A.T.E. (Advanced Test Engineering) Solutions, Inc.
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Online Catalog of Educational Courses and Resources
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What You Will Learn
Accelerated Stress Testing Handbook: Guide for Achieving Quality Products
Electrical Engineering Accelerated Stress Testing Handbook Guide for Achieving Quality Products As we move closer to a genuinely global economy, the pressure to develop highly reliable products on ever-tighter schedules will increase. Part of a designer's "toolbox" for achieving product reliability in a compressed time frame should be a set of best practices for utilizing accelerated stress testing (AST). The Accelerated Stress Testing Handbook delineates a core set of AST practices as part of an overall methodology for enhancing hardware product reliability. The techniques presented will teach readers to identify design deficiencies and problems with component quality or manufacturing processes early in the product's life, and then to take corrective action as quickly as possible. A wide array of case studies gleaned from leading practitioners of AST supplement the theory and methodology, which will provide the reader with a more concrete idea of how AST truly enhances quality in a reduced time frame. Important topics covered include: * Theoretical basis for AST * General AST best practices * AST design and manufacturing processes * AST equipment and techniques * AST process safety qualification In this handbook, AST cases studies demonstrate thermal, vibration, electrical, and liquid stress application; failure mode analysis; and corrective action techniques. Individuals who would be interested in this book include: reliability engineers and researchers, mechanical and electrical engineers, those involved with all facets of electronics and telecommunications product design and manufacturing, and people responsible for implementing quality and process improvement programs.
An Introduction to Mixed-Signal IC Test and Measurement
Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. This book was written in response ot the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is designed to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts.
Analog Test Signal Generation Using Periodic Sigma Delta-Encoded Data Streams
Analog Test Signal Generation Using Periodic ÓÄ-Encoded Data Streams presents a new method to generate high quality analog signals with low hardware complexity. The theory of periodic ÓÄ-encoded bitstreams is presented along with a set of empirical tables to help select the appropriate parameters of a bitstream. An optimization procedure is also outlined to help select a bit sequence with the desired attributes. A large variety of signals can be generated using this approach. Silicon implementation issues are discussed with a specific emphasis on area overhead and ease of design. One FPGA circuit and three different silicon implementations are presented along with experimental results. It is shown that simple designs are capable of generating very high precision signals-on-chip. The technique is further extended to multi-bit signal generation where it is shown how to increase the performance of arbitrary waveform, generators commonly found in past and present-day mixed-signal testers. No hardware modifications are required, only the numbers in memory are changed. Three different calibration techniques to reduce the effects of the AWG's non-linearities are also introduced, together with supporting experimental evidence. The main focus of this text is to describe an area-efficient technique for analog signal generation using ÓÄ-encoded data stream. The main characteristics of the technique are: · High quality signals (SFDR of 110 dB observed); · Large variety of signals generated; · Bitstreams easily obtained with a fast optimization program; · Good frequency resolution, compatible with coherent sampling; · Simple and fast hardware implementation; · Mostly digital, except an easily testable 1-bit DAC and possibly a reconstruction filter; · Memory already available on-chip can be reused, reducing area overhead; · Designs can be incorporated into existing CAD tools; · High frequency generation.
ATE Selection and Management
Presented from a non-biased perspective, this course will teach you the decision process for test strategy selection. It provides a generic approach and alert you to things you should consider for ATE investment.
ATE Selection, Design and Programming
This course covers every aspect of a test engineer's responsibility. Participants will learn how to select an automatic test equipment (ATE) from the number of choices and generically different types available. You will learn how to build an ATE from instrumentation and other building blocks. You will learn the bussing requirements of the IEEE 488, VXIbus, and PC-based instruments. You will also learn the software issues. The course will teach you how to approach a functional test programming activity for digital circuits. (In the longer, three-day course, analog test programming is also covered.) Finally, you will learn test management issues, such as test program development estimation, acquisition and quality assurance.
This course will teach you how to write test procedures and code for many of the ATEs used in the military and airline industries using the Abbreviated Test Language for All Systems (ATLAS) a standard that is maintained by the IEEE.
