides unique insights into better ways to test your software. This book describes how to use a preventive method of testing, which parallels the software development lifecycle, and explains how to create and subsequently use test plans, test design, and test metrics. Detailed instructions are presented to help you decide what to test, how to prioritize tests, and when testing is complete. Learn how to conduct risk analysis and measure test effectiveness to maximize the efficiency of your testing efforts. Because organizational structure, the right people, and management are keys to better software testing, Systematic Software Testing explains these issues with the insight of the authors’ more than 25 years of experience. Contents: Preface. Acknowledgments. An Overview of the Testing Process - A Brief History of Testing. STEPTM Testing Process. Risk Analysis - What is Risk? Software Risk Analysis. Planning Risks and Contingencies. Master Test Planning - Levels (Stages) of Test Planning. Audience Analysis. Activity Timing. Standard Templates. Sections of a Test Plan. Detailed Test Planning - Acceptance Testing. System Testing. Integration Testing. Unit Testing. Analysis and Design - Creating Inventories. Black Box vs. White Box. Black Box Science. Black Box Art. White Box Science. Test Design Documentation. Test Implementation - Test Environment. Model Office Concept. What Should be Automated? Avoiding Testing Tool Traps. Evaluating Testware. Test Execution - Before Beginning Test Execution. Test Log. Test Incident Reports. Testing Status and Results. When Are We Done Testing? Measuring Test Effectiveness. The Test Organization - Test Organizations. Office Environment. The Software Tester - Characteristics of Good Testers. Finding Good Testers. Hiring Testers. How Many Testers Do You Need? Retaining Staff. Software Tester Certifications. The Test Manager - What Is Management? Management vs. Leadership. Marine Corps Principles of Leadership. The Test Manager As a Leader. The Test Manager’s Role in the Team. The Test Manager’s Role in Training. Metrics Primer for Test Managers. Improving the Testing Process - Improving the Testing Process. ISO Certification. Capability Maturity Model (CMM). Test Process Improvement (TPI) Model. Continuous Improvement. Some Final Thoughts - Use Preventive Testing Techniques. Conduct Software Risk Analysis. Determine Planning Risks. Develop a Testing Strategy. Use Inventories. Use Testing Tools When Appropriate. Analyze Defect Trends and Patterns. Measure Test Effectiveness. Conduct Training Continually. Sell the Idea of Testing. More ...
  Telecommunication Wiring , 2nd Edition From planning to troubleshooting...All you need to know to make wiring a competitive advantage! More than almost anything else, your wiring plant determines whether you can run tomorrow's business-critical networked applications, fully leverage Internet technologies, and support the rapidly-changing needs of your organization. Telecommunications Wiring, Second Edition is the up-to-date, complete guide to making sure your wiring delivers the results you need-today, and for many years to come. From planning new wiring to systematizing and improving what you've already got, you'll find everything you need to know, including: Creating bid proposals that lead to successful, cost-effective installations Practical guidance on architecting or evolving a wiring system Proven plans and techniques for managing installation Documenting and standardizing cabling systems-including how to design a Telecommunications database Ensuring cable security Understanding fundamental wiring theory and practice Telecommunications Wiring, Second Edition offers a coherent, end-to-end approach to designing a cabling system, selecting media, choosing vendors, documenting the system, and streamlining maintenance. It covers both twisted-pair and fiber optic systems, presenting extensive troubleshooting help-and real-world guidance on avoiding problems in the first place. Whether you're a telecommunications or IT professional, technician or manager with responsibility for wiring systems, this is the single source for the information you need most. More ...
  Test and Design-For-Testability in Mixed-Signal Integrated Circuits Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field. More ...
