|
Previous
BestTest Newsletters
.BestTest
Newsletter Index
Bulletins
and Test News
Important news items for the
test industry.
Gartner
Dataquest’s latest report shows the global market for
automated test equipment (ATE) edging up 1.8% to US$2.22 billion in
2003. But the market will stage 55% and 61% surges in 2004 and 2005,
respectively. The ATE market is projected to expand to US$5.54 billion
by 2007. New demand is emerging. 9-15-03
Teradyne's
distribution of tester
product sales in 2002 is revealed, placing 50% of its sales in the
semiconductor tester market. Backplane connection systems made up
32% of its sales, with printed circuit board testers coming in 3rd with
only 14% despite Teradyne's acquisition of GenRad in October 2001.
Teradyne's booming $3 billion business in 2000 fell to $1.2 in 2002. 9-12-03
The
integrated
metrology market double over the next few years to $43 million
in 2005, according to the market research company The Information
Network. 9-8-03
Singapore-based
ST
Assembly Test Services Ltd. (STATS) announced plans to increase
its stake in Winstek Semiconductor Corp. STATS will invest approximately
$12 million, raising its holdings in Winstek to about 55 percent of the
Taiwan company's outstanding shares. 9-5-03
National
Instruments increases its R&D during the economic downturn.
While the company's long-term business model calls for maintaining
R&D costs at 14 percent of revenue, that figure went up to 15.8
percent in 2001 and 16.4 percent in 2002. In the first half of this
year, that figure was holding at 16.1 percent. 8-15-03
International
Test Conference to focus on MEMS Testing. This
year's test conference covering IC and board test issues will shift its
focus to microelectromechanical system (MEMS) technology as a growing
concern for test engineers. Scheduled for the week of Sept. 29, the
International Test Conference (ITC 2003) in Charlotte, North Carolina,
will include two MEMS lecture series. 8-14-03
The
Information Network, a New Tripoli, Pa.-based research
firm said that factory automation tools, which dropped 8 percent
in 2002, will fully recover in 2003 with a 15 percent increase.
Significant under investment since 2000 was given as the main reason for
the projection. 8-5-03
Aeroflex
Inc., an automated testing solutions and microelectronics company
for the aerospace industry, announced that it has acquired the Racal
Wireless Solutions Group, a digital wireless test and measurement
outfit, for cash of $38 million and a deferred payment of up to $16.5
million in either cash or Aeroflex common stock. 8-1-03
National
Semiconductor takes the IEEE-1149.1 to the backplane with its System
Test Access (STA) evaluation kit, the industry's first evaluation
kit to provide IEEE 1149.1 support for multi-card backplane
environments. The STA evaluation kit supports the IEEE 1149.1 standard,
and is a scaled-down representation of a typical multi-drop system.
Composed of a backplane with three slots and several daughtercards, the
kit features National's STA111, which extends the IEEE 1149.1 standard
to the system level. 7-21-03
Backend
equipment orders continue to grow, as the ratio of orders to
reported shipments continues to grow as well, according to Semiconductor
Equipment and Materials International data. While the overall
ratio of equipment bookings and billings was 0.93, the book-to-bill
ratio of backend assembly and test equipment was 1.19. North American
suppliers received orders of $209.5 million according to the three-month
rolling average, while billings or reported shipment was $175.4 million.7-21-03
Mentor
Graphics Earns Prestigious
Support Center Practices (SCP) Certification for the fourth
consecutive year. SCP
Certification quantifies the effectiveness of customer support based
upon a stringent set of performance standards and represents best
practices in the industry. 7-15-03
NPTest
jumped into the single, scaleable open test architecture fray,
publicly unveiling today its Sapphire
NP tester. While still leery of the architecture proposed by the Semiconductor
Test Consortium (STC), which is proposing an open, non-proprietary,
industry-wide standard ATE architecture and launched last year at
Semicon West, NPTest has embraced the idea of a single platform. 7-14-03
Is
the test industry bouncing back? According to an
article in Electronic News, Taiwanese test and assembly house
Advanced Semiconductor Engineering Inc. (ASE) saw overall June revenues
grow, including an 8 percent sequential jump for its test services