Automated Software Testing: Introduction, Management, and Performance
With the urgent demand for rapid turnaround on new software releases--without compromising quality--the testing element of software development must keep pace, requiring a major shift from slow, labor-intensive testing methods to a faster and more thorough automated testing approach. Automated Software Testing is a comprehensive, step-by-step guide to the most effective tools, techniques, and methods for automated testing. Using numerous case studies of successful industry implementations, this book presents everything you need to know to successfully incorporate automated testing into the development process. In particular, this book focuses on the Automated Test Life Cycle Methodology (ATLM), a structured process for designing and executing testing that parallels the Rapid Application Development methodology commonly used today. Automated Software Testing is designed to lead you through each step of this structured program, from the initial decision to implement automated software testing through test planning, execution, and reporting. Included are test automation and test management guidance for: * Acquiring management support * Test tool evaluation and selection * The automated testing introduction process * Test effort and test team sizing * Test team composition, recruiting, and management * Test planning and preparation * Test procedure development guidelines * Automation reuse analysis and reuse library * Best practices for test automation
Beta Testing for Better Software
Implement, operate, and use beta testing immediately with this hands-on guide to the best practices. Beta testing is a complex process that, when properly run, provides a wealth of diverse information. But when poorly executed, it delivers little or no data while wasting time and money. Written by a leading expert in the field, this book will help you reach the full potential that beta testing has to offer. Michael Fine compiles the best practices to date so you can effectively bring beta testing into your company’s process to improve product quality. Using real-world case studies, this book begins by clearly explaining what a beta is and why you need one. Fine then explores the beta test procedure and walks through the best processes to use when implementing a test. He concludes by detailing the steps you should take after completing a test in order to take full advantage of the results. With this book, you’ll gain a better understanding of what beta testing is, why every company needs a beta test program, and how to get the most from a test. Fine will help you: · Understand all the steps involved in beta testing using real-world case studies · Implement a beta test using best- known practices · Produce better products based on the results of well-run beta tests · Apply beta testing across many platforms and many technologies · Improve on existing processes and identify critical issues
Embedded Processor-Based Self-Test
Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit’s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.
ESD Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control
This is a revision of the highly successful electronic manufacturing guide, ESD Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control. This revision is comprehensive and explains how to develop, implement and manage an ESD control program, and includes up-to-date data, many new chapters, new case studies, and much more. New to this edition: + Extensive changes and additions to auditing techniques, cost benefits data, and materials evaluation. + Six new chapters on common myths, issues related to smaller companies, process controls, ISO 9000, material characterization, and training. + New case studies on field-induced failures in the factory, long-distance central office system upsets, and automation-caused failures. + Expanded coverage of the needs of smaller companies including discussion of common problems and cost-effective solutions. A training breakthrough is presented. Previously invisible ESD events can now be easily displayed for students at all levels -- `Seeing is believing' + Inclusion of new testing instruments such as the event detector and resistance probe. + The 12 critical factors in an ESD program have been updated to reflect changes and refinements in program management. The author has also included the latest information on handling procedures and requirements from the Lucent ESD Control Handbook. ESD Program Management: A Realistic Approach to Continuous Measurable Improvement in Static Control, Second Edition, is a refreshingly unbiased guide for electronic manufacturing and quality control professionals.
IEEE Standard Test Language for All Systems - (C/ATLAS) 1995
C/ATLAS or Common Abbreviated Test Language for All Systems is a standardized test language for test procedures and test programs. This volume is not only helpful to those who use ATLAS, but its syntax and structure are applicable to all test programs.
Generate faster, more accurate SPICE simulations! Make your SPICE simulations faster, more accurate - and avoid nonconvergence using the breakthrough methods packed into the Second Edition of Inside SPICE. In this updated and revised bestseller, Ron Kielkowski gives you the hands-on help and guidance you need to create more effective software modles for simulating circuit behavior. This one-of-a-kind modeling toll and troubleshooter brings you up to speed on the latest commercially-SPICE-like simulators, including HSPICe, PSPICE, IS_SPICE and MICROCAP IV...delivers proven solutions to the full range of circuit simulation problems, including convergence and accuracy problems...shows you how to make difficult measurement such as loop gain of an op amp or distortion measurements of clocked ciruits like converters and sample-and-hold circuits...measure any class of circuits, such as oscillators, charge-storage circuits, or very large circuits...and more. Inside SPICE. Up-to-date methods for creating fast, accurate circuit simulations with SPICE. The complexities of SPICE - the international standard in circuit simulation software - require expert handling, Inside SPICE gives you everything necessary to create the most effective software models for simulation the behavior of real circuits. And this edition of Inside SPICE offers the most up-to-date techniques for generating faster, more accurate simulations. Inside SPICE, Second Edition is an indispensable reference tool - and a troubleshooter. It will help professionals and students analyze and work around problems typically encountered with SPICE and SPICE-like simulator programs: HSPICE, PSPICE, IS_SPICE, and MICROCAP IV. It has a new chapter on simulation trends, in addition to a new, Windows-compatible CD-ROM version of RSPICE with extensive sample models. Well-organized chapters spell out the fundamentals, including: understanding circuit simulations; nonconvergence; SPICE options; numeric integration. Packed with example circuit files.
