A.T.E. (Advanced Test Engineering) Solutions, Inc.
test engineering consulting and educational firm
Your browser does not support script.
Select Topics & Courses
Dates & Location
A.T.E. Solutions Info
Books on Test
Build a Test Library
Testability Director Software
Test Flow Simulator Software
Schedule of Courses
Test Requirements Analysis
TRD and TPS Development
ATE Market Consulting
BITES single-chip Built-In Tester
Articles on Test
Test Vendor Directory
Test Products and Services Directory
Online Catalog of Educational Courses and Resources
Page 1 of 3 of Users' Guide
Add Educational Resource
Welcome to the Online Catalog of Courses and Educational Resources. There are many ways we have for you to find what you want from this catalog:
Using the "Search for Topic or Format-Text" box you can filter the selections by
a. Keywords, such as "in-circuit," "environment," etc.
b. Course formats, such as "public," "private," etc.
Read the "What You Will Learn" section next to each course.
For each course of interest, you can click the hyperlinked "Details" to see the detailed course outline.
Check the "Select" button next to titles that are of interest to you.
Press the "More on Selected Titles" button to see what formats and dates are available for these selected courses.
Search for Topic or Format-Text:
33 Records Found
What You Will Learn
This course will teach you how to write test procedures and code for many of the ATEs used in the military and airline industries using the Abbreviated Test Language for All Systems (ATLAS) a standard that is maintained by the IEEE.
Ball Grid Array Inspection and Defect Guide
This CD ROM is fully interactive and covers the different types of BGA component, design and process requirement with X-ray inspection of solder joints and a inspection standard for guidance. A Word document of the text is available on the CD ROM for use in a company standard and may be edited to suit the company documentation system. Examples of satisfactory standards are provided with a complete guide to possible process defects. The defect section may be viewed with small examples to make searching easy and then each sample may be viewed at both half and full screen. A description of each of the defects is included with the examples. A full animation of the surface mount assembly process is included on the disk which includes the BGA, double sided assembly and through hole/Intrusive reflow assembly. This section features a commentary by Bob Willis or can be viewed with just a text guide. The CD ROM also includes over 130 picture files which may be used freely in training material and standards in a manufacturing company provided that the resulting material is not resold.
Building your own ATE
You will learn how to put together an Automatic Test Equipment (ATE) from instrumentation built to the IEEE-488 (GPIB or HPIB) and VXIbus and PXI standards.
Cabling Handbook, The , 2nd Edition
The #1 A-Z network and telecom cabling reference—100% updated! New coverage! Fiber, home networking, cable modems, and much more WAN connections, xDSL wiring-even wireless networks Step-by-step planning, implementation, and management Systematic troubleshooting guide Quick-reference, task-oriented format! The professional's guide to computer and telecom cabling! Completely updated! Fiber, home networking, cable modems, wireless, and more Choosing the right vendors and products Great preparation for Network+ cable-related exam objectives! The Cabling Handbook, Second Edition is a thorough, up-to-the-minute professional's guide to every aspect of LAN and telecommunications cabling, from planning through installation and management. From Category 5 twisted pair and fiber to the latest wireless LAN solutions, it's all here: standards, product comparisons, topology and architecture design, electrical and safety considerations, and more—including invaluable information for anyone preparing for CompTIA Network+ certification. This brand new second edition has been updated with extensive new coverage of fiber technologies, home networking, cable modems, and much more. Rely on this book for expert guidance on: Estimating the cost of cable plant upgrades Choosing the right installer and supervising installation Selecting the optimal cabling system and products Deploying wireless LANs with maximum reliability, coverage, throughput, and security Managing cable systems to minimize long-term costs and maximize long-term reliability Troubleshooting cable system problems rapidly and effectively Expert John Vacca goes beyond LANs, reviewing key cable-related issues associated with campus networks, WANs, and the Internet. You'll find extensive coverage of cable management software and documenting cable systems. The book contains detailed listings of top cable installers, fiber optic cable manufacturers, cable labeling vendors, SCSI, and wireless LAN providers. Whether you buy, sell, or manage cabling systems, you need to maximize quality and minimize disruption—now and for decades to come. One book shows you how: The Cabling Handbook, Second Edition.
