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Online Catalog of Educational Courses and Resources
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29 Records Found
What You Will Learn
A Designer's Guide to Built-in Self-Test
Part of the
DFT/BIST Library Collection.
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test (BIST). This idea was first proposed around 1980 and has grown to become one of the most important testing techniques at the current time, as well as for the future. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented since 1980, along with their advantages and limitations. The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing. Particular attention is paid to system-level use of BIST in order to maximize the benefits of BIST through reduced testing time and cost as well as high diagnostic resolution. The author spent 15 years as a designer at Bell Labs where he designed over 20 production VLSI devices and 3 production circuit boards. Sixteen of the VLSI devices contained BIST of various types for regular structures and general sequential logic, including the first BIST for Random Access Memories (RAMs), the first completely self-testing integrated circuit, and the first BIST for mixed-signal systems at Bell Labs. He has spent the past 10 years in academia where his research and development continues to focus on BIST, including the first BIST for FPGAs and CPLDs along with continued work in the area of BIST for general sequential logic and mixed-signal systems. He holds 10 US patents (with 5 more pending) for various types of BIST approaches. Therefore, the author brings a unique blend of knowledge and experience to this practical guide for designers, test engineers, product engineers, system diagnosticians, and managers.
Analog and Mixed-Signal Boundary-Scan A Guide to the IEEE 1149.4 Test Standard
The Mixed-Signal Boundary-Scan Test Bus is the natural complement to the widely used Boundary-Scan IEEE Std. 1149.1, commonly known as JTAG. This new Mixed-Signal standard is called IEEE Standard 1149.4 and is mainly dedicated to the manufacturing test of analog and mixed-signal boards. But like the IEEE 1149.1 it can be used for many other purposes: the test buses and their digital control form a very general `analog data highway'. Increasingly, mixed-signal boards are gaining complexity, making their testing process extremely challenging. At the same time, IC complexity and technology are getting so sophisticated that testing ICs at the board level becomes very expensive. Embedding a part of the board tester on chip is the aim of the IEEE 1149.4. Analog and Mixed-Signal Boundary-Scan is a comprehensive treatment of the design, application and structure of the IEEE 1149.4. It updates the information on digital Boundary-Scan and addresses chip designers in a dedicated chapter containing guidance to easily build analog circuits including IEEE 1149.4. A basic metrology and a test strategy with the instrumentation needed for it are also described. Analog and Mixed-Signal Boundary-Scan is essential reading for researchers and professionals who need to understand IEEE Standard 1149.4 and its practical implementation in industry.
Analog Test and Fault Isolation
The problems that you will encounter when you try to test analog circuits with an ATE. The course will show how accuracies and resolutions can affect your test results. You will also learn to deal with analog simulation and fault simulation issues. The IEEE-1149.4 Mixed Signal Testability as well as the IEEE-1149.6 mechanisms will also be explored.
ATE Selection and Management
Presented from a non-biased perspective, this course will teach you the decision process for test strategy selection. It provides a generic approach and alert you to things you should consider for ATE investment.
ATE Selection, Design and Programming
This course covers every aspect of a test engineer's responsibility. Participants will learn how to select an automatic test equipment (ATE) from the number of choices and generically different types available. You will learn how to build an ATE from instrumentation and other building blocks. You will learn the bussing requirements of the IEEE 488, VXIbus, and PC-based instruments. You will also learn the software issues. The course will teach you how to approach a functional test programming activity for digital circuits. (In the longer, three-day course, analog test programming is also covered.) Finally, you will learn test management issues, such as test program development estimation, acquisition and quality assurance.
