A.T.E. (Advanced Test Engineering) Solutions, Inc.
test engineering consulting and educational firm
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Online Catalog of Educational Courses and Resources
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Welcome to the Online Catalog of Courses and Educational Resources. There are many ways we have for you to find what you want from this catalog:
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14 Records Found
What You Will Learn
ATE Selection, Design and Programming
This course covers every aspect of a test engineer's responsibility. Participants will learn how to select an automatic test equipment (ATE) from the number of choices and generically different types available. You will learn how to build an ATE from instrumentation and other building blocks. You will learn the bussing requirements of the IEEE 488, VXIbus, and PC-based instruments. You will also learn the software issues. The course will teach you how to approach a functional test programming activity for digital circuits. (In the longer, three-day course, analog test programming is also covered.) Finally, you will learn test management issues, such as test program development estimation, acquisition and quality assurance.
Ball Grid Array Inspection and Defect Guide
This CD ROM is fully interactive and covers the different types of BGA component, design and process requirement with X-ray inspection of solder joints and a inspection standard for guidance. A Word document of the text is available on the CD ROM for use in a company standard and may be edited to suit the company documentation system. Examples of satisfactory standards are provided with a complete guide to possible process defects. The defect section may be viewed with small examples to make searching easy and then each sample may be viewed at both half and full screen. A description of each of the defects is included with the examples. A full animation of the surface mount assembly process is included on the disk which includes the BGA, double sided assembly and through hole/Intrusive reflow assembly. This section features a commentary by Bob Willis or can be viewed with just a text guide. The CD ROM also includes over 130 picture files which may be used freely in training material and standards in a manufacturing company provided that the resulting material is not resold.
Building a Successful Board-Test Strategy Second Edition
Written in a clear and thoughtful style, Building a Successful Board-Test Strategy, Second Edition offers an integrated approach to the complicated process of developing the test strategies most suited to a company's profile and philosophy. This book also provides comprehensive coverage of the specifics of electronic test equipment as well as those broader issues of management and marketing that shape a manufacturer's "image of quality." In this new edition, the author adds still more "war stories," relevant examples from his own experience, which will guide his readers in their decision making. He has also updated all technical aspects of the first edition, covering new device and attachment technologies, new inspection techniques including optical, infrared and x-ray, as well as vectorless methods for detecting surface-mount open-circuit board failures. The chapter on economics has been extensively revised, and the bibliography includes the latest material on this topic.
Design for Testability and for Built-in Self Test
In this course you will learn all aspects of Design for Testability, from what it is, why you might need it, why someone would object to it, and what it can and cannot accomplish. You will learn how today's technology has become elusive to certain failure modes and how important it is to expose them through more testable designs. First you will learn some simple techniques to enhance observability and controllability. You will learn how you can access hundreds of internal points with as few as four additional edge connector pins. You will learn specific guidelines for both digital and analog circuit testability. You will learn structured testability techniques, such as internal and boundary-scan. You will come away with a deep understanding of the IEEE 1149.1 (JTAG) standard's operation, use and even its limitations. You will also learn some new techniques in testability, including IDDQ testing and I/O Mapping. In the second part of the course, you will learn what built-in [self] test (BIST) is and how it can be specified. You will learn structures such as linear feedback shift registers (LFSRs), signature analyzers, and pseudo-random signal generators. With these building blocks you will be able to evaluate a number of BIST architectures. You will learn BIT Software techniques and consider the effect false alarms have on BIT. You will finally be able to specify BIT for your products and look at the possibilities of BIT taking over some of the ATE functions.
Electrical Safety Engineering
This third edition incorporates revisions that cover the Electricity at Work Regulations 1989, EC Directives on safety matters and many recent developments in safety legislation and guidance publications. W Fordham Cooper drew on his long experience as HM Electrical Inspector of Factories and a consultant to the Insurance Technical Bureau to write this wide-ranging work. D A Dolbey Jones, who has revised this classic for its third edition, adds his own insights gained as an HM Senior Electrical Inspector with the Health and Safety Executive, responsible for steering the project on the Electricity at Work Regulations and the official Memorandum of Guidance on the Regulations; and as a Senior Engineering Inspector with the Department of Energy (now the DTI) . Published guidance and other useful reference material is signposted throughout the book. Two new appendices deal with essential up-to-date publications. Revised by D.A. Dolbey Jones Senior Engineering Inspector Electrical Safety Engineering deals with the theory and practice of the safe design, installation and operation of industrial electrical equipment. It is well established as the leading comprehensive source of reference on electrical safety.