Communications Network: Test and Measurement Handbook
Assure peak efficiency and performance in any type of communications network! The explosive growth of digital communications networks, linking all parts of the globe has dramatically increased the need for tools and processes that ensure the ability of these vaious elements to operate together, set national and international standards, achieve local objectives for quality of service, and provide information that allows effective and proactive network management. Test and measurement instruments, systems and software provide these tools. This handbook explains how they work and how to use them in a set of clear and understandable chapters written by experts in their fields. Youll find everything you need to enhance performance in public and private networks, the Internet and cellular networks. Chapters describe how to select tools, develop and perform appropriate tests, and get information as well as data that ensures effective network and understanding on: Network operation parameters and success metrics; Hardware and software technolgies in communications; The Open Systems Interface (OSI) model; Analyses of network protocols, transmission errors, and physical connections; Development of effective tests for operation and performance of all types of networks; Selection of the most appropriate test and measurement tools; Development of information not just data. Let the Communications Network Test and Measurement Handbook guide you straight to optimum network performance.
Design for Testability and Built-In Self Test for Boards and Systems
You will be exposed to structured scan techniques standardized by the IEEE-1149.1 (JTAG), by other IEEE-1149.x, by the IEEE-1500, and by the recently released IEEE-1687 standards. The course will cover memory BIST, logic BIST and analog BIST and how they can be used for board and system test. It will also cover built-in test (BIT) software, and its goal to provide diagnostic information. You will obtain convincing reasons for utilizing DFT and BIST techniques in your organization's board and system design.
Design for Testability and for Built-in Self Test
In this comprehensive course you will learn all aspects of Design for Testability (DFT), from what it is, why you might need it, why someone would object to it, and what it can and cannot accomplish. You will learn how today's technology has become elusive to certain failure modes and how important it is to expose them through more testable designs. This 3-day class will encompass DFT techniques for ICs, ASICs, SoCs, FPGAs, boards, systems, and even prognostic health management. First you will learn some simple techniques to enhance observability and controllability. You will learn how you can access hundreds of internal points with as few as four additional edge connector pins. You will learn specific guidelines for both digital and analog circuit testability. You will learn structured testability techniques, such as internal and boundary-scan. You will come away with a deep understanding of the IEEE 1149.1 (JTAG) standard's operation, use and even its limitations. You will also learn later standards, such as IEEE-1149.4, .6, .7 as well as IEEE-1500, 1532, 1581 and 1687. You will also learn some new techniques in testability, including IDDQ testing and I/O Mapping. In the second part of the course, you will learn what built-in [self] test (BIST) is and how it can be specified. You will learn structures such as linear feedback shift registers (LFSRs), signature analyzers, and pseudo-random signal generators. With these building blocks you will be able to evaluate a number of BIST architectures for Logic BIST and Memory BIST. You will learn BIT Software techniques and consider the effect false alarms have on BIT. You will finally be able to specify BIT for your products and look at the possibilities of BIT taking over some of the ATE functions.
Electrician's Pocket Manual
This toolbox-sized time-and-trouble saver makes short shrift of all those questions that pop up during your day's work, whether they relate to tools of the trade...standard electrical procedures...working with fiber optics and installing the newest communications equipment...basic math and measurement, including conversion...reading blueprints. It's also loaded with 100 tables and charts, 100 formulas and 300 diagrams. An appendix looks at codes, standards and regulations.
Electronic Instrument Handbook
Design, select and operate the latest electronic instruments. Now in an up-to-the-minute third edition, the bestselling Electronic Instrument Handbook, by top technical author Clyde F. Coombs, Jr. and over 30 leading experts, helps you design, select and operate conventional, virtual, and network-based electronic instruments. From calibration, traceability standards, data acquisition, transducers, analog-to-digital conversion, signal sources, processors and microprocessors, power supplies and more, you move on to current and voltage measurement, signal- and waveform-generation, frequency and time measurement and circuit element measurement instruments, microwave passive devices and digital domain instruments. You learn what every instrument type does.. how it works...and how to get the most out of it. You'll also zero in on: *Instrument systems *Software and connectivity for instrumentation -- including network connections...instrument drivers...graphical user interfaces...virtual instruments and software defined instruments *Distributed and networked instrumentation, including smart sensors and the Internet *Much, much more!