Instrumentation and Instrument Buses
An ATE consists of discrete instruments capable of applying stimuli and making accurate measurements under the control of a computer. You will learn how each of these elements does its job and what realistic expectations you can have.
LabVIEW Programming, Data Acquisition and Analysis (with CD-ROM)
*Master LabVIEW programming - hands-on! *Learn through real-world data acquisition and analysis applications *Dozens of key techniques presented through easy-to-adapt templates *Extensively classroom-tested with professional engineers *CD-ROM: Tools, templates, and complete LabVIEW evaluation version Master LabVIEW programming from the ground up - fast! LabVIEW Programming, Data Acquisition and Analysis is your easy, hands-on guide to LabVIEW programming and data analysis. Whether you're learning LabVIEW from the ground up, or updating knowledge you already have, Jeffrey Beyon covers every key technique you need to build reliable, high-performance applications. You'll start with the basics: the structure of LabVIEW source files; using sub VIs; loops and conditional statements; data display; data types; and the prerequisites for data acquisition, including sampling theorems and data acquisition VIs. Next, Beyon covers every key category of data acquisition and analysis application - analog and digital, input and output. Coverage includes: *Practical techniques for data save/read, data conversion, and much more *Tips and tricks for memory management, large file management, and more *Implementing each leading data analysis VI *Instrument control, counters, and more *Avoiding and troubleshooting common LabVIEW programming problems Most examples are presented in the form of software templates that are easy enough to understand quickly, and robust enough to serve as building blocks for real-world solutions. You'll find detailed, end-of-chapter review questions; an accompanying lab workbook is also available. Whether you're a field engineer, scientist, researcher, or student, there's no faster way to get results with LabVIEW! CD-ROM INCLUDES: *Complete library of LabVIEW tools and templates *Full LabVIEW evaluation version Companion lab workbook: Hands-On Exercise Manual for LabVIEW Programming, Data Acquisition and Analysis
LabVIEW: Advanced Programming Techniques
The graphical nature of LabVIEW makes it ideal for test and measurement applications and its use brings significant improvements in productivity over conventional programming languages. However, comprehensive treatments of the more advanced topics have been scattered and difficult to find-until now.LabVIEW Advanced Programming Techniques offers in-depth coverage of the subjects that move you to the next level of programming-the level that allows full exploitation of LabVIEW's power and utility. These topics include:Active X: Gain the background needed to use Active X in your LabVIEW applications.Object-Oriented Technologies: Get a clear description of object analysis and see examples of how it can apply to LabVIEW applications. Application structure: Discover a three-tiered architecture that results in robust, flexible, and easy to maintain code.State machines: Get extensive coverage of several types of state machines-arguably the most useful programming tool available.Exception handling: Learn how to detect, process, and resolve exceptions in your code.Instrument drivers: See the value drivers bring to code readability and maintenance -Learn the techniques for constructing reusable drivers.Multi-threading: Learn how to look at a LabVIEW code diagram to determine how many threads your application can use, then optimize the performance of the application.
