A.T.E. (Advanced Test Engineering) Solutions, Inc.
test engineering consulting and educational firm
Your browser does not support script.
Select Topics & Courses
Dates & Location
A.T.E. Solutions Info
Books on Test
Build a Test Library
Testability Director Software
Test Flow Simulator Software
Schedule of Courses
Test Requirements Analysis
TRD and TPS Development
ATE Market Consulting
BITES single-chip Built-In Tester
Articles on Test
Test Vendor Directory
Test Products and Services Directory
Online Catalog of Educational Courses and Resources
Page 1 of 3 of Users' Guide
Add Educational Resource
Welcome to the Online Catalog of Courses and Educational Resources. There are many ways we have for you to find what you want from this catalog:
Using the "Search for Topic or Format-Text" box you can filter the selections by
a. Keywords, such as "in-circuit," "environment," etc.
b. Course formats, such as "public," "private," etc.
Read the "What You Will Learn" section next to each course.
For each course of interest, you can click the hyperlinked "Details" to see the detailed course outline.
Check the "Select" button next to titles that are of interest to you.
Press the "More on Selected Titles" button to see what formats and dates are available for these selected courses.
Search for Topic or Format-Text:
26 Records Found
What You Will Learn
Analog and Mixed-Signal Boundary-Scan A Guide to the IEEE 1149.4 Test Standard
The Mixed-Signal Boundary-Scan Test Bus is the natural complement to the widely used Boundary-Scan IEEE Std. 1149.1, commonly known as JTAG. This new Mixed-Signal standard is called IEEE Standard 1149.4 and is mainly dedicated to the manufacturing test of analog and mixed-signal boards. But like the IEEE 1149.1 it can be used for many other purposes: the test buses and their digital control form a very general `analog data highway'. Increasingly, mixed-signal boards are gaining complexity, making their testing process extremely challenging. At the same time, IC complexity and technology are getting so sophisticated that testing ICs at the board level becomes very expensive. Embedding a part of the board tester on chip is the aim of the IEEE 1149.4. Analog and Mixed-Signal Boundary-Scan is a comprehensive treatment of the design, application and structure of the IEEE 1149.4. It updates the information on digital Boundary-Scan and addresses chip designers in a dedicated chapter containing guidance to easily build analog circuits including IEEE 1149.4. A basic metrology and a test strategy with the instrumentation needed for it are also described. Analog and Mixed-Signal Boundary-Scan is essential reading for researchers and professionals who need to understand IEEE Standard 1149.4 and its practical implementation in industry.
Analog and Mixed-Signal Test
This comprehensive guide to analog and mixed-signal IC testing is a tutorial and reference for electrical engineers designing or testing integrated circuits and devices with analog or both analog and digital components. Increasingly, ICs contain both analog and digital circuitry, making the testing process extremely challenging. This comprehensive guide reviews all the potential testing options for analog and mixed-signal ICs, enabling designers, engineers, CAD developers and researchers to choose the most cost-effective, accurate solution. It reviews all the potential testing options with an eye to choosing the most cost-effective and accurate solution; explains which digital testing techniques and algorithms are applicable to analog and mixed-signal circuitry and which must be modified; details fault modeling, especially inductive fault analysis; describes how to implement the 1149.4 Standard Mixed-signal Test Bus and its test functions, capabilities, potential benefits, and costs; and examines testing and design issues associated with CMOS switched-current circuits. It outlines the state-of-the-art in analog testing, and covers both major alternatives in-depth: specification-based test and fault model-based test.
ATE Selection, Design and Programming
This course covers every aspect of a test engineer's responsibility. Participants will learn how to select an automatic test equipment (ATE) from the number of choices and generically different types available. You will learn how to build an ATE from instrumentation and other building blocks. You will learn the bussing requirements of the IEEE 488, VXIbus, and PC-based instruments. You will also learn the software issues. The course will teach you how to approach a functional test programming activity for digital circuits. (In the longer, three-day course, analog test programming is also covered.) Finally, you will learn test management issues, such as test program development estimation, acquisition and quality assurance.
Building your own ATE
You will learn how to put together an Automatic Test Equipment (ATE) from instrumentation built to the IEEE-488 (GPIB or HPIB) and VXIbus and PXI standards.
