A.T.E. (Advanced Test Engineering) Solutions, Inc.
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Online Catalog of Educational Courses and Resources
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33 Records Found
What You Will Learn
ATE Selection and Management
Presented from a non-biased perspective, this course will teach you the decision process for test strategy selection. It provides a generic approach and alert you to things you should consider for ATE investment.
ATE Selection, Design and Programming
This course covers every aspect of a test engineer's responsibility. Participants will learn how to select an automatic test equipment (ATE) from the number of choices and generically different types available. You will learn how to build an ATE from instrumentation and other building blocks. You will learn the bussing requirements of the IEEE 488, VXIbus, and PC-based instruments. You will also learn the software issues. The course will teach you how to approach a functional test programming activity for digital circuits. (In the longer, three-day course, analog test programming is also covered.) Finally, you will learn test management issues, such as test program development estimation, acquisition and quality assurance.
Automated Software Testing: Introduction, Management, and Performance
With the urgent demand for rapid turnaround on new software releases--without compromising quality--the testing element of software development must keep pace, requiring a major shift from slow, labor-intensive testing methods to a faster and more thorough automated testing approach. Automated Software Testing is a comprehensive, step-by-step guide to the most effective tools, techniques, and methods for automated testing. Using numerous case studies of successful industry implementations, this book presents everything you need to know to successfully incorporate automated testing into the development process. In particular, this book focuses on the Automated Test Life Cycle Methodology (ATLM), a structured process for designing and executing testing that parallels the Rapid Application Development methodology commonly used today. Automated Software Testing is designed to lead you through each step of this structured program, from the initial decision to implement automated software testing through test planning, execution, and reporting. Included are test automation and test management guidance for: * Acquiring management support * Test tool evaluation and selection * The automated testing introduction process * Test effort and test team sizing * Test team composition, recruiting, and management * Test planning and preparation * Test procedure development guidelines * Automation reuse analysis and reuse library * Best practices for test automation
Beta Testing for Better Software
Implement, operate, and use beta testing immediately with this hands-on guide to the best practices. Beta testing is a complex process that, when properly run, provides a wealth of diverse information. But when poorly executed, it delivers little or no data while wasting time and money. Written by a leading expert in the field, this book will help you reach the full potential that beta testing has to offer. Michael Fine compiles the best practices to date so you can effectively bring beta testing into your company’s process to improve product quality. Using real-world case studies, this book begins by clearly explaining what a beta is and why you need one. Fine then explores the beta test procedure and walks through the best processes to use when implementing a test. He concludes by detailing the steps you should take after completing a test in order to take full advantage of the results. With this book, you’ll gain a better understanding of what beta testing is, why every company needs a beta test program, and how to get the most from a test. Fine will help you: · Understand all the steps involved in beta testing using real-world case studies · Implement a beta test using best- known practices · Produce better products based on the results of well-run beta tests · Apply beta testing across many platforms and many technologies · Improve on existing processes and identify critical issues
Building your own ATE
You will learn how to put together an Automatic Test Equipment (ATE) from instrumentation built to the IEEE-488 (GPIB or HPIB) and VXIbus and PXI standards.
Cabling Handbook, The , 2nd Edition
The #1 A-Z network and telecom cabling reference—100% updated! New coverage! Fiber, home networking, cable modems, and much more WAN connections, xDSL wiring-even wireless networks Step-by-step planning, implementation, and management Systematic troubleshooting guide Quick-reference, task-oriented format! The professional's guide to computer and telecom cabling! Completely updated! Fiber, home networking, cable modems, wireless, and more Choosing the right vendors and products Great preparation for Network+ cable-related exam objectives! The Cabling Handbook, Second Edition is a thorough, up-to-the-minute professional's guide to every aspect of LAN and telecommunications cabling, from planning through installation and management. From Category 5 twisted pair and fiber to the latest wireless LAN solutions, it's all here: standards, product comparisons, topology and architecture design, electrical and safety considerations, and more—including invaluable information for anyone preparing for CompTIA Network+ certification. This brand new second edition has been updated with extensive new coverage of fiber technologies, home networking, cable modems, and much more. Rely on this book for expert guidance on: Estimating the cost of cable plant upgrades Choosing the right installer and supervising installation Selecting the optimal cabling system and products Deploying wireless LANs with maximum reliability, coverage, throughput, and security Managing cable systems to minimize long-term costs and maximize long-term reliability Troubleshooting cable system problems rapidly and effectively Expert John Vacca goes beyond LANs, reviewing key cable-related issues associated with campus networks, WANs, and the Internet. You'll find extensive coverage of cable management software and documenting cable systems. The book contains detailed listings of top cable installers, fiber optic cable manufacturers, cable labeling vendors, SCSI, and wireless LAN providers. Whether you buy, sell, or manage cabling systems, you need to maximize quality and minimize disruption—now and for decades to come. One book shows you how: The Cabling Handbook, Second Edition.
