A.T.E. (Advanced Test Engineering) Solutions, Inc.
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Online Catalog of Educational Courses and Resources
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54 Records Found
What You Will Learn
Advanced Topics in LabWindows/CVI
Take virtual instrumentation to the next level with high-level programming. * High-level programming with LabWindows/CVI * Live data display via Internet or intranet sources * Programmatic creation and control of GUIs * Data acquisition and VXI device communication * Graph control, table control, function panels, instrument drivers, and Open GL Unleash the true power of LabWindows/CVI when you employ the rich features of this programming environment. In this follow-up to his LabWindows CVI Programming for Beginners, Shahid F. Khalid presents the sophisticated techniques that allow experienced users to make the most of this virtual instrumentation powerhouse. The flexibility of LabWindows/CVI software means that you can build virtual instrumentation using Microsoft Visual Basic and Visual C++ as well as ANSI C. Advanced Topics in LabWindows/CVI focuses on the use of C in an open software architecture. It is a project-oriented guide that will teach you to build applications using the more complex features of this programming environment. Applications include: * Live data acquisition via Internet or intranet sources using Data Socket technology * GUI controls created and manipulated in real time * Advanced features of graph and table controls * 3-D data plotting with Open GL * Communications with VXI devices using VISA * Creating and using function panels and instrument drivers The material is organized to present information with maximum clarity, keeping the reader in mind. For convenience, each chapter concludes with an explanation of the purpose and prototype of the library functions under discussion. Advanced Topics in LabWindows/CVI will give students and working professionals the tools to build and automate sophisticated virtual instrumentation for a world of applications.About the CD: The accompanying CD-ROM includes a demo version of LabWindows/CVI 6.0 that is included as a component of Measurement Studio and all the projects in the book in complete, ready-to-run form. Just load and run the projects as you work along with the text.
An Introduction to Mixed-Signal IC Test and Measurement
Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. This book was written in response ot the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is designed to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts.
Analog Test and Fault Isolation
The problems that you will encounter when you try to test analog circuits with an ATE. The course will show how accuracies and resolutions can affect your test results. You will also learn to deal with analog simulation and fault simulation issues. The IEEE-1149.4 Mixed Signal Testability as well as the IEEE-1149.6 mechanisms will also be explored.
ATE Selection, Design and Programming
This course covers every aspect of a test engineer's responsibility. Participants will learn how to select an automatic test equipment (ATE) from the number of choices and generically different types available. You will learn how to build an ATE from instrumentation and other building blocks. You will learn the bussing requirements of the IEEE 488, VXIbus, and PC-based instruments. You will also learn the software issues. The course will teach you how to approach a functional test programming activity for digital circuits. (In the longer, three-day course, analog test programming is also covered.) Finally, you will learn test management issues, such as test program development estimation, acquisition and quality assurance.
Building your own ATE
You will learn how to put together an Automatic Test Equipment (ATE) from instrumentation built to the IEEE-488 (GPIB or HPIB) and VXIbus and PXI standards.
Communications Network: Test and Measurement Handbook
Assure peak efficiency and performance in any type of communications network! The explosive growth of digital communications networks, linking all parts of the globe has dramatically increased the need for tools and processes that ensure the ability of these vaious elements to operate together, set national and international standards, achieve local objectives for quality of service, and provide information that allows effective and proactive network management. Test and measurement instruments, systems and software provide these tools. This handbook explains how they work and how to use them in a set of clear and understandable chapters written by experts in their fields. Youll find everything you need to enhance performance in public and private networks, the Internet and cellular networks. Chapters describe how to select tools, develop and perform appropriate tests, and get information as well as data that ensures effective network and understanding on: Network operation parameters and success metrics; Hardware and software technolgies in communications; The Open Systems Interface (OSI) model; Analyses of network protocols, transmission errors, and physical connections; Development of effective tests for operation and performance of all types of networks; Selection of the most appropriate test and measurement tools; Development of information not just data. Let the Communications Network Test and Measurement Handbook guide you straight to optimum network performance.
Contaminants and Moisture Can Disrupt Your Electronics
Course description This course provides details about the root causes of many poorly understood electronic failures. The chemistry encountered in many end-use environments will be covered at length. We will discuss sources of contamination and the adverse effects of contamination on high-rel electronic systems. This understanding will enable participants to create more complete and accurate testing protocols for evaluating the true long-term reliability of new electronic designs, materials and processes. This understanding will also help organizations to troubleshoot production and field problems with existing electronic designs, materials and processes. Illustrated lectures and classroom discussion reveal the dangerous yet little recognized synergistic (that is, combined) field conditions of contamination + moisture, especially when field thermal and vibration stresses are added. These conditions will cause the premature failure of many forms of allegedly strong and highly reliable (but actually weak and unreliable - vulnerable) electronic equipment. Current production testing and screening protocols (as well as reliability studies) largely ignore these dangerous combined environments. Ever-smaller feature sizes and separations, plus smaller signal levels and higher frequencies all act to increase vulnerability to contaminants and moisture. Without proper testing, too much blind trust is being placed in supposedly safe conformal coatings and other protective measures. Subtle changes in test protocols, which can cause major differences in the results, will be discussed, along with some of the limitations of present measuring and monitoring equipment. A major topic: the optimum point in the production cycle at which to screen. Objectives High reliability electronic systems utilizing new designs and expanded systems integration are required to meet performance based specifications. Contracts should include some form of laboratory validation method prior to (1) awarding the contract, (2) making milestone payments, and (3) assessing penalty clauses if fielded equipment fails to perform fully. Upon completion of this course, participants will realize the potential cost savings of highly accelerated life testing (HALT) that combines contamination with traditional testing protocols. The course will enable participants to generate more realistic test data needed for (1) predicting long term reliability and for (2) predicting warranty/infant mortality. June 16-18, 2003 in Santa Barbara
Cost Effective Tests Using ATE, DFT and BIST
The two main reasons to test are 1) to eliminate failures escaping to your customers and 2) to reduce the life cycle cost of a product by eliminating penalty costs associated with delivering potentially faulty units. Many people have traded one of these requirements for the other, but with the advent of more sophisticated automatic test equipment (ATE), more attention paid to design for testability (DFT) and utilizing built-in self test (BIST), it is possible to do both. This tutorial provides a thorough understanding of each of these tools and strategies for more comprehensive and cost-effective testing. The course will combine the technical aspects of testing today’s complex circuits with the economics demanded by lower costs, faster times to market and a higher rate of obsolescence for both electronic products and test equipment.