  Test Engineering: A Concise Guide to Cost-effective Design, Development and Manufacture Testing is usually the most expensive, time-consuming and difficult activity during the development of engineering products and systems. Development testing must be performed to ensure that designs meet requirements for performance, safety, durability, reliability, statutory aspects, etc. Most manufactured items must be tested to ensure that they are correctly made. However, much of the testing that is performed in industry is based upon traditions, standards and procedures that do not provide the optimum balance of assurance versus cost and time. There is often pressure to reduce testing because of the high costs involved, without appreciation of the effects on performance, reliability. etc. Misperceptions are commonplace, particularly the idea that tests should not stress products in excess of their operating levels. The main reason for this situation seems to be that engineers have not developed a consistent philosophy and methodology for testing. Testing is seldom taught as part of engineering curricula, and there are no books on the subject. Specialist areas are taught, for example fatigue testing to mechanical engineers and digital device testing to electronics engineers. However, a wide range is untaught, particularly multidisciplinary and systems aspects. Testing is not just an engineering issue. Because of the importance and magnitude of the economic and business aspects testing is an issue for management. Testing is perceived as a high cost activity, when it should be considered as a value-adding process. The objective of this book is, therefore, to propose a philosophy of engineering test and to describe the necessary technologies and methods that will provide a foundation for all plans, methods and decisions related to testing of engineered products and systems. The book will help those who must manage and conduct this most difficult and uncertain task. It will also provide a text, which can be used as the basis for teaching the principles of testing to all engineering students. More ...
  Test Procedures for Basic Electronics This introductory book about electronics testing details numerous test and measurement procedures with emphasis on the use of commonly available instruments. Through the use of clear and concise diagrams, accurate illustrations, and the application of basic principles, the text details the whats and whys of measuring and testing of electronic and electrical quantities. Everyone from students and hobbyists to professionals will benefit from this practical guide to electronic testing. More ...
  Test Resource Partitioning for System-on-a-Chip Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into "virtual sockets" on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator. The goal of the book is to position test resource partitioning in the context of SOC test automation, as well as to generate interest and motivate research on this important topic. SOC integrated circuits composed of embedded cores are now commonplace. Nevertheless, There remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design, and test challenges are a major contributor to the widening gap between design capability and manufacturing capacity. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. Test Resource Partitioning for System-on-a-Chip responds to a pressing need for a structured methodology for SOC test automation. It presents new techniques for the partitioning and optimization of the three major SOC test resources: test hardware, testing time and test data volume. Test Resource Partitioning for System-on-a-Chip paves the way for a powerful integrated framework to automate the test flow for a large number of cores in an SOC in a plug-and-play fashion. The framework presented allows the system integrator to reduce test cost and meet short time-to-market requirements. More ...
  Test Solutions For Digital Networks New telecommunications methods and the liberalization of the market have meant that network providers, city carriers, and systems manufacturers are faced with new challenges and problems: How does SDH work? How do you line up an SDH cross connect? How is the quality of service determined for ATM? How is it possible to determine guaranteed specifications for a 2 Mbit/s leased line? Is separate test equipment needed? What criteria should be used when selecting test equipment? These and similar questions are answered in this book. It is intended as a source of practical help and advice, and as a reference work on the subject of test solutions for digital networks. More ...
  Testability Concepts for Digital ICs: The Macro Test Approach Throughout the 1980s and 1990s, the theory and practice of testing electronic products has changed considerably. Quality and testing have become inextricably linked and both are fundamental to the generation of revenue to a company, helping the company to remain profitable and therefore survive. Testing plays an important role in assessing the quality of a product. The tester acts as a filter, separating good products from bad. Unfortunately, the tester can pass bad products and fail good products, and the generation of high quality tests has become complex and time consuming. To achieve significant reduction in time and cost of testing, the role and responsibility of testing has to be considered across an entire organization and product development process. Testability Concepts for Digital ICs: The Macro Test Approach considers testability aspects for digital ICs. The strategy taken is to integrate the testability aspects into the design and manufacturing of ICs and, for each IC design project, to give a precise definition of the boundary conditions, responsibilities, interfaces and communications between persons, and quality targets. Macro Test, a design-for-Testability approach, provides a manageable test program route. Using the Macro Test approach, one can explore alternative solutions to satisfy pre-defined levels of performance (e.g. defect detection, defect location, test application) within a pre-defined cost budget and time scale. Testability Concepts for Digital ICs is the first book to present a tried and proven method of using a Macro approach to testing complex ICs and is of particular interest to all test engineers, IC designers and managers concerned with producing high quality ICs. More ...