Communications Network: Test and Measurement Handbook
Assure peak efficiency and performance in any type of communications network! The explosive growth of digital communications networks, linking all parts of the globe has dramatically increased the need for tools and processes that ensure the ability of these vaious elements to operate together, set national and international standards, achieve local objectives for quality of service, and provide information that allows effective and proactive network management. Test and measurement instruments, systems and software provide these tools. This handbook explains how they work and how to use them in a set of clear and understandable chapters written by experts in their fields. Youll find everything you need to enhance performance in public and private networks, the Internet and cellular networks. Chapters describe how to select tools, develop and perform appropriate tests, and get information as well as data that ensures effective network and understanding on: Network operation parameters and success metrics; Hardware and software technolgies in communications; The Open Systems Interface (OSI) model; Analyses of network protocols, transmission errors, and physical connections; Development of effective tests for operation and performance of all types of networks; Selection of the most appropriate test and measurement tools; Development of information not just data. Let the Communications Network Test and Measurement Handbook guide you straight to optimum network performance.
Design for Testability and Built-In Self Test for Boards and Systems
You will be exposed to structured scan techniques standardized by the IEEE-1149.1 (JTAG), by other IEEE-1149.x, by the IEEE-1500, and by the recently released IEEE-1687 standards. The course will cover memory BIST, logic BIST and analog BIST and how they can be used for board and system test. It will also cover built-in test (BIT) software, and its goal to provide diagnostic information. You will obtain convincing reasons for utilizing DFT and BIST techniques in your organization's board and system design.
Design for Testability and for Built-in Self Test
In this comprehensive course you will learn all aspects of Design for Testability (DFT), from what it is, why you might need it, why someone would object to it, and what it can and cannot accomplish. You will learn how today's technology has become elusive to certain failure modes and how important it is to expose them through more testable designs. This 3-day class will encompass DFT techniques for ICs, ASICs, SoCs, FPGAs, boards, systems, and even prognostic health management. First you will learn some simple techniques to enhance observability and controllability. You will learn how you can access hundreds of internal points with as few as four additional edge connector pins. You will learn specific guidelines for both digital and analog circuit testability. You will learn structured testability techniques, such as internal and boundary-scan. You will come away with a deep understanding of the IEEE 1149.1 (JTAG) standard's operation, use and even its limitations. You will also learn later standards, such as IEEE-1149.4, .6, .7 as well as IEEE-1500, 1532, 1581 and 1687. You will also learn some new techniques in testability, including IDDQ testing and I/O Mapping. In the second part of the course, you will learn what built-in [self] test (BIST) is and how it can be specified. You will learn structures such as linear feedback shift registers (LFSRs), signature analyzers, and pseudo-random signal generators. With these building blocks you will be able to evaluate a number of BIST architectures for Logic BIST and Memory BIST. You will learn BIT Software techniques and consider the effect false alarms have on BIT. You will finally be able to specify BIT for your products and look at the possibilities of BIT taking over some of the ATE functions.
