A.T.E. Solutions Info
About Us
Contact Us
Site Map
Short Cuts
Online Store
Books on Test
Build a Test Library
Testability Director Software
Test Flow Simulator Software
Schedule of Courses
On-Site Courses
Test Requirements Analysis
TRD and TPS Development
Testability Consulting
BIST Consulting
ATE Market Consulting
Consultant Reports
BITES single-chip Built-In Tester
BestTest Directory
Test Calendar
Test Definitions
Articles on Test
Test Vendor Directory
Test Products and Services Directory

Online Catalog of Educational Courses and Resources


Page 1 of 3 of Users' Guide
Welcome to the Online Catalog of Courses and Educational Resources. There are many ways we have for you to find what you want from this catalog:
  1. Using the "Search for Topic or Format-Text" box you can filter the selections by
      a. Keywords, such as "in-circuit," "environment," etc.
      b. Course formats, such as "public," "private," etc.
  2. Read the "What You Will Learn" section next to each course.
  3. For each course of interest, you can click the hyperlinked "Details" to see the detailed course outline.
  4. Check the "Select" button next to titles that are of interest to you.
  5. Press the "More on Selected Titles" button to see what formats and dates are available for these selected courses.
Search for Topic or Format-Text:
3 Records Found
Select A Title What You Will Learn Details
  Analog and Mixed-Signal Boundary-Scan A Guide to the IEEE 1149.4 Test Standard The Mixed-Signal Boundary-Scan Test Bus is the natural complement to the widely used Boundary-Scan IEEE Std. 1149.1, commonly known as JTAG. This new Mixed-Signal standard is called IEEE Standard 1149.4 and is mainly dedicated to the manufacturing test of analog and mixed-signal boards. But like the IEEE 1149.1 it can be used for many other purposes: the test buses and their digital control form a very general `analog data highway'. Increasingly, mixed-signal boards are gaining complexity, making their testing process extremely challenging. At the same time, IC complexity and technology are getting so sophisticated that testing ICs at the board level becomes very expensive. Embedding a part of the board tester on chip is the aim of the IEEE 1149.4. Analog and Mixed-Signal Boundary-Scan is a comprehensive treatment of the design, application and structure of the IEEE 1149.4. It updates the information on digital Boundary-Scan and addresses chip designers in a dedicated chapter containing guidance to easily build analog circuits including IEEE 1149.4. A basic metrology and a test strategy with the instrumentation needed for it are also described. Analog and Mixed-Signal Boundary-Scan is essential reading for researchers and professionals who need to understand IEEE Standard 1149.4 and its practical implementation in industry. More ...
  Optical Measurement Techniques and Applications Significant advances in optical metrology have fueled the development of new, innovative techniques for the technology in a wide range of applications. Now you can better understand these highly accurate and versatile new methods, and gain insight into applying the technology to solve specific measurement problems. Optical Measurement Techniques and Applications does much more than just cover the underlying principles behind the latest optical measurement techniques. With the help of hundreds of example diagrams and step-by-step equations, sixteen of the industryís leading experts quickly bring you up to speed on how these methods are used in dozens of real-world applications -- from laser remote-sensing, to vibration measurement, to providing the data necessary to develop computer models, and more. The book also prepares you to meet future optical measurement challenges by identifying what areas of research are on the horizon. And each chapter concludes with an extensive list of references for more advanced research. This is an invaluable reference for optical researchers and practicing engineers who need sharp insight into the key optical measurement techniques and systems in use today. Itís also a powerful learning resource for upper-level undergraduate and postgraduate students. 1. Introduction: Interference of Waves. Diffraction. Polarization. Speckle. Sensitivity, Accuracy, and Precision. Scope of the Text. Concluding Remarks. 2. Optical Metrology of Engineering Surfaces -- Scope and Trends: Triangulation. Projected Fringe Techniques for Industrial Inspection and Microshape Analysis. Interferometry for Precision Measurements. Interferometry on Optically Rough Surfaces. Shearing Interferometry. White-Light Interferometry for Micro- and Macrostructure Analysis. Heterodyne Interferometry. Interferometry Outside the Coherence Length. Interferometry for Microtopography and Roughness Measurements. 3. Digital Processing of Fringe Patterns in Optical Metrology: Techniques for Digital Phase Reconstruction. Measurement of Three-Dimensional Displacement Fields. Conclusion. 4. Interferometric Optical Testing: Principles of Optical Testing. Implementation and Development of Interferometric Testing Methods. Conclusion. 5. Holographic Interferometry -- An Important Tool in Nondestructive Measurement and Testing: Wavefront Reconstruction Process. Basic Methods of Wavefront Comparison. Brief Introduction to Fringe Formation and Phase Difference Measurement. Measurement of Static Deformation. Study of Vibrations. Flow Visualization. Measurement of Surface Topography. Concept of Holographic Flaw Detection. Some Examples of Application. TV Holography and Electronic Holography. Conclusions. 6. Speckle Photography, Shearography, and ESPI: Some Statistical Properties. Speckle Photography. Speckle Interferometry. Speckle-Shear Interferometry (Shearography). Contour Generation. ESPI. Summary. 7. Photoelasticity and Moire: Photoelasticity. Moire. Conclusions. 8. Optical Fiber Sensors: Intensity-Based Sensors. Distributed Sensors. Interferometric Sensors. Summary. 9. Fiber Optic Smart Sensing: Fiber Optic Smart Sensing. Smart Sensing Subsystems. Sensor Selection. Application Examples. Outlook. 10. Holographic Metrology of Micro-objects in a Dynamic Volume: Historical Background. Basic Principles of In-Line Fraunhofer Holography. System Design Parameters. Some Practical Considerations. Hologram Fringe Contrast and Its Enhancement. Nonimage Plane Analysis. Velocimetry and High-Speed Holography. Off-Axis Holography. Automated Analysis. Some Other Developments. 11. Particle Image Velocimetry: Principles. Methods of Image Analysis in PIV. Advances. Conclusions Highlighting Areas of Future Development. 12. Surface Roughness Measurement: Microscopy. Mechanical Profilers. Optical Profilers. Total Integrated Scattering. Angle-Resolved Scattering. Other Techniques. Importance of Surface Cleanliness. Future Developments. 13. Lidar for Atmospheric Remote Sensing: The Lidar Method. Lidar Systems. Conclusion. 14. Some Other Methods in Optical Metrology: Optical Caustics. Digital Image Correlation. Ellipsometry. Digital Photogrammetry. More ...
  The Boundary-Scan Handbook, Third Edition Analog and Digital Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, and popularly called the JTAG standard, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily deal with. IEEE standards, when embraced by practicing engineers, are living entities that grow and change quickly. The Boundary-Scan Handbook, Second Edition: Analog and Digital is intended to describe these standards in simple English rather than the strict and pedantic legalese encountered in the standards. The 1149.1 standard is now over eight years old and has a large infrastructure of support in the electronics industry. Today, the majority of custom ICs and programmable devices contain 1149.1. New applications for the 1149.1 protocol have been introduced, most notably the `In-System Configuration' (ISC) capability for Field Programmable Gate Arrays (FPGAs). The Boundary-Scan Handbook, Second Edition: Analog and Digital updates the information about IEEE Std. 1149.1, including the 1993 supplement that added new silicon functionality and the 1994 supplement that formalized the BSDL language definition. In addition, the new second edition presents completely new information about the newly approved 1149.4 standard often termed `Analog Boundary-Scan'. Along with this is a discussion of Analog Metrology needed to make use of 1149.1. This forms a toolset essential for testing boards and systems of the future. More ...