LabWindows/CVI Programming for Beginners (With CD-ROM)
The first "teach yourself" guide for LabWindows/CVI! LabWindows/CVI is the #1 system for building Windows-based virtual instrumentation with ANSI C—and this hands-on, project-oriented guide is the fastest way to get results with LabWindows/CVI! You'll master all you need to know to build programs that control instruments and data acquisition hardware—while still taking advantage of an easy-to-use user interface editor for building Windows applications. Shahid F. Khalid presents never-before-published LabWindows/CVI tips and tricks—plus coverage of every key LabWindows/CVI skill you'll need, including: * Systematically creating effective GUIs and automatically generating C code * Learning the tips and tricks of the Source Code Editor and Debugger * Learning the library functions through the use of Function Panels * Creating applications using File I/O, List Boxes, Rings, Text Box controls, and many more * Creating standalone executables, distribution disks, Dynamic Link Libraries (DLLs), and using the application from a supported external compiler * Complete tutorial on communication with instruments using GPIB and RS-232 interfaces Each chapter is organized for maximum clarity and convenience, and you'll find handy appendices explaining the features of LabWindows/CVI environment, formatting and scanning functions, and tutorial on two demo programs. If you're a LabWindows/CVI novice, you'll learn fast—and once you do, LabWindows/CVI Programming for Beginnerswill serve you well as a reference for years to come. CD-ROM INCLUDED The accompanying CD-ROM includes a complete trial version of LabWindows/CVI 5.5, plus finished versions of every project covered in the book. The CD-ROM also comes with complete trial versions of a System Test application and a mathematical application that analyzes functions parametrically
Maintainability: A Key to Effective Serviceability and Maintenance Management
Gets professionals quickly on-line with all the crucial design concepts and skills they need to dramatically improve the maintainability of their products or systems Maintainability is a practical, step-by-step guide to implementing a comprehensive maintainability program within your organization's design and development function. From program scheduling, organizational interfacing, cost estimating, and supplier activities, to maintainability prediction, task analysis, formal design review, and maintainability tests and demonstrations, it describes all the planning and organizational aspects of maintainability for projects under development and Schools readers in state-of-the-art maintainability design techniques Demonstrates methods for quantitatively measuring maintainability at every stage of the development process Shows how to increase effectiveness while reducing life-cycle costs of already existing systems or products Features numerous case studies, sample applications, and practice exercises Functions equally well as a professional reference and a classroom text Independent cost analysis studies indicate that an inordinately large percentage of the overall life-cycle cost of most systems/products is currently taken up by maintenance and support. In fact, for many large-scale systems, maintenance and support have been shown to account for as much as 60% to 75% of overall life-cycle costs. At a time of fierce global competition, long-term cost effectiveness is a major competitive advantage that manufacturers simply cannot afford to underestimate. Clearly then, to remain competitive in today's international marketplace, companies must institute programs for reducing system maintenance and support costs— comprehensive programs that are an integral part of the design and development process from its earliest conceptual stages. This book shows you how to implement such a program within your organization's design and development function. From program scheduling, organizational interfacing, cost estimating, and supplier activities, to maintainability prediction, task analysis, formal design review, and maintainability tests and demonstrations, it describes all the planning and organizational aspects of maintainability for projects under development while schooling you in the use of the full range of proven design techniques—including methods for quantitatively measuring maintainability at every stage of the development process. The authors also clearly explain how the principles and practices outlined in Maintainability can be applied to the evaluation of systems/products now in use both to increase their effectiveness and reduce long-term costs. While theoretical aspects of maintainability are discussed, the authors' main purpose in writing this book is to help get professionals quickly on-line with the essential maintainability concepts and skills. Hence, in addition to clarity of presentation and a rational hierarchical format, Maintainability features many case studies and sample applications that help to clarify the points covered, and numerous practice exercises that help engineers to test their mastery of the concepts and techniques covered. Maintainability is an invaluable professional tool for engineers from all disciplines who are involved with the design, testing, prototyping, manufacturing, and maintenance of products and systems. It also serves as a superior course book for graduate-level programs in those disciplines.
Neural Models and Algorithms for Digital Testing
Neural Models and Algorithms for Digital Testing presents a novel solution to a difficult problem, namely, test generation for digital logic circuits. An optimization approach to this problem has only recently been attempted. The authors propose a new and unconventional modeling technique for digital circuits. The input and output signal states of a logic gate are related through an energy function such that the minimum energy states correspond to the gate's logic function. There are at least two advantages to this new approach. First, since the function of the circuit is expressed as a mathematical expression, new techniques can be used to solve a problem like test generation. Second, the non-causal form of the model allows effective use of parallel processing. The authors present the mathematical basis for models and discuss their fundamental properties. Based on the same circuit models, test generation algorithms that can exploit fine-grain parallel computing, relaxation techniques, quadratic 0-1 programming and graph-theoretic techniques are presented. In addition to its practical value, the proposed problem formulation leads to interesting theoretical contributions. As a further application of the model, the intractability of the test generation problem is considered. Using the neural network models, a new class of circuits in which this problem is solvable in polynomial time is presented. This contribution is especially important since it leads to design styles for easily-testable digital circuits and provides a possible step toward design for testability.