Design-For-Test For Digital IC's and Embedded Core Systems
The first practical DFT guide from an industry insider. Skip the high-brow theories and mathematical formulas—get down to the business of digital design and testing as it's done in the real world. Learn practical testing strategies that address today's business needs for quality, reliability, and cost control, working within the tight deadlines of typical high-pressure production environments. Design-for-Test for Digital IC's and Embedded Core Systems helps you optimize the engineering trade-offs between such resources as silicon area, operating frequency, and power consumption, while balancing the corporate concerns of cost-of-test, time-to-market, and time-to-volume. You'll also boost your efficiency with the special focus on automatic test pattern generation (ATPG). The book includes a roadmap that allows you to fine-tune your learning if you want to skip directly to a specific subject. Key topics include: Core-based design, focusing on embedded cores and embedded memories System-on-a-chip and ultra-large scale integrated design issues AC scan, at-speed scan, and embedded DFT Built-in self-test, including memory BIST, logic BIST, and scan BIST Virtual test sockets and testing in isolation Design for reuse, including reuse vectors and cores Test issues being addressed by VSIA and the IEEE P1500 Standard Design-for-Test for Digital IC's and Embedded Core Systems is filled with full-page graphics taken directly from the author's teaching materials. Every section is illustrated with flow-charts, engineering diagrams, and conceptual summaries to make learning and reference fast and easy. This book is a must for the engineers and managers involved in design and testing. The enclosed CD-ROM contains full-color versions of all the book's illustrations in Acrobat PDF format. These images may be viewed interactively on screen or printed out to create overheads for teaching. Acrobat Reader software for Windows and UNIX computers is included.
Eben Hewitt's ColdFusion Training Course: A Digital Seminar on CD-ROM
Start creating ColdFusion enterprise applications right now -- visually! · A fully-integrated eBook/QuickTime video package: more than 5 hours of expert personal training from Eben Hewitt, one of the world's most experienced ColdFusion developers! · Includes easy-to-adapt source code for key enterprise applications -- XML, WML, SQL/database integration, Web mail, and much more. · Bonus! Eben Hewitt's best-selling Core ColdFusion 5 in fully searchable electronic format. Web developers and designers live in a visual world -- and now there's a visual way to master ColdFusion 5's most powerful capabilities: Eben Hewitt's ColdFusion Training Course! Your personal instructor is Eben Hewitt, creator of ColdFusion sites visited by more than two million people each month. Watch as he builds enterprise-class Web applications right before your eyes -- and listen, as he explains every step. You'll learn a broad range of essential ColdFusion techniques, encompassing the ColdFusion language and application server, administration, content serialization with XML, SQL, wireless deployment, and more. The course offers practical insight into advanced ColdFusion 5 features, including user-defined functions, query-of-queries, data-driven Macromedia Generator graphs, custom tags, and more. Your CD-ROM contains all the source files you'll need to follow along. You also get a 250-page printed workbook -- plus a comprehensive eBook, Core ColdFusion 5, accessible with one click from anywhere in the course. As you practice, test yourself with exercises -- and extend your knowledge with the CD-ROM's extensive resource center, full of additional ColdFusion readings and Web links. Eben Hewitt is a Macromedia Certified ColdFusion Developer, a certified Microsoft SQL Server Administrator, and Director of Production for Creative Services at Cybertrails.com. A frequent ColdFusion Developer's Journal columnist, he is a member of the ColdFusion Edge faculty, and author of Core ColdFusion 5. Every month, nearly two million people visit the ColdFusion sites he has created.
Electronic Instrument Handbook
Design, select and operate the latest electronic instruments. Now in an up-to-the-minute third edition, the bestselling Electronic Instrument Handbook, by top technical author Clyde F. Coombs, Jr. and over 30 leading experts, helps you design, select and operate conventional, virtual, and network-based electronic instruments. From calibration, traceability standards, data acquisition, transducers, analog-to-digital conversion, signal sources, processors and microprocessors, power supplies and more, you move on to current and voltage measurement, signal- and waveform-generation, frequency and time measurement and circuit element measurement instruments, microwave passive devices and digital domain instruments. You learn what every instrument type does.. how it works...and how to get the most out of it. You'll also zero in on: *Instrument systems *Software and connectivity for instrumentation -- including network connections...instrument drivers...graphical user interfaces...virtual instruments and software defined instruments *Distributed and networked instrumentation, including smart sensors and the Internet *Much, much more!
Embedded Processor-Based Self-Test
Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.