Boundary-Scan Interconnect Diagnosis
Boundary-Scan Interconnect Diagnosis explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those sequences. Its importance has to do with designing complex electronic systems using pre-designed intellectual property (IP) cores, which is becoming increasingly popular nowadays. Since tests for pre-designed cores can be supplied with the cores themselves, the only additional tests that need to be developed to test and diagnose the entire system are those for wire interconnects between the cores. Besides the trivial solutions that are often used to solve this problem, there are many more methods that enable significant optimizations of test vector length and/or diagnostic resolution. The book surveys all existing methods of this kind and proposes new ones. In the new approach circuit and interconnect faults are carefully modeled, and graph techniques are applied to solve the problem. The original feature of the new method is the fact that it can be adjusted to provide shorter test sequences and/or greater diagnostic resolution. The effectiveness of existing and proposed methods is then evaluated using real electronic assemblies and published statistical data for an actual manufacturing process from HP.
Boundary-Scan Test A Practical Approach
This book will act an introduction to as well as a practical guide to Boundary-Scan testing. The ever increasing miniaturization of digital electronic components is hampering the conventional testing of Printed Circuit Boards (PCBs) by means of bed-of-nails fixtures. Basically this is caused by the very high scale of integration of ICs, through which packages with hundreds of pins at very small pitches of down to a fraction of a millimeter, have become available. As a consequence, the trace distances between the copper tracks on a printed circuit board came down to the same value. Not only have the required small physical dimensions of the test nails made conventional testing unfeasible, the complexity to provide test signals for many hundreds of test nails has grown beyond manageable limits. Following the evolution in the IC test technology, Boundary-Scan testing has become the new approach to PCB testing. By taking precautions in the design of the IC (design for testability), testing on a PCB level could be simplified to a great extent. This condition has been essential for the success of the introduction of a Boundary-Scan Test (BST) at board level. This book will aid a company to introduce the Boundary-Scan Test. IC design and test engineers alike will find the book an important introduction and guide to using the Boundary-Scan Test in their work. Engineering managers can also use this book to gain an insight to the impact that the Boundary-Scan Test will make on their organization.
Built-In Test: Bridge From Design Through Support
This book was written for use by various disciplines. It clearly describes the use if BIT, BITE, Self-Test and BIST, from the perspective of Designers, Test Engineers, Support and Management. It distinguishes between component, board and system application of BIT and illustrates implementation for each. The reader is introduced to scan techniques, Linear Feedback Shift Registers, signature analyzers, Pseudo-Random Signal Generators and other BIT design tools. Analog BIT is also covered. Finally, techniques are given to evaluate BIT design in terms of fault detection, fault isolation, false alarm rates, as well as its effect on maintainability, MTTR, Operational Readiness and Availability.
Cost Effective Tests Using ATE, DFT and BIST
The two main reasons to test are 1) to eliminate failures escaping to your customers and 2) to reduce the life cycle cost of a product by eliminating penalty costs associated with delivering potentially faulty units. Many people have traded one of these requirements for the other, but with the advent of more sophisticated automatic test equipment (ATE), more attention paid to design for testability (DFT) and utilizing built-in self test (BIST), it is possible to do both. This tutorial provides a thorough understanding of each of these tools and strategies for more comprehensive and cost-effective testing. The course will combine the technical aspects of testing today’s complex circuits with the economics demanded by lower costs, faster times to market and a higher rate of obsolescence for both electronic products and test equipment.
Design for Testability and for Built-in Self Test
In this course you will learn all aspects of Design for Testability, from what it is, why you might need it, why someone would object to it, and what it can and cannot accomplish. You will learn how today's technology has become elusive to certain failure modes and how important it is to expose them through more testable designs. First you will learn some simple techniques to enhance observability and controllability. You will learn how you can access hundreds of internal points with as few as four additional edge connector pins. You will learn specific guidelines for both digital and analog circuit testability. You will learn structured testability techniques, such as internal and boundary-scan. You will come away with a deep understanding of the IEEE 1149.1 (JTAG) standard's operation, use and even its limitations. You will also learn some new techniques in testability, including IDDQ testing and I/O Mapping. In the second part of the course, you will learn what built-in [self] test (BIST) is and how it can be specified. You will learn structures such as linear feedback shift registers (LFSRs), signature analyzers, and pseudo-random signal generators. With these building blocks you will be able to evaluate a number of BIST architectures. You will learn BIT Software techniques and consider the effect false alarms have on BIT. You will finally be able to specify BIT for your products and look at the possibilities of BIT taking over some of the ATE functions.