EMC for Product Designers, 3rd edition
Widely regarded as the standard text on EMC, Tim Williams' book provides all the information necessary to meet the requirements of the EMC Directive. Most importantly, it shows how to incorporate EMC design principles into products, avoiding cost and performance penalties, meeting the needs of specific standards, and resulting in a better overall product.
Fiber Optic Test and Measurement
The complete, practical guide to testing fiber optic communication components and systems. Fiber optic networks are evolving rapidly—and so is the technology used to design, measure, and test them. Fiber Optic Test and Measurement is the first authoritative, complete guide to measuring both current optical networks and those on the horizon. It reflects the collective experience of Hewlett-Packard's world-class lightwave test and measurement organization, and presents extensive information that has had limited circulation to date. Learn how to characterize all three basic components of a fiber optic communication system: the optical transmitter, fiber medium, and optical receiver. Review each fundamental area of fiber optic measurement, including: Optical power measurements using several types of photodetectors Spectral measurements using diffraction gratings, Michelson interferometers and both heterodyne and homodyne spectrum analysis Polarization measurements—increasingly important in high data rate networks that utilize optical amplifiers Modulation measurements via frequency and time domain analyses The book's unprecedented coverage of advanced fiber technology will be invaluable to professionals implementing or maintaining new optical networks. Learn how to: Test digital fiber systems to SONET/SDH international standards Accurately characterize the behavior of Wavelength Division Multiplexing (WDM) fiber systems Test two-port optical devices for insertion loss, reflectivity of components, chromatic and polarization mode dispersion, and the behavior of Erbium-doped fiber amplifiers (EDFAs). This practical guide will help technicians, engineers, and scientists accurately measure and test fiber optic systems, without becoming experts in fiber optic theory. It will be equally useful for experienced fiber optic professionals and those new to the field.
Grounding and Shielding Techniques
A step-by-step guide to solving noise and interference problems in the digital age The rapid growth of digital technology over the past decade has brought the analog world into direct contact with high-speed operations and electromagnetic processes--and created a host of new problems for designers. This new twist requires different approaches to issues of noise and interference in digital processing, high-speed communication, mass data storage, and high-frequency applications. Grounding and Shielding Techniques, Fourth Edition is entirely rewritten to reflect these new challenges. This highly effective tool for the management of interference problems in electronic equipment treats the fundamentals of electrostatics as they relate to electromagnetic phenomena. Specifically, this volume deals with the new interference problems created when analog designs are buried in the middle of hardware that must meet radiation and susceptibility standards. It features: * Effective techniques for handling noise problems in a variety of circumstances * Step-by-step instructions for building noise-free instrument systems * Strategies for reducing or eliminating noise in interconnecting systems * Expanded discussion of multishielded transformers * An overview of current trends to limit the use of transformers * Real-world examples of factors influencing electronic noise * Simplified, practical explanations of the physics of fields * Dozens of illustrations and a clear, readable text. Grounding and Shielding Techniques, Fourth Edition is a state-of-the-art problem-solving guide for electronic design engineers and technicians. It is also an extremely useful text for short courses on electronic noise.
Handbook of Polygraph Testing
The Handbook of Polygraph Testing examines the fundamental principles behind lie detector tests, and provides an up-to-date review of their validity. The editor presents current psychological theories, including an explanation of the cognitive processes central to polygraph testing. He describes the various methods of testing, the research in support of each method, and special issues in polygraph research. The Handbook helps readers interpret existing research studies, and learn how to improve the accuracy of polygraph testing and analysis. The dual focus on research and clinical applications makes this text appropriate for a broad range of readers, from polygraph examiners and law enforcement personnel to lawyers, scientists, and graduate students. The Handbook helps establish standards in the field by establishing a set of common terms, concepts, and processes for the people who administer and analyze the tests as well as for the researchers who test the underlying theories.
How to Design for Testability (DFT) for Today's Boards and Systems
Detailed review of the various guidelines covered in the SMTA/TMAG Testability Guidelines. Part 1 of the Webtorial will introduce attendees to the issues surrounding testing of electronic circuit boards and systems. It introduces testing concept and the mix of testers normally used. This includes the JTAG/IEEE-1149.1 boundary scan as well as built-in self test (BIST). With a combination of these technologies, the idea of non-intrusive board (and system) test is explored. The Webtorial takes the view that DFT is the best way to improve test performance and cost effectiveness. Towards that end Part 2 provides specific DFT guidelines. It concludes with exploring new standards and developments in DFT that will improve testing of boards and systems in the future.