Generate faster, more accurate SPICE simulations! Make your SPICE simulations faster, more accurate - and avoid nonconvergence using the breakthrough methods packed into the Second Edition of Inside SPICE. In this updated and revised bestseller, Ron Kielkowski gives you the hands-on help and guidance you need to create more effective software modles for simulating circuit behavior. This one-of-a-kind modeling toll and troubleshooter brings you up to speed on the latest commercially-SPICE-like simulators, including HSPICe, PSPICE, IS_SPICE and MICROCAP IV...delivers proven solutions to the full range of circuit simulation problems, including convergence and accuracy problems...shows you how to make difficult measurement such as loop gain of an op amp or distortion measurements of clocked ciruits like converters and sample-and-hold circuits...measure any class of circuits, such as oscillators, charge-storage circuits, or very large circuits...and more. Inside SPICE. Up-to-date methods for creating fast, accurate circuit simulations with SPICE. The complexities of SPICE - the international standard in circuit simulation software - require expert handling, Inside SPICE gives you everything necessary to create the most effective software models for simulation the behavior of real circuits. And this edition of Inside SPICE offers the most up-to-date techniques for generating faster, more accurate simulations. Inside SPICE, Second Edition is an indispensable reference tool - and a troubleshooter. It will help professionals and students analyze and work around problems typically encountered with SPICE and SPICE-like simulator programs: HSPICE, PSPICE, IS_SPICE, and MICROCAP IV. It has a new chapter on simulation trends, in addition to a new, Windows-compatible CD-ROM version of RSPICE with extensive sample models. Well-organized chapters spell out the fundamentals, including: understanding circuit simulations; nonconvergence; SPICE options; numeric integration. Packed with example circuit files.
Introduction to Automatic Test System Software Standards and to Automatic Test Markup Language (ATML)
You will get a comprehensive picture of industry standards applicable to Automatic Test Systems (ATS) software and will be introduced to the emerging Automatic Test Markup Language (ATML) standards. You will learn how the adoption of ATML and other standards can help you reduce the cost of Automatic Test Equipment (ATE) and Test Program Set (TPS) development, operation, and modernization.
LabVIEW Programming, Data Acquisition and Analysis (with CD-ROM)
*Master LabVIEW programming - hands-on! *Learn through real-world data acquisition and analysis applications *Dozens of key techniques presented through easy-to-adapt templates *Extensively classroom-tested with professional engineers *CD-ROM: Tools, templates, and complete LabVIEW evaluation version Master LabVIEW programming from the ground up - fast! LabVIEW Programming, Data Acquisition and Analysis is your easy, hands-on guide to LabVIEW programming and data analysis. Whether you're learning LabVIEW from the ground up, or updating knowledge you already have, Jeffrey Beyon covers every key technique you need to build reliable, high-performance applications. You'll start with the basics: the structure of LabVIEW source files; using sub VIs; loops and conditional statements; data display; data types; and the prerequisites for data acquisition, including sampling theorems and data acquisition VIs. Next, Beyon covers every key category of data acquisition and analysis application - analog and digital, input and output. Coverage includes: *Practical techniques for data save/read, data conversion, and much more *Tips and tricks for memory management, large file management, and more *Implementing each leading data analysis VI *Instrument control, counters, and more *Avoiding and troubleshooting common LabVIEW programming problems Most examples are presented in the form of software templates that are easy enough to understand quickly, and robust enough to serve as building blocks for real-world solutions. You'll find detailed, end-of-chapter review questions; an accompanying lab workbook is also available. Whether you're a field engineer, scientist, researcher, or student, there's no faster way to get results with LabVIEW! CD-ROM INCLUDES: *Complete library of LabVIEW tools and templates *Full LabVIEW evaluation version Companion lab workbook: Hands-On Exercise Manual for LabVIEW Programming, Data Acquisition and Analysis
Managing the Testing Process: Practical Tools and Techniques for Managing Hardware and Software Test
An updated edition of the best tips and tools to plan, build, and execute a structured test operation. In this update of his bestselling book, Rex Black walks you through how to develop essential tools and apply them to your test project. He helps you master the basic tools, apply the techniques to manage your resources, and give each area just the right amount of attention so that you can successfully survive managing a test project! Offering a thorough review of the tools and resources you will need to manage both large and small projects for hardware and software, this book prepares you to adapt the concepts across a broad range of settings. Simple and effective, the tools comply with industry standards and bring you up to date with the best test management practices and tools of leading hardware and software vendors. Rex Black draws from his own numerous testing experiences–– including the bad ones, so you can learn from his mistakes–– to provide you with insightful tips in test project management. He explores such topics as: · Dates, budgets, and quality–expectations versus reality · Fitting the testing process into the overall development or maintenance process · How to choose and when to use test engineers and technicians, contractors and consultants, and external test labs and vendors · Setting up and using an effective and simple bug-tracking database · Following the status of each test case The companion Web site contains fifty tools, templates, and case studies that will help you put these ideas into action–– fast!