Design-For-Test For Digital IC's and Embedded Core Systems
The first practical DFT guide from an industry insider. Skip the high-brow theories and mathematical formulas—get down to the business of digital design and testing as it's done in the real world. Learn practical testing strategies that address today's business needs for quality, reliability, and cost control, working within the tight deadlines of typical high-pressure production environments. Design-for-Test for Digital IC's and Embedded Core Systems helps you optimize the engineering trade-offs between such resources as silicon area, operating frequency, and power consumption, while balancing the corporate concerns of cost-of-test, time-to-market, and time-to-volume. You'll also boost your efficiency with the special focus on automatic test pattern generation (ATPG). The book includes a roadmap that allows you to fine-tune your learning if you want to skip directly to a specific subject. Key topics include: Core-based design, focusing on embedded cores and embedded memories System-on-a-chip and ultra-large scale integrated design issues AC scan, at-speed scan, and embedded DFT Built-in self-test, including memory BIST, logic BIST, and scan BIST Virtual test sockets and testing in isolation Design for reuse, including reuse vectors and cores Test issues being addressed by VSIA and the IEEE P1500 Standard Design-for-Test for Digital IC's and Embedded Core Systems is filled with full-page graphics taken directly from the author's teaching materials. Every section is illustrated with flow-charts, engineering diagrams, and conceptual summaries to make learning and reference fast and easy. This book is a must for the engineers and managers involved in design and testing. The enclosed CD-ROM contains full-color versions of all the book's illustrations in Acrobat PDF format. These images may be viewed interactively on screen or printed out to create overheads for teaching. Acrobat Reader software for Windows and UNIX computers is included.
Digital Hardware Testing
Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path. Contents:Faults in Digital Circuits. Bridging Faults in Random Logic. Open Circuit Faults in Random Logic. Fault Simulation and Test Generation. Testing of Structured Designs (PLAs). Memory Testing. Testing of Sequential Circuits. Microprocessor Testing. Design for Testability. Current Testing. Special Test Methods.
Exploring the World of SCSI
So many peripherals, so little time! With Exploring the World of SCSI, you will gain the knowledge needed to get the most out of your peripheral devices, including scanners, printers, external disc drives and more. Focusing on the needs of the hobbyist, PC enthusiast, as well as system administrator, This is a comprehensive book for anyone interested in learning the hands-on aspects of SCSI. It includes how to work with the Logical Unit Numbers (LUNs) within SCSI, how termination works, bus mastering, caching, and how the different levels of RAID provide varying levels of performance and reliability. This book offers the functionality that intermediate and advanced system users need for configuring SCSI on their systems, while also providing the experienced professional with the necessary diagrams, descriptions, information sources, and guidance on how to implement SCSI-based solutions. Exploring the World of SCSI contains both real-world applications and theoretical information for the technical professional who wants to get the most out of SCSI, including how to configure it on a workstation or server. This book can be used as both a desktop reference as well as a guide to configuring SCSI. Included are troubleshooting tips and tricks for getting SCSI devices configured on a network as well as information about the role of SCSI in network-based storage. Exploring the World of SCSI will provide both technicians and administrators with assistance in defining network topology issues.
High-Level Test Synthesis of Digital VLSI Circuits
This is the first book to propose HTS as a complete, effective design approach to derive an inherently testable architecture at low or even no overhead. The book presents a background to HTS, discusses various HTS techniques for both scan and built-in self-test methodologies, covers register transfer level test synthesis, and introduces high-level synthesis algorithms. It provides examples of several effective HTS schemes for highly testable digital circuits and a survey of representative HTS systems.
Iddq Testing for CMOS VLSI
This is one of the most comprehensive books dealing with this new testing phenomenon that has demonstrated impressive increases in fault coverage with less effort than functional or scan based testing. The text is oriented towards application and is useful in understanding the objectives of IDDQ testing.