Design and Test for Multiple Gbps Communication Devices and Systems
Design and Test for Multiple Gbps Communication Devices and Systems focuses on the latest multiple Gbps communication technologies and applications "from design to test" and covers the essential elements of device and system development (architecture, simulation and modeling, design techniques, and testing). Currently, the data rate for communication systems continues to increase. In the network area, 10- and 40-Gbps devices and systems are now available for Gigabit Ethernet and SONET. In the computer area, I/O buses at 2.5 and 3 Gbps are common for PCI Express and Serial ATA, respectively, with higher-speed I/O buses at up to 4.8 Gbps on the horizon. Such data-rate increases suggest a growing demand for higher-speed applications and create greater challenges that affect system architectures, design methods, simulation and modeling methods, and test and measurement methods. With Design and Test for Multiple Gbps Communication Devices and Systems in hand, you will learn and master the basics of today's design and test methodologies and techniques. With this enhanced knowledge, you will be able to more fully understand the current challenges facing today's practitioners, as well as which existing solutions are best to combat those challenges.
Design for AT-Speed Test, Diagnosis and Measurement
Design for AT-Speed Test, Diagnosis and Measurement offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
Design for Excellence
This course will teach you how to design a product that is manufacturable, testable, reliable, useable, electromagnetically compatible, maintainable and supportable. In short, an electronic product that not only functions but is made to be of excellent value to you and to your customer.
Detecting the World: Capturing Physical Measurements With C++
* Build cost-effective data recording and analysis systems on the PC * Measure speed, temperature, force, pressure, voltage, amperage, and resistance Do you need to build a system that can capture and analyze real-world data including speed, temperature, force, pressure, voltage, amperage, or electrical resistance? If so, you will find this an essential guide to building, programming, and using accurate and cost-effective PC-based data acquisition systems. You'll find designs for: * electronic measurement probing with physical transducers and signal conditioning * converting analog to digital records * software techniques appropriate for collecting, compressing, storing, reducing, analyzing, and presenting measurements While there is no typical data acquisition system, McCombs has identified the basic concepts that occur in all systems. You'll learn about selecting power supplies, sensors, and transducers, and you can even develop a fully functional PC-based voltmeter, ammeter, and ohmmeter! C++ code examples on the companion disk show how to use the data acquisition programs with Windows 95 or DOS, and can be ported to Presentation Manager under OS/2 and to X11 under Linux- or Intel-based UNIX.
Electrical Measurement, Signal Processing, and Displays
Provides descriptive figures and photographs Contains several references in each chapter Includes contributions from an international panel Covers an extensive range of topics Covering sensors, methods, hardware, and software, this book describes the use of instruments and techniques for practical measurements of electric voltage, signal processing, and displays. It includes information processing systems, automatic data acquisition, reduction and analysis and their incorporation for control purposes. The articles provide equations that help engineers and scientists develop applications and solve problems that arise in fields not their specialty but effect their work. A concise and useful reference, the book supplies information on advanced applications, evaluative opinions, and possible areas for future study.
Electrician's Pocket Manual
This toolbox-sized time-and-trouble saver makes short shrift of all those questions that pop up during your day's work, whether they relate to tools of the trade...standard electrical procedures...working with fiber optics and installing the newest communications equipment...basic math and measurement, including conversion...reading blueprints. It's also loaded with 100 tables and charts, 100 formulas and 300 diagrams. An appendix looks at codes, standards and regulations.
Electronic Test Instruments: Theory and Application
Offers an in-depth examination of basic measurement theory and how it relates to practical measurements. For those who are interested in learning about electronic measurements. DLC: Electronic instruments.
Electronic Instrument Handbook
Design, select and operate the latest electronic instruments. Now in an up-to-the-minute third edition, the bestselling Electronic Instrument Handbook, by top technical author Clyde F. Coombs, Jr. and over 30 leading experts, helps you design, select and operate conventional, virtual, and network-based electronic instruments. From calibration, traceability standards, data acquisition, transducers, analog-to-digital conversion, signal sources, processors and microprocessors, power supplies and more, you move on to current and voltage measurement, signal- and waveform-generation, frequency and time measurement and circuit element measurement instruments, microwave passive devices and digital domain instruments. You learn what every instrument type does.. how it works...and how to get the most out of it. You'll also zero in on: *Instrument systems *Software and connectivity for instrumentation -- including network connections...instrument drivers...graphical user interfaces...virtual instruments and software defined instruments *Distributed and networked instrumentation, including smart sensors and the Internet *Much, much more!
Electronic Test Instruments: Analog and Digital Measurements , 2nd Edition
Electronic Test Instruments: Analog and Digital Measurements, Second Edition offers a thorough, unified, up-to-date survey of electronics instrumentation, digital and analog. Start with basic measurement theory, then master all mainstream forms of electronic test equipment through real-world application examples. This new edition is now fully updated for the latest technologies, with extensive new coverage of digital oscilloscopes, power supplies, and more.
Extech 480823 Electro Magnetic Field (EMF/ELF) Meter
The Extech 480823 EMF/ELF meter allows you to measure electromagnetic field radiation levels from fans, electrical appliances, wiring, and power lines. With a large ½" LCD display and a sampling time of 2.5 times per second, you can be assured of easy and accurate measurements. Readings available in both milligauss or micro Tesla. Battery included.
Fiber Optic Test and Measurement
The complete, practical guide to testing fiber optic communication components and systems. Fiber optic networks are evolving rapidly—and so is the technology used to design, measure, and test them. Fiber Optic Test and Measurement is the first authoritative, complete guide to measuring both current optical networks and those on the horizon. It reflects the collective experience of Hewlett-Packard's world-class lightwave test and measurement organization, and presents extensive information that has had limited circulation to date. Learn how to characterize all three basic components of a fiber optic communication system: the optical transmitter, fiber medium, and optical receiver. Review each fundamental area of fiber optic measurement, including: Optical power measurements using several types of photodetectors Spectral measurements using diffraction gratings, Michelson interferometers and both heterodyne and homodyne spectrum analysis Polarization measurements—increasingly important in high data rate networks that utilize optical amplifiers Modulation measurements via frequency and time domain analyses The book's unprecedented coverage of advanced fiber technology will be invaluable to professionals implementing or maintaining new optical networks. Learn how to: Test digital fiber systems to SONET/SDH international standards Accurately characterize the behavior of Wavelength Division Multiplexing (WDM) fiber systems Test two-port optical devices for insertion loss, reflectivity of components, chromatic and polarization mode dispersion, and the behavior of Erbium-doped fiber amplifiers (EDFAs). This practical guide will help technicians, engineers, and scientists accurately measure and test fiber optic systems, without becoming experts in fiber optic theory. It will be equally useful for experienced fiber optic professionals and those new to the field.