PC Troubleshooting Pocket Book Third Edition
The Newnes PC Troubleshooting Pocket Book provides a concise and compact reference that describes, in a clear and straightforward manner, the principles and practice of faultfinding and upgrading PCs and peripherals. The book is aimed at anyone who is involved with the installation, configuration, maintenance, upgrading, repair or support of PC systems. It also provides non-technical users with sufficient background information, charts and checklists to enable the diagnosis of faults and help to carry out simple modifications and repairs. The new edition of PC Troubleshooting will continue to include a number of short cuts that are instrumental in avoiding hours of potential frustration and costly effort. In order to reflect rapid changes in computer technology (both hardware and software) the third edition of the Newnes PC Troubleshooting Pocket Book has been completely revised and rewritten. New and expanded sections on: modern machines (Pentium II, III, IV, AMD); modern buses (FSB, AGP, Cyrix, Chip sets); different RAM chip types, performance and guide to RAM connectors; Win2000, ME, XP and NT4/5; latest SCSI standards, Ultra DMA, “live” re-portioning of the disc, FAT 16, FAT36, NTFS, performance and compatibility differences; ‘famous’ viruses and personal firewalls.
PC-based Instrumentation and Control Second Edition
In this established text Mike Tooley explains how to design and implement control systems using easily sourced components and tried and tested circuits. Representative software routines in a variety of languages (including 8086 assembler, BASIC and C) are included.
Software Design for Testability (SDFT)
The latest theory and practice of Software Design for Testability (SDFT) will be explained, primarily through comparisons and analogies to the well-established discipline of hardware DFT.
Software System Testing and Quality Assurance
While many sources tell you how to design, implement, and operate a system, few provide the practical guidance needed to ensure reliable operation of software in all stages of development. This comprehensive guide to system testing and quality assurance does.
Software Test, Reliability and Quality Assurance
You will get practical answers to the following questions: When should you start testing and when can you stop testing? How do you predict software bug rates? Which defects are acceptable and why? What software metrics should be collected to measure testing progress? How do you plan for testing, debugging, and fixing software? What can you look for in code to verify that software reliability has been designed into the software? This course prepares you to create better software and to evaluate software produced by others.
System Validation and Verification
Covers all aspects of validation and verification and their use as problem-solving tools Contains helpful figures and tables to support the text Includes both theory and practical methods Historically, the terms validation and verification have been very loosely defined in the system engineering world, with predictable confusion. Few hardware or software testing texts even touch upon validation and verification, despite the fact that, properly employed, these test tools offer system and test engineers powerful techniques for identifying and solving problems early in the design process. Together, validation and verification encompass testing, analysis, demonstration, and examination methods used to determine whether a proposed design will satisfy system requirements. System Validation and Verification offers, for the first time in a single reference, clear definitions of the terms and detailed information on using these fundamental tools for problem solving. It smoothes the transition between requirements and design by providing methods to evaluate a given approach's ability to satisfy demanding technical requirements. With System Validation and Verification, system and test engineers and project managers will gain confidence in their designs and lessen the likelihood of serious problems cropping up late in the program. In addition to explanations of the theories behind the concepts, the book includes practical methods for each step of the process, examples from the author's considerable firsthand experience, and illustrations and tables to support the ideas presented in the text. Although not primarily a textbook, System Validation and Verification is based in part on validation and verification courses taught by the author and is an excellent supplemental reference for engineering students. In addition to its usefulness to system engineers, the book will be valuable to a wider audience including manufacturing, design, software , and risk management project engineers - anyone involved in large systems design projects.