Instrumentation and Instrument Buses
An ATE consists of discrete instruments capable of applying stimuli and making accurate measurements under the control of a computer. You will learn how each of these elements does its job and what realistic expectations you can have.
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Spot defects are random phenomena present in every fabrication line. As technological processes mature towards submicron features, the effect of these defects on the functional and parametric behavior of the IC becomes crucial. Integrated Circuit Defect-Sensitivity: Theory and Computational Models reviews the importance of a defect-sensitivity analysis in comtemporary VLSI design procedures. The modeling of defects in microelectronics technologies is revised from a set theoretical approach as well as from a practical point of view. This way of handling the material introduces the reader step-by-step to critical area analysis through the construction of formal mathematical models. The rigorous formalism developed in this book is necessary to study the construction of deterministic algorithms for layout defect exploration. Without this basis, it would be impossible to scan layouts in the order of 106 objects, or more, in a reasonable time. The theoretical component of this book is complemented with a set of practical case studies for fault extraction, yield prediction, and IC defect-sensitivity evaluation. These case studies emphasize the fact that by using appropriate formulae combining statistical data with the computed defect-sensitivity, an estimate of the IC's defect tolerance can be obtained at the end of the respective production line. The case studies range from highlighting their geometrical nature as a function of the defect size to more specific situations highlighting layout regions where faults may occur. In addition to the visualization of critical areas, numerical data in the form of tables, graphs and histograms are provided for quantification purposes. More than that, ever smarter, defect-tolerant design strategies have to be devised to attain high yields. Obviously, the work presented in the book is not definitive, and more research will always be useful to advance the field of CAD for manufacturability. This is, of course, one of the interesting challenges imposed by the ever-changing nature of microelectronic technologies. CAD developers and yield practitioners from academia and industry will find that this book lays the foundations for further pioneering work
Introduction to Advanced System-on-Chip Test Design and Optimization
Test design is applied to make a system testable. In a modular core-based environment where blocks of reusable logic, the so called cores, are integrated to a system, test design for each core include: test method selection, test data (stimuli and responses) generation (ATPG), definition of test data storage and partitioning [off-chip as ATE (Automatic Test Equipment) and/or on-chip as BIST (Built-In Self-Test)], wrapper selection and design (IEEE std 1500), TAM (test access mechanism) design, and test scheduling minimizing a cost function whilst considering limitations and constraint. A system test design perspective that takes all the issues above into account is required in order to develop a globally optimized solution. SOC test design and its optimization is the topic of this book. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
LabWindows/CVI Programming for Beginners (With CD-ROM)
The first "teach yourself" guide for LabWindows/CVI! LabWindows/CVI is the #1 system for building Windows-based virtual instrumentation with ANSI C—and this hands-on, project-oriented guide is the fastest way to get results with LabWindows/CVI! You'll master all you need to know to build programs that control instruments and data acquisition hardware—while still taking advantage of an easy-to-use user interface editor for building Windows applications. Shahid F. Khalid presents never-before-published LabWindows/CVI tips and tricks—plus coverage of every key LabWindows/CVI skill you'll need, including: * Systematically creating effective GUIs and automatically generating C code * Learning the tips and tricks of the Source Code Editor and Debugger * Learning the library functions through the use of Function Panels * Creating applications using File I/O, List Boxes, Rings, Text Box controls, and many more * Creating standalone executables, distribution disks, Dynamic Link Libraries (DLLs), and using the application from a supported external compiler * Complete tutorial on communication with instruments using GPIB and RS-232 interfaces Each chapter is organized for maximum clarity and convenience, and you'll find handy appendices explaining the features of LabWindows/CVI environment, formatting and scanning functions, and tutorial on two demo programs. If you're a LabWindows/CVI novice, you'll learn fast—and once you do, LabWindows/CVI Programming for Beginnerswill serve you well as a reference for years to come. CD-ROM INCLUDED The accompanying CD-ROM includes a complete trial version of LabWindows/CVI 5.5, plus finished versions of every project covered in the book. The CD-ROM also comes with complete trial versions of a System Test application and a mathematical application that analyzes functions parametrically
Power-Constrained Testing of VLSI Circuits
Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density. Power-Constrained Testing of VLSI Circuits focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. The first part of this book surveys the existing techniques for power constrained testing of VLSI circuits. In the second part, several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths are presented.