Instrumentation and Instrument Buses
An ATE consists of discrete instruments capable of applying stimuli and making accurate measurements under the control of a computer. You will learn how each of these elements does its job and what realistic expectations you can have.
Introduction to Automatic Test System Software Standards and to Automatic Test Markup Language (ATML)
You will get a comprehensive picture of industry standards applicable to Automatic Test Systems (ATS) software and will be introduced to the emerging Automatic Test Markup Language (ATML) standards. You will learn how the adoption of ATML and other standards can help you reduce the cost of Automatic Test Equipment (ATE) and Test Program Set (TPS) development, operation, and modernization.
Introduction to Instrumentation and Measurements
Describes new quantum standards for the ohm, volt, and other modern measurement standards Includes a detailed treatment of linear and nonlinear analog signal processing Evaluates noise and coherent interference and explains how to predict the noise-limited resolution of a measurement system Presents numerous examples of optoelectronic instrument systems Introduces elements of digital signal conditioning used in modern measurement systems Offers examples of unique measurement systems designed by the author Discusses current industry trends Includes a separate problems and solutions manual with exercises for Chapters 1-8 This new textbook and reference makes it easy to make an informed choice among sensors and signal conditioning systems. The book's broad coverage includes: electrical and physical standards; analog signal conditioning; noise and coherent interference; DC and AC null methods; sensor mechanisms and applications; electrical measurements; digital interfaces; digital signal conditioning; measurement system design examples; and more. The few other texts available on this topic lack the breadth of coverage and fail to cover recent changes in standards. An excellent sourcebook for students and practicing engineers alike, Introduction to Instrumentation and Measurements includes all the general information on instrumentation and measurements, as well as the technical details you need to apply your knowledge in the real world. There is no other text like it.
ISO-9000 and Quality Assurance
You will learn to identify the ISO-9000 standards relevant to your organization. You will also learn the planning and implementation process associated with installing an ISO-9000 quality system.
Managing the Testing Process: Practical Tools and Techniques for Managing Hardware and Software Test
An updated edition of the best tips and tools to plan, build, and execute a structured test operation. In this update of his bestselling book, Rex Black walks you through how to develop essential tools and apply them to your test project. He helps you master the basic tools, apply the techniques to manage your resources, and give each area just the right amount of attention so that you can successfully survive managing a test project! Offering a thorough review of the tools and resources you will need to manage both large and small projects for hardware and software, this book prepares you to adapt the concepts across a broad range of settings. Simple and effective, the tools comply with industry standards and bring you up to date with the best test management practices and tools of leading hardware and software vendors. Rex Black draws from his own numerous testing experiences–– including the bad ones, so you can learn from his mistakes–– to provide you with insightful tips in test project management. He explores such topics as: · Dates, budgets, and quality–expectations versus reality · Fitting the testing process into the overall development or maintenance process · How to choose and when to use test engineers and technicians, contractors and consultants, and external test labs and vendors · Setting up and using an effective and simple bug-tracking database · Following the status of each test case The companion Web site contains fifty tools, templates, and case studies that will help you put these ideas into action–– fast!
Microelectronic Reliability, Vol 1
Let twelve specialists show you how to test, analyze, and achieve better microelectronic reliability of silicon and GaAs devices. Microelectronic Reliability, Volume I: Reliability, Test, and Diagnostics offers you detailed, original works on the topics most vital to both device and equipment reliability and manufacturing yield. Broad enough to serve as an effective textbook and in-depth enough for practicing engineers, this text also makes an ideal reference for managers who need a quick overview of current reliability, test, and failure analysis issues. Supported by 600 references, 147 figures, and 39 tables, this encyclopedic guide shows you how to identify the thermal, chemical, and mechanical processes that influence the incidence and severity of failure mechanisms. This coverage outlines techniques for assessing the susceptibility to failure of various devices. Detailing the theory and operation of current failure analysis tools, the text also gives you instrument price ranges and example analyses. Combined with the sweeping overview and comprehensive bibliography found in Microelectronic Reliability Volume II, this text gives you the only source you need to meet today's ever-improving standards for quality and reliability of advanced microelectronic technology. Contents: Preface. Introduction. Statistical Aspects for Reliability. Failure Mechanisms in Microelectronic Devices. Testability for Functional Verification and Diagnostics. Automatic Testing. Manufacturing Process Control. GaAs Reliability and Test. Appendix A: Advanced Failure Analysis Instrumentation. List of Acronyms. Glossary. Index.