Design and Test for Multiple Gbps Communication Devices and Systems
Design and Test for Multiple Gbps Communication Devices and Systems focuses on the latest multiple Gbps communication technologies and applications "from design to test" and covers the essential elements of device and system development (architecture, simulation and modeling, design techniques, and testing). Currently, the data rate for communication systems continues to increase. In the network area, 10- and 40-Gbps devices and systems are now available for Gigabit Ethernet and SONET. In the computer area, I/O buses at 2.5 and 3 Gbps are common for PCI Express and Serial ATA, respectively, with higher-speed I/O buses at up to 4.8 Gbps on the horizon. Such data-rate increases suggest a growing demand for higher-speed applications and create greater challenges that affect system architectures, design methods, simulation and modeling methods, and test and measurement methods. With Design and Test for Multiple Gbps Communication Devices and Systems in hand, you will learn and master the basics of today's design and test methodologies and techniques. With this enhanced knowledge, you will be able to more fully understand the current challenges facing today's practitioners, as well as which existing solutions are best to combat those challenges.
Design for Testability and for Built-in Self Test
In this course you will learn all aspects of Design for Testability, from what it is, why you might need it, why someone would object to it, and what it can and cannot accomplish. You will learn how today's technology has become elusive to certain failure modes and how important it is to expose them through more testable designs. First you will learn some simple techniques to enhance observability and controllability. You will learn how you can access hundreds of internal points with as few as four additional edge connector pins. You will learn specific guidelines for both digital and analog circuit testability. You will learn structured testability techniques, such as internal and boundary-scan. You will come away with a deep understanding of the IEEE 1149.1 (JTAG) standard's operation, use and even its limitations. You will also learn some new techniques in testability, including IDDQ testing and I/O Mapping. In the second part of the course, you will learn what built-in [self] test (BIST) is and how it can be specified. You will learn structures such as linear feedback shift registers (LFSRs), signature analyzers, and pseudo-random signal generators. With these building blocks you will be able to evaluate a number of BIST architectures. You will learn BIT Software techniques and consider the effect false alarms have on BIT. You will finally be able to specify BIT for your products and look at the possibilities of BIT taking over some of the ATE functions.
Design-For-Test For Digital IC's and Embedded Core Systems
The first practical DFT guide from an industry insider. Skip the high-brow theories and mathematical formulas—get down to the business of digital design and testing as it's done in the real world. Learn practical testing strategies that address today's business needs for quality, reliability, and cost control, working within the tight deadlines of typical high-pressure production environments. Design-for-Test for Digital IC's and Embedded Core Systems helps you optimize the engineering trade-offs between such resources as silicon area, operating frequency, and power consumption, while balancing the corporate concerns of cost-of-test, time-to-market, and time-to-volume. You'll also boost your efficiency with the special focus on automatic test pattern generation (ATPG). The book includes a roadmap that allows you to fine-tune your learning if you want to skip directly to a specific subject. Key topics include: Core-based design, focusing on embedded cores and embedded memories System-on-a-chip and ultra-large scale integrated design issues AC scan, at-speed scan, and embedded DFT Built-in self-test, including memory BIST, logic BIST, and scan BIST Virtual test sockets and testing in isolation Design for reuse, including reuse vectors and cores Test issues being addressed by VSIA and the IEEE P1500 Standard Design-for-Test for Digital IC's and Embedded Core Systems is filled with full-page graphics taken directly from the author's teaching materials. Every section is illustrated with flow-charts, engineering diagrams, and conceptual summaries to make learning and reference fast and easy. This book is a must for the engineers and managers involved in design and testing. The enclosed CD-ROM contains full-color versions of all the book's illustrations in Acrobat PDF format. These images may be viewed interactively on screen or printed out to create overheads for teaching. Acrobat Reader software for Windows and UNIX computers is included.