subsidiary, ASE Test Ltd. ASE Test posted net revenue of $33.7
million in June, up 8 percent from
May and up 25 percent year-over-year. In
another article, Electronic News reports that Dataquest forecasts
the global equipment market will boom in 2004, lead by Asia/Pacific with
44 percent growth to $12.5 billion, followed by the U.S. with 41.5
percent growth, Europe with 42.3 percent, and Japan with 21.9 percent
growth. Overall, it anticipates the world equipment market to grow 38.3
percent next year to $28.5 billion, followed in 2005 by 47 percent
growth to $41.9 billion, before contracting in 2006. 7-9-03
Teradyne
layoff - is it coming? Financial research firms and
internet message boards are predicting layoffs from 400 to 700 Teradyne
employees, in order to save $40 million in an attempt to make the
company profitable in the fourth quarter. Teradyne, while not
denying the possibility, is denying that layoffs have already started
and that a decision has been made. Teradyne has shrunk from over
12,000 employees a few years ago to less than 7,200. 8-20-03
New
approach to failure analysis was introduced in a product that
utilizes magnetic imaging. The Magma C20 introduced by Neocera,
can "see" through semiconductor packaging and interconnect
layers to evaluate intensity and locate defects. 6-27-03
Market
research company VLSI Research Inc. released the results of its annual
customer satisfaction survey, which included the top 10 VLSI
ATE companies. Credence
Systems Corp. headed the list with a score of 7.84, followed by
Multitest and NP Test Inc. with scores of 7.61 and 7.46, respectively.
Agilent, Teradyne and LTX took 8th, 9th and 10th place, with scores of
7.06, 6.89, and 6.75, respectively. Click for the complete list of
the 10 VLSI
ATE companies. 6-19-03
Salary
survey indicates stagnation. Evaluation Engineering's 2003
Salary Survey reveals that unless you hold a Ph.D. you will have a
median income below $100,000, even with an MBA and even if you are the
boss. 15 years of experience will get you to $80,000, but someone
starting out will make $56,000. The salaries, however, are not
much worst than last year, but the report also shows that continuing
education has suffered and therefore the long term effect may be felt
for years. 6-15-03
Far-infrared
(terahertz) radiation has potential applications in homeland security such
as detection
of explosives in the mail or other non-metallic portable containers,
according to the National Institute of Standards and Technology. A
demonstration shows that it can rapidly identify bulk or airborne
materials inside sealed paper or plastic containers. 6-11-03
The
Semiconductor
Test Consortium Inc. (STC) today released the first draft of its
specification for its proposed open semiconductor test architecture, or
OpenSTAR. Created last year and incorporated in California earlier
this year as a non-profit corporation, the STC wants to establish an
open architecture ATE system. Some major ATE vendors reacted to the idea
with guarded skepticism at best at last year's Semicon West, even as
chipmakers and third-party ATE instrument vendors embraced the
idea. 6-3-03
Core
Test Language (CTL) Browser from Agilent to help IEEE Standard.
Ideally, CTL, an IEEE standard in the making, will make the test and
integration of differing cores from various manufacturers a plug and
play process. Agilent's sees this project as a way to continue to drive
sales of its configurable system-on-chip (SOC) test platform in a cost
conscious and consumer-driven world, and as an answer to its smaller
competitors that espouse small, low cost, DFT-based testers designed to
take advantage of methods like built-in self-test from the ground up.
5-30-03
May
29, 2003 , EXAMINING
THE SMTA TESTABILITY GUIDELINES TP-101C, Webcast was at 10:30 AM (PDST
- Los Angeles Time). Those who missed this webcast but wish to
have its contents should write to experts@BestTest.com.
5-29-03
Intel
disclosed
an electrical problem that can cause computers using its flagship
Itanium 2 processor to behave erratically or crash. The glitch only
affects some chips, and then only in the case of "a specific set of
operations in a specific sequence with specific data," according to
Barbara Grimes, an Intel spokeswoman. Intel has developed a test
that can determine if a chip is affected and is offering to exchange
affected chips. 5-12-03
NEPCON
West, scheduled for October 2003 in San Jose, CA has been postponed
indefinitely.