Principles of Testing Electronic Systems
A pragmatic approach to testing electronic systems. As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way–learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today’s very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: · An explanation of where a test belongs in the design flow · Detailed discussion of scan-path and ordering of scan-chains · BIST solutions for embedded logic and memory blocks · Test methodologies for FPGAs · A chapter on testing system on a chip · Numerous references
The Boundary-Scan Handbook, Third Edition Analog and Digital
Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, and popularly called the JTAG standard, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily deal with. IEEE standards, when embraced by practicing engineers, are living entities that grow and change quickly. The Boundary-Scan Handbook, Second Edition: Analog and Digital is intended to describe these standards in simple English rather than the strict and pedantic legalese encountered in the standards. The 1149.1 standard is now over eight years old and has a large infrastructure of support in the electronics industry. Today, the majority of custom ICs and programmable devices contain 1149.1. New applications for the 1149.1 protocol have been introduced, most notably the `In-System Configuration' (ISC) capability for Field Programmable Gate Arrays (FPGAs). The Boundary-Scan Handbook, Second Edition: Analog and Digital updates the information about IEEE Std. 1149.1, including the 1993 supplement that added new silicon functionality and the 1994 supplement that formalized the BSDL language definition. In addition, the new second edition presents completely new information about the newly approved 1149.4 standard often termed `Analog Boundary-Scan'. Along with this is a discussion of Analog Metrology needed to make use of 1149.1. This forms a toolset essential for testing boards and systems of the future.
WebCourse - ATE 101 - Overview of Test, ATE & Testability
A participant who has little or no background in test can leave this course with a thorough understanding of the issues. While the course provides few solutions, it is imperative that anyone making decisions concerning test and testability should first attend this course.
WebCourse - ATE 301 - ATE Test Programming
This course will teach you what is involved in developing a test program for an ATE. If you have never written a test program before, the course will illustrate the difficulties and point out traps that can make test programming a nightmare. For those who have experienced these problems, the course will provide a structured approach that will help avoid these problems in the future.
WebCourse - Design for Testability 101 - Who, What, When, Why, How Much
You will learn why Design for Testabilty (DFT) is an invaluable method to reduce test development costs. As long as DFT is performed early in the design stage, the return on investment (ROI) is substantial. You will learn how to translate techinical issues involving testability to economic issues understood by non-technical management.
WebCourse - Design for Testability 201 - Techniques for ICs, Boards and Systems
You will learn specific Design for Testabilty (DFT) techniques for making your circuit more testable, whether the circuit is an Integrated Circuit, Circuit Board, or a System. This course provides the "How" that was not covered in DFT 101. You will learn easy to apply techniques to circuits that will reap substantial benefits when it comes time to test the circuit.
WebCourse - Design for Testability 301 - JTAG/Boundary Scan/IEEE 1149.1
You will learn the details of Boundary Scan, often called, JTAG and officially called the IEEE-1149.1 standard. While you may have come across this concept, you may still be a bit unsure if you have a clear understanding. In this webinar we look under the hood and you will learn the intricate details of how this technology works.
WebCourse - Design for Testability 401 - System Level Testability and Diagnosability
For system level, testability isn't only failure detection. You need to concern yourself with repair and before that can happen, you need to accurately and unambigously determine the root cause of the system failure. That root cause should involve a single replaceable subsystem or board in nearly all cases. You will learn how to approach this in a logical fashion.
WebCourse - Design for Testability 501 - Advanced DFT Techniques
Boundary Scan pioneered a new approach to testability for board level. It is, however, important to integrate this with other forms of assembly. For today's complex circuits it may not be sufficient to test the boundary of the IC. Rather we will need to test inside the IC even when the IC is already mounted on a circuit board and when that board is already part of a module or system. This webinar will teach you about newer tools and the integration of those tools with traditional testability approaches.
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