Optimizing Electronics Vibration HALT, HASS, ALT and ESS
A three-day interactive workshop aimed at shortening the time required for electronics design, vibration testing and (when weaknesses are found) corrective action. This course applies to vibration of electronics at system, box or circuit card level. Methods can also be used in the design and testing of electronic components to meet vibration standards or desired capabilities. Discussion of simple methods and animations assist participants understand the complex responses of their electronics to laboratory and to field vibration. "Vibration test efficiency" is a new term, used here to illustrate recent improvements over the past slow "learning curve" for vibration knowledge. Since vibration life of most electronics is dependent on response at circuit card level, methods concentrate on the fatigue damage from PCB modal response. The purpose of this course is to simplify the complex field of vibration of electronics and make results understandable. 1% Efficiency? Tests can determine fragility limits of test samples. But few tests supply any further information (beyond pass/fail). Why? Because test measurements can't fully describe failures. Most tests miss most of the valuable information that is (with this course) readily available. Early Attempts In the 70's and 80's, relatively simple mathematical methods were developed to predict PCB vibration life capabilities. Why? Because few companies could afford that era's high-speed computer systems and the technical expertise needed to analyze vibration. Those early methods, still used by many, provide guidelines that sometimes work, but they never provide product understanding. And all too often, such guidelines outright fail, at great expense - the expense of design and production of an unreliable product. But since then, the cost of high-speed computer power has dropped at a rate of about 50% per year. The compounded cost savings of the mid 80's high-speed computer is over 99.99%. One of the best-kept secrets of certain large companies is their ability to produce reliable electronic products at low cost. How? They are able to fully understand vibration of their electronics through detailed analysis. Such companies rarely share their reliability secrets with competitors. But now, with this course, every company can afford high speed analysis support of its testing. Test Efficiency? Let's define test efficiency as dollar value of information gained divided by dollars of test cost. If you run a test program without analysis, your numerator is near zero. Adding modern technology analysis can immeasurably increase your "information gained" numerator. Every test performed without detailed posttest analysis throws information away and wastes money. Rather than throw it away, capture that information and use it to save many design and production problems. Detailed Analysis? The "design life" of any system is defined by its weakest part based on the part's local exposure. Since vibration damage of circuit cards is dominated by cyclic stresses (caused by modal vibration), analysis should concentrate on accurately quantifying the stresses experienced by every component. Design life is limited by accumulated fatigue damage. Taking advantage of the speed of today's PCs, companies without prior experience can use this course to understand and avoid vibration-induced failures. For DATES AND LOCATIONS see
Random Vibration, Shock Testing, HALT, ESS, HASS Measurements, Analysis and Calibration
Upon completion of this short course, you will be able to measure vibration and shock, calibrate vibration and shock measurement systems, convert measured data into a test program, interpret vibration and shock test requirements, conduct vibration and shock tests, design suitable vibration and shock test fixtures.
Software Design for Testability (SDFT)
The latest theory and practice of Software Design for Testability (SDFT) will be explained, primarily through comparisons and analogies to the well-established discipline of hardware DFT.
Standards in Test
You will be introduced to most of the Military and Commercial Standards that affect the way test is performed and interpreted by both military and commercial concerns.
System Validation and Verification
Covers all aspects of validation and verification and their use as problem-solving tools Contains helpful figures and tables to support the text Includes both theory and practical methods Historically, the terms validation and verification have been very loosely defined in the system engineering world, with predictable confusion. Few hardware or software testing texts even touch upon validation and verification, despite the fact that, properly employed, these test tools offer system and test engineers powerful techniques for identifying and solving problems early in the design process. Together, validation and verification encompass testing, analysis, demonstration, and examination methods used to determine whether a proposed design will satisfy system requirements. System Validation and Verification offers, for the first time in a single reference, clear definitions of the terms and detailed information on using these fundamental tools for problem solving. It smoothes the transition between requirements and design by providing methods to evaluate a given approach's ability to satisfy demanding technical requirements. With System Validation and Verification, system and test engineers and project managers will gain confidence in their designs and lessen the likelihood of serious problems cropping up late in the program. In addition to explanations of the theories behind the concepts, the book includes practical methods for each step of the process, examples from the author's considerable firsthand experience, and illustrations and tables to support the ideas presented in the text. Although not primarily a textbook, System Validation and Verification is based in part on validation and verification courses taught by the author and is an excellent supplemental reference for engineering students. In addition to its usefulness to system engineers, the book will be valuable to a wider audience including manufacturing, design, software , and risk management project engineers - anyone involved in large systems design projects.