Noting the continued recession in the electronics manufacturing industry
coupled with the trend for OEMs to outsource manufacturing and the
migration of the electronics manufacturing industry to China, Kelvin
Marsden-Kish, VP for Reed Exhibitions, commented, “events reflect the
markets they serve and at this time the Northern California market is
not strong enough for NEPCON West to provide the return on investment
desired by exhibitors.” 5-5-03
Agilent
Technologies Inc. won two EDN magazine 2002 Innovation
of the Year awards. Agilent's high-performance InfiniiMax active
probes won in the test and measurement category, and Agilent Fault
Detective Test Analyzer won in the software category. 5-1-03
"Department
of Defense needs to better manage ATE modernization," according to
a US General Accounting Office Report
by that title. The report says the services have billions of dollars
worth of outdated ATE, and that congressional mandate to reduce
proliferation of testers has not been universally implemented, resulting
in more than $50 billion spent on some 400 different types of ATEs
between 1980 and 1992.
IEEE.1149.6,
the AC EXTEST extension for testing AC-coupled nets, is approved as a
standard. This standard fills the void left by the IEEE-1149.1
Boundary-Scan and the IEEE-1149.4
Mixed Signal standards with regards to driving capacitive
networks.
Evaluation Engineering magazine
awards Best
Products of 2002 award in various categories based on randomly
selected readers. The winners are:
-
ATE category - Keithley
Instruments with the Model S600DC/RF Automated Parametric Test
System.
-
Communications Test - IFR
Systems with the 13-GHz 2394 Spectrum Analyzer.
-
Data Acquisition - IOtech with
the WaveBook/512A™.
-
EMC - Laplace Instruments with
the Model ESA-2000 series of EMC analyzers.
-
Instrumentation - the Tektronix
TDS6604, a silicon germanium, four-channel, real-time digital
storage oscilloscope.
-
Test Development Software
- Geotest-Marvin Test Systems with its ATEasy 4.0.
Test
& Measurement World also gave
out its annual Best in Test Awards and Test Product of the Year Award.
The 12 products that won 2003 Best in Test Awards are: also gave
out its annual Best in Test Awards and Test Product of the Year Award.
The 12 products that won 2003 Best in Test Awards are:
-
Inovys' Ocelot DFT-focused IC
testers
-
LeCroy's WaveMaster 8600A
oscilloscope
-
Vectron's K2-AOI automated
optical inspection system
-
National Instruments' PXI-5660
RF signal analyzer
-
OriginLab's OriginPro 7.0
data-analysis and plotting software
-
IFR's 3410 Series digital RF
signal generators
-
Yokogawa's DL 750 Scopecorder
oscilloscope
-
NPTest's IDS OptiFIB
focused-ion-beam system
-
Synopsis' SoCBIST
design-for-test software
-
Teradyne's Integra FLEX
semiconductor test system
-
Agilent's 81250 ParBERT
parallel bit-error-ratio tester
-
Fluke's 8508A reference
multimeter
The
BestTest Directory
Information derived from
our open forum database, SmartTest, allowing free
access for vendors and searchers alike. The following services are
FREE to all registered users and vendors:
- Vendors can upload and
searchers can download specifications of test products and services
- Searchers can find any of more
than 3,000 test vendors, by name and by keyword search of
products/services
- Participate in the industry
add/view definition of test terms
- Search/add articles,
publications and course topics
- View/add events to a test
calendar
- List/search temporary and
permanent test related jobs.
Test
Information Probe
Recent
articles, books, standards,
information:
SMTA Testability Guidelines now
available
for
sale.
EEDesign
reports that Built-In Self Repair (BISR) joins BIST for increasing
memory reliability. 4-28-03
Test
Education
In addition to
our
courses, others on test:
The
incessant demand for more system bandwidth has spawned a plethora of
new, high-speed, serial, protocol-rich interconnect standards. Thriving
in the World of High-Speed Serial Interconnects is a web
based course offered on July 16, 2003 by Agilent.
Agilent will offer Advanced
WLAN Receiver Testing eSeminar on July 22, 2003 at two different
times: 9-10 AM and 5-6 PM (USA Pacific Time).
Web based course offered by Agilent,
entitled IN-CIRCUIT
DEBUG TECHNIQUES FOR SYSTEM DESIGNS UTILIZING FPGAs on July
23, 2003 at 8:30-10:00AM (USA Pacific Time)
Agilent
Technologies and Fudan University School of Microelectronics in
Shanghai open IC Testing Education Center to train engineers for
China's booming semiconductor industry. Thousands of semiconductor
engineers are expected to benefit from the creation of the center, which
is expected to provide systematic IC testing training to both new and
experienced engineers. 5-27-03
Tektronix
today announced a high-volume
order of oscilloscopes and options to China's Ministry of Education.