IEE Wiring Regulations: Inspection, Testing and Certification of Electrical Fourth Edition
Brian Scaddan’s guides to the IEE Wiring Regulations have established themselves as an industry standard, so this new edition will be welcomed by anyone who wants to know more about the new issue of the Wiring Regs published on June 1st 2001, and mandatory from 1st January 2001. This book is essential reading for anyone with practical or management responsibility for testing and inspecting electrical installations. It is designed specifically to meet the requirements of the City & Guilds 2391 course, of which Brian Scaddan is the Chief Examiner.
Measurement of Mobile Antenna Systems
If you’re involved with the design, installation or maintenance of mobile antenna systems, this book gives you the most-comprehensive understanding of all the mandatory measurement techniques you need for your projects. You get practical guidance on the selection of measurement sites, the measurement of system building and setup, and the analysis of measured data. It presents in-depth examinations of all relevant mobile antenna measurement theories, along with practical measurement procedures and examples to show you how it’s done. Topics include propagation measurement, antenna characteristics measurement, radiation power measurement, human interaction measurement, base station siting and maintenance, and fading and field simulator systems. Referenced with 172 illustrations and 161 equations. Contents: Preface. Propagation Measurements – Overview of Propagation Measurements. Field Profile Measurements. Diversity Measurements. Delay Profile Measurements. Propagation Measurement System. Delay Profile Measurement System. Antenna Measurements for Radio Handsets and Mobile Terminals – Antenna Input Port Impedance Measurements. Radiation Pattern Measurement. Radiation Efficiency Measurements. Diversity Characteristics Measurement Using Radiation Patterns. EMC Measurements. Product Testing. Handset Antennas and Influences Due to the Human Body – Human Body Influences on the Handset Antenna. The Phantom: An Electrical Equivalent Model of the Human Body. Antenna Measurements Using a Phantom. SAR Measurement Using a Phantom. Measurements Using a Human Body. Base Station Antenna Siting, Measurement and Maintenance – Base Station Antenna Siting. Design of Cellular Base Station Antennas. Base Station Antenna Measurements. Product Inspection. Fading and Field Simulators – Fading Simulators. Field Simulators. Sensitivity Measurements Using a Field Simulator. Delay Spread Measurement Using a Field Simulator. Appendices. About the Author. Index.
Optical Measurement Techniques and Applications
Significant advances in optical metrology have fueled the development of new, innovative techniques for the technology in a wide range of applications. Now you can better understand these highly accurate and versatile new methods, and gain insight into applying the technology to solve specific measurement problems. Optical Measurement Techniques and Applications does much more than just cover the underlying principles behind the latest optical measurement techniques. With the help of hundreds of example diagrams and step-by-step equations, sixteen of the industry’s leading experts quickly bring you up to speed on how these methods are used in dozens of real-world applications -- from laser remote-sensing, to vibration measurement, to providing the data necessary to develop computer models, and more. The book also prepares you to meet future optical measurement challenges by identifying what areas of research are on the horizon. And each chapter concludes with an extensive list of references for more advanced research. This is an invaluable reference for optical researchers and practicing engineers who need sharp insight into the key optical measurement techniques and systems in use today. It’s also a powerful learning resource for upper-level undergraduate and postgraduate students. 1. Introduction: Interference of Waves. Diffraction. Polarization. Speckle. Sensitivity, Accuracy, and Precision. Scope of the Text. Concluding Remarks. 2. Optical Metrology of Engineering Surfaces -- Scope and Trends: Triangulation. Projected Fringe Techniques for Industrial Inspection and Microshape Analysis. Interferometry for Precision Measurements. Interferometry on Optically Rough Surfaces. Shearing Interferometry. White-Light Interferometry for Micro- and Macrostructure Analysis. Heterodyne Interferometry. Interferometry Outside the Coherence Length. Interferometry for Microtopography and Roughness Measurements. 3. Digital Processing of Fringe Patterns in Optical Metrology: Techniques for Digital Phase Reconstruction. Measurement of Three-Dimensional Displacement Fields. Conclusion. 4. Interferometric Optical Testing: Principles of Optical Testing. Implementation and Development of Interferometric Testing Methods. Conclusion. 