Fundamentals of Infrared Detector Operation and Testing
A comprehensive text/reference for the operation and testing of infrared (IR) detectors. Includes formulas and examples for most laboratory applications. Covers detector types, radiometric concepts, test equipment, measurements and error analysis.
Fundamentals of Semiconductor Manufacturing and Process Control
Fundamentals of Semiconductor Manufacturing and Process Control covers all issues involved in manufacturing microelectronic devices and circuits, including fabrication sequences, process control, experimental design, process modeling, yield modeling, and CIM/CAM systems. Readers are introduced to both the theory and practice of all basic manufacturing concepts. Following an overview of manufacturing and technology, the text explores process monitoring methods, including those that focus on product wafers and those that focus on the equipment used to produce wafers. Next, the text sets forth some fundamentals of statistics and yield modeling, which set the foundation for a detailed discussion of how statistical process control is used to analyze quality and improve yields. The discussion of statistical experimental design offers readers a powerful approach for systematically varying controllable process conditions and determining their impact on output parameters that measure quality. The authors introduce process modeling concepts, including several advanced process control topics such as run-by-run, supervisory control, and process and equipment diagnosis.
GeoMeasurements by Pulsing TDR Cables and Probes
GeoMeasurements by Pulsing TDR Cables and Probes examines Time Domain Reflectometry (TDR) research and provides information on its use as a robust, reliable, and economical production tool.Common uses for TDR technology include telecommunications and power industries, but the text examines applications such as measurement of moisture of unsaturated soils; detection of fluids for leak and pollution; measurement of water levels for hydrological purposes; measurement of water pressures beneath dams; and deformation and stability monitoring of mines, slopes, and structures.Chapters discuss:· basic physics of signal generation, transmission, and attenuation along the coaxial cable· probe designs and procedures for calibration as well as the variation in probe responses to changes in water content and soil mineralogy· variations in waveform characteristics associated with cable, deformation, cable calibration, and installation techniques for metallic cables in rock· several cases demonstrating the use of TDR cables in soil as well as weathered and soft rock· a rationale for the use of compliant cable in soil· the use of metallic cable (MTDR) and optical fiber (OTDR) to monitor response of structures· sensor/transducer components, connections from the sensors to the TDR pulser/sampler, and system control methods· available software for transmission and analysis of TDR signatures The diverse interest and terminology within the TDR community tends to obscure commonalities and the universal physical principles underlying the technology. The authors seek to crystallize the basic principles among the seemingly divergent specialties using TDR technology in geomaterials. By examining varied experiences, GeoMeasurements by Pulsing TDR Cables and Probes provides a synergistic text necessary to unify the field.
High Voltage Test Techniques Second Edition
The second edition of High Voltage Test Techniques has been completely revised. The present revision takes into account the latest international developments in High Voltage and Measurement technology, making it an essential reference for engineers in the testing field. High Voltage Technology belongs to the traditional area of Electrical Engineering. However, this is not to say that the area has stood still. New insulating materials, computing methods and voltage levels repeatedly pose new problems or open up methods of solution; electromagnetic compatibility (EMC) or components and systems also demand increased attention. The authors hope that their experience will be of use to students of Electrical Engineering confronted with High Voltage problems in their studies, in research and development and also in the testing field.
High-Speed Digital System Design: A Handbook of Interconnect Theory and Design Practices
A cutting-edge guide to the theory and practice of high-speed digital system design An understanding of high-speed interconnect phenomena is essential for digital designers who must deal with the challenges posed by the ever-increasing operating speeds of today's microprocessors. This book provides a much-needed, practical guide to the state of the art of modern digital system design, combining easily accessible explanations with immensely useful problem-solving strategies. Written by three leading Intel engineers, High-Speed Digital System Design clarifies difficult and often neglected topics involving the effects of high frequencies on digital buses and presents a variety of proven techniques and application examples. Extensive appendices, formulas, modeling techniques as well as hundreds of figures are also provided. Coverage includes: * A thorough introduction to the digital aspects of basic transmission line theory * Crosstalk and nonideal transmission line effects on signal quality and timings * The impact of packages, vias, and connectors on signal integrity * The effects of nonideal return current paths, high frequency power delivery, and simultaneous switching noise * Explanations of how driving circuit characteristics affect the quality of the digital signal * Digital timing analysis at the system level that incorporates high-speed signaling effects into timing budgets * Methodologies for designing high-speed buses and handling the very large number of variables that affect interconnect performance * Radiated emission problems and how to minimize system noise * The practical aspects of making measurements in high-speed digital systems
IDDQ Testing of VLSI Circuits
Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects. Later, this intuition was supported by data and analysis in the 1980s by Levi (RACD, Malaiya and Su (SUNY-Binghamton), Soden and Hawkins (Sandia Labs and the University of New Mexico), Jacomino and co-workers (Laboratoire d'Automatique de Grenoble), and Maly and co-workers (Carnegie Mellon University). Interest in IDDQ testing has advanced beyond the data reported in the 1980s and is now focused on applications and evaluations involving larger volumes of ICs that improve quality beyond what can be achieved by previous conventional means. In the conventional style of testing one attempts to propagate the logic states of the suspended nodes to primary outputs. This is done for all or most nodes of the circuit. For sequential circuits, in particular, the complexity of finding suitable tests is very high. In comparison, the IDDQ test does not observe the logic states, but measures the integrated current that leaks through all gates. In other words, it is like measuring a patient's temperature to determine the state of health. Despite perceived advantages, during the years that followed its initial announcements, skepticism about the practicality of IDDQ testing prevailed. The idea, however, provided a great opportunity to researchers. New results on test generation, fault simulation, design for testability, built-in self-test, and diagnosis for this style of testing have since been reported. After a decade of research, we are definitely closer to practice.