  Testing and Testable Design of High-Density Random-Access Memories Testing and Testable Design of High-Density Random-Access Memories deals with the study of fault modeling, testing and testable design of semiconductor random-access memories. It is written primarily for the practicing design engineer and the manufacturer of random-access memories (RAMs) of the modern age. It provides useful exposure to state-of-the-art testing schemes and testable design approaches for RAMs. It is also useful as a supplementary text for undergraduate courses on testing and testability of RAMs. Testing and Testable Design of High-Density Random-Access Memories presents an integrated approach to state-of-the-art testing and testable design techniques for RAMs. These new techniques are being used for increasing the memory testability and for lowering the cost of test equipment. Semiconductor memories are an essential component of digital computers - they are used as primary storage devices. They are used in almost all home electronic equipment, in hospitals and for avionics and space applications. From hand-held electronic calculators to supercomputers, we have seen generations of memories that have progressively become smaller, smarter and cheaper. For the past two decades there has been vigorous research in semiconductor memory design and testing. Such research has resulted in bringing the dynamic RAM (DRAM) to the forefront of the microelectronics industry in terms of achievable integration levels, high performance, high reliability, low power and low cost. The DRAM is regarded as the technological driver for the commercial microelectronics industry. Testing and Testable Design of High-Density Random-Access Memories deals with real- world examples that will be useful to readers. This book also provides college and university students with a systematic exposure to a wide spectrum of issues related to RAM testing and testable design. More ...
  Testing Applications on the Web: Test Planning for Internet-Based Systems A software testing survival guide for those who work in Internet time With Internet applications spreading like wildfire, the field of software testing is increasingly challenged by the brave new networked world of e-business. This book brings you up to speed on the technologies, testing concepts, and tools you will need to run e-business applications on the Web. Written by Hung Nguyen, a coauthor of the bestselling software testing book of all time, Testing Computer Software, this new guide takes you to the next level, helping you apply your existing skills to the testing of B2B (Business-to-Business), B2C (Business-to-Consumer), and internal Web-based applications. You ll learn how to test transactions across networks, explore complex systems for errors, and work efficiently with the many components at play - from servers to browsers to protocols. Most importantly, you will get detailed instructions on how to carry out specific test types along with case studies and error examples for each test. Software testers, test leads and test managers, QA analysts and managers, and IT managers and staff will find this an invaluable resource for their testing projects. With an emphasis on achievable goals and necessary rather than nice-to-have features, Testing Applications on the Web provides: · An analysis of the Web-application model and the difference between Web testing and traditional testing · A tutorial on the methodology and techniques for networking technologies and component-based testing · Strategies for test planning, test case designing, and error analysis on the Web · Effective real-world practices for UI (User Interface) tests, security tests, installation tests, load and stress tests, database tests, and more · A survey of commercial tools and a sampling of proven test matrices and templates More ...
  Testing of Digital Systems Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference. More ...
  The Automatic Test Equipment (ATE) Library Collection We selected the 14 of the best titles for your library with the intent of providing all the information you need to understand how to identify, select, specify, build, program and maintain an ATE. The combined list price of individual books is considerably higher. We update the selections based on availability and how they apply to current needs. See a list in The Test Library Collection More ...