System-level Test and Validation of Hardware/Software Systems
New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
System-on-a-Chip: Design and Test
Starting with a basic overview of system-on-a-chip (SoC), including definitions of related terms, this new book helps you understand SoC design challenges, and the latest design and test methodologies. You see how ASIC technology evolved to an embedded cores-based concept that includes pre-designed, reusable Intellectual Property (IP) cores that act as microprocessors, data storage devices, DSP, bus control, and interfaces -- all "stitched" together by a User’s Defined Logic (UDL). Part One features a discussion of SoC-related design difficulties including hardware-software co-design, reuse design, and cores design. You get practical, real-world design guidance referencing actual product specifications, delivery requirements, and system integration requirements in use by commercial enterprises and under evaluation by the SoC community. Significant attention is paid to the rules and guidelines for making SoC design reusable, including RTL coding guidelines and design validation. Part One concludes with the information you need to develop test benches at both the cores and SoC level. Part Two contains a review of the challenges you face in testing SoC and test methodologies for overcoming these hurdles. Test methods for embedded logic cores, microprocessor cores, micro-controller cores and large memory blocks are included, as well as methods for testing embedded analog and mixed-signal circuits, and Iddq testing on SoC. You also get an overview of material handling, speed-binning, and production flow to apply your knowledge to actual production processes. System-on-a-Chip: Design and Test is an excellent, one-stop reference for SoC and ASIC design engineers, IP designers and providers, and test engineers seeking comprehensive information on SoC design, testing, and production. Contents: Part One - Design. Introduction. Design Methodology for SoC Logic Cores. RTL Guidelines for Design Reuse. Verification. Design Validation. Design Examples. Part Two - Test. Introduction to SoC Testing of Logic Cores. Testing of Embedded Memories. Testing of Analog and Mixed-Signal Circuits. IDDQ Testing. Production Testing. Summary and Conclusion.
Systematic Software Testing
Gain an in-depth understanding of software testing management and process issues that are critical for delivering high-quality software on time and within budget. Written by leading experts in the field, this book offers those involved in building and maintaining complex, mission-critical software systems a flexible, risk-based process to improve their software testing capabilities. Whether your organization currently has a well-defined testing process or almost no process, Systematic Software Testing provides unique insights into better ways to test your software. This book describes how to use a preventive method of testing, which parallels the software development lifecycle, and explains how to create and subsequently use test plans, test design, and test metrics. Detailed instructions are presented to help you decide what to test, how to prioritize tests, and when testing is complete. Learn how to conduct risk analysis and measure test effectiveness to maximize the efficiency of your testing efforts. Because organizational structure, the right people, and management are keys to better software testing, Systematic Software Testing explains these issues with the insight of the authors’ more than 25 years of experience. Contents: Preface. Acknowledgments. An Overview of the Testing Process - A Brief History of Testing. STEPTM Testing Process. Risk Analysis - What is Risk? Software Risk Analysis. Planning Risks and Contingencies. Master Test Planning - Levels (Stages) of Test Planning. Audience Analysis. Activity Timing. Standard Templates. Sections of a Test Plan. Detailed Test Planning - Acceptance Testing. System Testing. Integration Testing. Unit Testing. Analysis and Design - Creating Inventories. Black Box vs. White Box. Black Box Science. Black Box Art. White Box Science. Test Design Documentation. Test Implementation - Test Environment. Model Office Concept. What Should be Automated? Avoiding Testing Tool Traps. Evaluating Testware. Test Execution - Before Beginning Test Execution. Test Log. Test Incident Reports. Testing Status and Results. When Are We Done Testing? Measuring Test Effectiveness. The Test Organization - Test Organizations. Office Environment. The Software Tester - Characteristics of Good Testers. Finding Good Testers. Hiring Testers. How Many Testers Do You Need? Retaining Staff. Software Tester Certifications. The Test Manager - What Is Management? Management vs. Leadership. Marine Corps Principles of Leadership. The Test Manager As a Leader. The Test Manager’s Role in the Team. The Test Manager’s Role in Training. Metrics Primer for Test Managers. Improving the Testing Process - Improving the Testing Process. ISO Certification. Capability Maturity Model (CMM). Test Process Improvement (TPI) Model. Continuous Improvement. Some Final Thoughts - Use Preventive Testing Techniques. Conduct Software Risk Analysis. Determine Planning Risks. Develop a Testing Strategy. Use Inventories. Use Testing Tools When Appropriate. Analyze Defect Trends and Patterns. Measure Test Effectiveness. Conduct Training Continually. Sell the Idea of Testing.
Test Process Improvement: A Practical Step-by-Step Guide to Structured Testing
Software testing is a vital component of the software development process, but few organizations expend any effort optimizing the process to make it more efficient. Although in practice it can be hard to define what steps need to be taken, models such as the Capability Maturity Model (CMM) have been successful in helping organizations improve their software process and TPI aims to do a similar thing for the testing part of the software process. The TPI model offers a frame of reference which helps to determine the strong and weak points in an organization's current test practice, and gives specific and realistic suggestions for the improvement of the test process in terms of lead time, costs and quality.