EMI Troubleshooting Techniques
Stop EMI, EMD and RFI cold! Now you can get the newest, most effective weapons to fight costly and potentially devastating electromagnetic interference (EMI), electromagnetic discharge (EMD), and radio frequency interference (RFI) in the field or on the bench. EMI Troubleshooting Techniques, by Michel Marduian, arms you with an arsenal of fail-safe, time- and labor-saving diagnostic routines to help you pinpoint and lock out even the most persistent interference problems. Its 4-step approach lets you 1) identify specific (and even hidden) trouble symptoms, 2) find the matching solutions, 3) implement them and 4) understand their strengths and limitations. From power line filters and conduction type fixes to transient suppressors and radiation control, this time-and money-saving guide streamlines robust designs, speeds on-site troubleshooting for industrial-strength applications, and simplifies EMC lab testing for optimal result. Plus, you get a variety of recommended filters, isolation transformers, shields, varistors, grounding and impedance devices, tapes, foils, and more. The EMI/RFI problems stop here. When you have got an electrical noise or interference problem this reference is all you need to diagnose and solve it in a hurry. EMI Troubleshooting Techniques presents an orderly, methodical approach to locating the cause of and correcting EMI/RFI breakdowns. It gives you hands-on, optimal solutions whether your task is design, lab testing, or on-site troubleshooting, no matter what type of electronic equipment you are handling. Written by veteran EMC designer/troubleshooter Michel Mardiguian, this efficiency-boosting guide is just what you are looking for in a practical solutions kit--and more. It offers: a solution matrix that helps you pinpoint the right fix quickly; a walk-through chart that simplifies the troubleshooting process; EMI-reduction components categorized by indications, applications, and limitations; practical alternatives to lab testing methods; consideration of real-life issues such as costs, time constraints, and accessibility; solutions for most electronic environments. Whether the EMI in a cars automatic-locking mechanism, a medical diagnostic tool, or a computer motherboard, and whether you are developing, prototyping, testing, diagnosing, or applying fixes, there is only one EMI reduction kit virtually guaranteed to help you avoid dead ends and wasted time: EMI Troubleshooting Techniques.
Essential Electronic Design Automation (EDA)
Targeting technical novices as well as nontechnical sales, marketing, legal, and finance readers, the book provides a clear description of EDA tools ranging from front-end design capture to back-end extraction and timing analysis, touching on business issues as well.
Exploring the World of SCSI
So many peripherals, so little time! With Exploring the World of SCSI, you will gain the knowledge needed to get the most out of your peripheral devices, including scanners, printers, external disc drives and more. Focusing on the needs of the hobbyist, PC enthusiast, as well as system administrator, This is a comprehensive book for anyone interested in learning the hands-on aspects of SCSI. It includes how to work with the Logical Unit Numbers (LUNs) within SCSI, how termination works, bus mastering, caching, and how the different levels of RAID provide varying levels of performance and reliability. This book offers the functionality that intermediate and advanced system users need for configuring SCSI on their systems, while also providing the experienced professional with the necessary diagrams, descriptions, information sources, and guidance on how to implement SCSI-based solutions. Exploring the World of SCSI contains both real-world applications and theoretical information for the technical professional who wants to get the most out of SCSI, including how to configure it on a workstation or server. This book can be used as both a desktop reference as well as a guide to configuring SCSI. Included are troubleshooting tips and tricks for getting SCSI devices configured on a network as well as information about the role of SCSI in network-based storage. Exploring the World of SCSI will provide both technicians and administrators with assistance in defining network topology issues.
GeoMeasurements by Pulsing TDR Cables and Probes
GeoMeasurements by Pulsing TDR Cables and Probes examines Time Domain Reflectometry (TDR) research and provides information on its use as a robust, reliable, and economical production tool.Common uses for TDR technology include telecommunications and power industries, but the text examines applications such as measurement of moisture of unsaturated soils; detection of fluids for leak and pollution; measurement of water levels for hydrological purposes; measurement of water pressures beneath dams; and deformation and stability monitoring of mines, slopes, and structures.Chapters discuss:· basic physics of signal generation, transmission, and attenuation along the coaxial cable· probe designs and procedures for calibration as well as the variation in probe responses to changes in water content and soil mineralogy· variations in waveform characteristics associated with cable, deformation, cable calibration, and installation techniques for metallic cables in rock· several cases demonstrating the use of TDR cables in soil as well as weathered and soft rock· a rationale for the use of compliant cable in soil· the use of metallic cable (MTDR) and optical fiber (OTDR) to monitor response of structures· sensor/transducer components, connections from the sensors to the TDR pulser/sampler, and system control methods· available software for transmission and analysis of TDR signatures The diverse interest and terminology within the TDR community tends to obscure commonalities and the universal physical principles underlying the technology. The authors seek to crystallize the basic principles among the seemingly divergent specialties using TDR technology in geomaterials. By examining varied experiences, GeoMeasurements by Pulsing TDR Cables and Probes provides a synergistic text necessary to unify the field.