  The Boundary-Scan Handbook, Third Edition Analog and Digital Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, and popularly called the JTAG standard, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily deal with. IEEE standards, when embraced by practicing engineers, are living entities that grow and change quickly. The Boundary-Scan Handbook, Second Edition: Analog and Digital is intended to describe these standards in simple English rather than the strict and pedantic legalese encountered in the standards. The 1149.1 standard is now over eight years old and has a large infrastructure of support in the electronics industry. Today, the majority of custom ICs and programmable devices contain 1149.1. New applications for the 1149.1 protocol have been introduced, most notably the `In-System Configuration' (ISC) capability for Field Programmable Gate Arrays (FPGAs). The Boundary-Scan Handbook, Second Edition: Analog and Digital updates the information about IEEE Std. 1149.1, including the 1993 supplement that added new silicon functionality and the 1994 supplement that formalized the BSDL language definition. In addition, the new second edition presents completely new information about the newly approved 1149.4 standard often termed `Analog Boundary-Scan'. Along with this is a discussion of Analog Metrology needed to make use of 1149.1. This forms a toolset essential for testing boards and systems of the future. More ...
  The Design for Testability and Built-In Self Test (DFT/BIST) Library Collection We selected 21 of the best books on the subjec for your company library with the intent of providing all the information you need to understand Design for Testability and Built-In Self-Test for analog, digital, mixed signal, board-leve, system-level,system-on-a-chip and even for a formal approach. The combined list price of individual books is considerably higher. We update the selections based on availability and how they apply to current needs. See a list in The Test Library Collection More ...
The Economics of Test and Testability Why test is a solution to an economic problem How non-technical management views return on investment (ROI) and how to translate technical benefits to these terms Existing formulas for the cost and benefits of IC, board, and system tests How behavioral economics applies to test and what we can learn from it. Details
  The Switch Book: The Complete Guide to LAN Switching Technology The most in-depth guide to the capabilities, application, and design of LAN switches and switched internetworksWritten by an innovator who has been at the forefront of networking technology for more than two decades, this comprehensive book covers everything you need to know about LAN switching. From understanding switch functions and features to technology integration and network management, it provides valuable insights for network planners, developers, and managers. Seifert helps you gain a clear understanding of the often-complex features and options available in LAN switches, along with detailed explanations of the latest technology enhancements–including previously unpublished information on Link Aggregation, Virtual LANs, and Layer 3 switches. Packed with the most up-to-date and complete information on LAN switches, this book: Explains how switches and bridges operate, and explores implementation and performance issues Details how switches can be deployed in both homogeneous and heterogeneous LAN environments Provides a comprehensive explanation of the Spanning Tree Protocol Covers source routing, which is available on Token Ring and FDDI networks Explains full duplex LAN operation and link flow control methods Looks at the applications and IEEE 802.3ad standard for aggregated links and their effect on system and higher-layer protocol behavior Introduces Virtual LANs and the IEEE 802.1Q standard Discusses the Simple Network Management Protocol (SNMP) as well as other forms of itch management Explores the architecture and data flow through a typical switch, including an analysis of switch fabric options More ...
  The Test Flow Simulator This software product is a test strategy economics calculator. It was designed for manufacturers who are confused about the type of test equipment they should buy. This simple-to use software runs with Microsoft Excel and many popular spreadsheet programs and provides the calculations necessary to predict your overall test, repair and penalty costs. With this software you will be able to compare alternative test strategies and predict which will be best for you. You can estimate your test, repair and penalty costs for various test strategies and choices of ATE. You can try a number of scenarios and learn how a change in equipment or in test methods would influence your bottom line costs. Calculate your actual savings. The Test Flow Simulator comes with an extensive manual and our recommendations on what to look for in your ATE selections. More ...
  The Testability Director This low priced software is used to motivate and evaluate testability practices in your organization. It contains hundreds of guidelines for meeting different types of testability criteria, including ASIC design, Analog, Digital, System Level and Built-In Test. The software runs with Microsoft Excel and many popular spreadsheet programs and contains tutorials on interpreting and scoring each criterion. It is truly the painless way to bring Design for Testability into your organization. See it at Testability Director Web Page More ...