Test and Evaluation of Complex Systems
Is it functional? Is it safe? Is it rigorous? Is it detrimental? Over the last two decades Test and Evaluation (T&E) techniques have evolved in response to the increasing complexity and interdependency of systems. The safe and proper operation of the complex systems and consumer products used in energy, transportation, electronics and communications, can no longer be realized without a formalized T&E program. Features include: · Easy-to-understand guide to the seven Best Practices for planning an effective T&E program · A useful model of the T&E Engineering process · T&E of computer programs, Modelling and Simulation, Operational T&E and Interoperability T&E · Case studies from both governmental and commercial sectors · T&E resources world-wide including the addresses of local T&E chapters Purposely written with the priorities of you the program manager and systems engineer in mind. This book masterfully captures the basic principles of T&E, specifically applying them to a variety of industries. Test and Evaluation of Complex Systems forms part of the Wiley Series in Measurement Science and Technology. Chief Editor: Peter Sydenham Australian Centre for Test and Evaluation, University of South Australia. This series was founded to coincide with the recognition of measurement science and instrument technology as fields with their own scholarship and techniques.
Test System Design: A Systematic Approach
The only expert guide to designing and implementing custom test systems Best practices for the entire lifecycle: planning through upgrades Maximizing accuracy, reliability, and usability(and protecting against obsolescence THE ONLY EXPERT GUIDE TO DESIGNING AND IMPLEMENTING CUSTOM TEST SYSTEMS More and more engineers now face the challenges of electronic testing(and those challenges are becoming more complex each year. In Test System Design: A Systematic Approach, three expert testing professionals offers start-to-finish best practices for designing, developing, and implementing custom test systems. Ideal for both engineers who are creating test systems and those contracting the responsibility to third parties, this book covers the entire system lifecycle, from planning to upgrades, and beyond. Designing, developing, and implementing more effective test systems(from start to finish Protecting against obsolescence through planned upgrades and open standards Simplifying development, minimizing risk, and maximizing accuracy and reliability Building systems that fit the skills of your operators Expert implementation: interfaces, cabling, switch panels, electrical safety, racking, temperature control, and more Discover proven techniques for evaluating your testing requirements, eliminating redundant tests, and determining exactly which equipment you really need. Compare your options for sourcing test equipment, and learn how to maximize the value of every supplier relationship. Learn better solutions for documenting your test systems, training your operators, streamlining your maintenance programs, and more. No matter what your testing challenges are, Test System Design is your comprehensive resource for achieving them faster and more cost effectively.
Testability Concepts for Digital ICs: The Macro Test Approach
Throughout the 1980s and 1990s, the theory and practice of testing electronic products has changed considerably. Quality and testing have become inextricably linked and both are fundamental to the generation of revenue to a company, helping the company to remain profitable and therefore survive. Testing plays an important role in assessing the quality of a product. The tester acts as a filter, separating good products from bad. Unfortunately, the tester can pass bad products and fail good products, and the generation of high quality tests has become complex and time consuming. To achieve significant reduction in time and cost of testing, the role and responsibility of testing has to be considered across an entire organization and product development process. Testability Concepts for Digital ICs: The Macro Test Approach considers testability aspects for digital ICs. The strategy taken is to integrate the testability aspects into the design and manufacturing of ICs and, for each IC design project, to give a precise definition of the boundary conditions, responsibilities, interfaces and communications between persons, and quality targets. Macro Test, a design-for-Testability approach, provides a manageable test program route. Using the Macro Test approach, one can explore alternative solutions to satisfy pre-defined levels of performance (e.g. defect detection, defect location, test application) within a pre-defined cost budget and time scale. Testability Concepts for Digital ICs is the first book to present a tried and proven method of using a Macro approach to testing complex ICs and is of particular interest to all test engineers, IC designers and managers concerned with producing high quality ICs.