Generate faster, more accurate SPICE simulations! Make your SPICE simulations faster, more accurate - and avoid nonconvergence using the breakthrough methods packed into the Second Edition of Inside SPICE. In this updated and revised bestseller, Ron Kielkowski gives you the hands-on help and guidance you need to create more effective software modles for simulating circuit behavior. This one-of-a-kind modeling toll and troubleshooter brings you up to speed on the latest commercially-SPICE-like simulators, including HSPICe, PSPICE, IS_SPICE and MICROCAP IV...delivers proven solutions to the full range of circuit simulation problems, including convergence and accuracy problems...shows you how to make difficult measurement such as loop gain of an op amp or distortion measurements of clocked ciruits like converters and sample-and-hold circuits...measure any class of circuits, such as oscillators, charge-storage circuits, or very large circuits...and more. Inside SPICE. Up-to-date methods for creating fast, accurate circuit simulations with SPICE. The complexities of SPICE - the international standard in circuit simulation software - require expert handling, Inside SPICE gives you everything necessary to create the most effective software models for simulation the behavior of real circuits. And this edition of Inside SPICE offers the most up-to-date techniques for generating faster, more accurate simulations. Inside SPICE, Second Edition is an indispensable reference tool - and a troubleshooter. It will help professionals and students analyze and work around problems typically encountered with SPICE and SPICE-like simulator programs: HSPICE, PSPICE, IS_SPICE, and MICROCAP IV. It has a new chapter on simulation trends, in addition to a new, Windows-compatible CD-ROM version of RSPICE with extensive sample models. Well-organized chapters spell out the fundamentals, including: understanding circuit simulations; nonconvergence; SPICE options; numeric integration. Packed with example circuit files.
Instrument Engineers Handbook, Third Edition, Three Volume Set
You get: Three huge volumes: more than 4000 pages! Thousands of diagrams, charts, and tables Index with more than 10,000 entries Appendices that cover units, symbols, conversions, test procedures and calculations, suppliers' addresses and phone numbers, and much more Manufacturer product and contact information, domestic and overseas suppliers, and cost ranges This third edition of the Instrument Engineers' Handbook--most complete and respected work on process instrumentation and control--helps you: o Select and apply hundreds of process measurement and control instruments and analytical devices o Design the most cost-effective process control systems, optimizing production and maximizing safety The third edition covers all the latest advances in control hardware, transmitters, displays, DCS, PLC, and computer systems. It also provides in-depth coverage of control theory and shows how such unit processes as distillation and chemical reaction are optimized. Each section begins with a "Feature Summary," which provides quick access to specific information on cost, suppliers, ranges, and the accuracy of instrumentation. A fast reference for the data you need every day, Instrument Engineers' Handbook includes all the specifications, formulas, tables, and data you often need to look up on a moment's notice.
Instrumentation and Instrument Buses
An ATE consists of discrete instruments capable of applying stimuli and making accurate measurements under the control of a computer. You will learn how each of these elements does its job and what realistic expectations you can have.
Introduction to Instrumentation and Measurements
Describes new quantum standards for the ohm, volt, and other modern measurement standards Includes a detailed treatment of linear and nonlinear analog signal processing Evaluates noise and coherent interference and explains how to predict the noise-limited resolution of a measurement system Presents numerous examples of optoelectronic instrument systems Introduces elements of digital signal conditioning used in modern measurement systems Offers examples of unique measurement systems designed by the author Discusses current industry trends Includes a separate problems and solutions manual with exercises for Chapters 1-8 This new textbook and reference makes it easy to make an informed choice among sensors and signal conditioning systems. The book's broad coverage includes: electrical and physical standards; analog signal conditioning; noise and coherent interference; DC and AC null methods; sensor mechanisms and applications; electrical measurements; digital interfaces; digital signal conditioning; measurement system design examples; and more. The few other texts available on this topic lack the breadth of coverage and fail to cover recent changes in standards. An excellent sourcebook for students and practicing engineers alike, Introduction to Instrumentation and Measurements includes all the general information on instrumentation and measurements, as well as the technical details you need to apply your knowledge in the real world. There is no other text like it.
IR101 Automatic Infrared IR Thermometer
This beauty is one of the neatest thermometers we've ever seen! You can measure the temperature of anything merely by pointing a IR beam of light at it! That's right, no contact, no sensors, no wires, glass, nothing but a beam of IR light! Is your motor running hot? Is your refrigerator cold enough? How cold IS that bottle of soda? If you want to know, just aim and push the button. The temperature is immediately displayed on the backlit LCD display! Last measurement is automatically held and stored until power-off. Measurements can be momentary or continuous, with minimum and maximum temps held during measurement! You can't ask for much more than that in a handheld thermometer that is contact-free besides! How does it work, you ask? Well if you really want to know, when making a temperature measurement the surface radiation of the object to be measured is evaluated using the principle of radiation thermometry. This is a purely passive process, i.e. no radiation is transmitted, but instead, use is made of only the natural electromagnetic radiation energy (heat radiation) that every body above a temperature of absolute zero (-273 °C) has. The temperature can be determined very accurately from this radiation energy if the emission factor of the object being measured is known. We'll stop there, because we only have so much space for all this copy! Runs on 4 LR44 cells (included) for a long life. If you want to know what the temperature is, check it out with the IR101!
LabVIEW for Automotive, Telecommunications, Semiconductor, Biomedical and Other Applications
Most test and measurement books focus on theory. This one is radically different: it brings together dozens of the best real-world LabVIEW applications in leading test and measurement markets -- with detailed practical explanations of how each application was defined and implemented, and the results achieved.KEY TOPICS:Every application offers a unique, detailed solution to a common test and measurement challenge -- along with diagrams, expert advice, and hands-on problem-solving techniques from an experienced LabVIEW user. The applications encompass all mainline markets for test and measurement, including telecommunications, semiconductors, automotive, sound/vibration, automation, and more. The goal: to give readers the practical insight they need to build world-class LabVIEW virtual instrumentation solutions of their own.MARKET:For all engineers and other professionals seeking to solve test and measurement problems with LabVIEW.
LabVIEW: Advanced Programming Techniques
The graphical nature of LabVIEW makes it ideal for test and measurement applications and its use brings significant improvements in productivity over conventional programming languages. However, comprehensive treatments of the more advanced topics have been scattered and difficult to find-until now.LabVIEW Advanced Programming Techniques offers in-depth coverage of the subjects that move you to the next level of programming-the level that allows full exploitation of LabVIEW's power and utility. These topics include:Active X: Gain the background needed to use Active X in your LabVIEW applications.Object-Oriented Technologies: Get a clear description of object analysis and see examples of how it can apply to LabVIEW applications. Application structure: Discover a three-tiered architecture that results in robust, flexible, and easy to maintain code.State machines: Get extensive coverage of several types of state machines-arguably the most useful programming tool available.Exception handling: Learn how to detect, process, and resolve exceptions in your code.Instrument drivers: See the value drivers bring to code readability and maintenance -Learn the techniques for constructing reusable drivers.Multi-threading: Learn how to look at a LabVIEW code diagram to determine how many threads your application can use, then optimize the performance of the application.