Using a loan from the World Bank's Higher Education Development Project,
the Ministry purchased, in November 2002, more than 1200 oscilloscopes
for 24 universities in 15 cities throughout the country. The products
will ship during 2003. 5-13-03
The
University of Liverpool, in
collaboration with National Instruments,
has established the UK's only e-Automation research facility. The
joint initiative will equip engineering students with
state-of-the-art engineering tools, such as the LabVIEW, graphical
development environment and PXI, an open, multi-vendor, standard
platform for measurement and automation. 5-8-03
According to
Evaluation
Engineering, Teradyne is donating its most popular semiconductor
test systems, the Integra J750, and other services valued at more than a
half million dollars to Iowa State University's College of Engineering.
Agilent Technologies will host a
free Web
seminar on jitter measurements in high-speed digital-transmission
systems. The seminar will take place at 9:00 AM-10:30 AM Eastern Time on
April 29, 2003 and will cover
eye-diagram analysis, stressed-eye receiver verification, cycle-to-cycle
jitter, FFT spectrum, and jitter-separation techniques.
A.T.E.
Solutions, Inc. in the News
Some things A.T.E. Solutions,
Inc. is doing:
(Note: As consultants,
A.T.E. Solutions, Inc. has nondisclosure agreements with many of its
clients that exclude revealing the projects we are engaged in and in
some cases even their identities. As a result, these announcement
are limited.)
Samsung
Regional Manager, Sujin Choi, wins the BestTest.com sponsored iPod
drawing at APEX 2006. Two
additional names (runner ups) were also drawn in case the winner could
not be contacted. The runner ups, Stuart Krever, an independent
contractor and Mathew McQueen of the US Navy's NSWC in Crane, Indiana
will both receive a Starbucks gift certificate. 2-10-2006
Louis
Y. Ungar presented Cost
Effective Tests Using ATE, DFT and BIST at APEX on February 7, 2006.
He also presented a half hour forum, entitled, "The
Economics of Testability in a Disposable, Obsolescence-ridden World of
Electronics" on Feb 9, 2006. Plans are being made to
present these as web-based courses. Dates have not yet been
selected. If you are interested in attending, contact us at experts@BestTest.com.
2-10-2006
Win
an iPod at the Measurement
Science Conference when you visit the A.T.E. Solutions, Inc. booth
and register for BestTest.com on March 1-3, 2006. 2-10-2006
Surface
Mount Technology Association (SMTA) makes its Testability Guidelines
available for downloading through A.T.E. Solutions, Inc.'s Online
Store. The SMTA Testability Guidelines are available as either a
single-user copy for only $39.95 or on a site-license basis for only
$199.95. For a limited time you may download
either of these options. 7-12-2004
Automatic
Testing Strategies for Today's Circuits is an online tutorial presented
by A.T.E.
Solutions, Inc. President, Louis Y. Ungar for Hewlett-Packard employees
worldwide on July 29, 2004 on the company's Intranet. The course is open
to Hewlett-Packard employees. Those interested should contact us
at experts@BestTest.com. 7-1-2004
previous
A.T.E. Solutions, Inc. in
the News
Two
courses on Test will again be taught by A.T.E.
Solutions, Inc. President, Louis Y. Ungar at Wescon
on September 22 and 23, 2004 in Anaheim, CA. For schedules contact
Wescon or write to us at experts@BestTest.com.
6-15-2004
Design
for Embedded and Built-In Test tutorial will again be taught by
A.T.E.
Solutions, Inc. President, Louis Y. Ungar at AutoTestCon
2004 on the opening day, September 20, 2004 in San Antonio, TX. This is our
sixth year in providing seminars to
the premier test conference.
University
of California at Los Angeles (UCLA) resumed its ATE and Design
for Testability courses in December 2003, taught by A.T.E.
Solutions, Inc. President, Louis Y. Ungar.
Design
for Built-In Test Course will again be taught by A.T.E.
Solutions, Inc. President, Louis Y. Ungar at AutoTestCon
2003 on the opening day, September 22, 2003 at the Disneyland Hotel
in Anaheim, CA. This is our fifth year in providing seminars to
the premier test conference. 7-23-03
A.T.E.
