Test Library Collection

What is the Test Library Collection

Test Library Collections are books, software, course notes, or any other information that we believe you should have to completely understand and maintain a library of references for a specific subject.  Our test professionals carefully selected the titles.

Save with Test Library Collections

When you need information about a test topic, you cannot afford to look for the lowest priced book on the subject.  In fact, you will find that when you buy all the books on the subject, it is still far less expensive than  to go without the correct information.  For that reason, we have combined a number (though not all) books on various test subjects.  We took great care to ensure that the information you get in the collection is the most relevant and credible that exists.

Test Library Collections are ideal for your company's library.  You could buy each title alone, but we believe that your library should have them all.  To make the purchase easier, we give you a substantial discount off the total regular price you would pay if you bought those titles individually.

Test Library Collections Available

 The following Test Library Collections are now available.

• The Automatic Test Equipment (ATE) Library Collection (14 titles)
• The Design for Testability and Built-In Self-Test Library Collection (21 titles)
• The Standards in Test Library Collection (Not yet available)
• The Test Instrumentation Library Collection (Not yet available)

• Course Notes:
  • Overview of Test, ATE and Testability by A.T.E. Solutions, Inc.
  • ATE Selection, Design and Management  by A.T.E. Solutions, Inc.
• Books on Instrumentation
  • Introduction to Instrumentation and Measurements by Robert B Northrop
  • Electronic Test Instruments: Theory and Application by Robert A. Witte
  • Digital Storage Oscilloscopes by Ian Hickman
• Building an ATE
  • Test System Design: A Systematic Approach by Christine Tursky, Rodney Gordon, Scott Cowie
  • IEEE-488 General Purpose Instrumentation Bus Manual by Anthony J. Caristi
  • PC-based Instrumentation and Control by Mike Tooley
• Programming
  • IEEE Standard Test Language for All Systems - (C/ATLAS) 1995
  • Learning with LabVIEW 6i by Robert H Bishop
  • LabVIEW for Electric Circuits, Machines, Drives, and Laboratories by Nesimi Ertugrul
  • LabWindows/CVI Programming for Beginners (With CD-ROM) by Shahid F. Khalid
• Test Economics and Management
  • Building a Successful Board-Test Strategy by Stephen F. Scheiber
  • Economics of Electronic Design, Manufacture and Test by Magdy Abadir and Tony P. Ambler

The individual list price of this collection is approximately $1,500 and is available at a substantial discount when ordered together.  See the price and order The Automatic Test Equipment (ATE) Library Collection now.

Select another Library Collection

The Design for Testability and Built-In Self Test (DFT/BIST) Library Collection - Provides information you and your coworkers will need to successfully implement a Design for Testability operation at your facility.  While there is a general overlap of subjects covered, we classified each text below based on its emphasis.

• Course Notes:
• Design for Testability and for Built-In Self Test by A.T.E. Solutions, Inc.
• System Level:
• Research Perspectives and Case Studies in Systems Test and Diagnosis by John W. Sheppard and William R. Simpson
• Principles of Testing Electronic Systems by Samiha Mourad, Yervant Zorian
• Board Level Only:
• SMTA Testability Guidelines 101C – Downloadable with Site License  from the Surface Mount Technology Association
• The Boundary-Scan Handbook, Third Edition, Analog and Digital by Kenneth Parker
• Boundary-Scan Interconnect Diagnosis by José T. de Sousa and Peter Y. K. Cheung
• Analog and Mixed-Signal Circuits:
• Analog and Mixed Signal Boundary-Scan:  A Guide to the IEEE 1149.4 Test Standard by Adam Osseiran
• Analog Signal Generation for Built-In Self-Test of Mixed-Signal Integrated Circuits by Gordon W. Roberts and Albert K. Lu
• Digital Circuits:
• Digital Circuit Testing and Testability by Parag Lala
• Testability Concepts for Digital ICs: The Macro Test Approach by F.P.M. Beenker , R.G. Bennetts, and A.P. Thijssen
• Design-For-Test For Digital IC's and Embedded Core Systems by Alfred Crouch
• Design for AT-Speed Test, Diagnosis and Measurement by B. Nadeau-Dosti
• Digital Systems Testing and Testable Design by Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
• Memories:
• Testing and Testable Design of High-Density Random-Access Memories by Kanad Chakraborty and Pinaki Mazumder
• High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test by R. Dean Adams
• System-on-a-Chip Testabiity:
• System-on-a-Chip: Design and Test by Rochit Rajsuman
• Test Resource Partitioning for System-on-a-Chip by Krishnendu Chakrabarty , Vikram Iyengar, and Anshuman Chandra
• Built-In Self Test:
• On Line Testing for VLSI by Michael Nicolaidis, Yervant Zorian, and Dhiraj K. Pradhan
• A Designer's Guide to Built-in Self-Test by Charles E. Stroud
• Formalizing DFT and BIST:
• CTL for Test Information of Digital ICs by Rohit Kapur
• High-Level Test Synthesis of Digital VLSI Circuits by Mike Tien-Chien Lee

The individual list price of this collection is approximately $1,500 and is available at a substantial discount when ordered together.  See the price and order The Design for Testability and Built-In Self-Test (DFT/BIST) Library Collection now.

Select another Library Collection

Select another Library Collection

Select another Library Collection

If you would like a collection of books by a subject of your preference, let us know and we will suggest a group of titles for you.  Our discount for that will be substantial as well.  Write to us at BooksSoftware@BestTest.com.