Magnetic Sensors and Magnetometers
Whether you’re an expert or new to the field, this unique resource offers you a thorough overview of the principles and design of magnetic sensors and magnetometers, as well as guidance in applying specific devices in the real world. From exploring sensor and magnetometer properties for optimum system design… to the testing and calibration of precise magnetometers for full utilization, this book serves as your complete reference. You get practical approaches to selecting the right sensors for specific applications and advice on starting the development of a customized device. The book covers both multi-channel and gradiometric magnetometer systems, special problems such as cross-talk and crossfield sensitivity, and comparisons between different sensors and magnetometers with respect to various application areas. Miniaturization and the use of new materials in magnetic sensors are also discussed. A comprehensive list of references to journal articles, books, proceedings and webpages helps you find additional information quickly. Supported with 315 illustrations and 340 equations. Contents: Basics – Magnetic Quantities and Units. Magnetic States of Matter. Magnetic Materials for Sensor Applications. Sensor Specifications. Induction Sensors – Air Coils. Search Coils With a Ferromagnetic Core. Noise Matching to an Amplifier. Design Examples. Other Measuring Coils. Fluxgate Sensors – Orthogonal-Type Fluxgates. Core Shapes of Parallel-Type Fluxgates. Theory of Fluxgate Magnetometer. Principles of Fluxgate Magnetometers. Exitation. Tuning the Output Voltage. Current-Output (or Short-Circuited) Fluxgate. Noise and Offset Stability. Crossfield Effect. Designs of Fluxgate Magnetometers. Miniature Fluxgates. ac Fluxgate. Multiaxis Magnetometers. Fluxgate Gradiometers. Magnetoresistors – AMR Sensors. GMR Sensors. Hall-Effect Magnetic Sensors – Basics of the Hall Effect and Hall Devices. High Electron Mobility Thin-Film Hall Elements. Integrated Hall Sensors. Nonplatelike Hall Magnetic Sensors. Magneto-Optical Sensors – Faraday and Magneto-Optical Kerr Effects. Sensors of Magnetic Fields and Electric Currents. Geometric Measurements. Resonant Magnetometers – Magnetic Resonance. Proton Precession Magnetometers. Optically Pumped Magnetometers. Superconducting Quantum Interference Devices (SQUIDs) – Introduction. SQUID Sensors. SQUID Operation. Input Circuits. Refrigeration. Environmental Noise (Noise Reduction). Applications. Other Principles – Magnetoimpedance and Magnetoinductance. Magnetoelastic Field Sensors. Biological Sensors. Applications of Magnetic Sensors – Biomagnetic Measurements. Navigation. Military and Security. Automotive Applications. Nondestructive Testing. Magnetic Marking and Labeling. Geomagnetic Measurements: Mineral Prospecting, Object Location, and Variation Stations. Space Research. Testing and Calibration Instruments – Calibration Coils. Magnetic Shielding. Magnetic Sensors for Nonmagnetic Variables – Position Sensors. Proximity and Rotation Detectors. Force and Pressure. Torque Sensors. Magnetic Flowmeters. Current Sensors. Sensors Using Magnetic Liquids. Magnetic Sensors, Magnometers, and Calibration Equiptment Manufacturers. List of Symbols and Abbreviations
Measurement and Calibration Requirements for Quality Assurance to ISO 9000
Quality assurance is of paramount importance for today’s businesses. This uniquely integrated approach to quality management focuses on the measurement and calibration requirements that are key to the achievement of ISO 9000. The cross-disciplinary approach makes this well-structured text an invaluable asset both to engineers concerned with the development, implementation and maintenance of quality systems and to managers wishing to gain an insight into quality assurance issues. Features include: · Examination of the requirements of ISO 9000 benefiting readers who are constructing new quality systems or updating existing schemes · Description of the mechanisms for assessing the sources of measurement error and quantifying their effect allowing the engineer to pinpoint problems · Discussion of the general principles of measurement and calibration procedures enabling the reader to formulate a quality control strategy · The comprehensive review of measurement and calibration procedures for process parameters qualifying the reader to select appropriate instruments · Coverage of environmental management systems satisfying ISO 14000 enabling companies to demonstrate their commitment to responsible manufacturing
Measurement of Mobile Antenna Systems
If you’re involved with the design, installation or maintenance of mobile antenna systems, this book gives you the most-comprehensive understanding of all the mandatory measurement techniques you need for your projects. You get practical guidance on the selection of measurement sites, the measurement of system building and setup, and the analysis of measured data. It presents in-depth examinations of all relevant mobile antenna measurement theories, along with practical measurement procedures and examples to show you how it’s done. Topics include propagation measurement, antenna characteristics measurement, radiation power measurement, human interaction measurement, base station siting and maintenance, and fading and field simulator systems. Referenced with 172 illustrations and 161 equations. Contents: Preface. Propagation Measurements – Overview of Propagation Measurements. Field Profile Measurements. Diversity Measurements. Delay Profile Measurements. Propagation Measurement System. Delay Profile Measurement System. Antenna Measurements for Radio Handsets and Mobile Terminals – Antenna Input Port Impedance Measurements. Radiation Pattern Measurement. Radiation Efficiency Measurements. Diversity Characteristics Measurement Using Radiation Patterns. EMC Measurements. Product Testing. Handset Antennas and Influences Due to the Human Body – Human Body Influences on the Handset Antenna. The Phantom: An Electrical Equivalent Model of the Human Body. Antenna Measurements Using a Phantom. SAR Measurement Using a Phantom. Measurements Using a Human Body. Base Station Antenna Siting, Measurement and Maintenance – Base Station Antenna Siting. Design of Cellular Base Station Antennas. Base Station Antenna Measurements. Product Inspection. Fading and Field Simulators – Fading Simulators. Field Simulators. Sensitivity Measurements Using a Field Simulator. Delay Spread Measurement Using a Field Simulator. Appendices. About the Author. Index.