On-Chip ESD Protection for Integrated Circuits: An IC Design Perspective
This comprehensive and insightful book discusses ESD protection circuit design problems from an IC designer's perspective. On-Chip ESD Protection for Integrated Circuits: An IC Design Perspective provides both fundamental and advanced materials needed by a circuit designer for designing ESD protection circuits, including: · Testing models and standards adopted by U.S. Department of Defense, EIA/JEDEC, ESD Association, Automotive Electronics Council, International Electrotechnical Commission, etc. · ESD failure analysis, protection devices, and protection of sub-circuits · Whole-chip ESD protection and ESD-to-circuit interactions · Advanced low-parasitic compact ESD protection structures for RF and mixed-signal IC's · Mixed-mode ESD simulation-design methodologies for design prediction ESD-to-circuit interactions, and more! Many real world ESD protection circuit design examples are provided. The book can be used as a reference book for working IC designers and as a textbook for students in the IC design field.
Optimizing Electronics Vibration HALT, HASS, ALT and ESS
A three-day interactive workshop aimed at shortening the time required for electronics design, vibration testing and (when weaknesses are found) corrective action. This course applies to vibration of electronics at system, box or circuit card level. Methods can also be used in the design and testing of electronic components to meet vibration standards or desired capabilities. Discussion of simple methods and animations assist participants understand the complex responses of their electronics to laboratory and to field vibration. "Vibration test efficiency" is a new term, used here to illustrate recent improvements over the past slow "learning curve" for vibration knowledge. Since vibration life of most electronics is dependent on response at circuit card level, methods concentrate on the fatigue damage from PCB modal response. The purpose of this course is to simplify the complex field of vibration of electronics and make results understandable. 1% Efficiency? Tests can determine fragility limits of test samples. But few tests supply any further information (beyond pass/fail). Why? Because test measurements can't fully describe failures. Most tests miss most of the valuable information that is (with this course) readily available. Early Attempts In the 70's and 80's, relatively simple mathematical methods were developed to predict PCB vibration life capabilities. Why? Because few companies could afford that era's high-speed computer systems and the technical expertise needed to analyze vibration. Those early methods, still used by many, provide guidelines that sometimes work, but they never provide product understanding. And all too often, such guidelines outright fail, at great expense - the expense of design and production of an unreliable product. But since then, the cost of high-speed computer power has dropped at a rate of about 50% per year. The compounded cost savings of the mid 80's high-speed computer is over 99.99%. One of the best-kept secrets of certain large companies is their ability to produce reliable electronic products at low cost. How? They are able to fully understand vibration of their electronics through detailed analysis. Such companies rarely share their reliability secrets with competitors. But now, with this course, every company can afford high speed analysis support of its testing. Test Efficiency? Let's define test efficiency as dollar value of information gained divided by dollars of test cost. If you run a test program without analysis, your numerator is near zero. Adding modern technology analysis can immeasurably increase your "information gained" numerator. Every test performed without detailed posttest analysis throws information away and wastes money. Rather than throw it away, capture that information and use it to save many design and production problems. Detailed Analysis? The "design life" of any system is defined by its weakest part based on the part's local exposure. Since vibration damage of circuit cards is dominated by cyclic stresses (caused by modal vibration), analysis should concentrate on accurately quantifying the stresses experienced by every component. Design life is limited by accumulated fatigue damage. Taking advantage of the speed of today's PCs, companies without prior experience can use this course to understand and avoid vibration-induced failures. For DATES AND LOCATIONS see
PC Troubleshooting Pocket Book Third Edition
The Newnes PC Troubleshooting Pocket Book provides a concise and compact reference that describes, in a clear and straightforward manner, the principles and practice of faultfinding and upgrading PCs and peripherals. The book is aimed at anyone who is involved with the installation, configuration, maintenance, upgrading, repair or support of PC systems. It also provides non-technical users with sufficient background information, charts and checklists to enable the diagnosis of faults and help to carry out simple modifications and repairs. The new edition of PC Troubleshooting will continue to include a number of short cuts that are instrumental in avoiding hours of potential frustration and costly effort. In order to reflect rapid changes in computer technology (both hardware and software) the third edition of the Newnes PC Troubleshooting Pocket Book has been completely revised and rewritten. New and expanded sections on: modern machines (Pentium II, III, IV, AMD); modern buses (FSB, AGP, Cyrix, Chip sets); different RAM chip types, performance and guide to RAM connectors; Win2000, ME, XP and NT4/5; latest SCSI standards, Ultra DMA, “live” re-portioning of the disc, FAT 16, FAT36, NTFS, performance and compatibility differences; ‘famous’ viruses and personal firewalls.