The Automatic Test Equipment (ATE) Library Collection
We selected the 14 of the best titles for your library with the intent of providing all the information you need to understand how to identify, select, specify, build, program and maintain an ATE. The combined list price of individual books is considerably higher. We update the selections based on availability and how they apply to current needs. See a list in
The Test Library Collection
The Boundary-Scan Handbook, Third Edition Analog and Digital
Boundary-Scan, formally known as IEEE/ANSI Standard 1149.1-1990, and popularly called the JTAG standard, is a collection of design rules applied principally at the Integrated Circuit (IC) level that allow software to alleviate the growing cost of designing, producing and testing digital systems. A fundamental benefit of the standard is its ability to transform extremely difficult printed circuit board testing problems that could only be attacked with ad-hoc testing methods into well-structured problems that software can easily deal with. IEEE standards, when embraced by practicing engineers, are living entities that grow and change quickly. The Boundary-Scan Handbook, Second Edition: Analog and Digital is intended to describe these standards in simple English rather than the strict and pedantic legalese encountered in the standards. The 1149.1 standard is now over eight years old and has a large infrastructure of support in the electronics industry. Today, the majority of custom ICs and programmable devices contain 1149.1. New applications for the 1149.1 protocol have been introduced, most notably the `In-System Configuration' (ISC) capability for Field Programmable Gate Arrays (FPGAs). The Boundary-Scan Handbook, Second Edition: Analog and Digital updates the information about IEEE Std. 1149.1, including the 1993 supplement that added new silicon functionality and the 1994 supplement that formalized the BSDL language definition. In addition, the new second edition presents completely new information about the newly approved 1149.4 standard often termed `Analog Boundary-Scan'. Along with this is a discussion of Analog Metrology needed to make use of 1149.1. This forms a toolset essential for testing boards and systems of the future.
The Economics of Test and Testability
Why test is a solution to an economic problem How non-technical management views return on investment (ROI) and how to translate technical benefits to these terms Existing formulas for the cost and benefits of IC, board, and system tests How behavioral economics applies to test and what we can learn from it.
The Test Flow Simulator
This software product is a test strategy economics calculator. It was designed for manufacturers who are confused about the type of test equipment they should buy. This simple-to use software runs with Microsoft Excel and many popular spreadsheet programs and provides the calculations necessary to predict your overall test, repair and penalty costs. With this software you will be able to compare alternative test strategies and predict which will be best for you. You can estimate your test, repair and penalty costs for various test strategies and choices of ATE. You can try a number of scenarios and learn how a change in equipment or in test methods would influence your bottom line costs. Calculate your actual savings. The Test Flow Simulator comes with an extensive manual and our recommendations on what to look for in your ATE selections.
The Testability Director
This low priced software is used to motivate and evaluate testability practices in your organization. It contains hundreds of guidelines for meeting different types of testability criteria, including ASIC design, Analog, Digital, System Level and Built-In Test. The software runs with Microsoft Excel and many popular spreadsheet programs and contains tutorials on interpreting and scoring each criterion. It is truly the painless way to bring Design for Testability into your organization. See it at
Testability Director Web Page
VLSI Simulation and Test Generation
The stuck-at models used in simple logic is becoming obsolete when we wish to test Very Large Scale Integrated circuits. You will learn new approaches to test that can be used to test highly complex circuits.
WebCourse - ATE 101 - Overview of Test, ATE & Testability
A participant who has little or no background in test can leave this course with a thorough understanding of the issues. While the course provides few solutions, it is imperative that anyone making decisions concerning test and testability should first attend this course.
WebCourse - ATE 301 - ATE Test Programming
This course will teach you what is involved in developing a test program for an ATE. If you have never written a test program before, the course will illustrate the difficulties and point out traps that can make test programming a nightmare. For those who have experienced these problems, the course will provide a structured approach that will help avoid these problems in the future.
WebCourse - Design for Testability 101 - Who, What, When, Why, How Much
You will learn why Design for Testabilty (DFT) is an invaluable method to reduce test development costs. As long as DFT is performed early in the design stage, the return on investment (ROI) is substantial. You will learn how to translate techinical issues involving testability to economic issues understood by non-technical management.
WebCourse - Design for Testability 501 - Advanced DFT Techniques
Boundary Scan pioneered a new approach to testability for board level. It is, however, important to integrate this with other forms of assembly. For today's complex circuits it may not be sufficient to test the boundary of the IC. Rather we will need to test inside the IC even when the IC is already mounted on a circuit board and when that board is already part of a module or system. This webinar will teach you about newer tools and the integration of those tools with traditional testability approaches.
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