Optical Measurement Techniques and Applications
Significant advances in optical metrology have fueled the development of new, innovative techniques for the technology in a wide range of applications. Now you can better understand these highly accurate and versatile new methods, and gain insight into applying the technology to solve specific measurement problems. Optical Measurement Techniques and Applications does much more than just cover the underlying principles behind the latest optical measurement techniques. With the help of hundreds of example diagrams and step-by-step equations, sixteen of the industry’s leading experts quickly bring you up to speed on how these methods are used in dozens of real-world applications -- from laser remote-sensing, to vibration measurement, to providing the data necessary to develop computer models, and more. The book also prepares you to meet future optical measurement challenges by identifying what areas of research are on the horizon. And each chapter concludes with an extensive list of references for more advanced research. This is an invaluable reference for optical researchers and practicing engineers who need sharp insight into the key optical measurement techniques and systems in use today. It’s also a powerful learning resource for upper-level undergraduate and postgraduate students. 1. Introduction: Interference of Waves. Diffraction. Polarization. Speckle. Sensitivity, Accuracy, and Precision. Scope of the Text. Concluding Remarks. 2. Optical Metrology of Engineering Surfaces -- Scope and Trends: Triangulation. Projected Fringe Techniques for Industrial Inspection and Microshape Analysis. Interferometry for Precision Measurements. Interferometry on Optically Rough Surfaces. Shearing Interferometry. White-Light Interferometry for Micro- and Macrostructure Analysis. Heterodyne Interferometry. Interferometry Outside the Coherence Length. Interferometry for Microtopography and Roughness Measurements. 3. Digital Processing of Fringe Patterns in Optical Metrology: Techniques for Digital Phase Reconstruction. Measurement of Three-Dimensional Displacement Fields. Conclusion. 4. Interferometric Optical Testing: Principles of Optical Testing. Implementation and Development of Interferometric Testing Methods. Conclusion. 5. Holographic Interferometry -- An Important Tool in Nondestructive Measurement and Testing: Wavefront Reconstruction Process. Basic Methods of Wavefront Comparison. Brief Introduction to Fringe Formation and Phase Difference Measurement. Measurement of Static Deformation. Study of Vibrations. Flow Visualization. Measurement of Surface Topography. Concept of Holographic Flaw Detection. Some Examples of Application. TV Holography and Electronic Holography. Conclusions. 6. Speckle Photography, Shearography, and ESPI: Some Statistical Properties. Speckle Photography. Speckle Interferometry. Speckle-Shear Interferometry (Shearography). Contour Generation. ESPI. Summary. 7. Photoelasticity and Moire: Photoelasticity. Moire. Conclusions. 8. Optical Fiber Sensors: Intensity-Based Sensors. Distributed Sensors. Interferometric Sensors. Summary. 9. Fiber Optic Smart Sensing: Fiber Optic Smart Sensing. Smart Sensing Subsystems. Sensor Selection. Application Examples. Outlook. 10. Holographic Metrology of Micro-objects in a Dynamic Volume: Historical Background. Basic Principles of In-Line Fraunhofer Holography. System Design Parameters. Some Practical Considerations. Hologram Fringe Contrast and Its Enhancement. Nonimage Plane Analysis. Velocimetry and High-Speed Holography. Off-Axis Holography. Automated Analysis. Some Other Developments. 11. Particle Image Velocimetry: Principles. Methods of Image Analysis in PIV. Advances. Conclusions Highlighting Areas of Future Development. 12. Surface Roughness Measurement: Microscopy. Mechanical Profilers. Optical Profilers. Total Integrated Scattering. Angle-Resolved Scattering. Other Techniques. Importance of Surface Cleanliness. Future Developments. 13. Lidar for Atmospheric Remote Sensing: The Lidar Method. Lidar Systems. Conclusion. 14. Some Other Methods in Optical Metrology: Optical Caustics. Digital Image Correlation. Ellipsometry. Digital Photogrammetry.
Optimizing Electronics Vibration HALT, HASS, ALT and ESS
A three-day interactive workshop aimed at shortening the time required for electronics design, vibration testing and (when weaknesses are found) corrective action. This course applies to vibration of electronics at system, box or circuit card level. Methods can also be used in the design and testing of electronic components to meet vibration standards or desired capabilities. Discussion of simple methods and animations assist participants understand the complex responses of their electronics to laboratory and to field vibration. "Vibration test efficiency" is a new term, used here to illustrate recent improvements over the past slow "learning curve" for vibration knowledge. Since vibration life of most electronics is dependent on response at circuit card level, methods concentrate on the fatigue damage from PCB modal response. The purpose of this course is to simplify the complex field of vibration of electronics and make results understandable. 1% Efficiency? Tests can determine fragility limits of test samples. But few tests supply any further information (beyond pass/fail). Why? Because test measurements can't fully describe failures. Most tests miss most of the valuable information that is (with this course) readily available. Early Attempts In the 70's and 80's, relatively simple mathematical methods were developed to predict PCB vibration life capabilities. Why? Because few companies could afford that era's high-speed computer systems and the technical expertise needed to analyze vibration. Those early methods, still used by many, provide guidelines that sometimes work, but they never provide product understanding. And all too often, such guidelines outright fail, at great expense - the expense of design and production of an unreliable product. But since then, the cost of high-speed computer power has dropped at a rate of about 50% per year. The compounded cost savings of the mid 80's high-speed computer is over 99.99%. One of the best-kept secrets of certain large companies is their ability to produce reliable electronic products at low cost. How? They are able to fully understand vibration of their electronics through detailed analysis. Such companies rarely share their reliability secrets with competitors. But now, with this course, every company can afford high speed analysis support of its testing. Test Efficiency? Let's define test efficiency as dollar value of information gained divided by dollars of test cost. If you run a test program without analysis, your numerator is near zero. Adding modern technology analysis can immeasurably increase your "information gained" numerator. Every test performed without detailed posttest analysis throws information away and wastes money. Rather than throw it away, capture that information and use it to save many design and production problems. Detailed Analysis? The "design life" of any system is defined by its weakest part based on the part's local exposure. Since vibration damage of circuit cards is dominated by cyclic stresses (caused by modal vibration), analysis should concentrate on accurately quantifying the stresses experienced by every component. Design life is limited by accumulated fatigue damage. Taking advantage of the speed of today's PCs, companies without prior experience can use this course to understand and avoid vibration-induced failures. For DATES AND LOCATIONS see
OrCAD PSpice for Windows Volume 1: DC and AC Circuits
For courses in DC/AC Principles, Devices and Circuits, Operational Amplifiers, and Digital, Analog, and Filter Design. This text series takes students from a simple DC circuit with its customary current and voltage measurements, through a damped resonant circuit requiring rise time characteristics, to a complex digital circuit that demands sophisticated timing and frequency measurements. It continues simulation studies with more advanced topics such as operational amplifiers, digital, and filter design. Comfortable, yet challenging, multi-level activities, examples, and exercises show students how to use the program to draw circuits directly on the screen, analyze the circuit in seconds using PSpice, and display the results using sophisticated techniques that go far beyond those possible with conventional instruments.