High-Speed Digital System Design: A Handbook of Interconnect Theory and Design Practices
A cutting-edge guide to the theory and practice of high-speed digital system design An understanding of high-speed interconnect phenomena is essential for digital designers who must deal with the challenges posed by the ever-increasing operating speeds of today's microprocessors. This book provides a much-needed, practical guide to the state of the art of modern digital system design, combining easily accessible explanations with immensely useful problem-solving strategies. Written by three leading Intel engineers, High-Speed Digital System Design clarifies difficult and often neglected topics involving the effects of high frequencies on digital buses and presents a variety of proven techniques and application examples. Extensive appendices, formulas, modeling techniques as well as hundreds of figures are also provided. Coverage includes: * A thorough introduction to the digital aspects of basic transmission line theory * Crosstalk and nonideal transmission line effects on signal quality and timings * The impact of packages, vias, and connectors on signal integrity * The effects of nonideal return current paths, high frequency power delivery, and simultaneous switching noise * Explanations of how driving circuit characteristics affect the quality of the digital signal * Digital timing analysis at the system level that incorporates high-speed signaling effects into timing budgets * Methodologies for designing high-speed buses and handling the very large number of variables that affect interconnect performance * Radiated emission problems and how to minimize system noise * The practical aspects of making measurements in high-speed digital systems
IEEE-488 General Purpose Instrumentation Bus Manual
Written by a working designer of IEEE-488 installations, this guide covers GPIB addressing and communications, complete GPIB protocols and hardware (including the new IEEE-488.2 standard which has solved many of the user problems plaguing the GPIB in the past), programming requirements, and increasing systems performance. Includes examples of how real-world GPIB systems are designed, installed, and maintained; and nine appendices provide quick reference to IEEE-488.2 commands and queries and the electrical and mechanical specifications for IEEE-488 systems. Key Features * Written by a working designer of IEEE-488 installations, this book covers addressing and communications, protocols, hardware (including modems, expanders, and extenders), GPIB devices and functions, programming, and much more; You will discover how to * increase data acquisition and processing performance * design "human friendly" system interfaces * use "Tektronix standard" codes and formats
Instrumentation and Instrument Buses
An ATE consists of discrete instruments capable of applying stimuli and making accurate measurements under the control of a computer. You will learn how each of these elements does its job and what realistic expectations you can have.
Introduction to IDDQ Testing
Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.
LabVIEW Programming, Data Acquisition and Analysis (with CD-ROM)
*Master LabVIEW programming - hands-on! *Learn through real-world data acquisition and analysis applications *Dozens of key techniques presented through easy-to-adapt templates *Extensively classroom-tested with professional engineers *CD-ROM: Tools, templates, and complete LabVIEW evaluation version Master LabVIEW programming from the ground up - fast! LabVIEW Programming, Data Acquisition and Analysis is your easy, hands-on guide to LabVIEW programming and data analysis. Whether you're learning LabVIEW from the ground up, or updating knowledge you already have, Jeffrey Beyon covers every key technique you need to build reliable, high-performance applications. You'll start with the basics: the structure of LabVIEW source files; using sub VIs; loops and conditional statements; data display; data types; and the prerequisites for data acquisition, including sampling theorems and data acquisition VIs. Next, Beyon covers every key category of data acquisition and analysis application - analog and digital, input and output. Coverage includes: *Practical techniques for data save/read, data conversion, and much more *Tips and tricks for memory management, large file management, and more *Implementing each leading data analysis VI *Instrument control, counters, and more *Avoiding and troubleshooting common LabVIEW programming problems Most examples are presented in the form of software templates that are easy enough to understand quickly, and robust enough to serve as building blocks for real-world solutions. You'll find detailed, end-of-chapter review questions; an accompanying lab workbook is also available. Whether you're a field engineer, scientist, researcher, or student, there's no faster way to get results with LabVIEW! CD-ROM INCLUDES: *Complete library of LabVIEW tools and templates *Full LabVIEW evaluation version Companion lab workbook: Hands-On Exercise Manual for LabVIEW Programming, Data Acquisition and Analysis
LabVIEW: Advanced Programming Techniques
The graphical nature of LabVIEW makes it ideal for test and measurement applications and its use brings significant improvements in productivity over conventional programming languages. However, comprehensive treatments of the more advanced topics have been scattered and difficult to find-until now.LabVIEW Advanced Programming Techniques offers in-depth coverage of the subjects that move you to the next level of programming-the level that allows full exploitation of LabVIEW's power and utility. These topics include:Active X: Gain the background needed to use Active X in your LabVIEW applications.Object-Oriented Technologies: Get a clear description of object analysis and see examples of how it can apply to LabVIEW applications. Application structure: Discover a three-tiered architecture that results in robust, flexible, and easy to maintain code.State machines: Get extensive coverage of several types of state machines-arguably the most useful programming tool available.Exception handling: Learn how to detect, process, and resolve exceptions in your code.Instrument drivers: See the value drivers bring to code readability and maintenance -Learn the techniques for constructing reusable drivers.Multi-threading: Learn how to look at a LabVIEW code diagram to determine how many threads your application can use, then optimize the performance of the application.