  Thermal Testing of Integrated Circuits Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. Abnormal status of this variable, both too high and too low, is sign of abnormal behavior in electronic systems. In Thermal Testing of Integrated Circuits the authors present the feasibility to consider temperature as an observable for testing purposes. The coupling of circuits thtough heat is inherent to the solid-state nature and the inspection of temperature does not interact with Under Test Circuits or Systems, something that does not happen when voltage or current observable are used. In the book the basis of heat propagation, heat conducting mechanisms and temperature sensitivity of semiconductors are focused with a full coverage of the state of the art. We usually have the idea that all the heating processes are slow, which is true in the macroscopic world, but is not in the case of integrated circuits where the reduced size and amount of material and the really high conductivity of substrates make the thermal testing a promising technique. CMOS and BICMOS temperature sensors for built-in thermal testing are presented in the book. The application of temperature as testing magnitude for both on-line and off-line, analog or digital, on-chip or off-chip are considered. The temperature sensing has an inherent directional capability that can be used as an element for localizing failures, so the technique has interesting diagnosis capabilities as well. More ...
  Traceable Temperatures: An Introduction to Temperature Measurement and Calibration, 2nd Edition The accurate measurement of temperature is a vital parameter in many fields. A critically important aspect of applying any temperature sensor is that of traceable calibration - a concept that has been developed to ensure that all measurements made are accurate and legally valid. This timely new edition reflects the marked move towards ISO accreditation in measurement laboratories internationally, and the ever increasing emphasis on adequate uncertainty analysis for measurements in accredited laboratories to conform to national and international bodies, and the SI and Metric treaty. · Fully revised and updated to incorporate the latest trends and developments in measurements and calibration · Provides information concurrent with the latest ISO Quality Standards for assessing the uncertainty of measurement sensors · Offers detailed converage of traceability, how to make traceable measurements and how to design, carry out and report calibration · Unique emphasis on possible problems in the field, and provision of practical advice on how to recognise and treat errors. An essential reference resource for practising and training engineers, scientists and technicians in accredited test and calibration laboratories involved in temperature measurement and calibration. More ...
  Tube Testers and Classic Electronic Test Gear Provides an overview of pre-1970 (the vacuum tube era) radio test equipment. It begins with an extensive discussion of tube testing and use of testers, and progresses into curve tracing. The different types of testers are compared; emission, dynamic and mutual conductance, and testers from 23 different manufacturers are tabulated and pictured. The book also covers VOMs, VTVMs, Q Meters, Grid Dip Meters, Capacitance and Inductance Bridges, Signal Generators, Signal Tracers and Oscilloscopes. It includes brief company histories of the manufacturers. Useful for radio collectors, vacuum tube enthusiasts and historians. Over 300 photos and illustrations. More ...
  Using WAVES and VHDL for Effective Design and Testing The proliferation and growth of Electronic Design Automation (EDA) has spawned many diverse and interesting technologies. One of the most prominent of these technologies is the VHSIC Hardware Description Language, or VHDL. VHDL permits designers of digital modules, components, systems, and even networks to describe their designs both structurally and behaviorally. VHDL also allows simulation of the designs in order to investigate their performance prior to actually implementing them in hardware. Having gained the ability to simulate designs once encoded in VHDL, designers were naturally confronted with the issue of testing these designs. VHDL did not explicitly address the requirement to insert particular digital waveforms, often termed test vectors or patterns, or to subsequently assess the correctness of the response from some digital entity. In a distributed design environment, or even in an isolated one where the design was subject to review or scrutiny by another organization, de-facto methods of testing and evaluating results proved faulty. The reason was a lack of standardization. When organization A designed a circuit and tested it with their self-developed test tools it had a certain behavior. When it was delivered to organization B and B tested it using their test tools, the behavior was different. Was the fault in the circuit, in A's tools, or in B's tools? The only way to resolve this was for both organizations to agree on a test apparatus, validate its correctness and use it consistently. While VHDL was an IEEE standard language, and consistency among myriad designers was fairly well guaranteed, no such standard existed for test waveform generation and assessment. Hence, the value of standardization in the design language was being negated by the lack of such a standard for testing. The Waveform and Vector Exchange Specification, or WAVES, was conceived and designed to solve this testing problem - and it has. Being both a subset of VHDL itself, as well as an IEEE standard, it guarantees both conformity among multiple applications and easy integration with VHDL units under test (UUTs). Using WAVES and VHDL for Effective Design and Testing will serve many purposes. For the WAVES beginner, its tutorial will make the application of WAVES in typical, standard usage straightforward and convenient. For the more advanced user, the advanced topics will provide insight into the nuances of these useful capabilities. For all users, the tools, templates and examples given in the chapters, as well as on the companion disk, will provide a practical starting foundation for using WAVES and VHDL. More ...