A must-have guide to using oscilloscopes! The Oscilloscope Guide brings to life, with full illustrations and diagrams, oscilloscopes and how to utilize them in many useful electronic tests and measurement techniques. Oscilloscope Guide answers questions about various types of oscilloscopes and how to obtain useful test results on a variety of electronic devices. Many test examples are also given to help guide you through multiple test procedures. An invaluable handbook, The Oscilloscope Guide is a useful bench companion to have when a project would benefit from oscilloscope use.
Practical Radio Frequency Test and Measurement A Technician's Handbook
The book will teach readers the basics of performing the tests and measurements used in radio-frequency systems installation, proof of performance, maintenance, and troubleshooting. Practical Radio Frequency Test and Measurement teaches readers the basics of performing the tests and measurements used in radio-frequency systems installation, proof of performance, maintenance, and troubleshooting. Anyone interested in gaining more practical proficiency with RF, whether engineer, technician, amateur radio buff, or hobbyist, needs a copy of this book. Joseph J. Carr, himself an accomplished practitioner in this field, examines the instruments used in the various types of measurement before moving on to specific measurement methods. Carr includes information on basic theories of RF measurement, as well as test equipment, test set-ups, test and measurement procedures, and interpretation of results.
Production Testing of RF and System-On-A-Chip Devices for Wireless Communications
With the increasing number of integrated wireless devices being developed with SOC (system on a chip) technology, a merger of RF and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of RF and SOC product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, WLAN, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment.
Radio Frequency and Microwave Electronics Illustrated
Learn the fundamentals of RF and microwave electronics visually, using many thoroughly tested, practical examples RF and microwave technology are essential throughout industry and to a world of new applications-in wireless communications, in Direct Broadcast TV, in Global Positioning System (GPS), in healthcare, medical and many other sciences. Whether you're seeking to strengthen your skills or enter the field for the first time, Radio Frequency and Microwave Electronics Illustrated is the fastest way to master every key measurement, electronic, and design principle you need to be effective. Dr. Matthew Radmanesh uses easy mathematics and a highly graphical approach with scores of examples to bring about a total comprehension of the subject. Along the way, he clearly introduces everything from wave propagation to impedance matching in transmission line circuits, microwave linear amplifiers to hard-core nonlinear active circuit design in Microwave Integrated Circuits (MICs). Coverage includes: · A scientific framework for learning RF and microwaves easily and effectively · Fundamental RF and microwave concepts and their applications · The characterization of two-port networks at RF and microwaves using S-parameters · Use of the Smith Chart to simplify analysis of complex design problems · Key design considerations for microwave amplifiers: stability, gain, and noise · Workable considerations in the design of practical active circuits: amplifiers, oscillators , frequency converters, control circuits · RF and Microwave Integrated Circuits (MICs) · Novel use of "live math" in circuit analysis and design Dr. Radmanesh has drawn upon his many years of practical experience in the microwave industry and educational arena to introduce an exceptionally wide range of practical concepts and design methodology and techniques in the most comprehensible fashion. Applications include small-signal, narrow-band, low noise, broadband and multistage transistor amplifiers; large signal/high power amplifiers; microwave transistor oscillators, negative-resistance circuits, microwave mixers, rectifiers and detectors, switches, phase shifters and attenuators. The book is intended to provide a workable knowledge and intuitive understanding of RF and microwave electronic circuit design. Radio Frequency and Microwave Electronics Illustrated includes a comprehensive glossary, plus appendices covering key symbols, physical constants, mathematical identities/formulas, classical laws of electricity and magnetism, Computer-Aided-Design (CAD) examples and more. About the CD-ROM T The accompanying CD-ROM is an "E-Book" containing actual design examples and methodology from the text, in Microsoft Excel environment, where files can easily be manipulated with fresh data for a new design.
Random Vibration, Shock Testing, HALT, ESS, HASS Measurements, Analysis and Calibration
Upon completion of this short course, you will be able to measure vibration and shock, calibrate vibration and shock measurement systems, convert measured data into a test program, interpret vibration and shock test requirements, conduct vibration and shock tests, design suitable vibration and shock test fixtures.
RF Measurements of Die and Packages
The explosion in the wireless industry, coupled with the higher frequencies in today’s digital integrated circuits (IC) has made vital the need for accurate IC testing. This is the first book dedicated to the issues surrounding RFIC testing. An important resource for RFIC designers and high-frequency digital IC designers, IC test engineers, and IC manufacturing test engineers, this ground breaking resource helps you perform high-accuracy RF measurements of die and packages in the RF test lab, employ RF coplanar probes for accurate on-wafer characterization, and troubleshoot and utilize coplanar probes and test fixtures to extend their lifetime. Moreover, the book shows you how to build RF test systems for noise, high-power, and thermal testing, and de-embed the test system’s parasitic effects to get the die’s RF performance. This timely resource defines the essential elements in an RF system, explains where errors can be found in such a system, and shows how to mathematically remove them with calibration. It discusses the construction of both coplanar and high-volume testing membrane probes. The book details how to use coplanar probes to characterize individual die on the wafer, describes three popular RF test systems, and concludes with an explanation of how to characterize packages. Contents: Preface. Introduction. Calibration. Probes and Fixtures. Planarization. Repeatability. Performing Device Characterization. Characterizing Packaged Parts and Empty Packages. Summary: the Future. Appendix.
Software Test, Reliability and Quality Assurance
You will get practical answers to the following questions: When should you start testing and when can you stop testing? How do you predict software bug rates? Which defects are acceptable and why? What software metrics should be collected to measure testing progress? How do you plan for testing, debugging, and fixing software? What can you look for in code to verify that software reliability has been designed into the software? This course prepares you to create better software and to evaluate software produced by others.
Standards in Test
You will be introduced to most of the Military and Commercial Standards that affect the way test is performed and interpreted by both military and commercial concerns.