Solutions, Inc. teaches 3-day ATE Selection, Design and Programming
course to the US Navy's Measurement Directorate at NSWC, Corona,
California. The students included those responsible for
acquisition and certification of ATE and Test Program Sets. 6-11-03
The
Surface
Mount Technology Association (SMTA) Testability GuidelinesTP-101C,
2002, has been updated by its Testability Committee, headed by Louis Y.
Ungar of A.T.E. Solutions, Inc. A
web-based course on the Guidelines is scheduled for May 29, 2003 at
10:30 AM (Pacific Time)
Louis
Y. Ungar of A.T.E. Solutions, Inc. named technical advisor to Nepcon
West. Mr. Ungar will be responsible for soliciting and
reviewing papers on Design for Testability and Built-In Test.
Anyone interested to write and present a paper, please contact
Louis Ungar.
University of California, Los
Angeles (UCLA) has scheduled
the course for ATE, Design for Testability and Embedded Test for Dec
1-5, 2003 to be taught by Louis Y. Ungar of A.T.E. Solutions, Inc.
A.T.E.
Solutions, Inc. signs cooperative agreement involving test and testability
consulting with Huawei,
the largest telecommunications manufacturer in China. Louis Y.
Ungar visited the Shenzhen, China, where he provided tutorials on the
use of The
Testability Director software acquired by Huawei.
A.T.E. Solutions, Inc.
completed a three-year contract with WesTest
Engineering Corp. for the United States Air Force through which we
provided close to 2,000 hours of test engineering courses to the Turkish
Air Force and its subcontractor, HAVELSAN
in Ankara, Turkey. This was probably the most extensive test
education course anywhere. Students received comprehensive full
day courses on Test Programming, ATE Design, ATE Selection and
Economics, Failure Mode and Effects Analysis, Software Quality
Assurance, Electomagnetic Compatibility, Depot Management, and several
other test related courses. More than a dozen A.T.E. Solutions,
Inc. instructors
took place in this endeavor.
Announcements
New products/services by paid
sponsors:
GOEPEL
electronic releases V4.03 of its Boundary Scan software SYSTEM CASCON™
The new Automatic
Flash Program Generator (AFPG) is able to handle Flash memories of
unlimited size (64Mbit, 128Mbit, 256Mbit, etc.) and bus width (serial,
8bit, 16bit, 32bit, 64bit, etc.) individually or cascaded. 9-17-03
Fujitsu
will market its fingerprint sensor starting in August for $6.00 each
(in lots of 1,000). The award
winning MBF310 Sweep Sensor™ features an advanced
auto-finger detection (AFD) circuit and an on-board FIFO memory. 7-30-03
Amkor
releases its RF test platform, dubbed the RFt, is aimed at producers
of high volume, low cost RF chips commonly used in wireless
applications. RFt was
originally developed for internal use only. 7-16-03
Teradyne
announced the
availability of Safe Test TM for their in-circuit testers.
"The smaller device sizes and lower maximum voltage thresholds of
today's newest low voltage technology components expose electronics
manufacturers to considerable risk of damaging components through
over-voltage and over-current during powered-up in-circuit testing (ICT)
with conventional ICT solutions," said Alan Albee, marketing
product manager at Teradyne. Safe Test is intended to eliminate
the risk of damaging or severely weakening these new devices. 6-11-03
A
Request for White Papers in Test and Testability was posted by
Semiconductor Research Corporation (SRC) with a due date of July 1,
2003. The Call is
open to academic researchers worldwide. SRC anticipates being able to
add a number of research tasks in test and testability in January 2004. 6-21-03
The
PXI Systems Alliance now
has 880 products from a group of more than 50 worldwide members.
The
MEMS (micro-electro-mechanical systems) testing community, called MEMUNITY,
now has a forum which provides information on all manners of MEMS test
topics to anyone interested in learning more about MEMS testing.
Upcoming
Events
Highlighting events of interest
The
Business of Test
Mergers,
ventures, acquisitions and big
money in test:
Francisco
Partners, the world's largest technology-focused private equity fund,
and Shah Management, are paying
Schlumberger $220 million to acquire NPTest. Schlumberger split this
unit off as the semiconductor test and diagnostic branch of its
operation. 6-24-03
Unlike
other areas of the economy, the sale of PXI instruments set
records. According
to an article, PXI product introductions increased by about 55% and
sales increased by 35% in 2002. PXI sales topped $95 million in
2002, up from $70 million in 2001.