  Verification Methodology for System Verilog Functional verification remains one of the single biggest challenges in the development of complex system-on-chip (SoC) devices. Despite the introduction of successive new technologies, the gap between design capability and verification confidence continues to widen. The biggest problem is that these diverse new technologies have led to a proliferation of verification point tools, most with their own languages and methodologies. Fortunately, a solution is at hand. SystemVerilog is a unified language that serves both design and verification engineers by including RTL design constructs, assertions and a rich set of verification constructs. SystemVerilog is an industry standard that is well supported by a wide range of verification tools and platforms. A single language fosters the development of a unified simulation-based verification tool or platform. Consolidation of point tools into a unified platform and convergence to a unified language enable the development of a unified verification methodology that can be used on a wide range of SoC projects. ARM and Synopsys have worked together to define just such a methodology in the Verification Methodology Manual for SystemVerilog. This book is based upon best verification practices by ARM, Synopsys and their customers. Verification Methodology Manual for SystemVerilog is a blueprint for verification success, guiding SoC teams in building a reusable verification environment taking full advantage of design-for-verification techniques, constrained-random stimulus generation, coverage-driven verification, formal verification and other advanced technologies to help solve their current and future verification problems. This book is appropriate for anyone involved in the design or verification of a complex chip or anyone who would like to know more about the capabilities of SystemVerilog. Following the Verification Methodology Manual for SystemVerilog will give SoC development teams and project managers the confidence needed to tape out a complex design, secure in the knowledge that the chip will function correctly in the real world. More ...
  Vibration and Shock Distance Learning Thousands of Power Point slides and a number of images and video clips teach you about vibration and shock basics, control, instrumentation, calibration, analysis and testing. Course outlind includes the following: Introduction, Classical sinusoidal vibration, Resonance effects, Torsional vibration, Control of dynamic motion, Steady-state vibration measurements, Sinusoidal vibration calibration, continuous systems, Analysis of complex motion, Types of tests, Electrohydraulic shakers, Multiple EH shakers, Electrodynamic shakers, Power amplifiers, Sine test standards, Random vibration, Measurement and analysis of random vibration, Random vibration testing standards, Controlling random vibration tests, Environmental Stress Screening (ESS), Accelerated Testing and Screening, Mesuring mechanical shock, SRS - The Shock Response Spectrum, Mechanical Shock Testing, Modal Testing More ...
  Vibration Testing: Theory and Practice Vibration Testing: Theory and Practice not only shows how to avoid the pitfalls inherent in using modern instruments and methods but also covers all the important elements involved in conducting vibration tests, and builds an understanding of the theory through practical applications in laboratory and field environments. Based on the author's 30 years of experience in vibration testing and research, this clearly written, logically presented book: · Provides a review of the fundamentals of vibration theory · Brings the theory and practice of vibration testing up to date with all current instrumentation and research data · Covers transducers, their calibration as well as their limitations · Includes a complete chapter on vibration test specifications · Helps develop a sense of how instruments work individually as well as how they function as part of a testing environment · Includes practical examples that can be used for personnel training purposes Addressing concerns of both experimental researchers and product testers, and covering a wide range of field and laboratory situations, Vibration Testing: Theory and Practice is an extremely useful book for anyone striving to achieve meaningful results in vibration testing. Vibration testing is used to analyze the integrity of systems in a variety of applications that range from circuit boards and aircraft to steam turbines and home appliances. Conducting these tests in either the field or laboratory involves the use of data analyzers, instruments, and vibration exciters. The use of equipment and interpretation of test results require considerable understanding of vibration phenomena as well as analysis and experimental concepts. Consequently, the user of this equipment can be the dominant influence on the quality of test results. Vibration Testing: Theory and Practice is a step-by-step guide that shows how to obtain meaningful experimental results via the proper use of modern instrumentation, vibration exciters, and signal-processing equipment, with particular emphasis on how different types of signals are processed with a frequency analyzer. Also included are techniques for reading test results effectively and a discussion of how the test system's own dynamics can influence test results. Using practical lessons to introduce the theoretical aspects of vibration testing, the book covers all basic concepts and principles underlying dynamic testing, explains how current instruments and methods operate within the dynamic environment, and describes their behavior in a number of commonly encountered field and laboratory test situations. Vibration Testing: Theory and Practice deals with a wide range of product and production testing involving vibration, acoustics, and noise problems in the vibration-testing environment, whether relating to industrial applications or experimental work. It is an invaluable resource for graduate students, research-ers, and practicing engineers in aerospace, mechanical, and civil engineering. More ...