5. Holographic Interferometry -- An Important Tool in Nondestructive Measurement and Testing: Wavefront Reconstruction Process. Basic Methods of Wavefront Comparison. Brief Introduction to Fringe Formation and Phase Difference Measurement. Measurement of Static Deformation. Study of Vibrations. Flow Visualization. Measurement of Surface Topography. Concept of Holographic Flaw Detection. Some Examples of Application. TV Holography and Electronic Holography. Conclusions. 6. Speckle Photography, Shearography, and ESPI: Some Statistical Properties. Speckle Photography. Speckle Interferometry. Speckle-Shear Interferometry (Shearography). Contour Generation. ESPI. Summary. 7. Photoelasticity and Moire: Photoelasticity. Moire. Conclusions. 8. Optical Fiber Sensors: Intensity-Based Sensors. Distributed Sensors. Interferometric Sensors. Summary. 9. Fiber Optic Smart Sensing: Fiber Optic Smart Sensing. Smart Sensing Subsystems. Sensor Selection. Application Examples. Outlook. 10. Holographic Metrology of Micro-objects in a Dynamic Volume: Historical Background. Basic Principles of In-Line Fraunhofer Holography. System Design Parameters. Some Practical Considerations. Hologram Fringe Contrast and Its Enhancement. Nonimage Plane Analysis. Velocimetry and High-Speed Holography. Off-Axis Holography. Automated Analysis. Some Other Developments. 11. Particle Image Velocimetry: Principles. Methods of Image Analysis in PIV. Advances. Conclusions Highlighting Areas of Future Development. 12. Surface Roughness Measurement: Microscopy. Mechanical Profilers. Optical Profilers. Total Integrated Scattering. Angle-Resolved Scattering. Other Techniques. Importance of Surface Cleanliness. Future Developments. 13. Lidar for Atmospheric Remote Sensing: The Lidar Method. Lidar Systems. Conclusion. 14. Some Other Methods in Optical Metrology: Optical Caustics. Digital Image Correlation. Ellipsometry. Digital Photogrammetry.
Optical Techniques for Industrial Inspection
This book discusses automatic optical inspection techniques
Software Test, Reliability and Quality Assurance
You will get practical answers to the following questions: When should you start testing and when can you stop testing? How do you predict software bug rates? Which defects are acceptable and why? What software metrics should be collected to measure testing progress? How do you plan for testing, debugging, and fixing software? What can you look for in code to verify that software reliability has been designed into the software? This course prepares you to create better software and to evaluate software produced by others.
The Testability Director
The Testability Director will enable you to design circuits which are testable. The guidelines are provided as you design and you can evaluate your design's testability before you finalize it and before costs of design changes make testability prohibitive.
Thermal Testing of Integrated Circuits
Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. Abnormal status of this variable, both too high and too low, is sign of abnormal behavior in electronic systems. In Thermal Testing of Integrated Circuits the authors present the feasibility to consider temperature as an observable for testing purposes. The coupling of circuits thtough heat is inherent to the solid-state nature and the inspection of temperature does not interact with Under Test Circuits or Systems, something that does not happen when voltage or current observable are used. In the book the basis of heat propagation, heat conducting mechanisms and temperature sensitivity of semiconductors are focused with a full coverage of the state of the art. We usually have the idea that all the heating processes are slow, which is true in the macroscopic world, but is not in the case of integrated circuits where the reduced size and amount of material and the really high conductivity of substrates make the thermal testing a promising technique. CMOS and BICMOS temperature sensors for built-in thermal testing are presented in the book. The application of temperature as testing magnitude for both on-line and off-line, analog or digital, on-chip or off-chip are considered. The temperature sensing has an inherent directional capability that can be used as an element for localizing failures, so the technique has interesting diagnosis capabilities as well.
WebCourse - ATE 201 - Test Strategy and ATE Mix
Automatic Test Equipment (ATE) come in many generic forms. They serve different purposes and find different types of faults. In order to cover the types of faults you expect with your product, you need to strategize the types and the extent to which you will use some types of ATEs. This course will help you make these decisions, help you interpret fault data to improve your selections, and teach you how you can improve your allocation of ATE as your product matures and your fault universe changes.
WebCourse - Design for Testability 201 - Techniques for ICs, Boards and Systems
You will learn specific Design for Testabilty (DFT) techniques for making your circuit more testable, whether the circuit is an Integrated Circuit, Circuit Board, or a System. This course provides the "How" that was not covered in DFT 101. You will learn easy to apply techniques to circuits that will reap substantial benefits when it comes time to test the circuit.
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