Measurement and Calibration Requirements for Quality Assurance to ISO 9000
Quality assurance is of paramount importance for today’s businesses. This uniquely integrated approach to quality management focuses on the measurement and calibration requirements that are key to the achievement of ISO 9000. The cross-disciplinary approach makes this well-structured text an invaluable asset both to engineers concerned with the development, implementation and maintenance of quality systems and to managers wishing to gain an insight into quality assurance issues. Features include: · Examination of the requirements of ISO 9000 benefiting readers who are constructing new quality systems or updating existing schemes · Description of the mechanisms for assessing the sources of measurement error and quantifying their effect allowing the engineer to pinpoint problems · Discussion of the general principles of measurement and calibration procedures enabling the reader to formulate a quality control strategy · The comprehensive review of measurement and calibration procedures for process parameters qualifying the reader to select appropriate instruments · Coverage of environmental management systems satisfying ISO 14000 enabling companies to demonstrate their commitment to responsible manufacturing
PC Troubleshooting Pocket Book Third Edition
The Newnes PC Troubleshooting Pocket Book provides a concise and compact reference that describes, in a clear and straightforward manner, the principles and practice of faultfinding and upgrading PCs and peripherals. The book is aimed at anyone who is involved with the installation, configuration, maintenance, upgrading, repair or support of PC systems. It also provides non-technical users with sufficient background information, charts and checklists to enable the diagnosis of faults and help to carry out simple modifications and repairs. The new edition of PC Troubleshooting will continue to include a number of short cuts that are instrumental in avoiding hours of potential frustration and costly effort. In order to reflect rapid changes in computer technology (both hardware and software) the third edition of the Newnes PC Troubleshooting Pocket Book has been completely revised and rewritten. New and expanded sections on: modern machines (Pentium II, III, IV, AMD); modern buses (FSB, AGP, Cyrix, Chip sets); different RAM chip types, performance and guide to RAM connectors; Win2000, ME, XP and NT4/5; latest SCSI standards, Ultra DMA, “live” re-portioning of the disc, FAT 16, FAT36, NTFS, performance and compatibility differences; ‘famous’ viruses and personal firewalls.
Standards in Test
You will be introduced to most of the Military and Commercial Standards that affect the way test is performed and interpreted by both military and commercial concerns.
System-on-a-Chip: Design and Test
Starting with a basic overview of system-on-a-chip (SoC), including definitions of related terms, this new book helps you understand SoC design challenges, and the latest design and test methodologies. You see how ASIC technology evolved to an embedded cores-based concept that includes pre-designed, reusable Intellectual Property (IP) cores that act as microprocessors, data storage devices, DSP, bus control, and interfaces -- all "stitched" together by a User’s Defined Logic (UDL). Part One features a discussion of SoC-related design difficulties including hardware-software co-design, reuse design, and cores design. You get practical, real-world design guidance referencing actual product specifications, delivery requirements, and system integration requirements in use by commercial enterprises and under evaluation by the SoC community. Significant attention is paid to the rules and guidelines for making SoC design reusable, including RTL coding guidelines and design validation. Part One concludes with the information you need to develop test benches at both the cores and SoC level. Part Two contains a review of the challenges you face in testing SoC and test methodologies for overcoming these hurdles. Test methods for embedded logic cores, microprocessor cores, micro-controller cores and large memory blocks are included, as well as methods for testing embedded analog and mixed-signal circuits, and Iddq testing on SoC. You also get an overview of material handling, speed-binning, and production flow to apply your knowledge to actual production processes. System-on-a-Chip: Design and Test is an excellent, one-stop reference for SoC and ASIC design engineers, IP designers and providers, and test engineers seeking comprehensive information on SoC design, testing, and production. Contents: Part One - Design. Introduction. Design Methodology for SoC Logic Cores. RTL Guidelines for Design Reuse. Verification. Design Validation. Design Examples. Part Two - Test. Introduction to SoC Testing of Logic Cores. Testing of Embedded Memories. Testing of Analog and Mixed-Signal Circuits. IDDQ Testing. Production Testing. Summary and Conclusion.