VLSI Simulation and Test Generation The stuck-at models used in simple logic is becoming obsolete when we wish to test Very Large Scale Integrated circuits. You will learn new approaches to test that can be used to test highly complex circuits. Details
WebCourse - ATE 101 - Overview of Test, ATE & Testability A participant who has little or no background in test can leave this course with a thorough understanding of the issues. While the course provides few solutions, it is imperative that anyone making decisions concerning test and testability should first attend this course. Details
WebCourse - ATE 201 - Test Strategy and ATE Mix Automatic Test Equipment (ATE) come in many generic forms. They serve different purposes and find different types of faults. In order to cover the types of faults you expect with your product, you need to strategize the types and the extent to which you will use some types of ATEs. This course will help you make these decisions, help you interpret fault data to improve your selections, and teach you how you can improve your allocation of ATE as your product matures and your fault universe changes. Details
WebCourse - ATE 301 - ATE Test Programming This course will teach you what is involved in developing a test program for an ATE. If you have never written a test program before, the course will illustrate the difficulties and point out traps that can make test programming a nightmare. For those who have experienced these problems, the course will provide a structured approach that will help avoid these problems in the future. Details
WebCourse - Design for Testability 101 - Who, What, When, Why, How Much You will learn why Design for Testabilty (DFT) is an invaluable method to reduce test development costs. As long as DFT is performed early in the design stage, the return on investment (ROI) is substantial. You will learn how to translate techinical issues involving testability to economic issues understood by non-technical management. Details
WebCourse - Design for Testability 201 - Techniques for ICs, Boards and Systems You will learn specific Design for Testabilty (DFT) techniques for making your circuit more testable, whether the circuit is an Integrated Circuit, Circuit Board, or a System. This course provides the "How" that was not covered in DFT 101. You will learn easy to apply techniques to circuits that will reap substantial benefits when it comes time to test the circuit. Details
WebCourse - Design for Testability 301 - JTAG/Boundary Scan/IEEE 1149.1 You will learn the details of Boundary Scan, often called, JTAG and officially called the IEEE-1149.1 standard. While you may have come across this concept, you may still be a bit unsure if you have a clear understanding. In this webinar we look under the hood and you will learn the intricate details of how this technology works. Details
WebCourse - Design for Testability 401 - System Level Testability and Diagnosability For system level, testability isn't only failure detection. You need to concern yourself with repair and before that can happen, you need to accurately and unambigously determine the root cause of the system failure. That root cause should involve a single replaceable subsystem or board in nearly all cases. You will learn how to approach this in a logical fashion. Details
WebCourse - Design for Testability 501 - Advanced DFT Techniques Boundary Scan pioneered a new approach to testability for board level. It is, however, important to integrate this with other forms of assembly. For today's complex circuits it may not be sufficient to test the boundary of the IC. Rather we will need to test inside the IC even when the IC is already mounted on a circuit board and when that board is already part of a module or system. This webinar will teach you about newer tools and the integration of those tools with traditional testability approaches. Details