Testing Applications on the Web: Test Planning for Internet-Based Systems
A software testing survival guide for those who work in Internet time With Internet applications spreading like wildfire, the field of software testing is increasingly challenged by the brave new networked world of e-business. This book brings you up to speed on the technologies, testing concepts, and tools you will need to run e-business applications on the Web. Written by Hung Nguyen, a coauthor of the bestselling software testing book of all time, Testing Computer Software, this new guide takes you to the next level, helping you apply your existing skills to the testing of B2B (Business-to-Business), B2C (Business-to-Consumer), and internal Web-based applications. You ll learn how to test transactions across networks, explore complex systems for errors, and work efficiently with the many components at play - from servers to browsers to protocols. Most importantly, you will get detailed instructions on how to carry out specific test types along with case studies and error examples for each test. Software testers, test leads and test managers, QA analysts and managers, and IT managers and staff will find this an invaluable resource for their testing projects. With an emphasis on achievable goals and necessary rather than nice-to-have features, Testing Applications on the Web provides: · An analysis of the Web-application model and the difference between Web testing and traditional testing · A tutorial on the methodology and techniques for networking technologies and component-based testing · Strategies for test planning, test case designing, and error analysis on the Web · Effective real-world practices for UI (User Interface) tests, security tests, installation tests, load and stress tests, database tests, and more · A survey of commercial tools and a sampling of proven test matrices and templates
The Boundary-Scan Handbook, Third Edition Analog and Digital
Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, and popularly called the JTAG standard, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily deal with. IEEE standards, when embraced by practicing engineers, are living entities that grow and change quickly. The Boundary-Scan Handbook, Second Edition: Analog and Digital is intended to describe these standards in simple English rather than the strict and pedantic legalese encountered in the standards. The 1149.1 standard is now over eight years old and has a large infrastructure of support in the electronics industry. Today, the majority of custom ICs and programmable devices contain 1149.1. New applications for the 1149.1 protocol have been introduced, most notably the `In-System Configuration' (ISC) capability for Field Programmable Gate Arrays (FPGAs). The Boundary-Scan Handbook, Second Edition: Analog and Digital updates the information about IEEE Std. 1149.1, including the 1993 supplement that added new silicon functionality and the 1994 supplement that formalized the BSDL language definition. In addition, the new second edition presents completely new information about the newly approved 1149.4 standard often termed `Analog Boundary-Scan'. Along with this is a discussion of Analog Metrology needed to make use of 1149.1. This forms a toolset essential for testing boards and systems of the future.
The Test Flow Simulator
This software product is a test strategy economics calculator. It was designed for manufacturers who are confused about the type of test equipment they should buy. This simple-to use software runs with Microsoft Excel and many popular spreadsheet programs and provides the calculations necessary to predict your overall test, repair and penalty costs. With this software you will be able to compare alternative test strategies and predict which will be best for you. You can estimate your test, repair and penalty costs for various test strategies and choices of ATE. You can try a number of scenarios and learn how a change in equipment or in test methods would influence your bottom line costs. Calculate your actual savings. The Test Flow Simulator comes with an extensive manual and our recommendations on what to look for in your ATE selections.
The Testability Director
This low priced software is used to motivate and evaluate testability practices in your organization. It contains hundreds of guidelines for meeting different types of testability criteria, including ASIC design, Analog, Digital, System Level and Built-In Test. The software runs with Microsoft Excel and many popular spreadsheet programs and contains tutorials on interpreting and scoring each criterion. It is truly the painless way to bring Design for Testability into your organization. See it at
Testability Director Web Page
WebCourse - ATE 101 - Overview of Test, ATE & Testability
A participant who has little or no background in test can leave this course with a thorough understanding of the issues. While the course provides few solutions, it is imperative that anyone making decisions concerning test and testability should first attend this course.
WebCourse - Design for Testability 301 - JTAG/Boundary Scan/IEEE 1149.1
You will learn the details of Boundary Scan, often called, JTAG and officially called the IEEE-1149.1 standard. While you may have come across this concept, you may still be a bit unsure if you have a clear understanding. In this webinar we look under the hood and you will learn the intricate details of how this technology works.
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