Systematic Software Testing
Gain an in-depth understanding of software testing management and process issues that are critical for delivering high-quality software on time and within budget. Written by leading experts in the field, this book offers those involved in building and maintaining complex, mission-critical software systems a flexible, risk-based process to improve their software testing capabilities. Whether your organization currently has a well-defined testing process or almost no process, Systematic Software Testing provides unique insights into better ways to test your software. This book describes how to use a preventive method of testing, which parallels the software development lifecycle, and explains how to create and subsequently use test plans, test design, and test metrics. Detailed instructions are presented to help you decide what to test, how to prioritize tests, and when testing is complete. Learn how to conduct risk analysis and measure test effectiveness to maximize the efficiency of your testing efforts. Because organizational structure, the right people, and management are keys to better software testing, Systematic Software Testing explains these issues with the insight of the authors’ more than 25 years of experience. Contents: Preface. Acknowledgments. An Overview of the Testing Process - A Brief History of Testing. STEPTM Testing Process. Risk Analysis - What is Risk? Software Risk Analysis. Planning Risks and Contingencies. Master Test Planning - Levels (Stages) of Test Planning. Audience Analysis. Activity Timing. Standard Templates. Sections of a Test Plan. Detailed Test Planning - Acceptance Testing. System Testing. Integration Testing. Unit Testing. Analysis and Design - Creating Inventories. Black Box vs. White Box. Black Box Science. Black Box Art. White Box Science. Test Design Documentation. Test Implementation - Test Environment. Model Office Concept. What Should be Automated? Avoiding Testing Tool Traps. Evaluating Testware. Test Execution - Before Beginning Test Execution. Test Log. Test Incident Reports. Testing Status and Results. When Are We Done Testing? Measuring Test Effectiveness. The Test Organization - Test Organizations. Office Environment. The Software Tester - Characteristics of Good Testers. Finding Good Testers. Hiring Testers. How Many Testers Do You Need? Retaining Staff. Software Tester Certifications. The Test Manager - What Is Management? Management vs. Leadership. Marine Corps Principles of Leadership. The Test Manager As a Leader. The Test Manager’s Role in the Team. The Test Manager’s Role in Training. Metrics Primer for Test Managers. Improving the Testing Process - Improving the Testing Process. ISO Certification. Capability Maturity Model (CMM). Test Process Improvement (TPI) Model. Continuous Improvement. Some Final Thoughts - Use Preventive Testing Techniques. Conduct Software Risk Analysis. Determine Planning Risks. Develop a Testing Strategy. Use Inventories. Use Testing Tools When Appropriate. Analyze Defect Trends and Patterns. Measure Test Effectiveness. Conduct Training Continually. Sell the Idea of Testing.
Temperature Measurement covers nearly every type of temperature measurement device, in particular, bimetallic thermometers, filled bulb and glass stem thermometers, thermistors, thermocouples, and thermowells. Includes suppliers and prices.
Test and Evaluation of Complex Systems
Is it functional? Is it safe? Is it rigorous? Is it detrimental? Over the last two decades Test and Evaluation (T&E) techniques have evolved in response to the increasing complexity and interdependency of systems. The safe and proper operation of the complex systems and consumer products used in energy, transportation, electronics and communications, can no longer be realized without a formalized T&E program. Features include: · Easy-to-understand guide to the seven Best Practices for planning an effective T&E program · A useful model of the T&E Engineering process · T&E of computer programs, Modelling and Simulation, Operational T&E and Interoperability T&E · Case studies from both governmental and commercial sectors · T&E resources world-wide including the addresses of local T&E chapters Purposely written with the priorities of you the program manager and systems engineer in mind. This book masterfully captures the basic principles of T&E, specifically applying them to a variety of industries. Test and Evaluation of Complex Systems forms part of the Wiley Series in Measurement Science and Technology. Chief Editor: Peter Sydenham Australian Centre for Test and Evaluation, University of South Australia. This series was founded to coincide with the recognition of measurement science and instrument technology as fields with their own scholarship and techniques.
Test Gear and Measurements
Test Procedures for Basic Electronics
This introductory book about electronics testing details numerous test and measurement procedures with emphasis on the use of commonly available instruments. Through the use of clear and concise diagrams, accurate illustrations, and the application of basic principles, the text details the whats and whys of measuring and testing of electronic and electrical quantities. Everyone from students and hobbyists to professionals will benefit from this practical guide to electronic testing.
The Measurement, Instrumentation and Sensors Handbook
The Measurement Instrumentation and Sensors Handbook describes the use of instruments and techniques for practical measurements required in engineering, physics, chemistry, and the life sciences.The book examines: Sensors, Hardware, Software Techniques, Information processing systems, Automatic data acquisition, Reduction and analysis as well as their incorporation for control purposes. Organized according to the measurement problem, each section addresses the different ways of making a measurement for a given variable. Chapters present information on three levels:oBasic information without equations and a description of the subject that can be understood by the newcomer. Detailed text and mathematical treatment essential for discovering applications and solving problems outside one's field of specialtyoAdvanced applications of the subject, evaluative opinions, and areas for future studyThe Measurement, Instrumentation and Sensors Handbook provides a graded level of difficulty from start to finish, serving the reference needs of the broadest group of readers.Edited by one of the more noted instrumentation experts in the world, the book contains nearly 150 contributions, covering all aspects on the design and implementation of various instrumentation.
Traceable Temperatures: An Introduction to Temperature Measurement and Calibration, 2nd Edition
The accurate measurement of temperature is a vital parameter in many fields. A critically important aspect of applying any temperature sensor is that of traceable calibration - a concept that has been developed to ensure that all measurements made are accurate and legally valid. This timely new edition reflects the marked move towards ISO accreditation in measurement laboratories internationally, and the ever increasing emphasis on adequate uncertainty analysis for measurements in accredited laboratories to conform to national and international bodies, and the SI and Metric treaty. · Fully revised and updated to incorporate the latest trends and developments in measurements and calibration · Provides information concurrent with the latest ISO Quality Standards for assessing the uncertainty of measurement sensors · Offers detailed converage of traceability, how to make traceable measurements and how to design, carry out and report calibration · Unique emphasis on possible problems in the field, and provision of practical advice on how to recognise and treat errors. An essential reference resource for practising and training engineers, scientists and technicians in accredited test and calibration laboratories involved in temperature measurement and calibration.
Vibration and Shock Distance Learning
Thousands of Power Point slides and a number of images and video clips teach you about vibration and shock basics, control, instrumentation, calibration, analysis and testing. Course outlind includes the following: Introduction, Classical sinusoidal vibration, Resonance effects, Torsional vibration, Control of dynamic motion, Steady-state vibration measurements, Sinusoidal vibration calibration, continuous systems, Analysis of complex motion, Types of tests, Electrohydraulic shakers, Multiple EH shakers, Electrodynamic shakers, Power amplifiers, Sine test standards, Random vibration, Measurement and analysis of random vibration, Random vibration testing standards, Controlling random vibration tests, Environmental Stress Screening (ESS), Accelerated Testing and Screening, Mesuring mechanical shock, SRS - The Shock Response Spectrum, Mechanical Shock Testing, Modal Testing
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