Pin in Hole/Intrusive Assembly & Defect Guide
This CD ROM is fully interactive and covers the use of through hole components, design and process requirement when implementing Pin in Hole/Intrusive assembly. Examples of satisfactory solder standards are provided with a complete guide to possible process defects with intrusive reflow. The defect section may be viewed with small examples to make searching easy and then each sample may be viewed at both half and full screen. A description of each of the defects is included with the examples. A full animation of the surface mount assembly process is included on the disk which includes the BGA, double sided assembly and through hole/Intrusive reflow assembly. This section features a commentary by Bob Willis or can be viewed with just a text guide. This CD-ROM complements the video tape, report and photo album already available in industry and are the first products available in the world to cover the use of this technology.
Random Vibration, Shock Testing, HALT, ESS, HASS Measurements, Analysis and Calibration
Upon completion of this short course, you will be able to measure vibration and shock, calibrate vibration and shock measurement systems, convert measured data into a test program, interpret vibration and shock test requirements, conduct vibration and shock tests, design suitable vibration and shock test fixtures.
Software Design for Testability (SDFT)
The latest theory and practice of Software Design for Testability (SDFT) will be explained, primarily through comparisons and analogies to the well-established discipline of hardware DFT.
Standards in Test
You will be introduced to most of the Military and Commercial Standards that affect the way test is performed and interpreted by both military and commercial concerns.
Test Engineering: A Concise Guide to Cost-effective Design, Development and Manufacture
Testing is usually the most expensive, time-consuming and difficult activity during the development of engineering products and systems. Development testing must be performed to ensure that designs meet requirements for performance, safety, durability, reliability, statutory aspects, etc. Most manufactured items must be tested to ensure that they are correctly made. However, much of the testing that is performed in industry is based upon traditions, standards and procedures that do not provide the optimum balance of assurance versus cost and time. There is often pressure to reduce testing because of the high costs involved, without appreciation of the effects on performance, reliability. etc. Misperceptions are commonplace, particularly the idea that tests should not stress products in excess of their operating levels. The main reason for this situation seems to be that engineers have not developed a consistent philosophy and methodology for testing. Testing is seldom taught as part of engineering curricula, and there are no books on the subject. Specialist areas are taught, for example fatigue testing to mechanical engineers and digital device testing to electronics engineers. However, a wide range is untaught, particularly multidisciplinary and systems aspects. Testing is not just an engineering issue. Because of the importance and magnitude of the economic and business aspects testing is an issue for management. Testing is perceived as a high cost activity, when it should be considered as a value-adding process. The objective of this book is, therefore, to propose a philosophy of engineering test and to describe the necessary technologies and methods that will provide a foundation for all plans, methods and decisions related to testing of engineered products and systems. The book will help those who must manage and conduct this most difficult and uncertain task. It will also provide a text, which can be used as the basis for teaching the principles of testing to all engineering students.