Telecommunication Wiring , 2nd Edition
From planning to troubleshooting...All you need to know to make wiring a competitive advantage! More than almost anything else, your wiring plant determines whether you can run tomorrow's business-critical networked applications, fully leverage Internet technologies, and support the rapidly-changing needs of your organization. Telecommunications Wiring, Second Edition is the up-to-date, complete guide to making sure your wiring delivers the results you need-today, and for many years to come. From planning new wiring to systematizing and improving what you've already got, you'll find everything you need to know, including: Creating bid proposals that lead to successful, cost-effective installations Practical guidance on architecting or evolving a wiring system Proven plans and techniques for managing installation Documenting and standardizing cabling systems-including how to design a Telecommunications database Ensuring cable security Understanding fundamental wiring theory and practice Telecommunications Wiring, Second Edition offers a coherent, end-to-end approach to designing a cabling system, selecting media, choosing vendors, documenting the system, and streamlining maintenance. It covers both twisted-pair and fiber optic systems, presenting extensive troubleshooting help-and real-world guidance on avoiding problems in the first place. Whether you're a telecommunications or IT professional, technician or manager with responsibility for wiring systems, this is the single source for the information you need most.
Test Engineering: A Concise Guide to Cost-effective Design, Development and Manufacture
Testing is usually the most expensive, time-consuming and difficult activity during the development of engineering products and systems. Development testing must be performed to ensure that designs meet requirements for performance, safety, durability, reliability, statutory aspects, etc. Most manufactured items must be tested to ensure that they are correctly made. However, much of the testing that is performed in industry is based upon traditions, standards and procedures that do not provide the optimum balance of assurance versus cost and time. There is often pressure to reduce testing because of the high costs involved, without appreciation of the effects on performance, reliability. etc. Misperceptions are commonplace, particularly the idea that tests should not stress products in excess of their operating levels. The main reason for this situation seems to be that engineers have not developed a consistent philosophy and methodology for testing. Testing is seldom taught as part of engineering curricula, and there are no books on the subject. Specialist areas are taught, for example fatigue testing to mechanical engineers and digital device testing to electronics engineers. However, a wide range is untaught, particularly multidisciplinary and systems aspects. Testing is not just an engineering issue. Because of the importance and magnitude of the economic and business aspects testing is an issue for management. Testing is perceived as a high cost activity, when it should be considered as a value-adding process. The objective of this book is, therefore, to propose a philosophy of engineering test and to describe the necessary technologies and methods that will provide a foundation for all plans, methods and decisions related to testing of engineered products and systems. The book will help those who must manage and conduct this most difficult and uncertain task. It will also provide a text, which can be used as the basis for teaching the principles of testing to all engineering students.
Testing Applications on the Web: Test Planning for Internet-Based Systems
A software testing survival guide for those who work in Internet time With Internet applications spreading like wildfire, the field of software testing is increasingly challenged by the brave new networked world of e-business. This book brings you up to speed on the technologies, testing concepts, and tools you will need to run e-business applications on the Web. Written by Hung Nguyen, a coauthor of the bestselling software testing book of all time, Testing Computer Software, this new guide takes you to the next level, helping you apply your existing skills to the testing of B2B (Business-to-Business), B2C (Business-to-Consumer), and internal Web-based applications. You ll learn how to test transactions across networks, explore complex systems for errors, and work efficiently with the many components at play - from servers to browsers to protocols. Most importantly, you will get detailed instructions on how to carry out specific test types along with case studies and error examples for each test. Software testers, test leads and test managers, QA analysts and managers, and IT managers and staff will find this an invaluable resource for their testing projects. With an emphasis on achievable goals and necessary rather than nice-to-have features, Testing Applications on the Web provides: · An analysis of the Web-application model and the difference between Web testing and traditional testing · A tutorial on the methodology and techniques for networking technologies and component-based testing · Strategies for test planning, test case designing, and error analysis on the Web · Effective real-world practices for UI (User Interface) tests, security tests, installation tests, load and stress tests, database tests, and more · A survey of commercial tools and a sampling of proven test matrices and templates
WebCourse - ATE 101 - Overview of Test, ATE & Testability
A participant who has little or no background in test can leave this course with a thorough understanding of the issues. While the course provides few solutions, it is imperative that anyone making decisions concerning test and testability should first attend this course.
WebCourse - ATE 301 - ATE Test Programming
This course will teach you what is involved in developing a test program for an ATE. If you have never written a test program before, the course will illustrate the difficulties and point out traps that can make test programming a nightmare. For those who have experienced these problems, the course will provide a structured approach that will help avoid these problems in the future.
A.T.E. Solutions, Inc. - ©2017