As
the industry heads into the second half of the year, semiconductor
tester orders continue to improve, according to Agilent Technologies
Inc., but beyond the current quarter, it remains difficult to say what
will happen. Citing data from market research companies Prime Research
and VLSI Research, in the overall ATE market, Agilent said it captured
23 percent of the $2.94 billion market in 2000, putting it neck and neck
with rival Teradyne Inc. In 2000, Agilent only had 18 percent of a $7.91
billion market, following Advantest Inc. with 20 percent and Teradyne
with 30 percent. NPTest, the semi test division of conglomerate
Schlumberger Ltd., also significantly grew it's share of the overall
market from 3% in 2000 to 7% in 2002. 5-30-03
LTX
Corp. (LTXX) agreed to acquire
the remaining shares of StepTech Inc. it doesn't already own for up
to about $7.5 million in cash and up to 2.45 million in company shares.
LTX initially purchased 18% of StepTech, a semiconductor test
programming service back in October 2000. 5-22-03
Agilent,
despite its loss of more than $1 billion last year has ambitions of
outselling Tektronix Inc. and LeCroy Corp. in the high-end
oscilloscope market. Though the global oscilloscope market dropped
from $1.2 billion in 2001 to $850 million, it is expected to rebound by
5% to 7% this year. It remains to be seen if the 6-GHz and 4-GHz
scope that Agilent introduced will help it gain market share. 5-15-03
Boeing
selects Teradyne for Next
Generation (NxGen) Test Solution which is designed to reduce the cost of component testing for airlines while ensuring test quality and reliability. It replaces the current ATS-182 for testing 737, 747, 757 and 767 components and the ATS-195 for 777 components.
Teradyne's SpectrumTM 9000-Series functional test system
will be the core of NxGen. 5-5-03
Singapore's
ST Assembly Test Services Ltd. (STTS) reported losses
for the first quarter narrowed on year while revenue doubled as it
tested and packaged more chips for mobile phones, data storage and other
technology products. Net loss for the three months ended March
shrank to US$9.6 million, from US$26.6 million, in the year-ago period.
It was the ninth consecutive quarter of loss
but the sixth consecutive quarter of revenue growth for ST Assembly. 5-1-03
Agilent
Technologies (NYSE: A) today announced that Lattice Semiconductor
(NASDAQ: LSCC), a supplier of integrated programmable logic and
high-speed SerDes solutions, has selected the Agilent 93000 SOC Series
to test its most advanced field programmable gate array (FPGA), field
programmable system chip (FPSC), and expanded PLD (XPLD) programmable
products. 4-21-03
Intel
and Agilent announced a collaboration to develop the Agilent protocol
test card that coincides with the Intel product development solution for
the PCI Express market. 4-10-2003
Agilent Technologies signed an
agreement to sell it's VXI-based mechanical data-acquisition products to
VXI Technology, Inc., a
privately held company headquartered in Irvine, California. The sale is
effective May 1, 2003. 4-9-03
Keithley
Instruments manufacturer of parametric tests for wireless and mobile
communication ICs, and Novellus
Systems developers of processes for the global semiconductor
industry, have announced plans to collaborate on the development of
diagnostic tests for copper and low-k integration. 4-8-03
Something
for Nothing
Giveaways FREE to our visitors
offered by paid
sponsors:
FREE
Lunch. MentorGraphics
offers lunchtime courses at various locations on test and testability
topics.
Test
Talk
Heard something about test? Tell
Us to post it.
Links
Worth a Click
Google.
Test sites of interest: Evaluation
Engineering Test
& Measurement World American
Society of Test Engineers ATE
World Want
to trade links? We'll list yours here and you list you list
ours at your site.
|
Analysis,
Integration & Design, Inc. CEO, Hugh A. Pritchett, was the
lucky winner of the BestTest.com sponsored iPod
drawing at AutoTestCon 2006,
held at the Disneyland Hotel in Sept. 2006. Mr. Pritchett stood by
as his registration slip was pulled from hundreds of entries by an
employee of the US Marine Corps. Chief Sgt Roosevelt Crawley, the
winner of an iPod at the Measurement
Science Conference on March 3, 2006 also came by to the booth and to
show his appreciation of the iPod he won a few months earlier. 
US
Marine Corps Senior Calibration Chief, Sgt. Roosevelt Crawley,
wins
an iPod in the A.T.E. Solutions, Inc. booth at the 