Test System Design: A Systematic Approach
The only expert guide to designing and implementing custom test systems Best practices for the entire lifecycle: planning through upgrades Maximizing accuracy, reliability, and usability(and protecting against obsolescence THE ONLY EXPERT GUIDE TO DESIGNING AND IMPLEMENTING CUSTOM TEST SYSTEMS More and more engineers now face the challenges of electronic testing(and those challenges are becoming more complex each year. In Test System Design: A Systematic Approach, three expert testing professionals offers start-to-finish best practices for designing, developing, and implementing custom test systems. Ideal for both engineers who are creating test systems and those contracting the responsibility to third parties, this book covers the entire system lifecycle, from planning to upgrades, and beyond. Designing, developing, and implementing more effective test systems(from start to finish Protecting against obsolescence through planned upgrades and open standards Simplifying development, minimizing risk, and maximizing accuracy and reliability Building systems that fit the skills of your operators Expert implementation: interfaces, cabling, switch panels, electrical safety, racking, temperature control, and more Discover proven techniques for evaluating your testing requirements, eliminating redundant tests, and determining exactly which equipment you really need. Compare your options for sourcing test equipment, and learn how to maximize the value of every supplier relationship. Learn better solutions for documenting your test systems, training your operators, streamlining your maintenance programs, and more. No matter what your testing challenges are, Test System Design is your comprehensive resource for achieving them faster and more cost effectively.
The Boundary-Scan Handbook, Third Edition Analog and Digital
Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, and popularly called the JTAG standard, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily deal with. IEEE standards, when embraced by practicing engineers, are living entities that grow and change quickly. The Boundary-Scan Handbook, Second Edition: Analog and Digital is intended to describe these standards in simple English rather than the strict and pedantic legalese encountered in the standards. The 1149.1 standard is now over eight years old and has a large infrastructure of support in the electronics industry. Today, the majority of custom ICs and programmable devices contain 1149.1. New applications for the 1149.1 protocol have been introduced, most notably the `In-System Configuration' (ISC) capability for Field Programmable Gate Arrays (FPGAs). The Boundary-Scan Handbook, Second Edition: Analog and Digital updates the information about IEEE Std. 1149.1, including the 1993 supplement that added new silicon functionality and the 1994 supplement that formalized the BSDL language definition. In addition, the new second edition presents completely new information about the newly approved 1149.4 standard often termed `Analog Boundary-Scan'. Along with this is a discussion of Analog Metrology needed to make use of 1149.1. This forms a toolset essential for testing boards and systems of the future.
Traceable Temperatures: An Introduction to Temperature Measurement and Calibration, 2nd Edition
The accurate measurement of temperature is a vital parameter in many fields. A critically important aspect of applying any temperature sensor is that of traceable calibration - a concept that has been developed to ensure that all measurements made are accurate and legally valid. This timely new edition reflects the marked move towards ISO accreditation in measurement laboratories internationally, and the ever increasing emphasis on adequate uncertainty analysis for measurements in accredited laboratories to conform to national and international bodies, and the SI and Metric treaty. · Fully revised and updated to incorporate the latest trends and developments in measurements and calibration · Provides information concurrent with the latest ISO Quality Standards for assessing the uncertainty of measurement sensors · Offers detailed converage of traceability, how to make traceable measurements and how to design, carry out and report calibration · Unique emphasis on possible problems in the field, and provision of practical advice on how to recognise and treat errors. An essential reference resource for practising and training engineers, scientists and technicians in accredited test and calibration laboratories involved in temperature measurement and calibration.
Vibration and Shock Distance Learning
Thousands of Power Point slides and a number of images and video clips teach you about vibration and shock basics, control, instrumentation, calibration, analysis and testing. Course outlind includes the following: Introduction, Classical sinusoidal vibration, Resonance effects, Torsional vibration, Control of dynamic motion, Steady-state vibration measurements, Sinusoidal vibration calibration, continuous systems, Analysis of complex motion, Types of tests, Electrohydraulic shakers, Multiple EH shakers, Electrodynamic shakers, Power amplifiers, Sine test standards, Random vibration, Measurement and analysis of random vibration, Random vibration testing standards, Controlling random vibration tests, Environmental Stress Screening (ESS), Accelerated Testing and Screening, Mesuring mechanical shock, SRS - The Shock Response Spectrum, Mechanical Shock Testing, Modal Testing
WebCourse - Design for Testability 501 - Advanced DFT Techniques
Boundary Scan pioneered a new approach to testability for board level. It is, however, important to integrate this with other forms of assembly. For today's complex circuits it may not be sufficient to test the boundary of the IC. Rather we will need to test inside the IC even when the IC is already mounted on a circuit board and when that board is already part of a module or system. This webinar will teach you about newer tools and the integration of those tools with traditional testability approaches.
A.T.E. Solutions, Inc. - ©2017